PORTO @ Archivio Istituzionale della Ricerca

CANTORO, RICCARDO
 Distribuzione geografica
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Continente #
EU - Europa 6.857
NA - Nord America 5.814
AS - Asia 1.569
SA - Sud America 56
AF - Africa 11
OC - Oceania 5
Continente sconosciuto - Info sul continente non disponibili 4
Totale 14.316
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Nazione #
US - Stati Uniti d'America 5.753
IT - Italia 2.129
GB - Regno Unito 1.495
DE - Germania 949
FR - Francia 825
CN - Cina 556
SG - Singapore 398
RU - Federazione Russa 237
UA - Ucraina 185
IE - Irlanda 183
BE - Belgio 180
TR - Turchia 180
NL - Olanda 162
KR - Corea 113
SE - Svezia 81
FI - Finlandia 79
CH - Svizzera 76
AT - Austria 75
IN - India 69
ID - Indonesia 60
CA - Canada 59
HK - Hong Kong 53
JO - Giordania 48
JP - Giappone 47
EE - Estonia 40
GR - Grecia 35
RO - Romania 24
BR - Brasile 19
TW - Taiwan 19
CO - Colombia 13
EU - Europa 13
PL - Polonia 13
BG - Bulgaria 11
IR - Iran 11
CL - Cile 10
PK - Pakistan 9
PT - Portogallo 9
UY - Uruguay 9
LT - Lituania 8
ES - Italia 7
HR - Croazia 7
CZ - Repubblica Ceca 6
IL - Israele 5
AU - Australia 4
EG - Egitto 4
SN - Senegal 4
MO - Macao, regione amministrativa speciale della Cina 3
MY - Malesia 3
PE - Perù 3
RS - Serbia 3
AE - Emirati Arabi Uniti 2
AM - Armenia 2
DK - Danimarca 2
MK - Macedonia 2
NO - Norvegia 2
SA - Arabia Saudita 2
SI - Slovenia 2
VN - Vietnam 2
AL - Albania 1
AR - Argentina 1
CI - Costa d'Avorio 1
CM - Camerun 1
DZ - Algeria 1
EC - Ecuador 1
GL - Groenlandia 1
HU - Ungheria 1
ME - Montenegro 1
MT - Malta 1
MX - Messico 1
NZ - Nuova Zelanda 1
PH - Filippine 1
TH - Thailandia 1
TJ - Tagikistan 1
UZ - Uzbekistan 1
Totale 14.316
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Città #
Southend 1.346
Ashburn 1.088
Turin 616
Chandler 426
Fairfield 394
Torino 393
Seattle 308
Boardman 260
Houston 258
Singapore 258
Council Bluffs 250
Princeton 208
Ann Arbor 198
Woodbridge 195
Wilmington 190
Brussels 177
Dublin 176
Santa Clara 155
Cambridge 139
Berlin 135
Milan 114
San Ramon 96
Jacksonville 86
Istanbul 80
Izmir 78
Beijing 74
Helsinki 66
Vienna 66
Saint Petersburg 65
Shanghai 65
Bern 64
Jakarta 58
San Donato Milanese 54
Des Moines 50
Rome 49
Bremen 44
Falls Church 38
Penza 36
Mountain View 34
Amsterdam 33
Los Angeles 31
Tallinn 30
Shenzhen 27
Guangzhou 26
Leiden 25
Frankfurt am Main 24
Toronto 24
Dearborn 23
Fremont 23
Seoul 22
Zaporozhye 22
San Antonio 20
Palermo 18
Paris 18
Varese 18
Redmond 17
Zhengzhou 17
London 16
Malatya 16
Redwood City 16
St Petersburg 16
Fuzhou 15
Munich 15
Yubileyny 15
Aosta 14
Duncan 14
Hangzhou 14
Stuttgart 14
The Hague 14
Utrecht 14
Las Vegas 13
Lund 13
Miami 13
Baltimore 12
Chengdu 12
Forte Dei Marmi 12
Norwalk 12
Borgosesia 11
New York 11
Sofia 11
Washington 11
Almese 10
Kunming 10
Monopoli 10
Nanjing 10
Ottawa 10
San Diego 10
San Jose 10
Vercelli 10
Cadoneghe 9
Kraków 9
Lake Forest 9
Lappeenranta 9
Montréal 9
San Mateo 9
Tappahannock 9
Bari 8
Binasco 8
Chicago 8
Livorno 8
Totale 9.304
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Nome #
New techniques for functional testing of microprocessor based systems 453
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 432
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers 413
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors 385
Software-based self-test techniques of computational modules in dual issue embedded processors 357
Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs 336
An Evolutionary Approach for Test Program Compaction 331
A Flexible Framework for the Automatic Generation of SBST Programs 315
An Optimized Test During Burn-In for Automotive SoC 314
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller 309
On the Testability of IEEE 1687 Networks 308
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation 304
On the Automatic Generation of SBST Test Programs for In-Field Test 298
On the Maximization of the Sustained Switching Activity in a Processor 284
On the Functional Test of the Cache Coherency Logic in Multi-core Systems 281
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In 281
Observability solutions for in-field functional test of processor-based systems 279
Test Time Minimization in Reconfigurable Scan Networks 267
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 267
Thermal issues in test: An overview of the significant aspects and industrial practice 256
In-field functional test programs development flow for embedded FPUs 253
Effective generation and evaluation of diagnostic SBST programs 253
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC 236
A Suite of IEEE 1687 Benchmark Networks 232
On the diagnostic analysis of IEEE 1687 networks 232
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks 230
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors 217
Automated Test Program Reordering for Efficient SBST 215
Semi-Supervised Deep Learning for Microcontroller Performance Screening 211
On the Optimization of SBST Test Program Compaction 191
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors 188
On the detection of board delay faults through the execution of functional programs 188
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests 184
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks 175
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks 170
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications 162
Test of Reconfigurable Modules in Scan Networks 145
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks 143
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 139
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications 137
Exploiting Active Learning for Microcontroller Performance Prediction 134
Fault-Independent Test-Generation for Software-Based Self-Testing 128
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification 127
An analysis of test solutions for COTS-based systems in space applications 123
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks 117
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions 116
Industrial best practice: cases of study by automotive chip- makers 109
Transfer Learning in MCU Performance Screening 108
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 108
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network 106
Comparing different approaches to the test of Reconfigurable Scan Networks 106
Feature Selection for Cost Reduction in MCU Performance Screening 104
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor 100
In-field Functional Test of CAN Bus Controllers 99
New Perspectives on Core In-field Path Delay Test 99
Targeting different defect-oriented fault models in IC testing: an experimental approach 97
A Multi-Label Active Learning Framework for Microcontroller Performance Screening 97
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration 95
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 95
An evolutionary technique for reducing the duration of reconfigurable scan network test 93
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 89
Device-Aware Test for Anomalous Charge Trapping in FeFETs 87
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 86
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects 84
Investigating on Gradient Regularization for Testing Neural Networks 78
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters 78
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data 76
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques 75
Evaluating the Code Encryption Effects on Memory Fault Resilience 74
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 72
COVID-19 Detection from Exhaled Breath 71
Recent Trends and Perspectives on Defect-Oriented Testing 69
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors 68
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT 68
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 65
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques 65
Enabling Inter-Product Transfer Learning on MCU Performance Screening 64
Improved Test Solutions for COTS-Based Systems in Space Applications 63
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 63
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks 62
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core 58
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip 57
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults 54
Fault-Independent Test-Generation for Software-Based Self-Testing 53
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening 52
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing 52
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 51
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors 48
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms 46
Using Formal Methods to Support the Development of STLs for GPUs 38
Embedded Feature Selection in MCU Performance Screening 37
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 37
Defects, Fault Modeling, and Test Development Framework for FeFETs 23
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 22
Self-Test Library Generation for In-field Test of Path Delay faults 21
Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode 18
Totale 14.656
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Categoria #
all - tutte 37.431
article - articoli 8.063
book - libri 0
conference - conferenze 27.871
curatela - curatele 0
other - altro 373
patent - brevetti 0
selected - selezionate 0
volume - volumi 307
Totale 74.045
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020942 0 0 0 0 160 185 139 160 139 60 50 49
2020/20211.200 189 114 76 104 35 92 74 88 78 215 84 51
2021/20221.177 127 71 59 37 63 102 45 111 62 59 157 284
2022/20232.044 130 241 137 174 198 208 145 116 211 82 122 280
2023/20241.268 92 113 115 101 149 134 111 76 42 67 138 130
2024/20251.865 64 579 246 700 276 0 0 0 0 0 0 0
Totale 14.656