Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
2004 D., Appello; A., Fudoli; V., Tancorre; Bernardi, Paolo; Corno, Fulvio; Rebaudengo, Maurizio; SONZA REORDA, Matteo
A comprehensive evaluation of functional programs for power-aware test
2014 Touati, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernardi, P.
A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC
2017 Bernardi, Paolo; Appello, Davide; Giacopelli, Giampaolo; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Rabbi, Christian; Restifo, Marco; Ruberg, Priit; Sanchez, Ernesto; Villa, Claudio Maria; Venini, Federico
A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores
2009 Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
2017 Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Venini, Federico; Appello, D.
A fault grading methodology for software-based self-test programs in systems-on-chip
2010 Ballan, O.; Bernardi, Paolo; Fontana, G.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO
A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors
2013 Bernardi, Paolo; Du, Boyang; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Grosso, Michelangelo; Ballan, O.
A guided debugger-based fault injection methodology for assessing functional test programs
2023 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs
2010 Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo
A Hybrid Approach to Fault Detection and Correction in SoCs
2007 Bernardi, Paolo; VEIRAS BOLZANI, Leticia Maria; SONZA REORDA, Matteo
A hybrid in-field self-test technique for SoCs
2019 Carbonara, S.; Bernardi, P.; Restifo, M.
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2023 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip
2019 Manzini, A.; Inglese, P.; Caldi, L.; Cantoro, R.; Carnevale, G.; Coppetta, M.; Giltrelli, M.; Mautone, N.; Irrera, F.; Ullmann, R.; Bernardi, P.
A new Architecture to Cross-Fertilize On-line and Manufacturing Testing
2011 Bernardi, Paolo; SONZA REORDA, Matteo
A new DFM-proactive technique
2005 D., Appello; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo; V., Tancorre
A new hybrid fault detection technique for systems-on-a-chip
2006 Bernardi, Paolo; VEIRAS BOLZANI, Leticia Maria; Rebaudengo, Maurizio; SONZA REORDA, Matteo; F. L., Vargas; Violante, Massimo
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
2022 Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre
A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm
2008 Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
A novel SEU injection setup for Automotive SoC
2022 Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques / D., Appello; A., Fudoli; V., Tancorre; Bernardi, Paolo; Corno, Fulvio; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 20:(2004), pp. 79-87. [10.1023/B:JETT.0000009315.57771.94] | 1-gen-2004 | BERNARDI, PAOLOCORNO, FulvioREBAUDENGO, MaurizioSONZA REORDA, Matteo + | - |
| A comprehensive evaluation of functional programs for power-aware test / Touati, A.; Bosio, A.; Dilillo, L.; Girard, P.; Todri-Sanial, A.; Virazel, A.; Bernardi, P.. - (2014), pp. 69-72. (Intervento presentato al convegno 23rd IEEE North Atlantic Test Workshop, NATW 2014 tenutosi a Binghamton, NY, usa nel 2014) [10.1109/NATW.2014.23]. | 1-gen-2014 | Bernardi P. + | 09301557.pdf |
| A Comprehensive Methodology for Stress Procedures Evaluation and Comparison for Burn-In of Automotive SoC / Bernardi, Paolo; Appello, Davide; Giacopelli, Giampaolo; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Rabbi, Christian; Restifo, Marco; Ruberg, Priit; Sanchez, Ernesto; Villa, Claudio Maria; Venini, Federico. - (2017). (Intervento presentato al convegno Design, Automation and Test in Europe Conference and Exhibition (DATE2017)). | 1-gen-2017 | BERNARDI, PAOLORESTIFO, MARCOSanchez, ErnestoVENINI, FEDERICO + | - |
| A Deterministic Methodology for Identifying Functionally Untestable Path-Delay Faults in Microprocessor Cores / Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - (2009), pp. 103-108. (Intervento presentato al convegno 9th International Workshop on Microprocessor Test and Verification (MTV'08) tenutosi a Austin, TX (U.S.A.) nel 8-10 Dic., 2008) [10.1109/MTV.2008.9]. | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo | - |
| A DMA and CACHE-based stress schema for burn-in of automotive microcontroller / Bernardi, Paolo; Cantoro, Riccardo; Gianotto, L.; Restifo, Marco; SANCHEZ SANCHEZ, EDGAR ERNESTO; Venini, Federico; Appello, D.. - STAMPA. - (2017), pp. 1-6. (Intervento presentato al convegno 2017 18th IEEE Latin American Test Symposium (LATS) tenutosi a Bogota (CO) nel 13-15 March 2017) [10.1109/LATW.2017.7906767]. | 1-gen-2017 | BERNARDI, PAOLOCANTORO, RICCARDORESTIFO, MARCOSANCHEZ SANCHEZ, EDGAR ERNESTOVENINI, FEDERICO + | - |
| A fault grading methodology for software-based self-test programs in systems-on-chip / Ballan, O.; Bernardi, Paolo; Fontana, G.; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO. - (2010), pp. 43-46. (Intervento presentato al convegno International Workshop on Microprocessor Test and Verification tenutosi a Austin (TX), USA nel Dec. 13-15, 2010) [10.1109/MTV.2010.16]. | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTO + | - |
| A Functional Test Algorithm for the Register Forwarding and Pipeline Interlocking unit in Pipelined Microprocessors / Bernardi, Paolo; Du, Boyang; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Grosso, Michelangelo; Ballan, O.. - STAMPA. - (2013). (Intervento presentato al convegno IEEE 7th International Design and Test Symposium (IDT) tenutosi a Doha (Qatar) nel December 2012) [10.1109/IDT.2013.6727120]. | 1-gen-2013 | BERNARDI, PAOLODU, BOYANGCIGANDA, LYL MERCEDESSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MatteoGROSSO, MICHELANGELO + | - |
| A guided debugger-based fault injection methodology for assessing functional test programs / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - (2023), pp. 1-7. (Intervento presentato al convegno VLSI Test Symposium tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140099]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloDi Gruttola Giardino, Nicola + | A_guided_debugger-based_fault_injection_methodology_for_assessing_functional_test_programs.pdf |
| A Hybrid Approach for Detection and Correction of Transient Faults in SoCs / Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - STAMPA. - Volume: 7 , Issue: 4:(2010), pp. 439-445. [10.1109/TDSC.2010.33] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo + | - |
| A Hybrid Approach to Fault Detection and Correction in SoCs / Bernardi, Paolo; VEIRAS BOLZANI, Leticia Maria; SONZA REORDA, Matteo. - (2007), pp. 107-112. (Intervento presentato al convegno IOLTS2007: IEEE International On-Line Testing Symposium tenutosi a Hersonissos, Greece nel July 2007). | 1-gen-2007 | BERNARDI, PAOLOVEIRAS BOLZANI, Leticia MariaSONZA REORDA, Matteo | - |
| A hybrid in-field self-test technique for SoCs / Carbonara, S.; Bernardi, P.; Restifo, M.. - (2019), pp. 1-6. (Intervento presentato al convegno 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019 tenutosi a grc nel 2019) [10.1109/DTIS.2019.8735075]. | 1-gen-2019 | Carbonara S.Bernardi P.Restifo M. | 08735075.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] | 1-gen-2023 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf |
| A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip / Manzini, A.; Inglese, P.; Caldi, L.; Cantoro, R.; Carnevale, G.; Coppetta, M.; Giltrelli, M.; Mautone, N.; Irrera, F.; Ullmann, R.; Bernardi, P.. - ELETTRONICO. - (2019), pp. 1-6. (Intervento presentato al convegno 2019 IEEE European Test Symposium (ETS) tenutosi a Baden-Baden, Germany nel 27-31 May 2019) [10.1109/ETS.2019.8791529]. | 1-gen-2019 | Inglese P.Caldi L.Cantoro R.Bernardi P. + | ets19-99.pdf; PUBLISHED-08791529.pdf |
| A new Architecture to Cross-Fertilize On-line and Manufacturing Testing / Bernardi, Paolo; SONZA REORDA, Matteo. - STAMPA. - (2011), pp. 142-147. (Intervento presentato al convegno Twentieth IEEE Asian Test Symposium (ATS 2011) tenutosi a New Delhi, India nel 20-23 November 2011). | 1-gen-2011 | BERNARDI, PAOLOSONZA REORDA, Matteo | - |
| A new DFM-proactive technique / D., Appello; Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo; V., Tancorre. - (2005). (Intervento presentato al convegno SDD'05: 2nd IEEE International Workshop on Silicon Debug and Diagnosis tenutosi a Austin, Texas, USA nel 10 - 11 novembre 2005). | 1-gen-2005 | BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo + | - |
| A new hybrid fault detection technique for systems-on-a-chip / Bernardi, Paolo; VEIRAS BOLZANI, Leticia Maria; Rebaudengo, Maurizio; SONZA REORDA, Matteo; F. L., Vargas; Violante, Massimo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 55:(2006), pp. 185-198. [10.1109/TC.2006.15] | 1-gen-2006 | BERNARDI, PAOLOVEIRAS BOLZANI, Leticia MariaREBAUDENGO, MaurizioSONZA REORDA, MatteoVIOLANTE, MASSIMO + | - |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (2023). (Intervento presentato al convegno Conference on Very Large Scale Integration (VLSI-SoC 2023)). | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | - |
| A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip / Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre. - (2022). (Intervento presentato al convegno Latin American Test Symposium tenutosi a Montevideo (Uruguay) nel 05-08 September 2022) [10.1109/LATS57337.2022.9936975]. | 1-gen-2022 | Iaria GiusyFrancesco AngionePaolo BernardiMatteo Sonza Reorda + | A_novel_Pattern_Selection_Algorithm_to_reduce_the_Test_Cost_of_large_Automotive_Systems-on-Chip.pdf |
| A novel SBST generation technique for path-delay faults in microprocessors based on BDD analysis and evolutionary algorithm / Christou, K; Michael, M. K.; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - (2008), pp. 389-394. (Intervento presentato al convegno 26th IEEE VLSI Test Symposium tenutosi a San Diego, CA, USA nel apr 27 - may 1) [10.1109/VTS.2008.37]. | 1-gen-2008 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| A novel SEU injection setup for Automotive SoC / Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.. - (2022), pp. 623-626. (Intervento presentato al convegno 2022 IEEE International Symposium on Industrial Electronics tenutosi a Anchorage, AK (USA) nel 01-03 June 2022) [10.1109/ISIE51582.2022.9831533]. | 1-gen-2022 | G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + | A_novel_SEU_injection_setup_for_Automotive_SoC.pdf |