VALEA, EMANUELE

VALEA, EMANUELE  

Dipartimento di Automatica e Informatica  

044010  

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Citazione Data di pubblicazione Autori File
Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - (2022), pp. 23-24. (Intervento presentato al convegno Dependable Systems and Networks nel 27-30 June 2022) [10.1109/DSN-S54099.2022.00017]. 1-gen-2022 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + DSN_2022.pdfImproving_the_Fault_Resilience_of_Neural_Network_Applications_Through_Security_Mechanisms.pdf
Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - In: IEEE ACCESS. - ISSN 2169-3536. - 9:(2021), pp. 155998-156012. [10.1109/ACCESS.2021.3129149] 1-gen-2021 Deligiannis NikolaosRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + Towards_the_Integration_of_Reliability_and_Security_Mechanisms_to_Enhance_the_Fault_Resilience_of_Neural_Networks.pdf
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network / Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; Valea, Emanuele. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)) [10.1109/DFT50435.2020.9250869]. 1-gen-2020 Cantoro, RiccardoDeligiannis, NikolaosReorda, Matteo SonzaValea, Emanuele + Camera Ready.pdf09250869.pdf
Evaluating the Code Encryption Effects on Memory Fault Resilience / Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E.. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 21st IEEE Latin-American Test Symposium, LATS 2020 tenutosi a Maceio, Brazil nel 30 March-2 April 2020) [10.1109/LATS49555.2020.9093670]. 1-gen-2020 Cantoro R.Deligiannis N.Sonza Reorda M.Valea E. + PUBLISHED-09093670.pdf_LATS2020__Evaluating_the_Code_Encryption_Effects_on_Memory_Fault_Resilience.pdf
On the Optimization of SBST Test Program Compaction / Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni; Valea, Emanuele. - STAMPA. - (2017), pp. 1-4. (Intervento presentato al convegno IEEE International Symposium On Defect And Fault Tolerance In VLSI And Nanotechnology Systems (DFTS) tenutosi a Cambridge (UK) nel October 23-25, 2017) [10.1109/DFT.2017.8244444]. 1-gen-2017 CANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEOSQUILLERO, GIOVANNIVALEA, EMANUELE -