Archivio Istituzionale della RicercaBERNARDI, PAOLO
BERNARDI, PAOLO
Dipartimento di Automatica e Informatica
012326
Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs
In corso di stampa Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo
A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs
2025 Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo
A Cost–Benefit Analysis of Multi-Site Wafer Testing
2025 Foscale, Tommaso; Bernardi, Paolo
A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs
2025 Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo
A System-Level Test Methodology for Communication Peripherals in System-on-Chips
2025 Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo
Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC
2025 Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements
2025 Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs
2024 Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf
Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips
2024 Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress
2023 Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips
2023 Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto
Parallel Multithread Analysis of Extremely Large Simulation Traces
2022 Appello, D.; Bernardi, Paolo; Calabrese, Andrea; Pollaccia, G.; Quer, Stefano; Tancorre, V.; Ugioli, R.
An efficient strategy for the development of software test libraries for an automotive microcontroller family
2020 Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC
2018 Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In
2018 Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
An Optimized Test During Burn-In for Automotive SoC
2018 Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico
Scan-Chain Intra-Cell Aware Testing
2018 Touati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; SONZA REORDA, Matteo; Auvray, Etienne
Microprocessor Testing: Functional Meets Structural Test
2017 Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors
2017 Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Squillero, Giovanni
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers
2016 Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Netlist-Independent Functional Stress Pattern generation strategy for AI HW Accelerators embedded into SoCs / Filipponi, Gabriele; Schwachhofer, Denis; Angione, Francesco; Bertani, Claudia; Corbellini, Simone; Di Gruttola Giardino, Nicola; Garozzo, Giuseppe; Insinga, Giorgio; Tancorre, Vincenzo; Bernardi, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 1557-9956. - (In corso di stampa). | In corso di stampa | Gabriele FilipponiFrancesco AngioneSimone CorbelliniNicola di Gruttola GiardinoGiorgio InsingaPaolo Bernardi + | ToC_AMU_accept.pdf |
| A Comprehensive Scan Test Cost Model to Optimize the Production of very large SoCs / Iaria, Giusy; Bernardi, Paolo; Bertani, Claudia; Cardone, Lorenzo; Garozzo, Giuseppe; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:4(2025), pp. 1278-1292. [10.1109/TC.2024.3521246] | 1-gen-2025 | Iaria, GiusyBernardi, PaoloCardone, Lorenzo + | A_Comprehensive_Scan_Test_Cost_Model_to_Optimize_the_Production_of_Very_Large_SoCs.pdf |
| A Cost–Benefit Analysis of Multi-Site Wafer Testing / Foscale, Tommaso; Bernardi, Paolo. - In: ELECTRONICS. - ISSN 2079-9292. - 14:12(2025). [10.3390/electronics14122450] | 1-gen-2025 | Foscale, TommasoBernardi, Paolo | A Cost–Benefit Analysis of Multi-Site Wafer Testing.pdf |
| A Novel Indirect Methodology based on Execution Traces for Grading Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Quer, Stefano; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:11(2025), pp. 3582-3595. [10.1109/tc.2025.3600005] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloCalabrese, AndreaCardone, LorenzoQuer, Stefano + | A_Novel_Indirect_Methodology_based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf; A_Novel_Indirect_Methodology_Based_on_Execution_Traces_for_Grading_Functional_Test_Programs.pdf |
| A System-Level Test Methodology for Communication Peripherals in System-on-Chips / Angione, Francesco; Bernardi, Paolo; Di Gruttola Giardino, Nicola; Filipponi, Gabriele; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 731-739. [10.1109/TC.2024.3500375] | 1-gen-2025 | Francesco AngionePaolo BernardiNicola di Gruttola GiardinoGabriele Filipponi + | A_System-Level_Test_Methodology_for_Communication_Peripherals_in_System-on-Chips.pdf |
| Automatic Generation of System-Level Test for Un-Core Logic of Large Automotive SoC / Angione, Francesco; Bernardi, Paolo; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:9(2025), pp. 3195-3209. [10.1109/tc.2025.3587515] | 1-gen-2025 | Angione, FrancescoBernardi, PaoloIaria, Giusy + | Automatic_Generation_of_System-Level_Test_for_Un-Core_Logic_of_Large_Automotive_SoC.pdf |
| Extended design and linearity analysis of a 6-bit low-area hybrid ADC design for local system-on-chip measurements / Kolahimahmoudi, Nima; Insinga, Giorgio; Bernardi, Paolo. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - 118:(2025). [10.1016/j.micpro.2025.105191] | 1-gen-2025 | Nima KolahimahmoudiGiorgio InsingaPaolo Bernardi | 1-s2.0-S0141933125000584-main.pdf |
| Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs / Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf. - In: ELECTRONICS. - ISSN 2079-9292. - 13:2(2024). [10.3390/electronics13020303] | 1-gen-2024 | Bernardi, PaoloInsinga, GiorgioPaganini, Giovanni + | electronics-13-00303.pdf |
| Logic Diagnosis Based on Logic Built-In Self-Test Signatures Collected In-Field from Failing System-on-Chips / Bernardi, Paolo; Filipponi, Gabriele; Iaria, Giusy; Bertani, Claudia; Tancorre, Vincenzo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:21(2024). [10.3390/electronics13214234] | 1-gen-2024 | Paolo BernardiGabriele FilipponiGiusy Iaria + | electronics-13-04234.pdf |
| A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] | 1-gen-2023 | Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + | A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf |
| A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] | 1-gen-2023 | Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + | A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf |
| Parallel Multithread Analysis of Extremely Large Simulation Traces / Appello, D.; Bernardi, Paolo; Calabrese, Andrea; Pollaccia, G.; Quer, Stefano; Tancorre, V.; Ugioli, R.. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 10:(2022), pp. 56440-56457. [10.1109/ACCESS.2022.3177613] | 1-gen-2022 | Paolo BernardiAndrea CalabreseStefano Quer + | ieeeAccess.pdf |
| An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115 (113962):(2020). [10.1016/j.microrel.2020.113962] | 1-gen-2020 | Piumatti, D.Sanchez, E.Bernardi, P. + | 1-s2.0-S0026271420307939-main-post print.pdf; Versione editoriale pre print.pdf |
| Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34:(2018), pp. 43-52. [10.1007/s10836-018-5705-1] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoFederico Venini + | - |
| An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + | - |
| An Optimized Test During Burn-In for Automotive SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53. [10.1109/MDAT.2018.2799807] | 1-gen-2018 | Paolo BernardiRiccardo CantoroMarco RestifoErnesto SanchezFederico Venini + | PREPRINT_DT_DTSI-2017-04-0096.R2.pdf; 08272388.pdf |
| Scan-Chain Intra-Cell Aware Testing / Touati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; SONZA REORDA, Matteo; Auvray, Etienne. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2018), pp. 1-1. [10.1109/TETC.2016.2624311] | 1-gen-2018 | BERNARDI, PAOLOSONZA REORDA, Matteo + | 07737018.pdf; 07737018-1.pdf |
| Microprocessor Testing: Functional Meets Structural Test / Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18. [10.1142/S0218126617400072] | 1-gen-2017 | BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, MATTEO + | - |
| Software-Based Self-Test Techniques for Dual-Issue Embedded Processors / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2017). [10.1109/TETC.2017.2758641] | 1-gen-2017 | BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GIOVANNI + | - |
| Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2016), pp. 744-754. [10.1109/TC.2015.2498546] | 1-gen-2016 | BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTO + | 07321794.pdf; 07321794-1.pdf |