PORTO @ Archivio Istituzionale della Ricerca

CANTORO, RICCARDO
 Distribuzione geografica
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Continente #
EU - Europa 9.490
NA - Nord America 8.933
AS - Asia 8.923
SA - Sud America 705
AF - Africa 99
Continente sconosciuto - Info sul continente non disponibili 7
OC - Oceania 6
Totale 28.163
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Nazione #
US - Stati Uniti d'America 8.745
IT - Italia 2.910
SG - Singapore 2.839
VN - Vietnam 2.011
CN - Cina 1.733
GB - Regno Unito 1.542
DE - Germania 1.210
RU - Federazione Russa 1.171
FR - Francia 1.035
BR - Brasile 563
KR - Corea 447
HK - Hong Kong 434
IN - India 225
NL - Olanda 217
TR - Turchia 204
BD - Bangladesh 200
UA - Ucraina 197
IE - Irlanda 193
IL - Israele 188
BE - Belgio 180
AT - Austria 173
JP - Giappone 143
FI - Finlandia 142
CA - Canada 125
SE - Svezia 97
CH - Svizzera 81
ID - Indonesia 80
PH - Filippine 67
TH - Thailandia 59
JO - Giordania 58
TW - Taiwan 54
AR - Argentina 44
EE - Estonia 44
ES - Italia 42
GR - Grecia 40
IQ - Iraq 38
MX - Messico 32
PL - Polonia 32
PT - Portogallo 32
PK - Pakistan 31
RO - Romania 30
ZA - Sudafrica 26
MA - Marocco 22
AE - Emirati Arabi Uniti 21
CO - Colombia 21
CL - Cile 19
LT - Lituania 17
EC - Ecuador 16
SA - Arabia Saudita 16
IR - Iran 14
UY - Uruguay 14
UZ - Uzbekistan 14
EU - Europa 13
BG - Bulgaria 12
EG - Egitto 12
KE - Kenya 12
AL - Albania 10
CY - Cipro 10
CZ - Repubblica Ceca 10
VE - Venezuela 10
AZ - Azerbaigian 9
HR - Croazia 9
PE - Perù 9
KZ - Kazakistan 8
MY - Malesia 7
PY - Paraguay 7
DZ - Algeria 6
JM - Giamaica 6
NP - Nepal 6
SN - Senegal 6
AU - Australia 5
CR - Costa Rica 5
DK - Danimarca 5
DO - Repubblica Dominicana 5
KG - Kirghizistan 5
LB - Libano 5
MD - Moldavia 5
RS - Serbia 5
TN - Tunisia 5
HU - Ungheria 4
NO - Norvegia 4
SI - Slovenia 4
AM - Armenia 3
CI - Costa d'Avorio 3
CU - Cuba 3
HN - Honduras 3
MO - Macao, regione amministrativa speciale della Cina 3
SK - Slovacchia (Repubblica Slovacca) 3
XK - ???statistics.table.value.countryCode.XK??? 3
BO - Bolivia 2
GE - Georgia 2
MK - Macedonia 2
NI - Nicaragua 2
OM - Oman 2
PA - Panama 2
TJ - Tagikistan 2
TT - Trinidad e Tobago 2
BA - Bosnia-Erzegovina 1
BY - Bielorussia 1
CG - Congo 1
Totale 28.147
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Città #
Singapore 1.746
Ashburn 1.595
Southend 1.346
Turin 934
San Jose 788
Ho Chi Minh City 540
Hanoi 490
Chandler 426
Fairfield 394
Torino 393
Council Bluffs 346
Santa Clara 346
Hong Kong 314
Seattle 311
Hefei 296
Houston 267
Boardman 264
Seoul 263
Los Angeles 252
Milan 227
Beijing 209
Princeton 208
Ann Arbor 198
Woodbridge 195
Wilmington 190
Dublin 186
Brussels 173
Berlin 142
Cambridge 139
Dallas 121
Frankfurt am Main 117
Vienna 108
Tongling 101
Lauterbourg 100
San Ramon 96
Da Nang 95
Istanbul 95
Tel Aviv 92
Moscow 91
Jerusalem 90
Jacksonville 87
Nuremberg 84
Shanghai 84
Rome 83
New York 79
Izmir 78
Helsinki 76
Saint Petersburg 65
São Paulo 64
Bern 63
Jakarta 60
Haiphong 56
Tokyo 55
San Donato Milanese 54
Munich 52
Amsterdam 51
Des Moines 50
Bremen 44
Buffalo 41
Guangzhou 41
Lappeenranta 41
Toronto 40
Falls Church 38
North Bergen 38
Penza 36
Shenzhen 35
The Dalles 35
Mountain View 34
Tallinn 33
Montreal 30
Figino 29
London 27
Biên Hòa 26
Leiden 25
Madrid 25
San Francisco 24
Bangkok 23
Dearborn 23
Fremont 23
Paris 23
Xi'an 23
San Antonio 22
Zaporozhye 22
Hangzhou 21
Palermo 21
Baghdad 20
The Hague 20
Turku 20
Zhengzhou 20
Hải Dương 19
Lisbon 19
Warsaw 19
Redmond 18
Stuttgart 18
Thái Bình 18
Varese 18
Bến Tre 17
Fuzhou 17
Naples 17
Orem 17
Totale 16.545
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Nome #
New techniques for functional testing of microprocessor based systems 636
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 573
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers 520
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors 482
Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs 465
An Optimized Test During Burn-In for Automotive SoC 449
Software-based self-test techniques of computational modules in dual issue embedded processors 441
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller 425
A Flexible Framework for the Automatic Generation of SBST Programs 423
An Evolutionary Approach for Test Program Compaction 411
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation 407
On the Testability of IEEE 1687 Networks 405
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 401
On the Automatic Generation of SBST Test Programs for In-Field Test 399
Test Time Minimization in Reconfigurable Scan Networks 398
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In 397
On the Functional Test of the Cache Coherency Logic in Multi-core Systems 393
On the Maximization of the Sustained Switching Activity in a Processor 374
Semi-Supervised Deep Learning for Microcontroller Performance Screening 368
Observability solutions for in-field functional test of processor-based systems 366
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC 356
Effective generation and evaluation of diagnostic SBST programs 340
In-field functional test programs development flow for embedded FPUs 330
Thermal issues in test: An overview of the significant aspects and industrial practice 328
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors 324
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors 319
A Suite of IEEE 1687 Benchmark Networks 319
On the diagnostic analysis of IEEE 1687 networks 312
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 311
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks 310
On the Optimization of SBST Test Program Compaction 309
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests 308
Device-Aware Test for Anomalous Charge Trapping in FeFETs 296
Automated Test Program Reordering for Efficient SBST 288
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks 282
On the detection of board delay faults through the execution of functional programs 280
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications 279
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks 278
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks 269
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks 257
Investigating on Gradient Regularization for Testing Neural Networks 255
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 255
New Perspectives on Core In-field Path Delay Test 254
Transfer Learning in MCU Performance Screening 253
Targeting different defect-oriented fault models in IC testing: an experimental approach 250
Test of Reconfigurable Modules in Scan Networks 245
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction 245
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects 243
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications 241
COVID-19 Detection from Exhaled Breath 240
Fault-Independent Test-Generation for Software-Based Self-Testing 237
Exploiting Active Learning for Microcontroller Performance Prediction 236
A Multi-Label Active Learning Framework for Microcontroller Performance Screening 234
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 234
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking 233
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 231
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration 229
An analysis of test solutions for COTS-based systems in space applications 229
Feature Selection for Cost Reduction in MCU Performance Screening 225
Industrial best practice: cases of study by automotive chip- makers 224
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification 221
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models 220
In-field Functional Test of CAN Bus Controllers 217
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 214
DOC: Detection of On-Line Failures in CNNs 212
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions 211
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor 211
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters 207
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks 205
Recent Trends and Perspectives on Defect-Oriented Testing 203
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits 202
Comparing different approaches to the test of Reconfigurable Scan Networks 202
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network 201
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 200
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques 198
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 198
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening 194
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults 192
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors 191
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 189
Evaluating the Code Encryption Effects on Memory Fault Resilience 189
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 189
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening 188
Performance-aware reliability optimization for digital designs 187
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques 187
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data 186
Enabling Inter-Product Transfer Learning on MCU Performance Screening 184
Using Formal Methods to Support the Development of STLs for GPUs 183
An evolutionary technique for reducing the duration of reconfigurable scan network test 181
Embedded Feature Selection in MCU Performance Screening 177
System-Level Test techniques for Automotive SoCs 177
Self-Test Library Generation for In-field Test of Path Delay faults 175
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 175
Defects, Fault Modeling, and Test Development Framework for FeFETs 174
Improved Test Solutions for COTS-Based Systems in Space Applications 171
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks 169
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation 163
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 161
Grouped Feature Selection for SMONs Placement in MCU Performance Screening 160
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms 159
Totale 27.244
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Categoria #
all - tutte 68.978
article - articoli 14.879
book - libri 0
conference - conferenze 51.693
curatela - curatele 0
other - altro 649
patent - brevetti 0
selected - selezionate 0
volume - volumi 543
Totale 136.742
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202151 0 0 0 0 0 0 0 0 0 0 0 51
2021/20221.177 127 71 59 37 63 102 45 111 62 59 157 284
2022/20232.020 130 241 137 174 198 208 145 116 203 80 117 271
2023/20241.243 89 113 113 98 144 131 109 76 39 67 136 128
2024/20254.813 62 571 246 691 290 348 336 501 552 202 371 643
2025/202611.012 505 495 485 737 681 607 1.662 1.076 2.269 1.392 549 554
Totale 28.567