CANTORO, RICCARDO

CANTORO, RICCARDO  

Dipartimento di Automatica e Informatica  

021727  

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About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications / Cantoro, R.; Firrincieli, Andrea; Piumatti, D.; Restifo, M.; Sanchez, E.; Reorda, M. Sonza. - STAMPA. - 2018-:(2018), pp. 1-6. ((Intervento presentato al convegno 19th IEEE Latin-American Test Symposium, LATS 2018 tenutosi a bra nel 2018 [10.1109/LATW.2018.8349679]. 1-gen-2018 Cantoro, R.FIRRINCIELI, ANDREAPiumatti, D.Restifo, M.Sanchez, E.Reorda, M. Sonza 08349679.pdflats18 preprint.pdf
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34:(2018), pp. 43-52. [10.1007/s10836-018-5705-1] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoFederico Venini + JETTA_FINAL.pdf
An analysis of test solutions for COTS-based systems in space applications / Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Ernesto, Sanchez; SONZA REORDA, Matteo; Mess, Jan-Gerd. - ELETTRONICO. - IEEE VLSI-SOC 2018:(2019), pp. 1-6. ((Intervento presentato al convegno 2018 IFIP/IEEE 26th International Conference on Very Large Scale Integration (VLSI-SOC) tenutosi a Verona (Italy) nel 8-10 Ottobre 2018 [10.1109/VLSI-SoC.2018.8644846]. 1-gen-2019 Riccardo CantoroCARBONARA, SARAAndrea FloridiaErnesto SanchezMatteo Sonza Reorda + -
Automated Test Program Reordering for Efficient SBST / Cantoro, Riccardo; Cetrulo, E.; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Voza, A.. - STAMPA. - (2017), pp. 1-6. ((Intervento presentato al convegno Design of Circuits and Integrated Systems Conference (DCIS2017) tenutosi a Barcelona nel 22-24 November 2017 [10.1109/DCIS.2017.8311634]. 1-gen-2017 CANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO + CAD_NOSTRUT_CR_SUBMITTED.pdf
Automatic generation of stimuli for fault diagnosis in IEEE 1687 networks / Cantoro, Riccardo; Montazeri, M.; SONZA REORDA, Matteo; Zadegan, F. Ghani; Larsson, E.. - STAMPA. - (2016), pp. 167-172. ((Intervento presentato al convegno 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS) nel 4-6 July 2016 [10.1109/IOLTS.2016.7604692]. 1-gen-2016 CANTORO, RICCARDOSONZA REORDA, Matteo + PUBLISHED_07604692.pdf
Comparing different approaches to the test of Reconfigurable Scan Networks / Cantoro, Riccardo; Damljanovic, Aleksa; Sonza Reorda, Matteo; Squillero, Giovanni. - ELETTRONICO. - (2018). ((Intervento presentato al convegno 3RD INTERNATIONAL TEST STANDARDS APPLICATION WORKSHOP (TESTA) tenutosi a Bremen, Germany nel May 31st – June 1st, 2018. 1-gen-2018 Cantoro, RiccardoDamljanovic, AleksaSonza Reorda, MatteoSquillero, Giovanni TESTA_ETS_2018.pdf
Correction to: Improved Test Solutions for COTS-Based Systems in Space Applications / Cantoro, Riccardo; Carbonara, Sara; Floridia, Andrea; Sanchez, Ernesto; Sonza Reorda, Matteo; Mess, Jan-Gerd. - ELETTRONICO. - 561:(2019), pp. 187-206. [10.1007/978-3-030-23425-6_14] 1-gen-2019 Cantoro, RiccardoCarbonara, SaraFloridia, AndreaSanchez, ErnestoSonza Reorda, Matteo + -
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs / da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian. - ELETTRONICO. - (2020), pp. 1-6. ((Intervento presentato al convegno 2020 IEEE European Test Symposium (ETS) tenutosi a Tallinn, Estonia nel 25-29 May 2020 [10.1109/ETS48528.2020.9131568]. 1-gen-2020 Sartoni, SandroCantoro, RiccardoReorda, Matteo SonzaHamdioui, Said + PUBLISHED-09131568.pdfETS20___Determined_Safe_Faults_Identification.pdf
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2016), pp. 744-754. [10.1109/TC.2015.2498546] 1-gen-2016 BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTO + 07321794.pdf07321794-1.pdf
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller / Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Venini, Federico; Appello, D.. - STAMPA. - (2017), pp. 1-6. ((Intervento presentato al convegno 2017 18th IEEE Latin American Test Symposium (LATS) tenutosi a Bogota (CO) nel 13-15 March 2017 [10.1109/LATW.2017.7906767]. 1-gen-2017 BERNARDI, PAOLOCANTORO, RICCARDORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + PUBLISHED_07906767.pdf
Effective generation and evaluation of diagnostic SBST programs / Riefert, Andreas; Cantoro, Riccardo; Sauer, Matthias; SONZA REORDA, Matteo; Becker, Bernd. - STAMPA. - 2016-:(2016), pp. 1-6. ((Intervento presentato al convegno 34th IEEE VLSI Test Symposium, VTS 2016 tenutosi a Las Vegas (USA) nel 25-27 April 2016 [10.1109/VTS.2016.7477279]. 1-gen-2016 CANTORO, RICCARDOSONZA REORDA, Matteo + PUBLISHED-07477279.pdf
Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor / Deligiannis, Nikolaos; Cantoro, Riccardo; Faller, Tobias; Paxian, Tobias; Becker, Bernd; Sonza Reorda, Matteo. - (2021), pp. 73-78. ((Intervento presentato al convegno Asian Test Symposium (ATS) nel 22-25 Nov. 2021 [10.1109/ATS52891.2021.00025]. 1-gen-2021 Nikolaos DeligiannisRiccardo CantoroMatteo Sonza Reorda + 2021178103.pdfEffective_SAT-based_Solutions_for_Generating_Functional_Sequences_Maximizing_the_Sustained_Switching_Activity_in_a_Pipelined_Processor.pdf
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. ((Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022 [10.1109/ETS54262.2022.9810392]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoSartoni, SandroReorda, Matteo Sonza + ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdfEffective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf
An Enhanced Evolutionary Technique for the Generation of Compact Reconfigurable Scan-Network Tests / Cantoro, Riccardo; Damljanovic, Aleksa; SONZA REORDA, Matteo; Squillero, Giovanni. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - ELETTRONICO. - (2019). [10.1142/S0218126619400073] 1-gen-2019 Riccardo CantoroAleksa DamljanovicMatteo Sonza ReordaGiovanni Squillero JCSC2019_preprint_draft.pdfJCSC_postprint_draft.pdf
Evaluating Data Encryption Effects on the Resilience of an Artificial Neural Network / Cantoro, Riccardo; Deligiannis, Nikolaos; Reorda, Matteo Sonza; Traiola, Marcello; Valea, Emanuele. - ELETTRONICO. - (2020), pp. 1-4. ((Intervento presentato al convegno 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) [10.1109/DFT50435.2020.9250869]. 1-gen-2020 Cantoro, RiccardoDeligiannis, NikolaosReorda, Matteo SonzaValea, Emanuele + Camera Ready.pdf09250869.pdf
Evaluating the Code Encryption Effects on Memory Fault Resilience / Cantoro, R.; Deligiannis, N.; Sonza Reorda, M.; Traiola, M.; Valea, E.. - ELETTRONICO. - (2020), pp. 1-6. ((Intervento presentato al convegno 21st IEEE Latin-American Test Symposium, LATS 2020 tenutosi a Maceio, Brazil nel 30 March-2 April 2020 [10.1109/LATS49555.2020.9093670]. 1-gen-2020 Cantoro R.Deligiannis N.Sonza Reorda M.Valea E. + PUBLISHED-09093670.pdf_LATS2020__Evaluating_the_Code_Encryption_Effects_on_Memory_Fault_Resilience.pdf
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + JOLPE_FINAL.pdf
An Evolutionary Approach for Test Program Compaction / Cantoro, Riccardo; Gaudesi, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schiavone, P.; Squillero, Giovanni. - STAMPA. - 1:(2015), pp. 1-6. ((Intervento presentato al convegno 16th Latin-American Test Symposium tenutosi a Puerto Vallarta, Mexico nel March 25-27 [10.1109/LATW.2015.7102406]. 1-gen-2015 CANTORO, RICCARDOGAUDESI, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, Giovanni + -
An evolutionary technique for reducing the duration of reconfigurable scan network test / Cantoro, Riccardo; San Paolo, Luigi; Sonza Reorda, Matteo; Squillero, Giovanni. - STAMPA. - (2018), pp. 129-134. ((Intervento presentato al convegno 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2018 tenutosi a hun nel 2018 [10.1109/DDECS.2018.00030]. 1-gen-2018 Cantoro, RiccardoSonza Reorda, MatteoSquillero, Giovanni + -
Exploiting Active Learning for Microcontroller Performance Prediction / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2021), pp. 1-4. ((Intervento presentato al convegno 2021 IEEE European Test Symposium nel 24-28 May 2021 [10.1109/ETS50041.2021.9465472]. 1-gen-2021 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + ETS21___Speed_Monitors__Camera_ready.pdfExploiting_Active_Learning_for_Microcontroller_Performance_Prediction.pdf