Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements
In corso di stampa Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs
In corso di stampa Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo
A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems
2024 DI GRUTTOLA GIARDINO, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; Bertani and Vincenzo Tancorre, Claudia
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2024 Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
2024 Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
Exploring trade-offs in multi-site wafer testing
2024 Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
2024 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
Optimizing System-Level Test Program Generation via Genetic Programming
2024 Schwachhofer, D.; Angione, F.; Becker, S.; Wagner, S.; Sauer, M.; Bernardi, P.; Polian, I.
A guided debugger-based fault injection methodology for assessing functional test programs
2023 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2023 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test
2023 Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips
2023 Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto
About the correlation between logical identified faulty gates and their layout characteristics
2023 Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo
Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults
2023 Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo
Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests
2023 Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems
2023 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo
A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip
2022 Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre
A novel SEU injection setup for Automotive SoC
2022 Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.
An innovative Strategy to Quickly Grade Functional Test Programs
2022 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip
2022 Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A 6-bit Low-Area Hybrid ADC Design For System-on-Chip Measurements / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (In corso di stampa). (Intervento presentato al convegno IEEE International conference on Design, Test & Technology of Integrated Systems (DTTIS) tenutosi a Aix-en-Provence (FR) nel 2024). | In corso di stampa | Bernardi,PaoloKolahimahmoudi,NimaInsinga,Giorgio | DTTIS24_6_pages.pdf |
| A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs / Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (In corso di stampa). | In corso di stampa | Iaria, GiusyBernardi, PaoloCardone, Lorenzo + | - |
| A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems / DI GRUTTOLA GIARDINO, Nicola; Angione, Francesco; Bernardi, Paolo; Foscale, Tommaso; Bertani and Vincenzo Tancorre, Claudia. - (2024). (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) tenutosi a Didcot (UK) nel 08-10 October 2024) [10.1109/DFT63277.2024.10753536]. | 1-gen-2024 | Nicola di Gruttola GiardinoFrancesco AngionePaolo BernardiTommaso Foscale + | A_Flexible_FPGA-Based_Test_Equipment_for_Enabling_Out-of-Production_Manufacturing_Test_Flow_of_Digital_Systems.pdf |
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, Francesco; Bernardi, Paolo; DI GRUTTOLA GIARDINO, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2024). [10.1109/TC.2024.3500375] | 1-gen-2024 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs / Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf. - In: ELECTRONICS. - ISSN 2079-9292. - 13:2(2024). [10.3390/electronics13020303] | 1-gen-2024 | Bernardi, PaoloInsinga, GiorgioPaganini, Giovanni + | electronics-13-00303.pdf |
| Exploring trade-offs in multi-site wafer testing / Bernardi, Paolo; Cardone, Lorenzo; Foscale, Tommaso. - (2024). (Intervento presentato al convegno 25th IEEE Latin American Test Symposium 2024 tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534596]. | 1-gen-2024 | Bernardi, PaoloCardone, LorenzoFoscale, Tommaso | Exploring_trade-offs_in_multi-site_wafer_testing.pdf |
| Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips / Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:21(2024). [10.3390/electronics13214234] | 1-gen-2024 | Paolo BernardiGabriele FilipponiGiusy Iaria + | electronics-13-04234.pdf |
| Optimizing System-Level Test Program Generation via Genetic Programming / Schwachhofer, D.; Angione, F.; Becker, S.; Wagner, S.; Sauer, M.; Bernardi, P.; Polian, I.. - (2024). (Intervento presentato al convegno 2024 IEEE European Test Symposium (ETS) tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ETS61313.2024.10567817]. | 1-gen-2024 | Angione F.Bernardi P. + | Optimizing_System-Level_Test_Program_Generation_via_Genetic_Programming.pdf |
| A guided debugger-based fault injection methodology for assessing functional test programs / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - (2023), pp. 1-7. (Intervento presentato al convegno VLSI Test Symposium tenutosi a San Diego (USA) nel 24-26 April 2023) [10.1109/VTS56346.2023.10140099]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloDi Gruttola Giardino, Nicola + | A_guided_debugger-based_fault_injection_methodology_for_assessing_functional_test_programs.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] | 1-gen-2023 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf |
| A Novel Approach to Extract Embedded Memory Design Parameter Through Irradiation Test / Bernardi, Paolo; Kolahimahmoudi, Nima; Insinga, Giorgio. - (2023), pp. 1-6. (Intervento presentato al convegno Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel October 16 - 18, 2023) [10.1109/VLSI-SoC57769.2023.10321848]. | 1-gen-2023 | Bernardi, PaoloKolahimahmoudi, NimaInsinga, Giorgio | A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf; A_Novel_Approach_to_Extract_Embedded_Memory_Design_Parameter_Through_Irradiation_Test.pdf |
| A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] | 1-gen-2023 | Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + | A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf |
| About the correlation between logical identified faulty gates and their layout characteristics / Bernardi, Paolo; Cardone, Lorenzo; Iaria, Giusy; Appello, Davide; Garozzo, Giuseppe; Tancorre, Vincenzo. - (2023). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System Design tenutosi a 03-05 July 2023 nel Crete, Greece) [10.1109/IOLTS59296.2023.10224897]. | 1-gen-2023 | Bernardi, PaoloCardone, LorenzoIaria, Giusy + | IOLTS_2023_FaultsLayoutAnalysis (4).pdf; About_the_Correlation_between_Logical_Identified_Faulty_Gates_and_their_Layout_Characteristics.pdf |
| Collecting diagnostic information through dichotomic search from Logic BIST of failing in-field automotive SoCs with delay faults / Bernardi, Paolo; Filipponi, Gabriele; Reorda, Matteo Sonza; Appello, Davide; Bertani, Claudia; Tancorre, Vincenzo. - ELETTRONICO. - (2023), pp. 21-26. (Intervento presentato al convegno International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139670]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleReorda, Matteo Sonza + | 2023058710.pdf; Collecting_diagnostic_information_through_dichotomic_search_from_Logic_BIST_of_failing_in-field_automotive_SoCs_with_delay_faults.pdf |
| Low cost external serial interface watchdog for SoCs and FPGAs automatic characterization tests / Bernardi, Paolo; Filipponi, Gabriele; Foscale, Tommaso; Insinga, Giorgio. - (2023). (Intervento presentato al convegno IEEE Latin-American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154486]. | 1-gen-2023 | Bernardi, PaoloFilipponi, GabrieleFoscale, TommasoInsinga, Giorgio | LATS_2023.pdf; Low_cost_external_serial_interface_watchdog_for_SoCs_and_FPGAs_automatic_characterization_tests.pdf |
| On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. | 1-gen-2023 | Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + | On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf |
| A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip / Iaria, Giusy; Angione, Francesco; Bernardi, Paolo; SONZA REORDA, Matteo; Davide, Appello; Giuseppe, Garozzo; Vincenzo, Tancorre. - (2022). (Intervento presentato al convegno Latin American Test Symposium tenutosi a Montevideo (Uruguay) nel 05-08 September 2022) [10.1109/LATS57337.2022.9936975]. | 1-gen-2022 | Iaria GiusyFrancesco AngionePaolo BernardiMatteo Sonza Reorda + | A_novel_Pattern_Selection_Algorithm_to_reduce_the_Test_Cost_of_large_Automotive_Systems-on-Chip.pdf |
| A novel SEU injection setup for Automotive SoC / Iaria, G.; Foscale, T.; Bernardi, P.; Presicce, L.; Sonza Reorda, M.; Appello, D.; Tancorre, V.; Ugioli, R.. - (2022), pp. 623-626. (Intervento presentato al convegno 2022 IEEE International Symposium on Industrial Electronics tenutosi a Anchorage, AK (USA) nel 01-03 June 2022) [10.1109/ISIE51582.2022.9831533]. | 1-gen-2022 | G. IariaT. FoscaleP. BernardiL. PresicceM. Sonza Reorda + | A_novel_SEU_injection_setup_for_Automotive_SoC.pdf |
| An innovative Strategy to Quickly Grade Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 355-364. (Intervento presentato al convegno International Test Conference tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00044]. | 1-gen-2022 | Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + | An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf |
| An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip / Angione, Francesco; Bernardi, Paolo; Filipponi, Gabriele; SONZA REORDA, Matteo; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 1-6. (Intervento presentato al convegno IEEE European Test Symposium tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810396]. | 1-gen-2022 | Francesco ANGIONEPaolo BERNARDIGabriele FILIPPONIMatteo SONZA REORDA + | An_Optimized_Burn-In_Stress_Flow_targeting_Interconnections_logic_to_Embedded_Memories_in_Automotive_Systems-on-Chip.pdf |