SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

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Risultati 1 - 20 di 111 (tempo di esecuzione: 0.027 secondi).
Citazione Data di pubblicazione Autori File
Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:3(2024). [10.3390/electronics13030578] 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-13-00578.pdf
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] 1-gen-2023 Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] 1-gen-2023 Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT / Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4270-4281. [10.1109/TCAD.2023.3252467] 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _IEEE_TCAD__Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdfAutomating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 98:(2023), p. 104775. [10.1016/j.micpro.2023.104775] 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda _MICPRO_SI_DSD21__Automating_the_Generation_of_Programs_Maximizing_the_Switching_Activity_in_Microprocessor_Units_via_Evolutionary_Techniques.pdf1-s2.0-S0141933123000212-main.pdf
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 70:4(2023), pp. 370-380. [10.1109/tns.2022.3224538] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + Characterizing_a_Neutron-Induced_Fault_Model_for_Deep_Neural_Networks.pdf
STLs for GPUs: Using High-Level Language Approaches / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 40:4(2023), pp. 51-60. [10.1109/MDAT.2023.3267601] 1-gen-2023 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo STLs_for_GPUs_Using_High-Level_Language_Approaches.pdfSTLs_for_GPUs_Using_High-Level_Language_Approaches.pdf
Using STLs for Effective In-field Test of GPUs / Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, Guerrero-Balaguera; Hamdioui, Said; Sauer, Christian; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 40:2(2023), pp. 109-117. [10.1109/MDAT.2022.3188573] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraSaid HamdiouiMatteo Sonza Reorda + DT_DT-2021-10-0106.R2_RODRIGUEZ CONDIA.pdfUsing_STLs_for_Effective_In-Field_Test_of_GPUs.pdf
A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] 1-gen-2022 Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo Termico_FINALpoof.pdf1-s2.0-S0026271421003826-main.pdf
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] 1-gen-2022 Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + electronics-11-02481-v2.pdf
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs / Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - ELETTRONICO. - 22:2(2022), pp. 129-141. [10.1109/TDMR.2022.3166260] 1-gen-2022 Rodriguez Condia, Josie E.Rech, PaoloCarro, LuigiSonza Reorda, Matteo + Transactions_on_device_and_materials_reliability_accepted_version.pdfAn_Effective_Method_to_Identify_Microarchitectural_Vulnerabilities_in_GPUs.pdf
An Experimental Evaluation of Resistive Defects and Different Testing Solutions in Low-Power Back-Biased SRAM Cells / Mirabella, N.; Grosso, M.; Franchino, G.; Rinaudo, S.; Deretzis, I.; La Magna, A.; Reorda, M. S.. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 11:2(2022), p. 203. [10.3390/electronics11020203] 1-gen-2022 Mirabella N.Grosso M.Reorda M. S. + electronics-11-00203.pdfMDPI_Paper.pdf
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips / Bagbaba, A. C.; da Silva, F. A.; Reorda, M. S.; Hamdioui, S.; Jenihhin, M.; Sauer, C.. - In: ELECTRONICS. - ISSN 2079-9292. - 11:3(2022), p. 319. [10.3390/electronics11030319] 1-gen-2022 Reorda M. S.Hamdioui S. + electronics-11-00319-v2.pdf
Evaluating low-level software-based hardening techniques for configurable GPU architectures / Goncalves, Marcio M.; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo; Sterpone, Luca; Azambuja, Jose Rodrigo. - In: THE JOURNAL OF SUPERCOMPUTING. - ISSN 0920-8542. - ELETTRONICO. - 78:6(2022), pp. 8081-8105. [10.1007/s11227-021-04154-z] 1-gen-2022 Rodriguez Condia, Josie EstebanSonza Reorda, MatteoSterpone, Luca + Goncalves2022_Article_EvaluatingLow-levelSoftware-ba.pdfJSupercomp___Software_based_for_FlexGrip.pdf
DYRE: a DYnamic REconfigurable solution to increase GPGPU's reliability / Rodriguez Condia, Josie E.; Narducci, Pierpaolo; Sonza Reorda, Matteo; Sterpone, Luca. - In: THE JOURNAL OF SUPERCOMPUTING. - ISSN 0920-8542. - ELETTRONICO. - (2021). [10.1007/s11227-021-03751-2] 1-gen-2021 Rodriguez Condia, Josie E.Sonza Reorda, MatteoSterpone, Luca + Condia2021_Article_DYREADYnamicREconfigurableSolu.pdf
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Marcello, Traiola; Valea, Emanuele. - In: IEEE ACCESS. - ISSN 2169-3536. - 9:(2021), pp. 155998-156012. [10.1109/ACCESS.2021.3129149] 1-gen-2021 Deligiannis NikolaosRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + Towards_the_Integration_of_Reliability_and_Security_Mechanisms_to_Enhance_the_Fault_Resilience_of_Neural_Networks.pdf
A Novel Sequence Generation Approach to Diagnose Faults in Reconfigurable Scan Networks / Cantoro, Riccardo; Damljanovic, Aleksa; Sonza Reorda, Matteo; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - ELETTRONICO. - 69:1(2020), pp. 87-98. [10.1109/TC.2019.2939125] 1-gen-2020 Cantoro, RiccardoDamljanovic, AleksaSonza Reorda, MatteoSquillero, Giovanni FinalFile.pdf08823015.pdf
An on-line testing technique for the scheduler memory of a GPGPU / Di Carlo, Stefano; Condia, Josie E. Rodriguez; Reorda, Matteo Sonza. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 8:1(2020), pp. 1-16893. [10.1109/ACCESS.2020.2968139] 1-gen-2020 Di Carlo, StefanoCondia, Josie E. RodriguezReorda, Matteo Sonza 08963963-2.pdf
Assessing the effectiveness of different test approaches for power devices in a PCB / Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - (2020), pp. 1-14. [10.1109/JESTPE.2020.3013229] 1-gen-2020 Piumatti, DavideBorlo, StefanoReorda, Matteo SonzaBojoi, Radu FINAL VERSION.pdf09153558.pdf
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors / Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco. - In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS. - ISSN 2319-2518. - STAMPA. - 9:4(2020), pp. 206-212. [10.18178/ijeetc.9.4.206-212] 1-gen-2020 Matteo V. QuitadamoDavide PiumattiMatteo Sonza ReordaFranco Fiori 5fad2e2165a91658384c85f25b0f4f87d3ef.pdf