DELIGIANNIS, NIKOLAOS

DELIGIANNIS, NIKOLAOS  

Dipartimento di Automatica e Informatica  

060034  

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Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. 1-gen-2024 Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdfEvaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf
Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2024). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616077]. 1-gen-2024 Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo IOLTS-24_CameraReady.pdfFault_Grading_Techniques_for_Evaluating_Software-Based_Self-Test_with_Respect_to_Small_Delay_Defects.pdf
Formal Methods for Test and Reliability / Deligiannis, Nikolaos. - (2024 Jul 11), pp. 1-168. 11-lug-2024 DELIGIANNIS, NIKOLAOS [PHD_THESIS]__Formal_Methods_for_Test_and_Reliability.pdf[PHD_ABSTRACT]_Formal_Methods_for_Test_and_Reliability.pdf
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. 1-gen-2023 Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + ETS_RISC_V_testing_safety_security.pdfA_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdfAutomatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdfAutomating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT / Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4270-4281. [10.1109/TCAD.2023.3252467] 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _IEEE_TCAD__Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdfAutomating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 98:(2023), p. 104775. [10.1016/j.micpro.2023.104775] 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda _MICPRO_SI_DSD21__Automating_the_Generation_of_Programs_Maximizing_the_Switching_Activity_in_Microprocessor_Units_via_Evolutionary_Techniques.pdf1-s2.0-S0141933123000212-main.pdf
Constraint-Based Automatic SBST Generation for RISC-V Processor Families / Faller, Tobias; Deligiannis, Nikolaos; Schwörer, Markus; SONZA REORDA, Matteo; Becker, Bernd. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174156]. 1-gen-2023 Nikolaos DeligiannisMatteo Sonza Reorda + _ETS2023__Constraint_Based_Automatic_SBST_Generation_for_RISC_V_Processor_Families.pdfConstraint-Based_Automatic_SBST_Generation_for_RISC-V_Processor_Families.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Esteban RodriguezNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf978-3-031-40843-4_33.pdf
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - (2022), pp. 23-24. (Intervento presentato al convegno Dependable Systems and Networks nel 27-30 June 2022) [10.1109/DSN-S54099.2022.00017]. 1-gen-2022 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + DSN_2022.pdfImproving_the_Fault_Resilience_of_Neural_Network_Applications_Through_Security_Mechanisms.pdf
New Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity of Complex SoCs / Deligiannis, Nikolaos. - (2022). (Intervento presentato al convegno European Test Symposium (ETS)). 1-gen-2022 Nikolaos Deligiannis ETS2022_PhD_Forum.pdf
Using Formal Methods to Support the Development of STLs for GPUs / Deligiannis, Nikolaos; Faller, Tobias; RODRIGUEZ CONDIA, JOSIE ESTEBAN; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2022), pp. 84-89. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Taiwan nel 21-24 November 2022) [10.1109/ATS56056.2022.00027]. 1-gen-2022 Nikolaos DeligiannisJosie Esteban RodriguezRiccardo CantoroMatteo Sonza Reorda + _ATS2022__Using_Formal_Methods_to_Support_the_Development_of_STLs_for_GPUs.pdfUsing_Formal_Methods_to_Support_the_Development_of_STLs_for_GPUs.pdf
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor / Deligiannis, Nikolaos; Cantoro, Riccardo; Faller, Tobias; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo. - (2021), pp. 73-78. (Intervento presentato al convegno Asian Test Symposium (ATS) nel 22-25 Nov. 2021) [10.1109/ATS52891.2021.00025]. 1-gen-2021 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + 2021178103.pdfEffective_SAT-based_Solutions_for_Generating_Functional_Sequences_Maximizing_the_Sustained_Switching_Activity_in_a_Pipelined_Processor.pdf
Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques / Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (2021), pp. 535-540. (Intervento presentato al convegno Digital System Design (DSD) nel 01-03 September 2021) [10.1109/DSD53832.2021.00086]. 1-gen-2021 Deligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo _DSD2021__Maximizing_the_Switching_Activity_of_a_Processor_via_Evolutionary_Tecnhiques.pdfMaximizing_the_Switching_Activity_of_Different_Modules_Within_a_Processor_Core_via_Evolutionary_Techniques.pdf
New Techniques for the Automatic Identification of Uncontrollable Lines in a CPU Core / Deligiannis, Nikolaos; Cantoro, Riccardo; Sauer, Matthias; Becker, Bernd; Reorda, Matteo Sonza. - (2021), pp. 1-7. (Intervento presentato al convegno 2021 IEEE 39th VLSI Test Symposium (VTS) nel 25-28 April 2021) [10.1109/VTS50974.2021.9441040]. 1-gen-2021 Deligiannis, NikolaosCantoro, RiccardoReorda, Matteo Sonza + 09441040.pdf
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - In: IEEE ACCESS. - ISSN 2169-3536. - 9:(2021), pp. 155998-156012. [10.1109/ACCESS.2021.3129149] 1-gen-2021 Deligiannis NikolaosRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + Towards_the_Integration_of_Reliability_and_Security_Mechanisms_to_Enhance_the_Fault_Resilience_of_Neural_Networks.pdf
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network / Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; Valea, Emanuele. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)) [10.1109/DFT50435.2020.9250869]. 1-gen-2020 Cantoro, RiccardoDeligiannis, NikolaosReorda, Matteo SonzaValea, Emanuele + Camera Ready.pdf09250869.pdf
Evaluating the Code Encryption Effects on Memory Fault Resilience / Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E.. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 21st IEEE Latin-American Test Symposium, LATS 2020 tenutosi a Maceio, Brazil nel 30 March-2 April 2020) [10.1109/LATS49555.2020.9093670]. 1-gen-2020 Cantoro R.Deligiannis N.Sonza Reorda M.Valea E. + PUBLISHED-09093670.pdf_LATS2020__Evaluating_the_Code_Encryption_Effects_on_Memory_Fault_Resilience.pdf