Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph
In corso di stampa Cardone, Lorenzo; Quer, Stefano; Bernardi, Paolo
Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis
In corso di stampa Anedda, Simone; Bernardi, Paolo; Coppetta, Matteo; Insinga, Giorgio; Montedoro, Tommaso; Ruospo, Annachiara; Ullmann, Rudolf; Tengler, Felix
Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits
In corso di stampa Bernardi, Paolo; Cardone, Lorenzo; Quer, Stefano
A Multi-Phase Diagnostic Flow Combining Scan-Based Refinement and Targeted Functional Tests for Automotive SoCs
2026 Iaria, Giusy; Filipponi, Gabriele; Foscale, Tommaso; Bertani, Claudia; Garozzo, Giuseppe; Tancorre, Vincenzo; Bernardi, Paolo
A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories
2026 Bernardi, Paolo; Insinga, Giorgio; Battilana, Matteo; Beer, Peter; Carnevale, Giambattista; Coppetta, Matteo; Mautone, Nellina; Repele, Alberto; Scaramuzza, Pierre; Ullmann, Rudolf
Advances in Testing and Reliability Benchmarks
2026 Angione, Francesco; Bernardi, Paolo; Giardino, Nicola Di Gruttola; Filipponi, Gabriele; Iaria, Giusy; Perlo, Giacomo; Pomeranz, Irith; Porsia, Antonio; Ruospo, Annachiara; Sanchez, Ernesto; Turco, Vittorio
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs
2026 Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo
Optimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling
2026 Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Garozzo, Giuseppe; Tancorre, Vincenzo
Software test libraries and real-time operating systems: A system integrator perspective
2026 Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs
2025 Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo
A Cost–Benefit Analysis of Multi-Site Wafer Testing
2025 Foscale, Tommaso; Bernardi, Paolo
A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs
2025 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2025 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
ARBoard: Augmented Reality for PCB Operations in Industry 5.0
2025 Insinga, Giorgio; Anzoino, Francesco; Bella, Pietro; Bernardi, Paolo; Filippetti, Luca; Khattar, Reem
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC
2025 Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs
2025 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
European Test Symposium Teams: an Anniversary Snapshot
2025 Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Ştefan, I.; Stan, O.; Corcheş, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersglüß, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W.; Vanhooren, R.; Chuang, P. -Y.; Marinissen, E. J.; Di Natale, G.; Barragan, M.; Maistri, P.; Mir, S.; Vatajelu, E. -I.; Bernardi, P.; Di Carlo, S.; Prinetto, P.; Reorda, M. Sonza; Violante, M.; Stratigopoulos, H. -G.; Michael, M. K.; Neophytou, S.; Hadjitheophanous, S.; Christou, K.; Skitsas, M.; Bosio, A.; Deveautour, B.; Girard, P.; Traiola, M.; Virazel, A.; Dos Santos, F. Fernandes; Kritikakou, A.; Casagranda, G.; Vallero, M.; Vella, F.; Rech, P.; Bolzani Poehls, L. M.; Krstic, M.; Andjelkovic, M.; Vargas, F.; Tshagharyan, G.; Harutyunyan, G.; Vardanian, V.; Shoukourian, S.; Zorian, Y.; Dworak, J.; Nepal, K.; Manikas, T.; Taouil, M.; Fieback, M.; Gebregiorgis, A.; Bishnoi, R.; Hamdioui, S.; Chatterjee, A.; Saha, A.; Komarraju, S.; Ma, K.; Amarnath, C.; Tahoori, M.; Mayahinia, M.; Rajabalipanah, M.; Basharkhah, K.; Nosrati, N.; Jahanpeima, Z.; Navabi, Z.; Wunderlich, H. -J.; Hellebrand, S.
Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG
2025 Ciullo, Alessandro; Eggersglüß, Stephan; Tille, Daniel; Glowatz, Andreas; Iaria, Giusy; Bernardi, Paolo
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements
2025 Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo
From Structural Test Escapes to Silent Data Errors: A preliminary analysis
2025 Angione, Francesco; Bernardi, Paolo; Sinha, Arani
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Fast Circuit Analysis via Neighborhood-Guided Maximum Common Subgraph / Cardone, L., Quer, S., Bernardi, P.. - (In corso di stampa). (European Test Symposium 2026 Platanias (GR) 25/05/2026 - 29/05/2026). | In corso di stampa | Cardone,LorenzoQuer,StefanoBernardi,Paolo | 2026_ETS.pdf |
| Off-Chip Super-Resolution AI Model to Support Embedded Memory Diagnosis / Anedda, S., Bernardi, P., Coppetta, M., Insinga, G., Montedoro, T., Ruospo, A., Ullmann, R., Tengler, F.. - (In corso di stampa). (2026 IEEE European Test Symposium (ETS) Chania, Crete May 25-29, 2026). | In corso di stampa | Paolo BernardiGiorgio InsingaAnnachiara Ruospo + | RS3-3.pdf |
| Smart Heuristics for Maximum Common Subgraph Sub-Estimation in Large Digital Circuits / Bernardi, P., Cardone, L., Quer, S.. - (In corso di stampa). (IWLS 2025 Verona (IT) 20/05/2024 - 24/05/2024). | In corso di stampa | Bernardi,PaoloCardone,LorenzoQuer,Stefano | - |
| A Multi-Phase Diagnostic Flow Combining Scan-Based Refinement and Targeted Functional Tests for Automotive SoCs / Iaria, G., Filipponi, G., Foscale, T., Bertani, C., Garozzo, G., Tancorre, V., Bernardi, P.. - In: IEEE ACCESS. - ISSN 2169-3536. - (2026), pp. 1-1. [10.1109/ACCESS.2026.3718146] | 1-gen-2026 | Giusy IariaGabriele FilipponiTommaso FoscalePaolo Bernardi + | - |
| A Versatile Strategy for Comprehensive Data Collection and Retention in Embedded SoC Memories / Bernardi, P., Insinga, G., Battilana, M., Beer, P., Carnevale, G., Coppetta, M., Mautone, N., Repele, A., Scaramuzza, P., Ullmann, R.. - In: ACM TRANSACTIONS ON EMBEDDED COMPUTING SYSTEMS. - ISSN 1539-9087. - 25:1(2026), pp. 1-15. [10.1145/3766550] | 1-gen-2026 | Bernardi, PaoloInsinga, Giorgio + | 3766550.pdf |
| Advances in Testing and Reliability Benchmarks / Angione, F., Bernardi, P., Giardino, N.D.G., Filipponi, G., Iaria, G., Perlo, G., Pomeranz, I., Porsia, A., Ruospo, A., Sanchez, E., Turco, V.. - (2026), pp. 1-10. (31st IEEE European Test Symposium, ETS 2026 Chania (GRC) 25-29 May 2026) [10.1109/ets69887.2026.11591740]. | 1-gen-2026 | Angione, FrancescoBernardi, PaoloGiardino, Nicola Di GruttolaFilipponi, GabrieleIaria, GiusyPerlo, GiacomoPorsia, AntonioRuospo, AnnachiaraSanchez, ErnestoTurco, Vittorio + | Advances_in_Testing_and_Reliability_Benchmarks.pdf |
| Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs / Filipponi, G., Schwachhofer, D., Angione, F., Bertani, C., Corbellini, S., Di Gruttola Giardino, N., Garozzo, G., Insinga, G., Tancorre, V., Bernardi, P.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 1557-9956. - 75:2(2026), pp. 554-566. | 1-gen-2026 | Gabriele FilipponiFrancesco AngioneSimone CorbelliniNicola di Gruttola GiardinoGiorgio InsingaPaolo Bernardi + | Netlist-Independent_Functional_Stress_Pattern_Generation_Strategy_for_AI_HW_Accelerators_Embedded_into_SoCs.pdf |
| Optimizing Scan Test Economics Trade-Offs in Homogeneous 3D SICs via Cost Modeling / Iaria, G., Bernardi, P., Bertani, C., Garozzo, G., Tancorre, V.. - (2026), pp. 1-7. (2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) ) [10.1109/iolts69666.2026.11633775]. | 1-gen-2026 | Iaria, GiusyBernardi, Paolo + | - |
| Software test libraries and real-time operating systems: A system integrator perspective / Angione, F., Bernardi, P., Cantoro, R.. - In: JOURNAL OF SYSTEMS ARCHITECTURE. - ISSN 1383-7621. - 177:(2026). [10.1016/j.sysarc.2026.103854] | 1-gen-2026 | Angione, FrancescoBernardi, PaoloCantoro, Riccardo | main.pdf |
| A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs / Iaria, G., Bernardi, P., Bertani, C., Cardone, L., Garozzo, G., Tancorre, V.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:4(2025), pp. 1278-1292. [10.1109/TC.2024.3521246] | 1-gen-2025 | Iaria, GiusyBernardi, PaoloCardone, Lorenzo + | A_Comprehensive_Scan_Test_Cost_Model_to_Optimize_the_Production_of_Very_Large_SoCs.pdf |
| A Cost–Benefit Analysis of Multi-Site Wafer Testing / Foscale, T., Bernardi, P.. - In: ELECTRONICS. - ISSN 2079-9292. - 14:12(2025). [10.3390/electronics14122450] | 1-gen-2025 | Foscale, TommasoBernardi, Paolo | A Cost–Benefit Analysis of Multi-Site Wafer Testing.pdf |
| A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs / Angione, F., Bernardi, P., Calabrese, A., Cardone, L., Quer, S., Bertani, C., Tancorre, V.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:11(2025), pp. 3582-3595. [10.1109/tc.2025.3600005] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCalabrese, AndreaCardone, LorenzoQuer, Stefano + | A_Novel_Indirect_Methodology_based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf; A_Novel_Indirect_Methodology_Based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf |
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, F., Bernardi, P., Di Gruttola Giardino, N., Filipponi, G., Bertani, C., Tancorre, V.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 731-739. [10.1109/TC.2024.3500375] | 1-gen-2025 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| ARBoard: Augmented Reality for PCB Operations in Industry 5.0 / Insinga, G., Anzoino, F., Bella, P., Bernardi, P., Filippetti, L., Khattar, R.. - (2025). (2025 IEEE International Symposium on Emerging Metaverse (ISEMV) Honolulu, HI (USA) 19-20 October 2025) [10.1109/ISEMV67326.2025.00014]. | 1-gen-2025 | Insinga, GiorgioAnzoino, FrancescoBella, PietroBernardi, PaoloFilippetti, LucaKhattar, Reem | ARBoard_Augmented_Reality_for_PCB_Operations_in_Industry_5.0.pdf; ARBoard_6_pages_IEEE_ISEMV_2025___camera_ready (1).pdf |
| Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC / Angione, F., Bernardi, P., Iaria, G., Bertani, C., Tancorre, V.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:9(2025), pp. 3195-3209. [10.1109/tc.2025.3587515] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloIaria, Giusy + | Automatic_Generation_of_System-Level_Test_for_Un-Core_Logic_of_Large_Automotive_SoC.pdf |
| Enhancing Logic Diagnosis of field returns through Logic BIST in Automotive SoCs / Bernardi, P., Filipponi, G., Iaria, G., Bertani, C., Tancorre, V.. - (2025). (2025 IEEE Latin American Test Symposium San Andres Islas (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963955]. | 1-gen-2025 | Paolo BernardiGabriele FilipponiGiusy Iaria + | LATS_2025.pdf; Enhancing_Logic_Diagnosis_of_Field_Returns_Through_Logic_BIST_in_Automotive_SoCs.pdf |
| European Test Symposium Teams: an Anniversary Snapshot / Jenihhin, M., Raik, J., Jutman, A., Cherezova, N., Ubar, R., Miclea, L., Enyedi, S., Ştefan, I., Stan, O., Corcheş, C., Peng, Z., Eles, P., Drechsler, R., Eggersglüß, S., Fey, G., Glowatz, A., Tille, D., Gielen, G., Coyette, A., Dobbelaere, W., et al.. - ELETTRONICO. - (2025), pp. 1-48. (2025 IEEE European Test Symposium, ETS 2025 Tallinn, Estonia 26-30 May 2025) [10.1109/ets63895.2025.11049652]. | 1-gen-2025 | Bernardi, P.Di Carlo, S.Prinetto, P.Reorda, M. SonzaViolante, M. + | European_Test_Symposium_Teams_an_Anniversary_Snapshot.pdf; ETSteams_2025_Draft1.pdf |
| Exploiting weak detections for optimizing pattern generation in Defect-Oriented Cell-Aware ATPG / Ciullo, A., Eggersglüß, S., Tille, D., Glowatz, A., Iaria, G., Bernardi, P.. - (2025), pp. 72-77. (IEEE International Test Conference ASIA 2025 Tokyo (JPN) December 16–19, 2025) [10.1109/ITC-Asia67627.2025.00021]. | 1-gen-2025 | Iaria, GiusyBernardi, Paolo + | Exploiting_weak_detections_for_optimizing_pattern_generation_in_Defect-Oriented_Cell-Aware_ATPG.pdf |
| Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements / Kolahimahmoudi, N., Insinga, G., Bernardi, P.. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 118:(2025). [10.1016/j.micpro.2025.105191] | 1-gen-2025 | Nima KolahimahmoudiGiorgio InsingaPaolo Bernardi | 1-s2.0-S0141933125000584-main.pdf |
| From Structural Test Escapes to Silent Data Errors: A preliminary analysis / Angione, F., Bernardi, P., Sinha, A.. - ELETTRONICO. - (2025). (2025 IEEE 9th International Test Conference India (ITC India) Bangalore (IND) 20-22 July 2025) [10.1109/ITCIndia66078.2025.11141623]. | 1-gen-2025 | Francesco AngionePaolo Bernardi + | From_Structural_Test_Escapes_to_Silent_Data_Errors_A_Preliminary_Analysis.pdf |