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SANCHEZ SANCHEZ, EDGAR ERNESTO

SANCHEZ SANCHEZ, EDGAR ERNESTO  

Dipartimento di Automatica e Informatica  

Sanchez, Ernesto; E. Sanchez; Sanchez E.; Ernesto Sanchez; SANCHEZ EDGAR; SANCHEZ E.; SANCHEZ SANCHEZ EDGAR ERNESTO; SANCHEZ SANCHEZ E.  

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Citazione Data di pubblicazione Autori File
Power Side-Channel Vulnerabilities of a RISC-V Cryptography Accelerator Integrated into CVA6 via Core-V eXtension Interface (CV-X-IF) / Farnaghinejad, Behnam; Bellizia, Davide; Dolmeta, Alessandra; Masera, Guido; Porsia, Antonio; Ruospo, Annachiara; Di Carlo, Stefano; Savino, Alessandro; Sanchez, Ernesto. - (In corso di stampa), pp. 1-10. (Intervento presentato al convegno International Test Conference 2025 tenutosi a San Diego, California (USA) nel September 21-26, 2025). In corso di stampa Behnam FarnaghinejadAlessandra DolmetaGuido MaseraAntonio PorsiaAnnachiara RuospoStefano Di CarloAlessandro SavinoErnesto Sanchez + ITC2025___Power_Side_Channel_Vulnerabilities_of_a_RISC_V_Cryptography_Accelerator_Integrated_into_CVA6_via_CV_X_IF.pdf
An Effective Iterative Statistical Fault Injection Methodology for Deep Neural Networks / Ruospo, Annachiara; Reorda, Matteo Sonza; Mariani, Riccardo; Sanchez, Ernesto. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - ELETTRONICO. - 74:7(2025), pp. 2431-2444. [10.1109/tc.2025.3566863] 1-gen-2025 Ruospo, AnnachiaraReorda, Matteo SonzaSanchez, Ernesto + An_Effective_Iterative_Statistical_Fault_Injection_Methodology_for_Deep_Neural_Networks.pdf; An_Effective_Iterative_Statistical_Fault_Injection_Methodology_for_Deep_Neural_Networks.pdf
Benchmark Suite for Resilience Assessment of Deep Learning Models / Bolchini, Cristiana; Bosio, Alberto; Cassano, Luca; Miele, Antonio; Pappalardo, Salvatore; Passarello, Dario; Ruospo, Annachiara; Sanchez, Ernesto; Sonza Reorda, Matteo; Turco, Vittorio. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - (2025). [10.1109/TCAD.2025.3578297] 1-gen-2025 Annachiara RuospoErnesto SanchezMatteo Sonza ReordaVittorio Turco + Benchmark_Suite_for_Resilience_Assessment_of_Deep_Learning_Models.pdf
Bi-LORD: Bit-Wise Low-Cost Real Numbers Dependability Assessment in AI Applications / Azziz, Julia; Ruospo, Annachiara; Sanchez, Ernesto; Acle, Julio Pérez. - (2025), pp. 1-6. (Intervento presentato al convegno 26th IEEE Latin American Test Symposium, LATS 2025 tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963952]. 1-gen-2025 Ruospo, AnnachiaraSanchez, Ernesto + lats25_posit.pdf; Bi-LORD_Bit-Wise_Low-Cost_Real_Numbers_Dependability_Assessment_in_AI_Applications.pdf
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 13-18. (Intervento presentato al convegno 28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Lyon (FRA) nel May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. 1-gen-2025 Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf
DOC: Detection of On-Line Failures in CNNs / Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno Latin American Test Workshop, LATW tenutosi a San Andrés (COL) nel 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. 1-gen-2025 Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf
Image Test Libraries for the in-field test of ultra-low-power devices / Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2025). (Intervento presentato al convegno Latin American Test Workshop, LATW tenutosi a San Andrés (Colombia) nel 11-14 March 2025) [10.1109/LATS65346.2025.10963940]. 1-gen-2025 Porsia, AntonioPerlo, GiacomoRuospo, AnnachiaraSanchez, Ernesto LATS25_ITL-3.pdf; Image_Test_Libraries_for_the_In-Field_Test_of_Ultra-Low-Power_Devices.pdf
Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - 15509:(2025), pp. 67-81. (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Castiglione della Pescaia (ITA) nel September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. 1-gen-2025 Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf
Late Contribution: VeriSide: A Modified Verilator for Leakage Assessment at the RTL Level / Farnaghinejad, Behnam; Porsia, Antonio; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto. - (2025), pp. 1-2. (Intervento presentato al convegno 26th IEEE Latin American Test Samposium 2025 tenutosi a San Andres Islas (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963943]. 1-gen-2025 Farnaghinejad, BehnamPorsia, AntonioRuospo, AnnachiaraSavino, AlessandroDi Carlo, StefanoSanchez, Ernesto LATS2025_IRIS.pdf; Late_Contribution_VeriSide_A_Modified_Verilator_for_Leakage_Assessment_at_the_RTL_Level.pdf
On the resilience of INT8 Quantized Neural Networks on Low-Power RISC-V Devices / Porsia, Antonio; Perlo, Giacomo; Ruospo, Annachiara; Sanchez, Ernesto. - (2025), pp. 119-122. (Intervento presentato al convegno AxC’25 The 10th Workshop on Approximate Computing tenutosi a Naples (Ita) nel June 23-26, 2025) [10.1109/DSN-W65791.2025.00049]. 1-gen-2025 Antonio PorsiaGiacomo PerloAnnachiara RuospoErnesto Sanchez AxC2025.pdf; On_the_Resilience_of_INT8_Quantized_Neural_Networks_on_Low-Power_RISC-V_Devices.pdf
Reliability of Deep Neural Networks: Impact and Open Issues / Ruospo, A.; Pappalardo, S.; Turco, V.; Bosio, A.; Sanchez, E.. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 42:3(2025), pp. 14-25. [10.1109/MDAT.2025.3544125] 1-gen-2025 Ruospo A.Turco V.Bosio A.Sanchez E. + DesignAndTest___TPTR_Special_Issue.pdf; Reliability_of_Deep_Neural_Networks_Impact_and_Open_Issues.pdf
Special Session: Trustworthy Hardware-AI at the Cloud / Angione, Francesco; Bernardi, Paolo; Bosio, Alberto; Dattatraya Dixit, Harish; Pappalardo, Salvatore; Ruospo, Annachiara; Sanchez, Ernesto; Sinha, Arani; Turco, Vittorio. - ELETTRONICO. - (2025). (Intervento presentato al convegno IEEE VLSI Test Symposium 2025 tenutosi a Tempe, Arizona (USA) nel 28-30 April 2025) [10.1109/VTS65138.2025.11022869]. 1-gen-2025 Francesco AngionePaolo BernardiAnnachiara RuospoErnesto SanchezVittorio Turco + VTS25___Special_Session.pdf; Special_Session_Trustworthy_Hardware-AI_at_the_Cloud.pdf
AI Eye Charts: measuring the visual acuity of Neural Networks with test images / Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2024), pp. 1-5. (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FR) nel 14-16 October 2024) [10.1109/DTTIS62212.2024.10780079]. 1-gen-2024 Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto ITL_SpecialSession-1.pdf; AI_Eye_Charts_measuring_the_visual_acuity_of_Neural_Networks_with_test_images.pdf
An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs / Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534609]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidSanchez, Ernesto + An_Integrated_Environment_for_the_Reliability_Assessment_of_CNNs_Accelerators_Implemented_in_FPGAs.pdf
Approximate Fault-Tolerant Neural Network Systems / Traiola, Marcello; Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto; Saeedi, Sepide; Carpegna, Alessio; Göğebakan, Anıl Bayram; Magliano, Enrico; Savino, Alessandro. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno IEEE European Test Symposium (ETS) 2024 tenutosi a Der Haag (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567290]. 1-gen-2024 Ruospo, AnnachiaraSanchez, ErnestoSaeedi, SepideCarpegna, AlessioMagliano, EnricoSavino, Alessandro + Paper___ETS24___Embedded_Tutorial.pdf; Approximate_Fault-Tolerant_Neural_Network_Systems.pdf
CAN-MM: Multiplexed Message Authentication Code for Controller Area Network Message Authentication in Road Vehicles / Oberti, Franco; Savino, Alessandro; Sanchez, Ernesto; Casasso, Paolo; Parisi, Filippo; Carlo, Stefano Di. - In: IEEE TRANSACTIONS ON VEHICULAR TECHNOLOGY. - ISSN 0018-9545. - STAMPA. - 73:10(2024), pp. 14661-14673. [10.1109/tvt.2024.3402986] 1-gen-2024 Oberti, FrancoSavino, AlessandroSanchez, ErnestoCarlo, Stefano Di + CAN-MM_Multiplexed_Message_Authentication_Code_for_Controller_Area_Network_Message_Authentication_in_Road_Vehicles.pdf
Early Detection of Permanent Faults in DNNs Through the Application of Tensor-Related Metrics / Turco, V.; Ruospo, A.; Sanchez, E.; Sonza Reorda, M.. - ELETTRONICO. - (2024), pp. 13-18. (Intervento presentato al convegno 2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Kielce (POL) nel 03-05 April 2024) [10.1109/DDECS60919.2024.10508918]. 1-gen-2024 Turco V.Ruospo A.Sanchez E.Sonza Reorda M. Early_Detection_of_Permanent_Faults_in_DNNs_Through_the_Application_of_Tensor-Related_Metrics.pdf
Model theft attack against a tinyML application running on an Ultra-Low-Power Open-Source SoC / Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto. - ELETTRONICO. - (2024), pp. 63-66. (Intervento presentato al convegno 21st ACM International Conference on Computing Frontiers Workshops and Special Sessions (CF '24 Companion) tenutosi a Ischia (IT) nel 07-09/05/2024) [10.1145/3637543.3652877]. 1-gen-2024 Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto OSHW24.pdf; 3637543.3652877.pdf
Reliable and Efficient hardware for Trustworthy Deep Neural Networks / Pappalardo, Salvatore; Piri, Ali; Ruospo, Annachiara; Deveautour, Bastien; Sanchez, Ernesto; Bosio, Alberto. - ELETTRONICO. - (2024), pp. 1-5. (Intervento presentato al convegno 2024 IEEE International Conference on Design, Test and Technology of Integrated Systems, DTTIS 2024 tenutosi a Aix-en-Provence (FRA) nel 14-16 October 2024) [10.1109/dttis62212.2024.10780183]. 1-gen-2024 Ruospo, AnnachiaraSanchez, Ernesto + DTTIS2024_SS.pdf; Reliable_and_Efficient_hardware_for_Trustworthy_Deep_Neural_Networks.pdf
Resiliency approaches in Convolutional, Photonic, and Spiking Neural Networks / Bosio, Alberto; Gomes, Mauricio; Pavanello, Fabio; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Vatajelu, Elena Ioana. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceió (BRA) nel 09-12 April 2024) [10.1109/LATS62223.2024.10534615]. 1-gen-2024 Porsia, AntonioRuospo, AnnachiaraSanchez, Ernesto + LATS24_SpecialSession.pdf; Resiliency_Approaches_in_Convolutional_Photonic_and_Spiking_Neural_Networks.pdf