HAMDIOUI, SAID

HAMDIOUI, SAID  

028262  

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Citazione Data di pubblicazione Autori File
An efficient method for the test of embedded memory cores during the operational phase / Bernardi, Paolo; Ciganda, LYL MERCEDES; SONZA REORDA, Matteo; Hamdioui, Said. - STAMPA. - (2013), pp. 227-232. ((Intervento presentato al convegno 2013 22nd Asian Test Symposium tenutosi a Yilan, Taiwan nel Nov. 2013. 1-gen-2013 BERNARDI, PAOLOCIGANDA, LYL MERCEDESSONZA REORDA, MatteoHAMDIOUI, SAID 5080a227.pdf
Automated Identification of Application-Dependent Safe Faults in Automotive Systems-on-a-Chips / Bagbaba, A. C.; da Silva, F. A.; Reorda, M. S.; Hamdioui, S.; Jenihhin, M.; Sauer, C.. - In: ELECTRONICS. - ISSN 2079-9292. - 11:3(2022), p. 319. [10.3390/electronics11030319] 1-gen-2022 Reorda M. S.Hamdioui S. + electronics-11-00319-v2.pdf
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs / da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian. - ELETTRONICO. - (2020), pp. 1-6. ((Intervento presentato al convegno 2020 IEEE European Test Symposium (ETS) tenutosi a Tallinn, Estonia nel 25-29 May 2020 [10.1109/ETS48528.2020.9131568]. 1-gen-2020 Sartoni, SandroCantoro, RiccardoReorda, Matteo SonzaHamdioui, Said + PUBLISHED-09131568.pdfETS20___Determined_Safe_Faults_Identification.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (In corso di stampa). ((Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS). In corso di stampa P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf
Special Session: AutoSoC - A Suite of Open-Source Automotive SoC Benchmarks / Da Silva, F. A.; Cagri Bagbaba, A.; Ruospo, A.; Mariani, R.; Kanawati, G.; Sanchez, E.; Reorda, M. S.; Jenihhin, M.; Hamdioui, S.; Sauer, C.. - ELETTRONICO. - 2020-:(2020), pp. 1-9. ((Intervento presentato al convegno 38th IEEE VLSI Test Symposium, VTS 2020 tenutosi a usa nel 2020 [10.1109/VTS48691.2020.9107599]. 1-gen-2020 Ruospo A.Sanchez E.Reorda M. S.Hamdioui S. + autosoc.pdfAutoSoC___VTS_Special_Session_postprint.pdf
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] 1-gen-2022 Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + electronics-11-02481-v2.pdf
Untestable faults identification in GPGPUs for safety-critical applications / Condia, Josie E. Rodriguez; Da Silva, Felipe A.; Hamdioui, S.; Sauer, C.; Reorda, M. Sonza. - ELETTRONICO. - (2019), pp. 570-573. ((Intervento presentato al convegno 2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) tenutosi a Genova nel 27-29 Nov. 2019 [10.1109/ICECS46596.2019.8964677]. 1-gen-2019 Condia, Josie E. RodriguezHamdioui, S.Reorda, M. Sonza + camera ready version.pdf08964677.pdf
Using STLs for Effective In-field Test of GPUs / Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, Guerrero-Balaguera; Hamdioui, Said; Sauer, Christian; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - (2022), pp. 1-1. [10.1109/MDAT.2022.3188573] 1-gen-2022 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraSaid HamdiouiMatteo Sonza Reorda + DT_DT-2021-10-0106.R2_RODRIGUEZ CONDIA.pdf