Archivio Istituzionale della RicercaCANTORO, RICCARDO
CANTORO, RICCARDO
Dipartimento di Automatica e Informatica
021727
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Performance-aware reliability optimization for digital designs
In corso di stampa Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design
2026 Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; Wang, Honghao; Xun, Hanzhi; Li, Xiuyan; Wang, Lin; Yin, Chujun; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Hamdioui, Said; Squillero, Giovanni; Cantoro, Riccardo
Assessing the Effectiveness of Software-Based Self-Test Programs for Cell-Aware Test
2026 Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo
Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation
2026 Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo
Software test libraries and real-time operating systems: A system integrator perspective
2026 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits
2025 Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Early Functional Safety and PPA Evaluation of Digital Designs
2025 Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking
2025 Deligiannis, Nikolaos; Faller, Tobias; Rodriguez Condia, Josie Esteban; Cantoro, Riccardo; Becker, Bernd; Sonza Reorda, Matteo
Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation
2025 Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( 28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Performance-aware reliability optimization for digital designs / Bartolomucci, M., Tran, U., Roland, D., Kingston, D., Nardi, A., Cantoro, R.. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (20th International Conference on Design, Test & Technology of Integrated Systems Athens (GRC) 15 – 17 October 2025). | In corso di stampa | Michelangelo BartolomucciRiccardo Cantoro + | _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design / Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; Wang, Honghao; Xun, Hanzhi; Li, Xiuyan; Wang, Lin; Yin, Chujun; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Hamdioui, Said; Squillero, Giovanni; Cantoro, Riccardo. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - (2026), pp. 1-1. [10.1109/led.2026.3680006] | 1-gen-2026 | Wang, ChanghaoBellarmino, NicolòKolahimahmoudi, NimaHamdioui, SaidSquillero, GiovanniCantoro, Riccardo + | A_Data-Driven_ANN-Based_Model_for_FeCAP_amp_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf |
| Assessing the Effectiveness of Software-Based Self-Test Programs for Cell-Aware Test / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - In: IEEE ACCESS. - ISSN 2169-3536. - 14:(2026), pp. 78568-78583. [10.1109/access.2026.3696050] | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloSonza Reorda, MatteoCantoro, Riccardo + | published_version.pdf |
| Automatic Enhancement of Cell Models to Enable Conditional Stuck-at Fault Simulation and Pattern Generation / Khoshzaban, Reza; Deligiannis, Nikolaos I.; Guglielminetti, Iacopo; Grosso, Michelangelo; Cantoro, Riccardo. - (2026), pp. 1-6. ( 2026 IEEE 27th Latin American Test Symposium (LATS) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480285]. | 1-gen-2026 | Khoshzaban, RezaGrosso, MichelangeloCantoro, Riccardo + | _LATS2026__Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck_At_Fault_Simulation_and_Pattern_Generation.pdf; Automatic_Enhancement_of_Cell_Models_to_Enable_Conditional_Stuck-at_Fault_Simulation_and_Pattern_Generation.pdf |
| Software test libraries and real-time operating systems: A system integrator perspective / Angione, F., Bernardi, P., Cantoro, R.. - In: JOURNAL OF SYSTEMS ARCHITECTURE. - ISSN 1383-7621. - 177:(2026). [10.1016/j.sysarc.2026.103854] | 1-gen-2026 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | main.pdf |
| A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, N., Guerrero-Balaguera, J., Cantoro, R., Habib, S.E.D., Reorda, M.S.. - In: IEEE ACCESS. - ISSN 2169-3536. - 13:(2025), pp. 32177-32196. [10.1109/access.2025.3534274] | 1-gen-2025 | Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + | A_Reliability_Evaluation_Flow_for_Assessing_the_Impact_of_Permanent_Hardware_Faults_on_Integer_Arithmetic_Circuits.pdf |
| COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 652-664. [10.1109/tc.2024.3500378] | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoFosson, Sophie M.Squillero, Giovanni + | 2023_XXX_Compress_Sensing_Journal_Paper (2).pdf; COSMO_COmpressed_Sensing_for_Models_and_Logging_Optimization_in_MCU_Performance_Screening.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. ( 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - 44:2(2025), pp. 641-654. [10.1109/tcad.2024.3436542] | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_TCAD_Transfer_Learning_Paper.pdf; Deep_Learning_Strategies_for_Labeling_and_Accuracy_Optimization_in_Microcontroller_Performance_Screening.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, V., Bellarmino, N., Ruospo, A., Cantoro, R., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, M., Kingston, D., Cupaiuolo, T., Nardi, A., Cantoro, R.. - ELETTRONICO. - (2025), pp. 1-2. (2025 Design, Automation and Test in Europe Conference, DATE 2025 Lyon (FRA) 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267]. | 1-gen-2025 | Bartolomucci, MichelangeloCantoro, Riccardo + | _DATE25__Early_Functional_Safety_and_PPA_evaluation_for_faster_digital_design_development_.pdf; Early_Functional_Safety_and_PPA_Evaluation_of_Digital_Designs.pdf |
| Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking / Deligiannis, N., Faller, T., Rodriguez Condia, J.E., Cantoro, R., Becker, B., Sonza Reorda, M.. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-24. [10.1145/3706635] | 1-gen-2025 | Deligiannis, NikolaosRodriguez Condia, Josie EstebanCantoro, RiccardoSonza Reorda, Matteo + | 3706635.pdf |
| Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, R., Guglielminetti, I., Grosso, M., Sonza Reorda, M., Cantoro, R.. - (2025), pp. 418-421. (International Test Conference San Diego, CA (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00054]. | 1-gen-2025 | Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + | Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf; Exploiting_the_correlation_with_traditional_fault_models_to_speed-up_cell-aware_fault_simulation.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - (2025), pp. 1-6. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T.. - STAMPA. - (2025), pp. 470-473. (International Test Conference (ITC) 2025 San Diego, California (USA) 21-26 September, 2025) [10.1109/ITC58126.2025.00067]. | 1-gen-2025 | Nicolò BellarminoRiccardo Cantoro + | 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf; Minimal_Supervision_Maximum_Accuracy_TabPFN_for_Microcontroller_Performance_Prediction.pdf |