PORTO @ Archivio Istituzionale della Ricerca

SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

Mostra records
Risultati 1 - 20 di 642 (tempo di esecuzione: 0.03 secondi).
Citazione Data di pubblicazione Autori File
APSS Metrics for Fault Detection: Area, Position, Symmetry, and Shape in Image Segmentation / Turco, Vittorio; Fezza, Lorenzo; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno DFT 2025 38th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Barcellona (ESP) nel 21-23 October 2025). In corso di stampa Turco,VittorioFezza,LorenzoRuospo,AnnachiaraSanchez,ErnestoSonza Reorda,Matteo DFT25___Segmentation_metrics.pdf
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo. - (In corso di stampa). (Intervento presentato al convegno International Test Conference). In corso di stampa Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza. - In: IEEE ACCESS. - ISSN 2169-3536. - 13:(2025), pp. 32177-32196. [10.1109/access.2025.3534274] 1-gen-2025 Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + A_Reliability_Evaluation_Flow_for_Assessing_the_Impact_of_Permanent_Hardware_Faults_on_Integer_Arithmetic_Circuits.pdf
A Structured Method to Generate Self-Test Libraries for Tensor Cores / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 14:11(2025). [10.3390/electronics14112148] 1-gen-2025 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-14-02148.pdf
About the Functional In-Field Self-Testing of AI Accelerators / Guerrero-Balaguera, Juan-David; Rodriguez condia, Josie Esteban; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963960]. 1-gen-2025 Guerrero-Balaguera, Juan-DavidRodriguez condia, Josie EstebanSierra, Robert LimasReorda, Matteo Sonza About_the_Functional_In-Field_Self-Testing_of_AI_Accelerators.pdf
AI-based Classification of Intentional vs. Unintentional Corruptions in the Split Computing context / Esposito, Giuseppe; Magliano, Enrico; Scarano, Nicola; Ahmed-Eltaras, Tamer; Guerrero-Balaguera, Juan-David; Mannella, Luca; Rodriguez-Condia, Josie-Esteban; Ruospo, Annachiara; Di Carlo, Stefano; Levorato, Marco; Savino, Alessandro; Sonza Reorda, Matteo. - (2025), pp. 1-7. (Intervento presentato al convegno 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Ischia, Naples, Italy nel 7-9 July 2025) [10.1109/IOLTS65288.2025.11116959]. 1-gen-2025 Esposito, GiuseppeMagliano, EnricoScarano, NicolaAhmed-Eltaras,TamerGuerrero-Balaguera, Juan-DavidMannella, LucaRodriguez-Condia, Josie-EstebanRuospo, AnnachiaraDi Carlo, StefanoLevorato, MarcoSavino, AlessandroSonza Reorda, Matteo _IOLTS_2025__Split_Reliabiliy_and_Security-6.pdf; AI-Based_Classification_of_Adversarial_Attacks_vs._Hardware_Fault_Corruptions_in_the_Split_Computing_Context.pdf
An Effective Iterative Statistical Fault Injection Methodology for Deep Neural Networks / Ruospo, Annachiara; Reorda, Matteo Sonza; Mariani, Riccardo; Sanchez, Ernesto. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - ELETTRONICO. - 74:7(2025), pp. 2431-2444. [10.1109/tc.2025.3566863] 1-gen-2025 Ruospo, AnnachiaraReorda, Matteo SonzaSanchez, Ernesto + An_Effective_Iterative_Statistical_Fault_Injection_Methodology_for_Deep_Neural_Networks.pdf; An_Effective_Iterative_Statistical_Fault_Injection_Methodology_for_Deep_Neural_Networks.pdf
Analysis and Mitigation of Soft-errors in GPU-accelerated Hyperspectral Image Classifiers / Abed, Sergiu-Mohamed; Guerrero-Balaguera, Juan-David; Condia, Josie E. Rodriguez; De Lucia, Gianluca; Lapegna, Marco; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 131-134. (Intervento presentato al convegno 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2025 tenutosi a Lyon (FRA) nel 05-07 May 2025) [10.1109/ddecs63720.2025.11006812]. 1-gen-2025 Abed, Sergiu-MohamedGuerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + Analysis_and_Mitigation_of_Soft-errors_in_GPU-accelerated_Hyperspectral_Image_Classifiers.pdf; _DDECS_25__Analysis_and_Mitigation_of_Soft_errors_in_GPU_accelerated_Hyperspectral_Image_Classifiers___4_pages_free.pdf
Benchmark Suite for Resilience Assessment of Deep Learning Models / Bolchini, Cristiana; Bosio, Alberto; Cassano, Luca; Miele, Antonio; Pappalardo, Salvatore; Passarello, Dario; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo; Turco, Vittorio. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - (2025). [10.1109/TCAD.2025.3578297] 1-gen-2025 Annachiara RuospoErnesto SanchezMatteo Sonza ReordaVittorio Turco + Benchmark_Suite_for_Resilience_Assessment_of_Deep_Learning_Models.pdf
Comparing Application-Level Hardening Techniques for Neural Networks on GPUs / Esposito, G.; Guerrero-Balaguera, J. -D.; Rodriguez Condia, J. E.; Sonza Reorda, M.. - In: ELECTRONICS. - ISSN 2079-9292. - 14:5(2025). [10.3390/electronics14051042] 1-gen-2025 Esposito G.Rodriguez Condia J. E.Sonza Reorda M. + Comparing_Application_Level_Hardening_Techniques_for_Neural_Networks_on_GPUs.pdf
Early Reliability Assessment of AI-based Automotive Systems / Hegde, Shailesh Sudhakara; Selvaraj, Dinesh Cyril; Rodriguez Condia, Josie E.; Amati, Nicola; Chiasserini, Carla Fabiana; Deflorio, Francesco; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON THE INTERNET OF THINGS. - ISSN 2577-6207. - (2025). 1-gen-2025 SHAILESH SUDHAKARA HEGDEDINESH CYRIL SELVARAJJOSIE E. RODRIGUEZ CONDIANICOLA AMATICARLA FABIANA CHIASSERINIFRANCESCO DEFLORIOMATTEO SONZA REORDA _ACM_Transactions_on_Internet_of_Things__CARS___Automotive_susceptibility_in_perception-9_mini.pdf
Effective Fault Effects Evaluation for Permanent Faults in GPUs executing DNNs / Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-33. [10.1145/3715327] 1-gen-2025 Guerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo 3715327.pdf
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking / Deligiannis, Nikolaos; Faller, Tobias; Rodriguez Condia, Josie Esteban; Cantoro, Riccardo; Becker, Bernd; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-24. [10.1145/3706635] 1-gen-2025 Deligiannis, NikolaosRodriguez Condia, Josie EstebanCantoro, RiccardoSonza Reorda, Matteo + 3706635.pdf
Estimating the Impact of Soft Errors on AI-Based Perception in Automotive / Hegde, Shailesh Sudhakara; Selvaraj, Dinesh Cyril; Rodriguez Condia, Josie Esteban; Amati, Nicola; Chiasserini, Carla Fabiana; Deflorio, Francesco Paolo; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963959]. 1-gen-2025 Hegde, Shailesh SudhakaraSelvaraj, Dinesh CyrilRodriguez Condia, Josie EstebanAmati, NicolaChiasserini, Carla FabianaDeflorio, Francesco PaoloReorda, Matteo Sonza Estimating_the_Impact_of_Soft_Errors_on_AI-Based_Perception_in_Automotive.pdf; SCANeR_Software_Reliability_submitted .pdf
GPD: Predictive Control Flow Error Detection Leveraging Data Flow Error Detection Methods / Raghunandana K, K; Yogesh Prasad, K R; Sonza Reorda, M.; Virendra, Singh. - (2025), pp. 1-5. (Intervento presentato al convegno 31st IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2025 tenutosi a Ischia (ITA) nel 07-09 July 2025) [10.1109/iolts65288.2025.11116971]. 1-gen-2025 M. Sonza Reorda + GPD_Predictive_Control_Flow_Error_Detection_Leveraging_Data_Flow_Error_Detection_Methods.pdf
Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization / Sierra, Robert Limas; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Islas (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963963]. 1-gen-2025 Sierra, Robert LimasEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza Improving_CNN_Runtime_Robustness_Against_Soft_Errors_by_Dropout_Layer_Optimization.pdf
Investigating and Mitigating Critical Faults in Floating-Point and Posit Arithmetic Hardware / Rodriguez Condia, Josie Esteban; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - (2025), pp. 1-12. [10.1109/tetc.2025.3615827] 1-gen-2025 Rodriguez Condia, Josie EstebanGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Investigating_and_Mitigating_Critical_Faults_in_Floating-Point_and_Posit_Arithmetic_Hardware.pdf
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe, AZ (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / Limas Sierra, Robert Alexander; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - 680:(2024), pp. 149-176. (Intervento presentato al convegno 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023 tenutosi a Sharjah, United Arab Emirates nel October 16–18, 2023) [10.1007/978-3-031-70947-0_8]. 1-gen-2024 Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf; 978-3-031-70947-0_8.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2024), pp. 1-4. (Intervento presentato al convegno 29th IEEE European Test Symposium 2024 tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf