Archivio Istituzionale della RicercaSONZA REORDA, MATTEO
SONZA REORDA, MATTEO
Dipartimento di Automatica e Informatica
REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda
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Risultati 1 - 20 di 605 (tempo di esecuzione: 0.025 secondi).
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors
In corso di stampa Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
Targeting different defect-oriented fault models in IC testing: an experimental approach
In corso di stampa Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo
Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units
In corso di stampa Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; dos Santos, Fernando F.; Sonza, Matteo; Rech, Paolo
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2023 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A Reliability-aware Environment for Design Exploration for GPU Devices
2023 Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors
2023 Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips
2023 Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto
Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs
2023 Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections
2023 Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing
2023 Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT
2023 Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques
2023 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks
2023 Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
2023 Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
Constraint-Based Automatic SBST Generation for RISC-V Processor Families
2023 Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd
Evaluating the Impact of Transition Delay Faults in GPUs
2023 Rodriguez Condia, Josie E.; Reorda, Matteo Sonza
Evaluating the Prevalence of SFUs in the Reliability of GPUs
2023 Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza
Evaluating the Prevalence of SFUs in the Reliability of GPUs
2023 Rodriguez Condia, Je; Guerrero-Balaguera, Jd; Nunez, Ejp; Limas, Robert; Reorda, Ms
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters
2023 Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters
2023 Rodriguez Condia, Josie E.; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (In corso di stampa). (Intervento presentato al convegno Asian Test Symposium (ATS)). | In corso di stampa | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdf |
| Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). | In corso di stampa | Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo | DSD_Conference_paper_1.9_submitted.docx; 2023172914.pdf |
| Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; dos Santos, Fernando F.; Sonza, Matteo; Rech, Paolo. - (In corso di stampa). (Intervento presentato al convegno SC23: International Conference for High Performance Computing, Networking, Storage and Analysis). | In corso di stampa | Juan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo SonzaPaolo Rech + | sc_2023_nvbitpermfi.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] | 1-gen-2023 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf |
| A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. | 1-gen-2023 | Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo | A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf |
| A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. | 1-gen-2023 | Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + | ETS_RISC_V_testing_safety_security.pdf; A_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf |
| A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] | 1-gen-2023 | Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + | A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf |
| Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154504]. | 1-gen-2023 | Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + | Analyzing_the_Architectural_Impact_of_Transient_Fault_Effects_in_SFUs_of_GPUs.pdf |
| Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. | 1-gen-2023 | Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + | date_2023_acceptedVersion.pdf; Assessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf |
| Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdf; Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf |
| Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT / Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4270-4281. [10.1109/TCAD.2023.3252467] | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + | _IEEE_TCAD__Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf; Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf |
| Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 98:(2023), p. 104775. [10.1016/j.micpro.2023.104775] | 1-gen-2023 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda | _MICPRO_SI_DSD21__Automating_the_Generation_of_Programs_Maximizing_the_Switching_Activity_in_Microprocessor_Units_via_Evolutionary_Techniques.pdf; 1-s2.0-S0141933123000212-main.pdf |
| Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 70:4(2023), pp. 370-380. [10.1109/tns.2022.3224538] | 1-gen-2023 | Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + | Characterizing_a_Neutron-Induced_Fault_Model_for_Deep_Neural_Networks.pdf |
| Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + | 2023058710.pdf; Collecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf |
| Constraint-Based Automatic SBST Generation for RISC-V Processor Families / Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174156]. | 1-gen-2023 | Nikolaos DeligiannisMatteo Sonza Reorda + | _ETS2023__Constraint_Based_Automatic_SBST_Generation_for_RISC_V_Processor_Families.pdf; Constraint-Based_Automatic_SBST_Generation_for_RISC-V_Processor_Families.pdf |
| Evaluating the Impact of Transition Delay Faults in GPUs / Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2023), pp. 353-358. (Intervento presentato al convegno International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID) tenutosi a Hyderabad (India) nel 08-12 January 2023) [10.1109/VLSID57277.2023.00077]. | 1-gen-2023 | Rodriguez Condia, Josie E.Reorda, Matteo Sonza | Camera_Ready_last_mod.pdf; Evaluating_the_Impact_of_Transition_Delay_Faults_in_GPUs.pdf |
| Evaluating the Prevalence of SFUs in the Reliability of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174110]. | 1-gen-2023 | Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + | Evaluating_the_Prevalence_of_SFUs_in_the_Reliability_of_GPUs.pdf |
| Evaluating the Prevalence of SFUs in the Reliability of GPUs / Rodriguez Condia, Je; Guerrero-Balaguera, Jd; Nunez, Ejp; Limas, Robert; Reorda, Ms. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174110]. | 1-gen-2023 | Rodriguez Condia, JEGuerrero-Balaguera, JDLimas, RobertReorda, MS + | Evaluating_the_Prevalence_of_SFUs_in_the_Reliability_of_GPUs.pdf |
| Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. | 1-gen-2023 | Esteban RodriguezNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda | _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf; 978-3-031-40843-4_33.pdf |
| Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez Condia, Josie E.; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. | 1-gen-2023 | Josie E. Rodriguez CondiaNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda | _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf; 978-3-031-40843-4_33.pdf |