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Evaluating the Impact of Aging on Path-Delay Self-Test Libraries
2023 Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele
Self-Test Library Generation for In-field Test of Path Delay faults
2023 Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo
New Perspectives on Core In-field Path Delay Test
2020 Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; Portolan, Michele
A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks
2019 Portolan, Michele; Cantoro, Riccardo; Ernesto, Sanchez
Alternatives to fault injections for early safety/security evaluations
2019 Portolan, M.; Savino, A.; Leveugle, R.; Di Carlo, S.; Bosio, A.; Di Natale, G.
Approximate computing design exploration through data lifetime metrics
2019 Savino, A.; Portolan, Michele; Leveugle, R.; Di Carlo, S.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Evaluating the Impact of Aging on Path-Delay Self-Test Libraries / Cantoro, Riccardo; Sartoni, Sandro; Reorda, Matteo Sonza; Anghel, Lorena; Portolan, Michele. - (2023). (Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) 2023 tenutosi a Juan-Les-Pins (FRA) nel 03-05 October 2023) [10.1109/dft59622.2023.10313531]. | 1-gen-2023 | Cantoro, RiccardoSartoni, SandroReorda, Matteo SonzaPortolan, Michele + | _DFTS2023__Evaluating_the_Impact_of_Aging_on_Path_Delay_Self_Test_Libraries-3.pdf; Evaluating_the_Impact_of_Aging_on_Path-Delay_Self-Test_Libraries.pdf |
| Self-Test Library Generation for In-field Test of Path Delay faults / Anghel, Lorena; Cantoro, Riccardo; Masante, Riccardo; Portolan, Michele; Sartoni, Sandro; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:11(2023), pp. 4246-4259. [10.1109/TCAD.2023.3268210] | 1-gen-2023 | Riccardo CantoroRiccardo MasanteMichele PortolanSandro SartoniMatteo Sonza Reorda + | IEEE_TCAD_____Self_Test_Library_Generation_for_In_field_Test_of_Path_Delay_faults.pdf; Self-Test_Library_Generation_for_In-Field_Test_of_Path_Delay_Faults.pdf |
| New Perspectives on Core In-field Path Delay Test / Cantoro, Riccardo; Foti, Dario; Sartoni, Sandro; Sonza Reorda, Matteo; Anghel, Lorena; Portolan, Michele. - ELETTRONICO. - (2020), pp. 1-5. (Intervento presentato al convegno 2020 IEEE International Test Conference (ITC) tenutosi a Washington DC (USA) nel 01-06 November 2020) [10.1109/ITC44778.2020.9325260]. | 1-gen-2020 | Cantoro, RiccardoFoti, DarioSartoni, SandroSonza Reorda, MatteoPortolan, Michele + | New_Perspectives_on_Core_In-field_Path_Delay_Test.pdf; ITC20___New_Perspectives_on_Core_In_field_Path_Delay_Test.pdf |
| A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks / Portolan, Michele; Cantoro, Riccardo; Ernesto, Sanchez. - ELETTRONICO. - (2019), pp. 1-2. (Intervento presentato al convegno 2019 IEEE European Test Symposium (ETS) tenutosi a Baden-Baden, Germany nel 27-31 May 2019) [10.1109/ETS.2019.8791522]. | 1-gen-2019 | Michele PortolanRiccardo CantoroErnesto Sanchez | CAMERA_READY-ets19-38.pdf; PUBLISHED-08791522.pdf |
| Alternatives to fault injections for early safety/security evaluations / Portolan, M.; Savino, A.; Leveugle, R.; Di Carlo, S.; Bosio, A.; Di Natale, G.. - ELETTRONICO. - (2019), pp. 1-10. (Intervento presentato al convegno 24th IEEE European Test Symposium (ETS 2019) tenutosi a Baden Baden, D nel 27-31 May 2019) [10.1109/ETS.2019.8791555]. | 1-gen-2019 | Portolan M.Savino A.Di Carlo S. + | ETS2019_SS.pdf |
| Approximate computing design exploration through data lifetime metrics / Savino, A.; Portolan, Michele; Leveugle, R.; Di Carlo, S.. - ELETTRONICO. - (2019), pp. 1-7. (Intervento presentato al convegno 24th IEEE European Test Symposium (ETS 2019) tenutosi a Baden Baden, D nel May 27-31 2019) [10.1109/ETS.2019.8791523]. | 1-gen-2019 | Savino A.PORTOLAN, MICHELEDi Carlo S. + | ETS19_CAMERAREADY_V1.2.pdf |