SONZA REORDA, MATTEO

SONZA REORDA, MATTEO  

Dipartimento di Automatica e Informatica  

REORDA M. S; Reorda, Matteo Sonza; Reorda M. Sonza; M. Sonza Reorda; Reorda, M. S.; M.S. Reorda; Matteo Sonza Reorda  

001894  

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Benchmark Suite for Resilience Assessment of Deep Learning Models / Bolchini, Cristiana; Bosio, Alberto; Cassano, Luca; Miele, Antonio; Pappalardo, Salvatore; Passarello, Dario; Ruospo, Annachiara; Sanchez, Ernesto; SONZA REORDA, Matteo; Turco, Vittorio. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - (In corso di stampa). In corso di stampa Annachiara RuospoErnesto SanchezMatteo Sonza ReordaVittorio Turco + TCAD2025_benchmarks_R2_final.pdf
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza. - In: IEEE ACCESS. - ISSN 2169-3536. - 13:(2025), pp. 32177-32196. [10.1109/access.2025.3534274] 1-gen-2025 Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + A_Reliability_Evaluation_Flow_for_Assessing_the_Impact_of_Permanent_Hardware_Faults_on_Integer_Arithmetic_Circuits.pdf
About the Functional In-Field Self-Testing of AI Accelerators / Guerrero-Balaguera, Juan-David; Rodriguez condia, Josie Esteban; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963960]. 1-gen-2025 Guerrero-Balaguera, Juan-DavidRodriguez condia, Josie EstebanSierra, Robert LimasReorda, Matteo Sonza About_the_Functional_In-Field_Self-Testing_of_AI_Accelerators.pdf
Comparing Application-Level Hardening Techniques for Neural Networks on GPUs / Esposito, G.; Guerrero-Balaguera, J. -D.; Rodriguez Condia, J. E.; Sonza Reorda, M.. - In: ELECTRONICS. - ISSN 2079-9292. - 14:5(2025). [10.3390/electronics14051042] 1-gen-2025 Esposito G.Rodriguez Condia J. E.Sonza Reorda M. + Comparing_Application_Level_Hardening_Techniques_for_Neural_Networks_on_GPUs.pdf
Effective Fault Effects Evaluation for Permanent Faults in GPUs executing DNNs / Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-33. [10.1145/3715327] 1-gen-2025 Guerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo 3715327.pdf
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking / Deligiannis, Nikolaos; Faller, Tobias; Rodriguez Condia, Josie Esteban; Cantoro, Riccardo; Becker, Bernd; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-24. [10.1145/3706635] 1-gen-2025 Deligiannis, NikolaosRodriguez Condia, Josie EstebanCantoro, RiccardoSonza Reorda, Matteo + 3706635.pdf
Estimating the Impact of Soft Errors on AI-Based Perception in Automotive / Hegde, Shailesh Sudhakara; Selvaraj, Dinesh Cyril; Rodriguez Condia, Josie Esteban; Amati, Nicola; Chiasserini, Carla Fabiana; Deflorio, Francesco Paolo; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963959]. 1-gen-2025 Hegde, Shailesh SudhakaraSelvaraj, Dinesh CyrilRodriguez Condia, Josie EstebanAmati, NicolaChiasserini, Carla FabianaDeflorio, Francesco PaoloReorda, Matteo Sonza Estimating_the_Impact_of_Soft_Errors_on_AI-Based_Perception_in_Automotive.pdfSCANeR_Software_Reliability_submitted .pdf
Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization / Sierra, Robert Limas; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Islas (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963963]. 1-gen-2025 Sierra, Robert LimasEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza -
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe, AZ (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence[s.l] : Springer, 2024. - ISBN 978-3-031-70946-3. - pp. 149-176 [10.1007/978-3-031-70947-0_8] 1-gen-2024 Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf978-3-031-70947-0_8.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2024), pp. 1-4. (Intervento presentato al convegno 29th IEEE European Test Symposium 2024 tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567198]. 1-gen-2024 Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdfAssessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf
Assessing the Reliability of Different Split Computing Neural Network Applications / Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534618]. 1-gen-2024 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoReorda, Matteo Sonza Assessing_the_Reliability_of_Different_Split_Computing_Neural_Network_Applications.pdf
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. 1-gen-2024 Turco V.Ruospo A.Sanchez E.Sonza Reorda M. Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-7. (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf
Enhancing the Reliability of Split Computing Deep Neural Networks / Esposito, G.; Guerrero-Balaguera, J. -D.; Condia, J. E. R.; Levorato, M.; Reorda, M. S.. - (2024), pp. 1-7. (Intervento presentato al convegno 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FR) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616071]. 1-gen-2024 Esposito G.Guerrero-Balaguera J. -D.Condia J. E. R.Levorato M.Reorda M. S. _IOLTS2024__Hardening_Split_Computing_DNNs.pdfEnhancing_the_Reliability_of_Split_Computing_Deep_Neural_Networks.pdf
Evaluating Different Fault Injection Abstractions on the Assessment of DNN SW Hardening Strategies / Esposito, Giuseppe; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 33rd IEEE Asian Test Symposium (ATS 2024) tenutosi a Ahmedabad, Gujarat (IND) nel 17th -20th December 2024) [10.1109/ATS64447.2024.10915284]. 1-gen-2024 Esposito, GiuseppeGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo _ATS2024_Eval_Hard_App_NvbitPERfi-2.pdfEvaluating_Different_Fault_Injection_Abstractions_on_the_Assessment_of_DNN_SW_Hardening_Strategies.pdf
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. 1-gen-2024 Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdfEvaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf
Evaluating the Reliability of Supervised Compression for Split Computing / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538938]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo Evaluating_the_Reliability_of_Supervised_Compression_for_Split_Computing.pdf
Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:3(2024). [10.3390/electronics13030578] 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-13-00578.pdf