Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques
2004 D., Appello; A., Fudoli; V., Tancorre; Bernardi, Paolo; Corno, Fulvio; Rebaudengo, Maurizio; SONZA REORDA, Matteo
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs
2010 Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2022 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A new hybrid fault detection technique for systems-on-a-chip
2006 Bernardi, Paolo; VEIRAS BOLZANI, Leticia Maria; Rebaudengo, Maurizio; SONZA REORDA, Matteo; F. L., Vargas; Violante, Massimo
A Parallel Tester Architecture for Accelerometerand Gyroscope MEMS Calibration and Test
2011 Ciganda, LYL MERCEDES; Bernardi, Paolo; SONZA REORDA, Matteo; Barbieri, D.; Bonaria, L.; Losco, R.; Marcigot, L.; Straiotto, M.
A System-layer Infrastructure for SoC Diagnosis
2007 Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC
2018 Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico
An adaptive low-cost tester architecture supporting embedded memory volume diagnosis
2012 Bernardi, Paolo; Ciganda, LYL MERCEDES
An Effective technique for the Automatic Generation of Diagnosis-oriented Programs for Processor Cores
2008 Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, Massimiliano; Squillero, Giovanni; SONZA REORDA, Matteo
An efficient strategy for the development of software test libraries for an automotive microcontroller family
2020 Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In
2018 Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
An Optimized Test During Burn-In for Automotive SoC
2018 Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers
2016 Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs
2009 Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug
2010 Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption
2013 Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard
HYBRID FAULT DETECTION TECHNIQUE A CASE STUDY ON VIRTEX-II PRO'S POWERPC
2006 Bernardi, Paolo; Sterpone, Luca; Violante, Massimo; M., PORTELA GARCIA
Identification and classification of single-event upsets in the configuration memory of sram-based fpgas
2003 M., Ceschia; Violante, Massimo; SONZA REORDA, Matteo; A., Paccagnella; Bernardi, Paolo; Rebaudengo, Maurizio; D., Bortolato; M., Bellato; P., Zambolin; A., Candelori
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test
2014 DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.
Microprocessor Testing: Functional Meets Structural Test
2017 Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques / D., Appello; A., Fudoli; V., Tancorre; Bernardi, Paolo; Corno, Fulvio; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 20:(2004), pp. 79-87. [10.1023/B:JETT.0000009315.57771.94] | 1-gen-2004 | BERNARDI, PAOLOCORNO, FulvioREBAUDENGO, MaurizioSONZA REORDA, Matteo + | - |
| A Hybrid Approach for Detection and Correction of Transient Faults in SoCs / Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - STAMPA. - Volume: 7 , Issue: 4:(2010), pp. 439-445. [10.1109/TDSC.2010.33] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo + | 05551155.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2022), pp. 1-14. [10.1109/TC.2022.3199994] | 1-gen-2022 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | - |
| A new hybrid fault detection technique for systems-on-a-chip / Bernardi, Paolo; VEIRAS BOLZANI, Leticia Maria; Rebaudengo, Maurizio; SONZA REORDA, Matteo; F. L., Vargas; Violante, Massimo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 55:(2006), pp. 185-198. [10.1109/TC.2006.15] | 1-gen-2006 | BERNARDI, PAOLOVEIRAS BOLZANI, Leticia MariaREBAUDENGO, MaurizioSONZA REORDA, MatteoVIOLANTE, MASSIMO + | TC_2006..pdf |
| A Parallel Tester Architecture for Accelerometerand Gyroscope MEMS Calibration and Test / Ciganda, LYL MERCEDES; Bernardi, Paolo; SONZA REORDA, Matteo; Barbieri, D.; Bonaria, L.; Losco, R.; Marcigot, L.; Straiotto, M.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 27:3(2011), pp. 389-402. [10.1007/s10836-011-5210-2] | 1-gen-2011 | CIGANDA, LYL MERCEDESBERNARDI, PAOLOSONZA REORDA, Matteo + | - |
| A System-layer Infrastructure for SoC Diagnosis / Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 23:(2007), pp. 389-404. | 1-gen-2007 | BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
| Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34:(2018), pp. 43-52. [10.1007/s10836-018-5705-1] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoFederico Venini + | JETTA_FINAL.pdf |
| An adaptive low-cost tester architecture supporting embedded memory volume diagnosis / Bernardi, Paolo; Ciganda, LYL MERCEDES. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 61:4(2012), pp. 1002-1018. [10.1109/TIM.2011.2179822] | 1-gen-2012 | BERNARDI, PAOLOCIGANDA, LYL MERCEDES | - |
| An Effective technique for the Automatic Generation of Diagnosis-oriented Programs for Processor Cores / Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Schillaci, Massimiliano; Squillero, Giovanni; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 27:(2008), pp. 570-574. [10.1109/TCAD.2008.915541] | 1-gen-2008 | BERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSCHILLACI, MASSIMILIANOSQUILLERO, GiovanniSONZA REORDA, Matteo | tcad2008.pdf |
| An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115:(2020), p. 113962. [10.1016/j.microrel.2020.113962] | 1-gen-2020 | Piumatti, D.Sanchez, E.Bernardi, P. + | 1-s2.0-S0026271420307939-main-post print.pdf; Versione editoriale pre print.pdf |
| An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + | JOLPE_FINAL.pdf |
| An Optimized Test During Burn-In for Automotive SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53. [10.1109/MDAT.2018.2799807] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoErnesto SanchezFederico Venini + | PREPRINT_DT_DTSI-2017-04-0096.R2.pdf; 08272388.pdf |
| Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2016), pp. 744-754. [10.1109/TC.2015.2498546] | 1-gen-2016 | BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTO + | 07321794.pdf; 07321794-1.pdf |
| Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs / Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 17 (11):(2009), pp. 1654-1659. [10.1109/TVLSI.2008.2006177] | 1-gen-2009 | BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | 1851511.pdf |
| Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug / Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - 4(2):(2010), pp. 104-113. [10.1049/iet-cdt.2008.0122] | 1-gen-2010 | BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo | - |
| Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption / Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - 9:(2013), pp. 253-263. [10.1166/jolpe.2013.1259] | 1-gen-2013 | BERNARDI, PAOLODE CARVALHO, MAURICIOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| HYBRID FAULT DETECTION TECHNIQUE A CASE STUDY ON VIRTEX-II PRO'S POWERPC / Bernardi, Paolo; Sterpone, Luca; Violante, Massimo; M., PORTELA GARCIA. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 53:(2006), pp. 3550-3557. [10.1109/TNS.2006.886221] | 1-gen-2006 | BERNARDI, PAOLOSTERPONE, LucaVIOLANTE, MASSIMO + | - |
| Identification and classification of single-event upsets in the configuration memory of sram-based fpgas / M., Ceschia; Violante, Massimo; SONZA REORDA, Matteo; A., Paccagnella; Bernardi, Paolo; Rebaudengo, Maurizio; D., Bortolato; M., Bellato; P., Zambolin; A., Candelori. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 50:(2003), pp. 2088-2094. | 1-gen-2003 | VIOLANTE, MASSIMOSONZA REORDA, MatteoBERNARDI, PAOLOREBAUDENGO, Maurizio + | - |
| Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test / DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 30:(2014), pp. 317-328. [10.1007/s10836-014-5457-5] | 1-gen-2014 | DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO + | - |
| Microprocessor Testing: Functional Meets Structural Test / Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18. [10.1142/S0218126617400072] | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, MATTEO + | S0218126617400072.pdf |