BERNARDI, PAOLO

BERNARDI, PAOLO

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Pubblicazioni

Risultati 1 - 20 di 23 (tempo di esecuzione: 0.001 secondi).

CitazioneData di pubblicazioneAutoriFile
1A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques / D.APPELLO; A.FUDOLI; V.TANCORRE; BERNARDI P.; F.CORNO; M.REBAUDENGO; M.SONZA REORDA. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 20(2004), pp. 79-87.2004BERNARDI, PAOLO  ; CORNO, Fulvio  ; REBAUDENGO, MAURIZIO  ; SONZA REORDA, MATTEO  -
2A Hybrid Approach for Detection and Correction of Transient Faults in SoCs / Bernardi P.; Grosso M.; Bolzani Poehls L.; Sonza Reorda M.. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - STAMPA. - Volume: 7 , Issue: 4(2010), pp. 439-445.2010BERNARDI, PAOLO  ; GROSSO, MICHELANGELO  ; SONZA REORDA, MATTEO  Administrator05551155.pdf
3A new hybrid fault detection technique for systems-on-a-chip / BERNARDI P.; VEIRAS BOLZANI LM.; M.REBAUDENGO; M.SONZA REORDA; F.L.VARGAS; M.VIOLANTE. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 55(2006), pp. 185-198.2006BERNARDI, PAOLO  ; VEIRAS BOLZANI, Leticia Maria  ; REBAUDENGO, MAURIZIO  ; SONZA REORDA, MATTEO  ; VIOLANTE, MASSIMO  AdministratorTC_2006..pdf
4A Parallel Tester Architecture for Accelerometerand Gyroscope MEMS Calibration and Test / Ciganda L.; Bernardi P.; Sonza Reorda M.; Barbieri D.; Bonaria L.; Losco R.; Marcigot L.; Straiotto M.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 27:3(2011), pp. 389-402.2011CIGANDA, LYL MERCEDES  ; BERNARDI, PAOLO  ; SONZA REORDA, MATTEO  ; -
5A System-layer Infrastructure for SoC Diagnosis / BERNARDI P; GROSSO M; REBAUDENGO M.; SONZA REORDA M. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 23(2007), pp. 389-404.2007BERNARDI, PAOLO  ; GROSSO, MICHELANGELO  ; REBAUDENGO, MAURIZIO  ; SONZA REORDA, MATTEO  -
6Adaptive Management Techniques for Optimized Burn-In of Safety-Critical SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Venini, Federico. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - STAMPA. - 34(2018), pp. 43-52.2018BERNARDI, PAOLO  ; CANTORO, RICCARDO  ; RESTIFO, MARCO  ; VENINI, FEDERICO  AdministratorJETTA_FINA...
7An adaptive low-cost tester architecture supporting embedded memory volume diagnosis / Bernardi P.; Ciganda L.. - In: IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT. - ISSN 0018-9456. - STAMPA. - 61:4(2012), pp. 1002-1018.2012BERNARDI, PAOLO  ; CIGANDA, LYL MERCEDES  -
8An Effective technique for the Automatic Generation of Diagnosis-oriented Programs for Processor Cores / P. BERNARDI; E. SANCHEZ; M. SCHILLACI; G. SQUILLERO; SONZA REORDA M.. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 27(2008), pp. 570-574.2008BERNARDI, PAOLO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; SCHILLACI, MASSIMILIANO  ; SQUILLERO, GIOVANNI  ; SONZA REORDA, MATTEO  Administratortcad2008.pdf
9Development Flow for On-Line Core Self-Test of Automotive Microcontrollers / Bernardi, Paolo; Cantoro, Riccardo; De Luca, Sergio; Sanchez, Ernesto; Sansonetti, Alessandro. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - STAMPA. - 65:3(2015), pp. 744-754.2015BERNARDI, PAOLO  ; CANTORO, RICCARDO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; Administrator07321794.pdf
10Effective Diagnostic Pattern Generation Strategy forTransition-Delay Faults in Full-Scan SOCs / APPELLO D; BERNARDI P; GROSSO M.; SANCHEZ E; SONZA REORDA M. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - 17 (11)(2009), pp. 1654-1659.2009BERNARDI, PAOLO  ; GROSSO, MICHELANGELO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; SONZA REORDA, MATTEO  Administrator1851511.pdf
11An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In / Appello, Davide; Bernardi, Paolo; Cantoro, Riccardo; Colazzo, Andrea; Motta, Alessandro; Pagani, Alberto; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - STAMPA. - (2018), pp. 86-98.2018BERNARDI, PAOLO  ; CANTORO, RICCARDO  ; RESTIFO, MARCO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; VENINI, FEDERICO  AdministratorJOLPE_FINA...
12Exploiting an infrastructure-intellectual property for systems-on-chip test, diagnosis and silicon debug / BERNARDI P; GROSSO M.; REBAUDENGO M; SONZA REORDA M. - In: IET COMPUTERS & DIGITAL TECHNIQUES. - ISSN 1751-8601. - 4(2)(2010), pp. 104-113.2010BERNARDI, PAOLO  ; GROSSO, MICHELANGELO  ; REBAUDENGO, MAURIZIO  ; SONZA REORDA, MATTEO  -
13Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption / P. Bernardi;M. De Carvalho;E. Sanchez;M. Sonza Reorda;A. Bosio;L. Dilillo;M. Valka;P. Girard. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - 9(2013), pp. 253-263.2013BERNARDI, PAOLO  ; DE CARVALHO, MAURICIO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; SONZA REORDA, MATTEO  ; -
14HYBRID FAULT DETECTION TECHNIQUE A CASE STUDY ON VIRTEX-II PRO'S POWERPC / BERNARDI P.; L.STERPONE; M.VIOLANTE; M. PORTELA-GARCIA. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 53(2006), pp. 3550-3557.2006BERNARDI, PAOLO  ; STERPONE, LUCA  ; VIOLANTE, MASSIMO  ; -
15Identification and classification of single-event upsets in the configuration memory of sram-based fpgas / M. CESCHIA; M. VIOLANTE; M. SONZA REORDA; A. PACCAGNELLA; P. BERNARDI; REBAUDENGO M.; D. BORTOLATO; M. BELLATO; P. ZAMBOLIN; A. CANDELORI. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 50(2003), pp. 2088-2094.2003VIOLANTE, MASSIMO  ; SONZA REORDA, MATTEO  ; BERNARDI, PAOLO  ; REBAUDENGO, MAURIZIO  ; -
16Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test / de Carvalho, M.; Bernardi, P.; Sanchez, E.; Sonza Reorda, M.; Ballan, O.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 30(2014), pp. 317-328.2014DE CARVALHO, MAURICIO  ; BERNARDI, PAOLO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; SONZA REORDA, MATTEO  ; -
17Microprocessor Testing: Functional Meets Structural Test / Touati, A.; Girard, P.; Virazel, A.; Bosio, Alberto; Bernardi, Paolo; SONZA REORDA, Matteo. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 26:8(2017), pp. 1-18.2017BOSIO, ALBERTO  ; BERNARDI, PAOLO  ; SONZA REORDA, MATTEO  AdministratorS021812661...
18MIHST: A Hardware Technique for Embedded Microprocessor Functional On-line Self-Test / Paolo Bernardi;Lyl M. ciganda;Ernesto Sanchez;Matteo Sonza Reorda. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 63:11(2014), pp. 2760-2771.2014BERNARDI, PAOLO  ; CIGANDA, LYL MERCEDES  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; SONZA REORDA, MATTEO  Administrator06579592.pdf
19An Optimized Test During Burn-In for Automotive SoC / Appello, Davide; Bernardi, Paolo; Bugeja, Conrad; Cantoro, Riccardo; Pollaccia, Giorgio; Restifo, Marco; Ernesto, Sanchez; Venini, Federico. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - STAMPA. - (2018), pp. 46-53.2018BERNARDI, PAOLO  ; CANTORO, RICCARDO  ; RESTIFO, MARCO  ; SANCHEZ SANCHEZ, EDGAR ERNESTO  ; VENINI, FEDERICO  AdministratorPREPRINT_D...
20Scan-Chain Intra-Cell Aware Testing / Touati, Aymen; Bosio, Alberto; Girard, Patrick; Virazel, Arnaud; Bernardi, Paolo; SONZA REORDA, Matteo; Auvray, Etienne. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - STAMPA. - (2016), pp. 1-1.2016BERNARDI, PAOLO  ; SONZA REORDA, MATTEO  ; Administrator07737018.pdf

Dettaglio

BERNARDI, PAOLO 

Dipartimento di Automatica e Informatica 

Pagina personale

012326 

Pubblicazioni

 
 
 
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