A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress

Burn-In test equipment usually owns extensive memory capabilities to store pre-computed patterns to be applied to the circuit inputs as well as ad-hoc circuitries to drive and read the DUT pins during the BI phase. The solution proposed in this paper dramatically reduces the memory size requirement and just demands a generic microcontroller unit (MCU) equipped with a couple of embedded processors, some standard common peripheral units, and a few KB memories. Moreover, the proposed Burn-In tester could be integrated into a System Level Test equipment which is typically based on MCUs to communicate functionally with the DUT. This paper provides full details about the architecture of such a low-cost innovative tester, which can supply the DUT with unlimited pseudo-random patterns created autonomously by the MCU firmware from any selected seed. The tester prototype developed to collect experimental results includes a low-cost System-on-Chip based on a multi-core MCU and a set of peripheral cores, encompassing timers and Direct Memory Access modules. The tester prototype is used to stress an automotive chip accounting for about 20 million gates, 700 thousand scan flip-flops, and several scan modes. The combination of pseudo-random pattern generation with the ability to control different scan and Design for Testability (DfT) modes, including LBIST, permits to reach a higher coverage of stress metrics than by the application of a limited set of pre-computed ATPG patterns. The toggle coverage level reached is up to 95.89%. The application speed achieved by the tester with non-optimized connections is up to about 10MHz.