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This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.

Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F., Appello, D., Aribido, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Huch, M., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., Sonza Reorda, M., Sterpone, L., Tancorre, V., et al.. - ELETTRONICO. - (2022). (2022 IEEE European Test Symposium (ETS) Barcelona (ESP) 23-27 May 2022) [10.1109/ETS54262.2022.9810388].

Test, Reliability and Functional Safety trends for Automotive System-on-Chip

F. Angione;N. Bellarmino;P. Bernardi;R. Cantoro;C. de Sio;T. Foscale;G. Gavarini;A. Ruospo;E. Sanchez;G. Squillero;M. Sonza Reorda;L. Sterpone;
2022

Abstract

This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.
2022
978-1-6654-6706-3
4.1 Contributo in Atti di convegno
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2955520