PORTO @ Archivio Istituzionale della Ricerca

SARTONI, SANDRO

SARTONI, SANDRO  

Dipartimento di Automatica e Informatica  

050789  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.028 secondi).
Citazione Data di pubblicazione Autori File
Evaluating the Impact of Aging on Path-Delay Self-Test Libraries / Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele. - (2023). (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023 tenutosi a Juan-Les-Pins (FRA) nel 03-05 October 2023) [10.1109/dft59622.2023.10313531]. 1-gen-2023 Cantoro, RiccardoSartoni, SandroReorda, Matteo SonzaPortolan, Michele + _DFTS2023__Evaluating_the_Impact_of_Aging_on_Path_Delay_Self_Test_Libraries-3.pdf; Evaluating_the_Impact_of_Aging_on_Path-Delay_Self-Test_Libraries.pdf
New Techniques to Detect and Mitigate Aging Effects in Advanced Semiconductor Technologies / Sartoni, Sandro. - (2023 Nov 03), pp. 1-177. 3-nov-2023 SARTONI, SANDRO conv_phdthesis-final.pdf; conv_phd_summary-1.pdf
Self-Test Library Generation for In-field Test of Path Delay faults / Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4246-4259. [10.1109/TCAD.2023.3268210] 1-gen-2023 Riccardo CantoroRiccardo MasanteMichele PortolanSandro SartoniMatteo Sonza Reorda + IEEE_TCAD_____Self_Test_Library_Generation_for_In_field_Test_of_Path_Delay_faults.pdf; Self-Test_Library_Generation_for_In-Field_Test_of_Path_Delay_Faults.pdf
A Systematic Method to Generate Effective STLs for the In-Field Test of CAN Bus Controllers / da Silva, Felipe Augusto; Cantoro, Riccardo; Hamdioui, Said; Sartoni, Sandro; Sauer, Christian; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 11:16(2022), p. 2481. [10.3390/electronics11162481] 1-gen-2022 Cantoro, RiccardoHamdioui, SaidSartoni, SandroSonza Reorda, Matteo + electronics-11-02481-v2.pdf
Effective techniques for automatically improving the transition delay fault coverage of Self-Test Libraries / Cantoro, Riccardo; Garau, Francesco; Girard, Patrick; Kolahimahmoudi, Nima; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2022), pp. 1-2. (Intervento presentato al convegno 2022 IEEE European Test Symposium tenutosi a Barcelona (SP) nel 23-27 Maggio 2022) [10.1109/ETS54262.2022.9810392]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoKolahimahmoudi, NimaSartoni, SandroReorda, Matteo Sonza + ETS22___Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self_Test_Libraries.pdf; Effective_techniques_for_automatically_improving_the_transition_delay_fault_coverage_of_Self-Test_Libraries.pdf
Exploiting post-silicon debug hardware to improve the fault coverage of Software Test Libraries / Cantoro, Riccardo; Garau, Francesco; Masante, Riccardo; Sartoni, Sandro; Singh, Virendra; Reorda, Matteo Sonza. - (2022), pp. 1-7. (Intervento presentato al convegno 2022 IEEE 40th VLSI Test Symposium (VTS) tenutosi a San Diego (USA) nel 25-27 Aprile 2022) [10.1109/VTS52500.2021.9794219]. 1-gen-2022 Cantoro, RiccardoGarau, FrancescoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + VTS22___Exploiting_post_silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries__CAMERA_READY_.pdf; Exploiting_post-silicon_debug_hardware_to_improve_the_fault_coverage_of_Software_Test_Libraries.pdf
Recent Trends and Perspectives on Defect-Oriented Testing / Bernardi, P.; Cantoro, R.; Coyette, A.; Dobbeleare, W.; Fieback, M.; Floridia, A.; Gielen, G.; Gomez, J.; Grosso, M.; Guerriero, A. M.; Guglielminetti, I.; Hamdioui, S.; Insinga, G.; Mautone, N.; Mirabella, N.; Sartoni, S.; Sonza Reorda, M.; Ullmann, R.; Vanhooren, R.; Xama, N.; Wu, L.. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino (Italy) nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897647]. 1-gen-2022 P. BernardiR. CantoroA. FloridiaM. GrossoS. HamdiouiG. InsingaN. MirabellaS. SartoniM. Sonza ReordaL. Wu + _IOLTS2022__Special_Session__Recent_Trends_and_Perspectives_on_Defect_Oriented_Testing.pdf; Recent_Trends_and_Perspectives_on_Defect-Oriented_Testing.pdf
Self-Test Libraries Analysis for Pipelined Processors Transition Fault Coverage Improvement / Cantoro, Riccardo; Girard, Patrick; Masante, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Virazel, Arnaud. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) nel 28-30 June 2021) [10.1109/IOLTS52814.2021.9486711]. 1-gen-2021 Cantoro, RiccardoMasante, RiccardoSartoni, SandroReorda, Matteo Sonza + IOLTS21__Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf; Self-Test_Libraries_Analysis_for_Pipelined_Processors_Transition_Fault_Coverage_Improvement.pdf
Determined-Safe Faults Identification: A step towards ISO26262 hardware compliant designs / da Silva, Felipe Augusto; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Reorda, Matteo Sonza; Hamdioui, Said; Sauer, Christian. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 2020 IEEE European Test Symposium (ETS) tenutosi a Tallinn, Estonia nel 25-29 May 2020) [10.1109/ETS48528.2020.9131568]. 1-gen-2020 Sartoni, SandroCantoro, RiccardoReorda, Matteo SonzaHamdioui, Said + PUBLISHED-09131568.pdf; ETS20___Determined_Safe_Faults_Identification.pdf
In-field Functional Test of CAN Bus Controllers / Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno IEEE VLSI Test Symposium 2020) [10.1109/VTS48691.2020.9107628]. 1-gen-2020 Cantoro, RiccardoSartoni, SandroReorda, Matteo Sonza 09107628.pdf; VTS20___CAN_Test.pdf
New Perspectives on Core In-field Path Delay Test / Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; Portolan, Michele. - ELETTRONICO. - (2020), pp. 1-5. (Intervento presentato al convegno 2020 IEEE International Test Conference (ITC) tenutosi a Washington DC (USA) nel 01-06 November 2020) [10.1109/ITC44778.2020.9325260]. 1-gen-2020 Cantoro, RiccardoFoti, DarioSartoni, SandroSonza Reorda, MatteoPortolan, Michele + New_Perspectives_on_Core_In-field_Path_Delay_Test.pdf; ITC20___New_Perspectives_on_Core_In_field_Path_Delay_Test.pdf