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CANTORO, RICCARDO

CANTORO, RICCARDO  

Dipartimento di Automatica e Informatica  

021727  

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Exploiting the correlation with traditional fault models to speed-up cell-aware fault simulation / Khoshzaban, Reza; Guglielminetti, Iacopo; Grosso, Michelangelo; Sonza Reorda, Matteo; Cantoro, Riccardo. - (In corso di stampa). (Intervento presentato al convegno International Test Conference). In corso di stampa Reza KhoshzabanMichelangelo GrossoMatteo Sonza ReordaRiccardo Cantoro + Exploiting_the_correlation_with_traditional_fault_models_to_speed_up_cell_aware_faultsim_poster_ITC.pdf
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno 28th Euromicro Conference Series on Digital System Design (DSD) 2025 tenutosi a Salerno (IT) nel 10-12 September, 2025). In corso di stampa Nicolò BellarminoRiccardo CantoroGiovanni Squillero + 2025_DSD_Foundation_Models (2).pdf
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias. - STAMPA. - (In corso di stampa). (Intervento presentato al convegno International Test Conference (ITC) 2025 tenutosi a San Diego, California (USA) nel 21-26 September, 2025). In corso di stampa Nicolò BellarminoRiccardo Cantoro + 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf
Performance-aware reliability optimization for digital designs / Bartolomucci, Michelangelo; Tran, Uyen; Roland, Didier; Kingston, David; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (In corso di stampa), pp. 1-6. (Intervento presentato al convegno 20th International Conference on Design, Test & Technology of Integrated Systems tenutosi a Athens (GRC) nel 15 – 17 October 2025). In corso di stampa Michelangelo BartolomucciRiccardo Cantoro + _DTTIS_2025__Performance_aware_reliability_optimization_for_digital_designs.pdf
Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza. - In: IEEE ACCESS. - ISSN 2169-3536. - 13:(2025), pp. 32177-32196. [10.1109/access.2025.3534274] 1-gen-2025 Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + A_Reliability_Evaluation_Flow_for_Assessing_the_Impact_of_Permanent_Hardware_Faults_on_Integer_Arithmetic_Circuits.pdf
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 652-664. [10.1109/tc.2024.3500378] 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoFosson, Sophie M.Squillero, Giovanni + 2023_XXX_Compress_Sensing_Journal_Paper (2).pdf; COSMO_COmpressed_Sensing_for_Models_and_Logging_Optimization_in_MCU_Performance_Screening.pdf
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. (Intervento presentato al convegno 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Lyon (FRA) nel May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. 1-gen-2025 Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - 44:2(2025), pp. 641-654. [10.1109/tcad.2024.3436542] 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + 2024_TCAD_Transfer_Learning_Paper.pdf; Deep_Learning_Strategies_for_Labeling_and_Accuracy_Optimization_in_Microcontroller_Performance_Screening.pdf
Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said. - (2025), pp. 635-641. (Intervento presentato al convegno 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 tenutosi a Tokyo (JPN) nel Jan. 20-23, 2025) [10.1145/3658617.3697755]. 1-gen-2025 Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + 3658617.3697755.pdf
Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said. - (2025). (Intervento presentato al convegno Titolo volume non avvalorato). 1-gen-2025 Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf
DOC: Detection of On-Line Failures in CNNs / Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno Latin American Test Workshop, LATW tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. 1-gen-2025 Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf
Early Functional Safety and PPA Evaluation of Digital Designs / Bartolomucci, Michelangelo; Kingston, David; Cupaiuolo, Teo; Nardi, Alessandra; Cantoro, Riccardo. - ELETTRONICO. - (2025), pp. 1-2. (Intervento presentato al convegno 2025 Design, Automation and Test in Europe Conference, DATE 2025 tenutosi a Lyon (FRA) nel 31 March 2025 - 02 April 2025) [10.23919/date64628.2025.10993267]. 1-gen-2025 Bartolomucci, MichelangeloCantoro, Riccardo + _DATE25__Early_Functional_Safety_and_PPA_evaluation_for_faster_digital_design_development_.pdf; Early_Functional_Safety_and_PPA_Evaluation_of_Digital_Designs.pdf
Enhancing the Effectiveness of STLs for GPUs via Bounded Model Checking / Deligiannis, Nikolaos; Faller, Tobias; Rodriguez Condia, Josie Esteban; Cantoro, Riccardo; Becker, Bernd; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-24. [10.1145/3706635] 1-gen-2025 Deligiannis, NikolaosRodriguez Condia, Josie EstebanCantoro, RiccardoSonza Reorda, Matteo + 3706635.pdf
Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963942]. 1-gen-2025 Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf
Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Castiglione della Pescaia (ITA) nel September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. 1-gen-2025 Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf
Assessing the Effectiveness of Software-Based Self-Test Programs for Static Cell-Aware Test / Cantoro, Riccardo; Grosso, Michelangelo; Guglielminetti, Iacopo; Khoshzaban, Reza; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567198]. 1-gen-2024 Cantoro, RiccardoGrosso, MichelangeloKhoshzaban, RezaReorda, Matteo Sonza + _ETS_2024__Assessing_the_Effectiveness_of_Software_Based_Self_Test_Programs_for_Static_Cell_Aware_Test-8.pdf; Assessing_the_Effectiveness_of_Software-Based_Self-Test_Programs_for_Static_Cell-Aware_Test.pdf
COVID-19 Detection from Exhaled Breath / Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; Squillero, Giovanni; Bozzini, Giorgio; Castelletti, Francesco; Ciricugno, Carla; Dalla Gasperina, Daniela; Dentali, Francesco; Poggialini, Giovanni; Salerno, Piergiorgio; Stefanotaborelli,. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - 14:(2024). [10.1038/s41598-024-74104-1] 1-gen-2024 Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + SCIENTIFIC_REPORTS_REVIEW.pdf; Bellarmino_et_al-2024-Scientific_Reports.pdf
Defects, Fault Modeling, and Test Development Framework for FeFETs / Wang, Changhao; Yuan, Sicong; Xun, Hanzhi; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Chen, Danyang; Li, Xiuyan; Wang, Lin; Cantoro, Riccardo; Yin, Chujun; Hamdioui, Said. - (2024), pp. 91-95. (Intervento presentato al convegno International Test Conference (ITC) 2024 tenutosi a San Diego (USA) nel 03-08 November 2024) [10.1109/ITC51657.2024.00026]. 1-gen-2024 Riccardo, CantoroSaid, Hamdioui + 2024_ITC_A_framework_of_defect_oritned_testing_for_FeFETs_2.pdf; Defects_Fault_Modeling_and_Test_Development_Framework_for_FeFETs.pdf
Embedded Feature Selection in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2024), pp. 1-6. (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FRA) nel October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. 1-gen-2024 Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf