PORTO @ Archivio Istituzionale della Ricerca

CANTORO, RICCARDO
 Distribuzione geografica
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Continente #
EU - Europa 6.527
NA - Nord America 5.436
AS - Asia 1.209
SA - Sud America 45
AF - Africa 11
OC - Oceania 5
Continente sconosciuto - Info sul continente non disponibili 4
Totale 13.237
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Nazione #
US - Stati Uniti d'America 5.386
IT - Italia 2.018
GB - Regno Unito 1.483
DE - Germania 931
FR - Francia 819
CN - Cina 510
SG - Singapore 272
UA - Ucraina 184
IE - Irlanda 175
RU - Federazione Russa 152
BE - Belgio 145
NL - Olanda 135
TR - Turchia 99
KR - Corea 91
SE - Svezia 81
CH - Svizzera 75
FI - Finlandia 75
AT - Austria 64
IN - India 64
CA - Canada 48
JO - Giordania 48
HK - Hong Kong 47
JP - Giappone 44
EE - Estonia 40
GR - Grecia 35
RO - Romania 22
TW - Taiwan 15
CO - Colombia 13
EU - Europa 13
PL - Polonia 13
IR - Iran 11
BG - Bulgaria 10
CL - Cile 10
BR - Brasile 9
PT - Portogallo 9
UY - Uruguay 9
ES - Italia 7
HR - Croazia 7
CZ - Repubblica Ceca 6
AU - Australia 4
EG - Egitto 4
IL - Israele 4
SN - Senegal 4
MO - Macao, regione amministrativa speciale della Cina 3
MY - Malesia 3
PE - Perù 3
PK - Pakistan 3
RS - Serbia 3
AM - Armenia 2
DK - Danimarca 2
ID - Indonesia 2
MK - Macedonia 2
NO - Norvegia 2
SA - Arabia Saudita 2
SI - Slovenia 2
VN - Vietnam 2
AE - Emirati Arabi Uniti 1
AL - Albania 1
AR - Argentina 1
CI - Costa d'Avorio 1
CM - Camerun 1
DZ - Algeria 1
GL - Groenlandia 1
HU - Ungheria 1
ME - Montenegro 1
MT - Malta 1
MX - Messico 1
NZ - Nuova Zelanda 1
PH - Filippine 1
TH - Thailandia 1
UZ - Uzbekistan 1
Totale 13.237
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Città #
Southend 1.346
Ashburn 1.080
Turin 555
Chandler 426
Fairfield 394
Torino 393
Seattle 308
Boardman 260
Houston 258
Council Bluffs 250
Princeton 208
Ann Arbor 198
Woodbridge 195
Wilmington 190
Singapore 172
Dublin 168
Brussels 142
Cambridge 139
Berlin 135
Milan 108
San Ramon 96
Jacksonville 86
Izmir 78
Beijing 74
Saint Petersburg 65
Shanghai 65
Bern 64
Helsinki 62
Vienna 56
San Donato Milanese 54
Des Moines 50
Rome 48
Bremen 44
Falls Church 38
Penza 36
Mountain View 34
Los Angeles 30
Santa Clara 30
Tallinn 30
Shenzhen 27
Guangzhou 26
Amsterdam 25
Dearborn 23
Leiden 22
Seoul 22
Zaporozhye 22
Fremont 21
Toronto 21
San Antonio 20
Palermo 18
Varese 18
Redmond 17
Zhengzhou 17
Malatya 16
Redwood City 16
St Petersburg 16
Frankfurt am Main 15
Fuzhou 15
Paris 15
Aosta 14
Duncan 14
Munich 14
Stuttgart 14
Utrecht 14
Hangzhou 13
Las Vegas 13
Lund 13
Miami 13
Baltimore 12
Chengdu 12
Forte Dei Marmi 12
Norwalk 12
New York 11
Washington 11
Almese 10
Kunming 10
London 10
Monopoli 10
Nanjing 10
San Diego 10
San Jose 10
Sofia 10
Vercelli 10
Cadoneghe 9
Kraków 9
Lake Forest 9
Lappeenranta 9
Montréal 9
San Mateo 9
Tappahannock 9
Bari 8
Binasco 8
Chicago 8
Livorno 8
Mcallen 8
Perugia 8
San Francisco 8
Athens 7
Candia Canavese 7
Chiusi 7
Totale 8.779
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Nome #
New techniques for functional testing of microprocessor based systems 441
On the Functional Test of the Register Forwarding and Pipeline Interlocking Unit in Pipelined Processors 423
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers 404
On the in-Field Functional Testing of Decode Units in Pipelined RISC Processors 379
Software-based self-test techniques of computational modules in dual issue embedded processors 353
Exploiting Evolutionary Computation in an Industrial Flow for the Development of Code-Optimized Microprocessor Test Programs 329
An Evolutionary Approach for Test Program Compaction 319
A Flexible Framework for the Automatic Generation of SBST Programs 307
An Optimized Test During Burn-In for Automotive SoC 305
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller 302
On the Testability of IEEE 1687 Networks 301
Observability solutions for in-field functional test of processor-based systems: a survey and quantitative test case evaluation 299
On the Automatic Generation of SBST Test Programs for In-Field Test 293
On the Maximization of the Sustained Switching Activity in a Processor 280
On the Functional Test of the Cache Coherency Logic in Multi-core Systems 276
Observability solutions for in-field functional test of processor-based systems 270
Test Time Minimization in Reconfigurable Scan Networks 263
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In 258
Test, Reliability and Functional Safety trends for Automotive System-on-Chip 253
Thermal issues in test: An overview of the significant aspects and industrial practice 249
In-field functional test programs development flow for embedded FPUs 247
Effective generation and evaluation of diagnostic SBST programs 247
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC 228
On the diagnostic analysis of IEEE 1687 networks 225
A Suite of IEEE 1687 Benchmark Networks 224
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks 223
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors 210
Automated Test Program Reordering for Efficient SBST 208
Semi-Supervised Deep Learning for Microcontroller Performance Screening 198
On the Optimization of SBST Test Program Compaction 186
On the detection of board delay faults through the execution of functional programs 182
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors 174
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests 173
A Semi-Formal Technique to Generate Effective Test Sequences for Reconfigurable Scan Networks 167
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks 163
About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications 154
Test of Reconfigurable Modules in Scan Networks 139
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks 135
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications 130
Exploiting Active Learning for Microcontroller Performance Prediction 125
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip 124
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification 118
An analysis of test solutions for COTS-based systems in space applications 116
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions 111
Fault-Independent Test-Generation for Software-Based Self-Testing 105
Industrial best practice: cases of study by automotive chip- makers 101
Optimized diagnostic strategy for embedded memories of Automotive Systems-on-Chip 98
Comparing different approaches to the test of Reconfigurable Scan Networks 97
Feature Selection for Cost Reduction in MCU Performance Screening 96
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network 95
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks 94
In-field Functional Test of CAN Bus Controllers 91
New Perspectives on Core In-field Path Delay Test 91
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor 91
Transfer Learning in MCU Performance Screening 88
An evolutionary technique for reducing the duration of reconfigurable scan network test 88
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries 87
A Multi-Label Active Learning Framework for Microcontroller Performance Screening 86
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration 83
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement 83
Targeting different defect-oriented fault models in IC testing: an experimental approach 82
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs 78
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters 67
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data 66
Evaluating the Code Encryption Effects on Memory Fault Resilience 66
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques 66
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects 65
Recent Trends and Perspectives on Defect-Oriented Testing 62
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors 60
A comparative overview of ATPG flows targeting traditional and cell-aware fault models 59
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems 59
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT 59
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques 57
Improved Test Solutions for COTS-Based Systems in Space Applications 56
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries 56
Enabling Inter-Product Transfer Learning on MCU Performance Screening 54
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks 54
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip 51
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core 49
Fault-Independent Test-Generation for Software-Based Self-Testing 47
Machine Learning based Performance Prediction of Microcontrollers using Speed Monitors 44
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers 42
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing 42
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults 40
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms 39
Investigating on Gradient Regularization for Testing Neural Networks 37
Using Formal Methods to Support the Development of STLs for GPUs 31
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening 27
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test 22
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries 14
Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode 13
Self-Test Library Generation for In-field Test of Path Delay faults 12
Totale 13.561
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Categoria #
all - tutte 34.031
article - articoli 7.290
book - libri 0
conference - conferenze 25.331
curatela - curatele 0
other - altro 351
patent - brevetti 0
selected - selezionate 0
volume - volumi 284
Totale 67.287
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.285 0 0 143 200 160 185 139 160 139 60 50 49
2020/20211.200 189 114 76 104 35 92 74 88 78 215 84 51
2021/20221.177 127 71 59 37 63 102 45 111 62 59 157 284
2022/20232.044 130 241 137 174 198 208 145 116 211 82 122 280
2023/20241.268 92 113 115 101 149 134 111 76 42 67 138 130
2024/2025770 64 579 127 0 0 0 0 0 0 0 0 0
Totale 13.561