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Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms
2022 Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network
2020 Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; Valea, Emanuele
Evaluating the Code Encryption Effects on Memory Fault Resilience
2020 Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E.
On the Optimization of SBST Test Program Compaction
2017 Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni; Valea, Emanuele
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Traiola, Marcello; Valea, Emanuele. - (2022), pp. 23-24. (Intervento presentato al convegno Dependable Systems and Networks nel 27-30 June 2022) [10.1109/DSN-S54099.2022.00017]. | 1-gen-2022 | Nikolaos DeligiannisRiccardo CantoroMatteo Sonza ReordaEmanuele Valea + | DSN_2022.pdf; Improving_the_Fault_Resilience_of_Neural_Network_Applications_Through_Security_Mechanisms.pdf |
| Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network / Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; Valea, Emanuele. - ELETTRONICO. - (2020), pp. 1-4. (Intervento presentato al convegno 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)) [10.1109/DFT50435.2020.9250869]. | 1-gen-2020 | Cantoro, RiccardoDeligiannis, NikolaosReorda, Matteo SonzaValea, Emanuele + | Camera Ready.pdf; 09250869.pdf |
| Evaluating the Code Encryption Effects on Memory Fault Resilience / Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E.. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 21st IEEE Latin-American Test Symposium, LATS 2020 tenutosi a Maceio, Brazil nel 30 March-2 April 2020) [10.1109/LATS49555.2020.9093670]. | 1-gen-2020 | Cantoro R.Deligiannis N.Sonza Reorda M.Valea E. + | PUBLISHED-09093670.pdf; _LATS2020__Evaluating_the_Code_Encryption_Effects_on_Memory_Fault_Resilience.pdf |
| On the Optimization of SBST Test Program Compaction / Cantoro, Riccardo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Squillero, Giovanni; Valea, Emanuele. - STAMPA. - (2017), pp. 1-4. (Intervento presentato al convegno IEEE International Symposium On Defect And Fault Tolerance In VLSI And Nanotechnology Systems (DFTS) tenutosi a Cambridge (UK) nel October 23-25, 2017) [10.1109/DFT.2017.8244444]. | 1-gen-2017 | CANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEOSQUILLERO, GIOVANNIVALEA, EMANUELE | - |