PORTO @ Archivio Istituzionale della Ricerca

CANTORO, RICCARDO
 Distribuzione geografica
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Continente #
EU - Europa 9.768
NA - Nord America 9.297
AS - Asia 9.060
SA - Sud America 716
Continente sconosciuto - Info sul continente non disponibili 414
AF - Africa 99
OC - Oceania 6
Totale 29.360
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Nazione #
US - Stati Uniti d'America 9.060
IT - Italia 3.143
SG - Singapore 2.882
VN - Vietnam 2.013
CN - Cina 1.740
GB - Regno Unito 1.542
DE - Germania 1.211
RU - Federazione Russa 1.171
FR - Francia 1.036
BR - Brasile 569
KR - Corea 447
HK - Hong Kong 436
BD - Bangladesh 274
IN - India 228
NL - Olanda 222
TR - Turchia 204
UA - Ucraina 197
IE - Irlanda 193
IL - Israele 188
BE - Belgio 181
AT - Austria 173
JP - Giappone 146
FI - Finlandia 143
CA - Canada 142
SE - Svezia 131
ID - Indonesia 82
CH - Svizzera 81
PH - Filippine 67
TH - Thailandia 59
JO - Giordania 58
TW - Taiwan 54
AR - Argentina 47
EE - Estonia 45
ES - Italia 42
GR - Grecia 40
IQ - Iraq 38
MX - Messico 36
PL - Polonia 32
PT - Portogallo 32
PK - Pakistan 31
RO - Romania 30
ZA - Sudafrica 26
MA - Marocco 22
AE - Emirati Arabi Uniti 21
CO - Colombia 21
CL - Cile 20
EC - Ecuador 17
LT - Lituania 17
SA - Arabia Saudita 16
IR - Iran 14
UY - Uruguay 14
UZ - Uzbekistan 14
CR - Costa Rica 13
EU - Europa 13
BG - Bulgaria 12
EG - Egitto 12
KE - Kenya 12
AL - Albania 10
CY - Cipro 10
CZ - Repubblica Ceca 10
VE - Venezuela 10
AZ - Azerbaigian 9
HR - Croazia 9
JM - Giamaica 9
PE - Perù 9
HN - Honduras 8
KZ - Kazakistan 8
MY - Malesia 8
PY - Paraguay 7
DO - Repubblica Dominicana 6
DZ - Algeria 6
NI - Nicaragua 6
NP - Nepal 6
RS - Serbia 6
SN - Senegal 6
AU - Australia 5
DK - Danimarca 5
KG - Kirghizistan 5
LB - Libano 5
MD - Moldavia 5
TN - Tunisia 5
HU - Ungheria 4
NO - Norvegia 4
SI - Slovenia 4
AM - Armenia 3
CI - Costa d'Avorio 3
CU - Cuba 3
MO - Macao, regione amministrativa speciale della Cina 3
PR - Porto Rico 3
SK - Slovacchia (Repubblica Slovacca) 3
XK - ???statistics.table.value.countryCode.XK??? 3
BB - Barbados 2
BO - Bolivia 2
GE - Georgia 2
GT - Guatemala 2
MK - Macedonia 2
OM - Oman 2
PA - Panama 2
SV - El Salvador 2
TJ - Tagikistan 2
Totale 28.934
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Città #
Singapore 1.749
Ashburn 1.630
Southend 1.346
Turin 941
San Jose 796
Ho Chi Minh City 541
Hanoi 490
Chandler 426
Fairfield 394
Torino 393
Council Bluffs 390
Santa Clara 363
Milan 361
Hong Kong 315
Seattle 312
Hefei 296
Houston 268
Boardman 265
Seoul 263
Los Angeles 259
Beijing 211
Princeton 208
Ann Arbor 198
Woodbridge 195
Wilmington 193
Dublin 186
Brussels 173
Berlin 142
Cambridge 140
Rome 134
Dallas 123
Frankfurt am Main 118
Vienna 108
Tongling 101
Lauterbourg 100
San Ramon 96
Da Nang 95
Istanbul 95
Tel Aviv 92
Moscow 91
Jerusalem 90
Jacksonville 89
Nuremberg 84
Shanghai 84
New York 83
Izmir 78
Helsinki 76
Saint Petersburg 65
São Paulo 65
Bern 63
Jakarta 60
Tokyo 58
Haiphong 56
Amsterdam 54
San Donato Milanese 54
Munich 52
Des Moines 50
Buffalo 47
Bremen 44
Toronto 43
Guangzhou 41
Lappeenranta 41
Falls Church 38
North Bergen 38
Penza 36
Shenzhen 35
The Dalles 35
Montreal 34
Mountain View 34
Figino 33
Tallinn 33
London 27
Biên Hòa 26
Leiden 25
Madrid 25
Dearborn 24
San Francisco 24
Bangkok 23
Fremont 23
Paris 23
Xi'an 23
San Antonio 22
Zaporozhye 22
Hangzhou 21
Palermo 21
Baghdad 20
The Hague 20
Turku 20
Zhengzhou 20
Hải Dương 19
Lisbon 19
Warsaw 19
Washington 19
Bari 18
Naples 18
Redmond 18
Stuttgart 18
Thái Bình 18
Varese 18
Bến Tre 17
Totale 16.900
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Nome #
New techniques for functional testing of microprocessor based systems 649
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 574
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers 522
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors 487
Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs 466
An Optimized Test During Burn-In for Automotive SoC 452
Software-based self-test techniques of computational modules in dual issue embedded processors 442
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller 430
A Flexible Framework for the Automatic Generation of SBST Programs 429
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation 428
On the Automatic Generation of SBST Test Programs for In-Field Test 412
An Evolutionary Approach for Test Program Compaction 412
On the Testability of IEEE 1687 Networks 412
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 411
Test Time Minimization in Reconfigurable Scan Networks 403
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In 397
On the Functional Test of the Cache Coherency Logic in Multi-core Systems 393
On the Maximization of the Sustained Switching Activity in a Processor 381
Semi-Supervised Deep Learning for Microcontroller Performance Screening 372
Observability solutions for in-field functional test of processor-based systems 369
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC 357
Effective generation and evaluation of diagnostic SBST programs 344
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors 335
In-field functional test programs development flow for embedded FPUs 331
Thermal issues in test: An overview of the significant aspects and industrial practice 329
A Suite of IEEE 1687 Benchmark Networks 326
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors 325
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 320
On the Optimization of SBST Test Program Compaction 320
On the diagnostic analysis of IEEE 1687 networks 313
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests 312
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks 310
On the detection of board delay faults through the execution of functional programs 299
Device-Aware Test for Anomalous Charge Trapping in FeFETs 298
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks 292
Automated Test Program Reordering for Efficient SBST 289
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications 286
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 282
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks 281
New Perspectives on Core In-field Path Delay Test 278
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks 273
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks 267
Investigating on Gradient Regularization for Testing Neural Networks 263
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction 257
Transfer Learning in MCU Performance Screening 256
Targeting different defect-oriented fault models in IC testing: an experimental approach 254
Test of Reconfigurable Modules in Scan Networks 251
COVID-19 Detection from Exhaled Breath 250
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects 249
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications 246
A Multi-Label Active Learning Framework for Microcontroller Performance Screening 245
Fault-Independent Test-Generation for Software-Based Self-Testing 241
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking 240
Exploiting Active Learning for Microcontroller Performance Prediction 239
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models 238
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 238
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration 237
An analysis of test solutions for COTS-based systems in space applications 237
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 234
Feature Selection for Cost Reduction in MCU Performance Screening 232
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification 232
Industrial best practice: cases of study by automotive chip- makers 227
In-field Functional Test of CAN Bus Controllers 222
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions 220
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor 220
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits 218
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 217
DOC: Detection of On-Line Failures in CNNs 215
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks 214
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters 210
Recent Trends and Perspectives on Defect-Oriented Testing 208
Comparing different approaches to the test of Reconfigurable Scan Networks 206
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 202
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network 201
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 201
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data 200
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults 200
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques 200
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening 199
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors 198
System-Level Test techniques for Automotive SoCs 198
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening 197
Performance-aware reliability optimization for digital designs 194
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques 194
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 191
Evaluating the Code Encryption Effects on Memory Fault Resilience 191
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 190
An evolutionary technique for reducing the duration of reconfigurable scan network test 188
Using Formal Methods to Support the Development of STLs for GPUs 187
Enabling Inter-Product Transfer Learning on MCU Performance Screening 186
Embedded Feature Selection in MCU Performance Screening 185
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation 180
Defects, Fault Modeling, and Test Development Framework for FeFETs 177
Self-Test Library Generation for In-field Test of Path Delay faults 177
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 176
Improved Test Solutions for COTS-Based Systems in Space Applications 174
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 172
Grouped Feature Selection for SMONs Placement in MCU Performance Screening 170
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing 169
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks 169
Totale 27.890
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Categoria #
all - tutte 72.376
article - articoli 15.760
book - libri 0
conference - conferenze 54.126
curatela - curatele 0
other - altro 671
patent - brevetti 0
selected - selezionate 0
volume - volumi 568
Totale 143.501
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20221.050 0 71 59 37 63 102 45 111 62 59 157 284
2022/20232.020 130 241 137 174 198 208 145 116 203 80 117 271
2023/20241.243 89 113 113 98 144 131 109 76 39 67 136 128
2024/20254.813 62 571 246 691 290 348 336 501 552 202 371 643
2025/202611.238 505 495 485 737 681 607 1.662 1.076 2.269 1.392 549 780
2026/2027567 303 264 0 0 0 0 0 0 0 0 0 0
Totale 29.360