PORTO @ Archivio Istituzionale della Ricerca

CANTORO, RICCARDO
 Distribuzione geografica
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Continente #
EU - Europa 9.169
AS - Asia 8.748
NA - Nord America 8.511
SA - Sud America 704
AF - Africa 99
Continente sconosciuto - Info sul continente non disponibili 7
OC - Oceania 6
Totale 27.244
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Nazione #
US - Stati Uniti d'America 8.347
SG - Singapore 2.827
IT - Italia 2.612
VN - Vietnam 2.011
CN - Cina 1.731
GB - Regno Unito 1.540
DE - Germania 1.202
RU - Federazione Russa 1.171
FR - Francia 1.031
BR - Brasile 563
KR - Corea 447
HK - Hong Kong 430
IN - India 225
NL - Olanda 215
TR - Turchia 204
UA - Ucraina 197
IE - Irlanda 193
IL - Israele 188
BE - Belgio 180
AT - Austria 173
FI - Finlandia 142
JP - Giappone 141
CA - Canada 106
SE - Svezia 94
CH - Svizzera 80
ID - Indonesia 80
PH - Filippine 67
TH - Thailandia 59
JO - Giordania 58
TW - Taiwan 54
BD - Bangladesh 45
EE - Estonia 44
AR - Argentina 43
ES - Italia 42
GR - Grecia 40
IQ - Iraq 38
MX - Messico 32
PL - Polonia 32
PT - Portogallo 32
PK - Pakistan 31
RO - Romania 30
ZA - Sudafrica 26
MA - Marocco 22
AE - Emirati Arabi Uniti 21
CO - Colombia 21
CL - Cile 19
EC - Ecuador 16
LT - Lituania 16
SA - Arabia Saudita 16
IR - Iran 14
UY - Uruguay 14
UZ - Uzbekistan 14
EU - Europa 13
BG - Bulgaria 12
EG - Egitto 12
KE - Kenya 12
AL - Albania 10
CY - Cipro 10
CZ - Repubblica Ceca 10
VE - Venezuela 10
AZ - Azerbaigian 9
HR - Croazia 9
PE - Perù 9
KZ - Kazakistan 8
MY - Malesia 7
PY - Paraguay 7
DZ - Algeria 6
NP - Nepal 6
SN - Senegal 6
AU - Australia 5
DK - Danimarca 5
DO - Repubblica Dominicana 5
JM - Giamaica 5
KG - Kirghizistan 5
LB - Libano 5
RS - Serbia 5
TN - Tunisia 5
HU - Ungheria 4
MD - Moldavia 4
NO - Norvegia 4
SI - Slovenia 4
AM - Armenia 3
CI - Costa d'Avorio 3
CR - Costa Rica 3
CU - Cuba 3
MO - Macao, regione amministrativa speciale della Cina 3
SK - Slovacchia (Repubblica Slovacca) 3
XK - ???statistics.table.value.countryCode.XK??? 3
BO - Bolivia 2
GE - Georgia 2
HN - Honduras 2
MK - Macedonia 2
OM - Oman 2
PA - Panama 2
TJ - Tagikistan 2
TT - Trinidad e Tobago 2
BA - Bosnia-Erzegovina 1
BY - Bielorussia 1
CG - Congo 1
CM - Camerun 1
Totale 27.229
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Città #
Singapore 1.744
Ashburn 1.561
Southend 1.346
Turin 913
San Jose 669
Ho Chi Minh City 540
Hanoi 490
Chandler 426
Fairfield 394
Torino 393
Santa Clara 330
Council Bluffs 322
Hong Kong 313
Seattle 311
Hefei 296
Houston 266
Seoul 263
Boardman 257
Los Angeles 225
Beijing 208
Princeton 208
Ann Arbor 198
Woodbridge 195
Wilmington 190
Dublin 186
Brussels 173
Milan 155
Berlin 142
Cambridge 139
Frankfurt am Main 115
Dallas 111
Vienna 108
Tongling 101
Lauterbourg 100
San Ramon 96
Da Nang 95
Istanbul 95
Tel Aviv 92
Moscow 91
Jerusalem 90
Jacksonville 86
Nuremberg 84
Shanghai 84
Izmir 78
Helsinki 76
Saint Petersburg 65
São Paulo 64
Bern 63
Jakarta 60
Haiphong 56
New York 55
Rome 55
San Donato Milanese 54
Tokyo 53
Amsterdam 51
Des Moines 50
Munich 47
Bremen 44
Guangzhou 41
Lappeenranta 41
Falls Church 38
North Bergen 38
Penza 36
Buffalo 35
Shenzhen 35
Toronto 35
Mountain View 34
Tallinn 33
The Dalles 32
London 27
Biên Hòa 26
Leiden 25
Madrid 25
Montreal 24
San Francisco 24
Bangkok 23
Dearborn 23
Fremont 23
Paris 23
Xi'an 23
Zaporozhye 22
Hangzhou 21
Baghdad 20
San Antonio 20
The Hague 20
Turku 20
Zhengzhou 20
Hải Dương 19
Lisbon 19
Warsaw 19
Palermo 18
Redmond 18
Stuttgart 18
Thái Bình 18
Varese 18
Bến Tre 17
Fuzhou 17
Orem 17
St Petersburg 17
Belo Horizonte 16
Totale 16.110
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Nome #
New techniques for functional testing of microprocessor based systems 617
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 572
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers 516
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors 478
Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs 462
An Optimized Test During Burn-In for Automotive SoC 446
Software-based self-test techniques of computational modules in dual issue embedded processors 439
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller 421
A Flexible Framework for the Automatic Generation of SBST Programs 418
An Evolutionary Approach for Test Program Compaction 409
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation 403
On the Testability of IEEE 1687 Networks 402
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In 396
Test Time Minimization in Reconfigurable Scan Networks 395
On the Automatic Generation of SBST Test Programs for In-Field Test 394
On the Functional Test of the Cache Coherency Logic in Multi-core Systems 390
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 390
On the Maximization of the Sustained Switching Activity in a Processor 372
Observability solutions for in-field functional test of processor-based systems 362
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC 354
Semi-Supervised Deep Learning for Microcontroller Performance Screening 347
Effective generation and evaluation of diagnostic SBST programs 338
In-field functional test programs development flow for embedded FPUs 327
Thermal issues in test: An overview of the significant aspects and industrial practice 325
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors 318
A Suite of IEEE 1687 Benchmark Networks 317
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors 313
On the diagnostic analysis of IEEE 1687 networks 310
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks 308
On the Optimization of SBST Test Program Compaction 305
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests 303
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 301
Automated Test Program Reordering for Efficient SBST 286
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks 281
On the detection of board delay faults through the execution of functional programs 277
Device-Aware Test for Anomalous Charge Trapping in FeFETs 276
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications 276
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks 275
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks 266
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks 255
Targeting different defect-oriented fault models in IC testing: an experimental approach 247
Transfer Learning in MCU Performance Screening 246
Investigating on Gradient Regularization for Testing Neural Networks 244
Test of Reconfigurable Modules in Scan Networks 244
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications 240
New Perspectives on Core In-field Path Delay Test 240
COVID-19 Detection from Exhaled Breath 234
Fault-Independent Test-Generation for Software-Based Self-Testing 234
Exploiting Active Learning for Microcontroller Performance Prediction 233
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 231
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects 227
A Multi-Label Active Learning Framework for Microcontroller Performance Screening 227
An analysis of test solutions for COTS-based systems in space applications 227
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 225
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration 224
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking 222
Industrial best practice: cases of study by automotive chip- makers 221
Feature Selection for Cost Reduction in MCU Performance Screening 220
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 220
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification 220
In-field Functional Test of CAN Bus Controllers 213
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions 210
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 210
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor 208
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction 203
Comparing different approaches to the test of Reconfigurable Scan Networks 201
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 199
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network 199
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters 198
Recent Trends and Perspectives on Defect-Oriented Testing 196
DOC: Detection of On-Line Failures in CNNs 191
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults 189
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening 188
Evaluating the Code Encryption Effects on Memory Fault Resilience 188
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 188
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data 185
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks 185
Enabling Inter-Product Transfer Learning on MCU Performance Screening 182
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 182
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits 181
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 180
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques 180
An evolutionary technique for reducing the duration of reconfigurable scan network test 179
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models 178
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques 176
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors 174
Embedded Feature Selection in MCU Performance Screening 173
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening 173
Defects, Fault Modeling, and Test Development Framework for FeFETs 172
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 171
Improved Test Solutions for COTS-Based Systems in Space Applications 169
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks 167
Performance-aware reliability optimization for digital designs 164
Self-Test Library Generation for In-field Test of Path Delay faults 163
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 158
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing 157
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms 155
Using Formal Methods to Support the Development of STLs for GPUs 153
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core 152
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation 148
Totale 26.504
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Categoria #
all - tutte 66.091
article - articoli 14.200
book - libri 0
conference - conferenze 49.557
curatela - curatele 0
other - altro 633
patent - brevetti 0
selected - selezionate 0
volume - volumi 530
Totale 131.011
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021135 0 0 0 0 0 0 0 0 0 0 84 51
2021/20221.177 127 71 59 37 63 102 45 111 62 59 157 284
2022/20232.020 130 241 137 174 198 208 145 116 203 80 117 271
2023/20241.243 89 113 113 98 144 131 109 76 39 67 136 128
2024/20254.813 62 571 246 691 290 348 336 501 552 202 371 643
2025/202610.084 505 495 485 737 681 607 1.662 1.076 2.269 1.392 175 0
Totale 27.639