The IEEE 1687 standard introduces several novelties, most notably Reconfigurable Scan Networks (RSNs), i.e., scan chains whose length can change dynamically. These architectures offer important advantages but can result in extremely complex integrity test following traditional structural approaches. In this paper, we will present an innovative approach to RSN test and debug based on the functional features of the standard, which is able to greatly speed up test generation time while guaranteeing a precise fault coverage.

A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks / Portolan, Michele; Cantoro, Riccardo; Ernesto, Sanchez. - ELETTRONICO. - (2019), pp. 1-2. ((Intervento presentato al convegno 2019 IEEE European Test Symposium (ETS) tenutosi a Baden-Baden, Germany nel 27-31 May 2019 [10.1109/ETS.2019.8791522].

A Functional Approach to Test and Debug of IEEE 1687 Reconfigurable Networks

Michele Portolan;Riccardo Cantoro;Ernesto Sanchez
2019

Abstract

The IEEE 1687 standard introduces several novelties, most notably Reconfigurable Scan Networks (RSNs), i.e., scan chains whose length can change dynamically. These architectures offer important advantages but can result in extremely complex integrity test following traditional structural approaches. In this paper, we will present an innovative approach to RSN test and debug based on the functional features of the standard, which is able to greatly speed up test generation time while guaranteeing a precise fault coverage.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11583/2838561