CANTORO, RICCARDO

CANTORO, RICCARDO  

Dipartimento di Automatica e Informatica  

021727  

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Fault Grading Techniques for Evaluating Software-Based Self-Test with Respect to Small Delay Defects / Bartolomucci, Michelangelo; Deligiannis, Nikolaos; Cantoro, Riccardo; Sonza Reorda, Matteo. - (In corso di stampa). (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS)). In corso di stampa Bartolomucci, MichelangeloDeligiannis, NikolaosCantoro, RiccardoSonza Reorda, Matteo IOLTS-24_CameraReady.pdf
Targeting different defect-oriented fault models in IC testing: an experimental approach / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 26th Euromicro Conference Series on Digital System Design (DSD) tenutosi a Durres (ALB) nel 6-8 September, 2023). In corso di stampa Mirabella,NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo DSD_Conference_paper_1.9_submitted.docx2023172914.pdf
Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
Evaluating the Reliability of Integer Multipliers With Respect to Permanent Faults / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo; Habib, S. E. D.. - (2024), pp. 124-129. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508899]. 1-gen-2024 Deligiannis, NikolaosCantoro, RiccardoSonza Reorda Matteo + DDECS2024__Evaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdfEvaluating_the_Reliability_of_Integer_Multipliers_With_Respect_to_Permanent_Faults.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - 14505:(2024), pp. 364-378. (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England (UK) nel September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. 1-gen-2024 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf978-3-031-53969-5_27.pdf
A Multi-Label Active Learning Framework for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:10(2023), pp. 3436-3449. [10.1109/TCAD.2023.3245989] 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoMartone, RaffaeleSquillero, Giovanni + post-print.pdfA_Multilabel_Active_Learning_Framework_for_Microcontroller_Performance_Screening.pdf
A Survey of Recent Developments in Testability, Safety and Security of RISC-V Processors / Anders, Jens; Andreu, Pablo; Becker, Bernd; Becker, Steffen; Cantoro, Riccardo; Deligiannis, Nikolaos; Elhamawy, Nourhan; Faller, Tobias; Hernandez, Carles; Mentens, Nele; Namazi Rizi, Mahnaz; Polian, Ilia; Sajadi, Abolfazl; Sauer, Mathias; Schwachhofer, Denis; SONZA REORDA, Matteo; Stefanov, Todor; Tuzov, Ilya; Wagner, Stefan; Zidaric, Nuša. - (2023), pp. 1-10. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174099]. 1-gen-2023 Riccardo CantoroNikolaos DeligiannisMatteo Sonza Reorda + ETS_RISC_V_testing_safety_security.pdfA_Survey_of_Recent_Developments_in_Testability_Safety_and_Security_of_RISC-V_Processors.pdf
Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors / Deligiannis, Nikolaos; Faller, Tobias; Iacopo, Guglielminetti; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno Asian Test Symposium (ATS) tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317988]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ATS2023__Automatic_Identification_of_Functionally_Untestable_Cell_Aware_Faults_in_Microprocessors.pdfAutomatic_Identification_of_Functionally_Untestable_Cell-Aware_Faults_in_Microprocessors.pdf
Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing / Deligiannis, Nikolaos; Faller, Tobias; Chenghan, Zhou; Cantoro, Riccardo; Becker, Bernd; SONZA REORDA, Matteo. - (2023), pp. 1-5. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (Italy) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174232]. 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _ETS2023__Automating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn_In_Testing.pdfAutomating_the_Generation_of_Functional_Stress_Inducing_Stimuli_for_Burn-In_Testing.pdf
Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT / Deligiannis, Nikolaos; Faller, Tobias; Cantoro, Riccardo; Paxian, Tobias; Becker, Bernd; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4270-4281. [10.1109/TCAD.2023.3252467] 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + _IEEE_TCAD__Automating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdfAutomating_the_Generation_of_Programs_Maximizing_the_Repeatable_Constant_Switching_Activity_in_Microprocessor_Units_via_MaxSAT.pdf
Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques / Deligiannis, Nikolaos; Cantoro, Riccardo; SONZA REORDA, Matteo. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 98:(2023), p. 104775. [10.1016/j.micpro.2023.104775] 1-gen-2023 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda _MICPRO_SI_DSD21__Automating_the_Generation_of_Programs_Maximizing_the_Switching_Activity_in_Microprocessor_Units_via_Evolutionary_Techniques.pdf1-s2.0-S0141933123000212-main.pdf
Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ATS_Transfer_Learning (4) (1).pdfEnabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf
Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. 1-gen-2023 Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + 2023_LATS_Feature_Selection.pdfFeature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Esteban RodriguezNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf978-3-031-40843-4_33.pdf
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. 1-gen-2023 Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf
Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venezia (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ETS_Semi_Supersived_Learning (2).pdfSemi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf
A comparative overview of ATPG flows targeting traditional and cell-aware fault models / Mirabella, Nunzio; Floridia, Andrea; Cantoro, Riccardo; Grosso, Michelangelo; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno 29th IEEE International Conference on Electronics Circuits and Systems (ICECS) tenutosi a Glasgow nel 24th - 26th October 2022) [10.1109/ICECS202256217.2022.9971003]. 1-gen-2022 Mirabella, NunzioFloridia, AndreaCantoro, RiccardoGrosso, MichelangeloSonza Reorda, Matteo ICECS_2022_1.2.pdfConference_paper_1.2_submitted.docxA_comparative_overview_of_ATPG_flows_targeting_traditional_and_cell-aware_fault_models.pdf
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] 1-gen-2022 Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + electronics-11-02481-v2.pdf
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. (Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022) [10.1109/ETS54262.2022.9810392]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoKolahimahmoudi, NimaSartoni, SandroReorda, Matteo Sonza + ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdfEffective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. (Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022) [10.1109/VTS52500.2021.9794219]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdfExploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf