PORTO @ Archivio Istituzionale della Ricerca

CANTORO, RICCARDO
 Distribuzione geografica
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Continente #
EU - Europa 7.583
NA - Nord America 6.595
AS - Asia 4.076
SA - Sud America 508
AF - Africa 42
Continente sconosciuto - Info sul continente non disponibili 5
OC - Oceania 5
Totale 18.814
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Nazione #
US - Stati Uniti d'America 6.496
IT - Italia 2.333
GB - Regno Unito 1.515
SG - Singapore 1.482
CN - Cina 1.394
DE - Germania 1.125
FR - Francia 884
BR - Brasile 423
KR - Corea 274
RU - Federazione Russa 248
NL - Olanda 201
UA - Ucraina 192
TR - Turchia 191
IE - Irlanda 187
IL - Israele 187
BE - Belgio 180
AT - Austria 168
FI - Finlandia 121
HK - Hong Kong 107
IN - India 92
SE - Svezia 88
CH - Svizzera 78
CA - Canada 70
JP - Giappone 64
ID - Indonesia 60
VN - Vietnam 54
JO - Giordania 51
EE - Estonia 43
GR - Grecia 37
RO - Romania 27
PL - Polonia 26
ES - Italia 23
TW - Taiwan 22
AR - Argentina 19
PK - Pakistan 19
CO - Colombia 18
PT - Portogallo 15
EU - Europa 13
IR - Iran 13
LT - Lituania 13
BG - Bulgaria 12
CL - Cile 12
IQ - Iraq 12
BD - Bangladesh 11
MX - Messico 11
UY - Uruguay 11
ZA - Sudafrica 11
EG - Egitto 9
EC - Ecuador 8
HR - Croazia 8
SA - Arabia Saudita 8
UZ - Uzbekistan 8
CY - Cipro 7
CZ - Repubblica Ceca 7
PE - Perù 7
AL - Albania 6
AZ - Azerbaigian 6
MA - Marocco 6
AE - Emirati Arabi Uniti 5
PY - Paraguay 5
AU - Australia 4
DO - Repubblica Dominicana 4
SN - Senegal 4
VE - Venezuela 4
CU - Cuba 3
DK - Danimarca 3
DZ - Algeria 3
KE - Kenya 3
KG - Kirghizistan 3
MO - Macao, regione amministrativa speciale della Cina 3
MY - Malesia 3
NO - Norvegia 3
RS - Serbia 3
SI - Slovenia 3
TH - Thailandia 3
TN - Tunisia 3
AM - Armenia 2
CR - Costa Rica 2
GE - Georgia 2
KZ - Kazakistan 2
MK - Macedonia 2
NP - Nepal 2
PA - Panama 2
TJ - Tagikistan 2
TT - Trinidad e Tobago 2
BO - Bolivia 1
BY - Bielorussia 1
CG - Congo 1
CI - Costa d'Avorio 1
CM - Camerun 1
GL - Groenlandia 1
HN - Honduras 1
HU - Ungheria 1
JM - Giamaica 1
LB - Libano 1
LU - Lussemburgo 1
ME - Montenegro 1
MT - Malta 1
NI - Nicaragua 1
NZ - Nuova Zelanda 1
Totale 18.808
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Città #
Southend 1.346
Ashburn 1.219
Singapore 803
Turin 716
Chandler 426
Fairfield 394
Torino 393
Seattle 310
Council Bluffs 284
Santa Clara 266
Houston 259
Boardman 256
Princeton 208
Ann Arbor 198
Woodbridge 195
Wilmington 190
Hefei 187
Dublin 180
Beijing 175
Brussels 173
Milan 145
Berlin 142
Cambridge 139
Seoul 131
Vienna 104
Dallas 102
Tongling 101
San Ramon 96
Tel Aviv 91
Jerusalem 90
Istanbul 86
Jacksonville 86
Nuremberg 83
Izmir 78
Los Angeles 73
Shanghai 73
Helsinki 70
Saint Petersburg 65
Bern 63
Frankfurt am Main 59
Jakarta 57
San Donato Milanese 54
Rome 51
Des Moines 50
Hong Kong 49
Amsterdam 44
Bremen 44
Munich 43
Falls Church 38
Guangzhou 38
São Paulo 38
Penza 36
Mountain View 34
Tallinn 32
Shenzhen 31
Lappeenranta 29
Toronto 26
Leiden 25
Dearborn 23
Fremont 23
Ho Chi Minh City 23
Xi'an 23
Zaporozhye 22
London 20
San Antonio 20
Zhengzhou 19
Palermo 18
The Hague 18
Turku 18
Varese 18
Buffalo 17
Fuzhou 17
Hangzhou 17
Paris 17
Redmond 17
St Petersburg 17
Malatya 16
Redwood City 16
San Francisco 16
Stuttgart 15
Yubileyny 15
Aosta 14
Duncan 14
Las Vegas 14
New York 14
Utrecht 14
Cangzhou 13
Lund 13
Madrid 13
Redondo Beach 13
Warsaw 13
Baltimore 12
Borgosesia 12
Chengdu 12
Forte Dei Marmi 12
Miami 12
Norwalk 12
Sofia 12
Washington 12
Belo Horizonte 11
Totale 11.441
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Nome #
New techniques for functional testing of microprocessor based systems 511
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 467
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers 450
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors 418
Software-based self-test techniques of computational modules in dual issue embedded processors 389
Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs 371
An Optimized Test During Burn-In for Automotive SoC 363
An Evolutionary Approach for Test Program Compaction 358
A Flexible Framework for the Automatic Generation of SBST Programs 356
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller 347
On the Testability of IEEE 1687 Networks 332
On the Automatic Generation of SBST Test Programs for In-Field Test 331
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation 330
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In 325
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 320
On the Maximization of the Sustained Switching Activity in a Processor 313
Test Time Minimization in Reconfigurable Scan Networks 310
On the Functional Test of the Cache Coherency Logic in Multi-core Systems 309
Observability solutions for in-field functional test of processor-based systems 303
Thermal issues in test: An overview of the significant aspects and industrial practice 284
Effective generation and evaluation of diagnostic SBST programs 281
In-field functional test programs development flow for embedded FPUs 280
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC 280
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks 263
A Suite of IEEE 1687 Benchmark Networks 262
On the diagnostic analysis of IEEE 1687 networks 261
Semi-Supervised Deep Learning for Microcontroller Performance Screening 259
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors 252
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors 248
Automated Test Program Reordering for Efficient SBST 236
On the Optimization of SBST Test Program Compaction 223
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests 222
On the detection of board delay faults through the execution of functional programs 220
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 209
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks 202
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks 201
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications 196
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks 186
Exploiting Active Learning for Microcontroller Performance Prediction 180
Test of Reconfigurable Modules in Scan Networks 179
Device-Aware Test for Anomalous Charge Trapping in FeFETs 178
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications 173
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks 167
Fault-Independent Test-Generation for Software-Based Self-Testing 165
Investigating on Gradient Regularization for Testing Neural Networks 162
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects 159
An analysis of test solutions for COTS-based systems in space applications 158
Targeting different defect-oriented fault models in IC testing: an experimental approach 157
Transfer Learning in MCU Performance Screening 157
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification 156
A Multi-Label Active Learning Framework for Microcontroller Performance Screening 155
Feature Selection for Cost Reduction in MCU Performance Screening 154
Industrial best practice: cases of study by automotive chip- makers 154
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 149
COVID-19 Detection from Exhaled Breath 144
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration 144
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions 140
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network 140
New Perspectives on Core In-field Path Delay Test 137
Comparing different approaches to the test of Reconfigurable Scan Networks 137
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 135
In-field Functional Test of CAN Bus Controllers 133
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor 133
An evolutionary technique for reducing the duration of reconfigurable scan network test 130
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 129
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data 128
Recent Trends and Perspectives on Defect-Oriented Testing 128
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 127
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters 123
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 121
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 115
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors 114
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 113
Enabling Inter-Product Transfer Learning on MCU Performance Screening 111
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques 110
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 109
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening 108
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults 108
Evaluating the Code Encryption Effects on Memory Fault Resilience 108
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques 98
Improved Test Solutions for COTS-Based Systems in Space Applications 97
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening 94
Defects, Fault Modeling, and Test Development Framework for FeFETs 93
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms 93
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking 93
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing 93
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks 93
Embedded Feature Selection in MCU Performance Screening 90
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core 90
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 87
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks 83
Using Formal Methods to Support the Development of STLs for GPUs 82
Self-Test Library Generation for In-field Test of Path Delay faults 80
Fault-Independent Test-Generation for Software-Based Self-Testing 79
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors 78
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip 77
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 73
DOC: Detection of On-Line Failures in CNNs 72
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits 72
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models 61
Totale 18.974
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Categoria #
all - tutte 51.880
article - articoli 11.250
book - libri 0
conference - conferenze 38.708
curatela - curatele 0
other - altro 510
patent - brevetti 0
selected - selezionate 0
volume - volumi 416
Totale 102.764
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021821 0 0 0 104 35 92 74 88 78 215 84 51
2021/20221.177 127 71 59 37 63 102 45 111 62 59 157 284
2022/20232.020 130 241 137 174 198 208 145 116 203 80 117 271
2023/20241.243 89 113 113 98 144 131 109 76 39 67 136 128
2024/20254.813 62 571 246 691 290 348 336 501 552 202 371 643
2025/20261.648 505 495 485 163 0 0 0 0 0 0 0 0
Totale 19.203