BERNARDI, PAOLO

BERNARDI, PAOLO  

Dipartimento di Automatica e Informatica  

012326  

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Risultati 1 - 20 di 28 (tempo di esecuzione: 0.095 secondi).
Citazione Data di pubblicazione Autori File
Built-In Self-Test Architecture Enabling Diagnosis for Massive Embedded Memory Banks in Large SoCs / Bernardi, Paolo; Guerriero, Augusto Maria; Insinga, Giorgio; Paganini, Giovanni; Carnevale, Giambattista; Coppetta, Matteo; Mischo, Walter; Ullmann, Rudolf. - In: ELECTRONICS. - ISSN 2079-9292. - 13:2(2024). [10.3390/electronics13020303] 1-gen-2024 Bernardi, PaoloInsinga, GiorgioPaganini, Giovanni + electronics-13-00303.pdf
A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress / Angione, F.; Appello, D.; Bernardi, P.; Bertani, C.; Gallo, G.; Littardi, S.; Pollaccia, G.; Ruggeri, W.; Reorda, M. S.; Tancorre, V.; Ugioli, R.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2023), pp. 1447-1459. [10.1109/TC.2022.3199994] 1-gen-2023 Angione F.Bernardi P.Littardi S.Ruggeri W.Reorda M. S. + A_Low-Cost_Burn-In_Tester_Architecture_to_Supply_Effective_Electrical_Stress.pdf
A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips / Angione, Francesco; Appello, Davide; Bernardi, Paolo; Calabrese, Andrea; Quer, Stefano; SONZA REORDA, Matteo; Tancorre, Vincenzo; Ugioli, Roberto. - In: IEEE ACCESS. - ISSN 2169-3536. - 11:(2023), pp. 105655-105676. [10.1109/ACCESS.2023.3316511] 1-gen-2023 Francesco AngionePaolo BernardiAndrea CalabreseStefano QuerMatteo Sonza Reorda + A_Toolchain_to_Quantify_Burn-In_Stress_Effectiveness_on_Large_Automotive_System-on-Chips.pdf
Parallel Multithread Analysis of Extremely Large Simulation Traces / Appello, D.; Bernardi, Paolo; Calabrese, Andrea; Pollaccia, G.; Quer, Stefano; Tancorre, V.; Ugioli, R.. - In: IEEE ACCESS. - ISSN 2169-3536. - ELETTRONICO. - 10:(2022), pp. 56440-56457. [10.1109/ACCESS.2022.3177613] 1-gen-2022 Paolo BernardiAndrea CalabreseStefano Quer + ieeeAccess.pdf
An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115 (113962):(2020). [10.1016/j.microrel.2020.113962] 1-gen-2020 Piumatti, D.Sanchez, E.Bernardi, P. + 1-s2.0-S0026271420307939-main-post print.pdfVersione editoriale pre print.pdf
Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34:(2018), pp. 43-52. [10.1007/s10836-018-5705-1] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoFederico Venini + -
An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98. [10.1166/jolpe.2018.1542] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto Sanchezand Federico Venini + -
An Optimized Test During Burn-In for Automotive SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53. [10.1109/MDAT.2018.2799807] 1-gen-2018 Paolo BernardiRiccardo CantoroMarco RestifoErnesto SanchezFederico Venini + PREPRINT_DT_DTSI-2017-04-0096.R2.pdf08272388.pdf
Scan-Chain Intra-Cell Aware Testing / Touati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; SONZA REORDA, Matteo; Auvray, Etienne. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2018), pp. 1-1. [10.1109/TETC.2016.2624311] 1-gen-2018 BERNARDI, PAOLOSONZA REORDA, Matteo + 07737018.pdf07737018-1.pdf
Microprocessor Testing: Functional Meets Structural Test / Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18. [10.1142/S0218126617400072] 1-gen-2017 BOSIO, ALBERTOBERNARDI, PAOLOSONZA REORDA, MATTEO + -
Software-Based Self-Test Techniques for Dual-Issue Embedded Processors / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2017). [10.1109/TETC.2017.2758641] 1-gen-2017 BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTOSQUILLERO, GIOVANNI + -
Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; SANCHEZ SANCHEZ, EDGAR ERNESTO; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2016), pp. 744-754. [10.1109/TC.2015.2498546] 1-gen-2016 BERNARDI, PAOLOCANTORO, RICCARDOSANCHEZ SANCHEZ, EDGAR ERNESTO + 07321794.pdf07321794-1.pdf
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test / DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 30:(2014), pp. 317-328. [10.1007/s10836-014-5457-5] 1-gen-2014 DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO + -
MIHST: A Hardware Technique for Embedded Microprocessor Functional On-line Self-Test / Bernardi, Paolo; Ciganda, LYL MERCEDES; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 63:11(2014), pp. 2760-2771. [10.1109/TC.2013.165] 1-gen-2014 BERNARDI, PAOLOCIGANDA, LYL MERCEDESSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo -
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption / Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - 9:(2013), pp. 253-263. [10.1166/jolpe.2013.1259] 1-gen-2013 BERNARDI, PAOLODE CARVALHO, MAURICIOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + -
An adaptive low-cost tester architecture supporting embedded memory volume diagnosis / Bernardi, Paolo; Ciganda, LYL MERCEDES. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 61:4(2012), pp. 1002-1018. [10.1109/TIM.2011.2179822] 1-gen-2012 BERNARDI, PAOLOCIGANDA, LYL MERCEDES -
A Parallel Tester Architecture for Accelerometerand Gyroscope MEMS Calibration and Test / Ciganda, LYL MERCEDES; Bernardi, Paolo; SONZA REORDA, Matteo; Barbieri, D.; Bonaria, L.; Losco, R.; Marcigot, L.; Straiotto, M.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 27:3(2011), pp. 389-402. [10.1007/s10836-011-5210-2] 1-gen-2011 CIGANDA, LYL MERCEDESBERNARDI, PAOLOSONZA REORDA, Matteo + -
A Hybrid Approach for Detection and Correction of Transient Faults in SoCs / Bernardi, Paolo; Grosso, Michelangelo; Bolzani Poehls, L.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - STAMPA. - Volume: 7 , Issue: 4:(2010), pp. 439-445. [10.1109/TDSC.2010.33] 1-gen-2010 BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, Matteo + -
Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug / Bernardi, Paolo; Grosso, Michelangelo; Rebaudengo, Maurizio; SONZA REORDA, Matteo. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - 4(2):(2010), pp. 104-113. [10.1049/iet-cdt.2008.0122] 1-gen-2010 BERNARDI, PAOLOGROSSO, MICHELANGELOREBAUDENGO, MaurizioSONZA REORDA, Matteo -
Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs / Appello, D; Bernardi, Paolo; Grosso, Michelangelo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 17 (11):(2009), pp. 1654-1659. [10.1109/TVLSI.2008.2006177] 1-gen-2009 BERNARDI, PAOLOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + -