SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

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Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo - In: VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence[s.l] : Springer, In corso di stampa. In corso di stampa Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf
Evaluating Different Fault Injection Abstractions on the Assessment of DNN SW Hardening Strategies / Esposito, Giuseppe; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 33rd IEEE Asian Test Symposium (ATS 2024) tenutosi a Ahmedabad, Gujarat (IND) nel 17th -20th December 2024). In corso di stampa Esposito, GiuseppeGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda ,Matteo _ATS2024_Eval_Hard_App_NvbitPERfi-2.pdf
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza. - In: IEEE ACCESS. - ISSN 2169-3536. - (2025), pp. 1-1. [10.1109/access.2025.3534274] 1-gen-2025 Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + _IEEE_ACCESS_Reliability_Multipliers-4.pdf
Effective Fault Effects Evaluation for Permanent Faults in GPUs executing DNNs / Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - (2025). [10.1145/3715327] 1-gen-2025 Guerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo _TODAES2024__FI_Permanent_faults_NVbitFI_final_version.pdf
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking / Deligiannis, Nikolaos; Faller, Tobias; Rodriguez Condia, Josie Esteban; Cantoro, Riccardo; Becker, Bernd; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-24. [10.1145/3706635] 1-gen-2025 Deligiannis, NikolaosRodriguez Condia, Josie EstebanCantoro, RiccardoSonza Reorda, Matteo + 3706635.pdf
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe, AZ (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2024), pp. 1-4. (Intervento presentato al convegno 29th IEEE European Test Symposium 2024 tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567198]. 1-gen-2024 Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdfAssessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf
Assessing the Reliability of Different Split Computing Neural Network Applications / Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534618]. 1-gen-2024 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoReorda, Matteo Sonza Assessing_the_Reliability_of_Different_Split_Computing_Neural_Network_Applications.pdf
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. 1-gen-2024 Turco V.Ruospo A.Sanchez E.Sonza Reorda M. Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-7. (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf
Enhancing the Reliability of Split Computing Deep Neural Networks / Esposito, G.; Guerrero-Balaguera, J. -D.; Condia, J. E. R.; Levorato, M.; Reorda, M. S.. - (2024), pp. 1-7. (Intervento presentato al convegno 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FR) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616071]. 1-gen-2024 Esposito G.Guerrero-Balaguera J. -D.Condia J. E. R.Levorato M.Reorda M. S. _IOLTS2024__Hardening_Split_Computing_DNNs.pdfEnhancing_the_Reliability_of_Split_Computing_Deep_Neural_Networks.pdf
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. 1-gen-2024 Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdfEvaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf
Evaluating the Reliability of Supervised Compression for Split Computing / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538938]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo Evaluating_the_Reliability_of_Supervised_Compression_for_Split_Computing.pdf
Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:3(2024). [10.3390/electronics13030578] 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-13-00578.pdf
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. 1-gen-2024 Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo IOLTS-24_CameraReady.pdfFault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Sonza Reorda, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 40:(2024), pp. 215-228. [10.1007/s10836-024-06107-9] 1-gen-2024 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertSonza Reorda, Matteo + s10836-024-06107-9.pdf
Reliability Assessment of Large DNN Models:Trading Off Performance and Accuracy / Chen, Junchao; Esposito, Giuseppe; Fernandes dos Santos, Fernando; Guerrero-Balaguera, Juan-David; Kritikakou, Angeliki; Krstic, Milos; Limas-Sierra, Robert-Alexander; Rodriguez-Condia, Josie-Esteban; Sonza-Reorda, Matteo; Traiola, Marcello; Veronesi, Alessandro. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC) tenutosi a Tanger (MAR) nel 06-09 October 2024) [10.1109/VLSI-SoC62099.2024.10767814]. 1-gen-2024 Esposito,GiuseppeGuerrero-Balaguera,Juan-DavidLimas-Sierra,Robert-AlexanderRodriguez-Condia,Josie-EstebanSonza-Reorda,Matteo + Reliability_Assessment_of_Large_DNN_Models_Trading_Off_Performance_and_Accuracy.pdf
Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538707]. 1-gen-2024 Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] 1-gen-2023 Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf