PIUMATTI, DAVIDE

PIUMATTI, DAVIDE  

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High-reliability uninterruptible power supply manager for critical virtualization cluster / Piumatti, Davide; Galletto, Andrea; Castagno, Flavio. - In: INTERNATIONAL JOURNAL OF POWER ELECTRONICS AND DRIVE SYSTEMS. - ISSN 2088-8694. - ELETTRONICO. - 15:2(2024), pp. 1117-1127. [10.11591/ijpeds.v15.i2.pp1117-1127] 1-gen-2024 Piumatti, DavideGalletto, AndreaCastagno, Flavio -
On the integration and hardening of Software Test Libraries in Real-Time Operating Systems / Angione, Francesco; Bernardi, Paolo; Cantoro, Riccardo; Di Gruttola Giardino, Nicola; Piumatti, Davide; Reorda, Matteo Sonza; Appello, Davide; Tancorre, Vincenzo. - (2023), pp. 1-6. (Intervento presentato al convegno Latin American Test Symposium tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154492]. 1-gen-2023 Angione, FrancescoBernardi, PaoloCantoro, RiccardoDi Gruttola Giardino, NicolaPiumatti, DavideReorda, Matteo Sonza + On_the_integration_and_hardening_of_Software_Test_Libraries_in_Real-Time_Operating_Systems.pdf
A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] 1-gen-2022 Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo Termico_FINALpoof.pdf1-s2.0-S0026271421003826-main.pdf
An innovative Strategy to Quickly Grade Functional Test Programs / Angione, Francesco; Bernardi, Paolo; Calabrese, Andrea; Cardone, Lorenzo; Niccoletti, Alessandro; Piumatti, Davide; Quer, Stefano; Appello, Davide; Tancorre, Vincenzo; Ugioli, Roberto. - (2022), pp. 355-364. (Intervento presentato al convegno International Test Conference tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00044]. 1-gen-2022 Francesco AngionePaolo BernardiAndrea CalabreseLorenzo CardoneDavide PiumattiStefano Quer + An_innovative_Strategy_to_Quickly_Grade_Functional_Test_Programs.pdf
A Suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices / Ruospo, A.; Piumatti, D.; Floridia, A.; Sanchez, E.. - ELETTRONICO. - (2021), pp. 1-6. (Intervento presentato al convegno 27th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2021 tenutosi a Torino, Italy nel 2021) [10.1109/IOLTS52814.2021.9486704]. 1-gen-2021 Ruospo A.Piumatti D.Floridia A.Sanchez E. FINAL_PUBLISHED.pdf
Reliability in Power Electronics and Power Systems / Piumatti, Davide. - (2021 Jul 08), pp. 1-165. 8-lug-2021 PIUMATTI, DAVIDE conv_versione_finale_tesi.pdfconv_abstract_finale.pdf
An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115:(2020), p. 113962. [10.1016/j.microrel.2020.113962] 1-gen-2020 Piumatti, D.Sanchez, E.Bernardi, P. + 1-s2.0-S0026271420307939-main-post print.pdfVersione editoriale pre print.pdf
Assessing the effectiveness of different test approaches for power devices in a PCB / Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - (2020), pp. 1-14. [10.1109/JESTPE.2020.3013229] 1-gen-2020 Piumatti, DavideBorlo, StefanoReorda, Matteo SonzaBojoi, Radu FINAL VERSION.pdf09153558.pdf
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro. - ELETTRONICO. - (2020), pp. 1235-1240. (Intervento presentato al convegno 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) tenutosi a Grenoble, France nel 9-13 March, 2020) [10.23919/DATE48585.2020.9116239]. 1-gen-2020 Floridia, AndreaPiumatti, DavideRuospo, AnnachiaraSanchez, Ernesto + DATE_CACHES.pdfpost_print_IEEE.pdf
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors / Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco. - In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS. - ISSN 2319-2518. - STAMPA. - 9:4(2020), pp. 206-212. [10.18178/ijeetc.9.4.206-212] 1-gen-2020 Matteo V. QuitadamoDavide PiumattiMatteo Sonza ReordaFranco Fiori 5fad2e2165a91658384c85f25b0f4f87d3ef.pdf
Multilevel Simulation Methodology for FMECA Study Applied to a Complex Cyber-Physical System / Piumatti, Davide; Sini, Jacopo; Borlo, Stefano; Sonza Reorda, Matteo; Bojoi, Radu; Violante, Massimo. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:10(2020), p. 1736. [10.3390/electronics9101736] 1-gen-2020 Piumatti, DavideSini, JacopoBorlo, StefanoSonza Reorda, MatteoBojoi, RaduViolante, Massimo electronics-09-01736.pdf
Test Solution for Heatsinks in Power Electronics Applications / Piumatti, Davide; Borlo, Stefano; Quitadamo, Matteo Vincenzo; Sonza Reorda, Matteo; Giacomo Armando, Eric; Fiori, Franco. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:6(2020), pp. 1-15. [10.3390/electronics9061020] 1-gen-2020 Piumatti, DavideBorlo, StefanoQuitadamo, Matteo VincenzoSonza Reorda, MatteoGiacomo Armando, EricFiori, Franco electronics-09-01020.pdf
Testing Heatsink Faults in Power Transistors by means of Thermal Model / Piumatti, Davide; Quitadamo, Matteo Vincenzo; Reorda, Matteo Sonza; Fiori, Franco. - (2020), pp. 1-6. (Intervento presentato al convegno 21st IEEE Latin-American Test Symposium (LATS20) tenutosi a Jatiúca (Maceió), Brazil nel 30th March - 2nd April 2020) [10.1109/LATS49555.2020.9093674]. 1-gen-2020 Piumatti, DavideQuitadamo, Matteo VincenzoReorda, Matteo SonzaFiori, Franco 09093674.pdfThermal_faults_V_4_CR_no_layout_editoriale.pdf
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana. - ELETTRONICO. - (2019), pp. 1-10. (Intervento presentato al convegno 2019 IEEE International Test Conference (ITC) tenutosi a Washington (USA) nel 9 - 15 November, 2019) [10.1109/ITC44170.2019.9000129]. 1-gen-2019 Andrea FloridiaDavide PiumattiRUOSPO, ANNACHIARAErnesto Sanchez + pre_print_IEEE.pdfpost_print_IEEE.pdf
A Possible Strategy for the Development of Software Test Libraries for different Processors of the same Family / Piumatti, Davide; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mosè. - ELETTRONICO. - ART 2019:(2019). (Intervento presentato al convegno ART 2019 tenutosi a Washington d.c. nel 14-15 November 2019). 1-gen-2019 Davide PiumattiErnesto Sanchez + -
Assessing the Effectiveness of the Test of Power Devices at the Board Level / Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; SONZA REORDA, Matteo; Bojoi, IUSTIN RADU. - 2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019:(2019), pp. 1-6. (Intervento presentato al convegno 34th IEEE Conference on Design of Circuits and Integrated Systems (DCIS 19) tenutosi a Bilbao, Spain nel November 20 – 22, 2019) [10.1109/DCIS201949030.2019.8959845]. 1-gen-2019 Davide PiumattiBORLO, STEFANOFabio MandrileMatteo Sonza ReordaRadu Bojoi Assessing the Effectiveness of the Test of Power Devices at the Board Level (5C7B5).pdf08959845.pdf
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool / Bernardi, P.; Piumatti, D.; Sanchez, E.. - ELETTRONICO. - (2019), pp. 77-80. (Intervento presentato al convegno 10th IEEE Latin American Symposium on Circuits and Systems 2019 (LASCAS19) tenutosi a Armenia, Quindío, Colombia nel February 24 - 27, 2019) [10.1109/LASCAS.2019.8667573]. 1-gen-2019 Bernardi, P.Piumatti, D.Sanchez, E. -
Hybrid on-line self-test architecture for computational units on embedded processor cores / Floridia, Andrea; Mongano, Gianmarco; Piumatti, Davide; Sanchez, Ernesto. - IEEE DDECS19:(2019), pp. 1-6. (Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019) [10.1109/DDECS.2019.8724647]. 1-gen-2019 Floridia, AndreaPiumatti, DavideSanchez, Ernesto + -
Increasing the Robustness of Software Test Libraries in Multi-core System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mose. - ART 2019:(2019). (Intervento presentato al convegno ART 2019 tenutosi a Washington d.c. nel 14-15 November 2019). 1-gen-2019 Andrea FloridiaDavide PiumattiAnnachiara RuospoErnesto Sanchez + -
New categories of Safe Faults in a processor-based Embedded System / Gursoy, C.; Jenihhin, M.; Oyeniran, A. S.; Piumatti, D.; Raik, J.; Reorda, M. Sonza; Ubar, R.. - DDECS19:(2019), pp. 1-4. (Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019) [10.1109/DDECS.2019.8724642]. 1-gen-2019 Piumatti, D.Reorda, M. Sonza + -