Archivio Istituzionale della RicercaThis paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (ESP) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388].
Test, Reliability and Functional Safety trends for Automotive System-on-Chip
F. Angione;N. Bellarmino;P. Bernardi;R. Cantoro;C. de Sio;T. Foscale;G. Gavarini;A. Ruospo;E. Sanchez;G. Squillero;M. Sonza Reorda;L. Sterpone;
2022
Abstract
This paper encompasses three contributions by industry professionals and university researchers. The contributions describe different trends in automotive products, including both manufacturing test and run-time reliability strategies. The subjects considered in this session deal with critical factors, from optimizing the final test before shipment to market to in-field reliability during operative life.
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01_ETS_special_session_ABSTRACT.pdf
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Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
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https://hdl.handle.net/11583/2955520