PIUMATTI, DAVIDE

PIUMATTI, DAVIDE  

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About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications / Cantoro, R.; Firrincieli, Andrea; Piumatti, D.; Restifo, M.; Sanchez, E.; Reorda, M. Sonza. - STAMPA. - 2018-:(2018), pp. 1-6. ((Intervento presentato al convegno 19th IEEE Latin-American Test Symposium, LATS 2018 tenutosi a bra nel 2018 [10.1109/LATW.2018.8349679]. 1-gen-2018 Cantoro, R.FIRRINCIELI, ANDREAPiumatti, D.Restifo, M.Sanchez, E.Reorda, M. Sonza 08349679.pdflats18 preprint.pdf
Analysis of Fault Simulations Result during development of a Software Test Library / Floridia, A.; Piumatti, D.; Ruospo, A.; Sanchez, E.. - ELETTRONICO. - ART 2018:(2018). ((Intervento presentato al convegno ART 2018 tenutosi a Phoenix, Arizona, USA nel November 01-02, 2018.. 1-gen-2018 A. FloridiaD. PiumattiRUOSPO, ANNACHIARAE. Sanchez -
Assessing Test Procedure Effectiveness for Power Devices / Piumatti, Davide; Sonza Reorda, M.. - ELETTRONICO. - 2018:(2018), pp. 1-6. ((Intervento presentato al convegno 33th IEEE Conference on Design of Circuits and Integrated Systems tenutosi a Lione, Francia nel November 14-16 2018 [10.1109/DCIS.2018.8681495]. 1-gen-2018 PIUMATTI, DAVIDEM. Sonza Reorda -
Assessing the effectiveness of different test approaches for power devices in a PCB / Piumatti, Davide; Borlo, Stefano; Reorda, Matteo Sonza; Bojoi, Radu. - In: IEEE JOURNAL OF EMERGING AND SELECTED TOPICS IN POWER ELECTRONICS. - ISSN 2168-6777. - ELETTRONICO. - (2020), pp. 1-14. [10.1109/JESTPE.2020.3013229] 1-gen-2020 Piumatti, DavideBorlo, StefanoReorda, Matteo SonzaBojoi, Radu FINAL VERSION.pdf09153558.pdf
Assessing the Effectiveness of the Test of Power Devices at the Board Level / Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; Sonza Reorda, Matteo; Bojoi, Iustin Radu. - IEEE DCIS19:(In corso di stampa). ((Intervento presentato al convegno 34th IEEE Conference on Design of Circuits and Integrated Systems (DCIS 19) tenutosi a Bilbao, Spain nel November 20 – 22, 2019. In corso di stampa Davide PiumattiBORLO, STEFANOFabio MandrileMatteo Sonza ReordaRadu Bojoi -
Assessing the Effectiveness of the Test of Power Devices at the Board Level / Piumatti, Davide; Borlo, Stefano; Mandrile, Fabio; Reorda, Matteo Sonza; Bojoi, Radu. - IEEE DCIS19:(2019), pp. 1-6. ((Intervento presentato al convegno XXXIV Conference on Design of Circuits and Integrated Systems (DCIS) 2019 tenutosi a Bilbao, Spagna nel 20-22 Nov. 2019 [10.1109/DCIS201949030.2019.8959845]. 1-gen-2019 Piumatti, DavideBorlo, StefanoMandrile, FabioReorda, Matteo SonzaBojoi, Radu Assessing the Effectiveness of the Test of Power Devices at the Board Level (5C7B5).pdf08959845.pdf
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana. - ELETTRONICO. - (2019), pp. 1-10. ((Intervento presentato al convegno 2019 IEEE International Test Conference (ITC) tenutosi a Washington (USA) nel 9 - 15 November, 2019 [10.1109/ITC44170.2019.9000129]. 1-gen-2019 Andrea FloridiaDavide PiumattiRUOSPO, ANNACHIARAErnesto Sanchez + pre_print_IEEE.pdfpost_print_IEEE.pdf
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro. - ELETTRONICO. - (2020), pp. 1235-1240. ((Intervento presentato al convegno 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) tenutosi a Grenoble, France nel 9-13 March, 2020 [10.23919/DATE48585.2020.9116239]. 1-gen-2020 Floridia, AndreaPiumatti, DavideRuospo, AnnachiaraSanchez, Ernesto + DATE_CACHES.pdfpost_print_IEEE.pdf
An efficient strategy for the development of software test libraries for an automotive microcontroller family / Piumatti, D.; Sanchez, E.; Bernardi, P.; Martorana, R.; Pernice, M. A.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 115:(2020), p. 113962. [10.1016/j.microrel.2020.113962] 1-gen-2020 Piumatti, D.Sanchez, E.Bernardi, P. + 1-s2.0-S0026271420307939-main-post print.pdfVersione editoriale pre print.pdf
Facilitating Fault-Simulation Comprehension through a Fault-Lists Analysis Tool / Bernardi, P.; Piumatti, D.; Sanchez, E.. - ELETTRONICO. - (2019), pp. 77-80. ((Intervento presentato al convegno 10th IEEE Latin American Symposium on Circuits and Systems 2019 (LASCAS19) tenutosi a Armenia, Quindío, Colombia nel February 24 - 27, 2019 [10.1109/LASCAS.2019.8667573]. 1-gen-2019 Bernardi, P.Piumatti, D.Sanchez, E. -
Faults Detection in the Heatsinks Mounted on Power Electronic Transistors / Quitadamo, Matteo V.; Piumatti, Davide; SONZA REORDA, Matteo; Fiori, Franco. - In: INTERNATIONAL JOURNAL OF ELECTRICAL AND ELECTRONIC ENGINEERING AND TELECOMMUNICATIONS. - ISSN 2319-2518. - STAMPA. - (2019). [10.18178/injeet.191001] 1-gen-2019 Matteo V. QuitadamoDavide PiumattiMatteo Sonza ReordaFranco Fiori 20191209042309355.pdf
Hybrid on-line self-test architecture for computational units on embedded processor cores / Floridia, Andrea; Mongano, Gianmarco; Piumatti, Davide; Sanchez, Ernesto. - IEEE DDECS19:(2019), pp. 1-6. ((Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019 [10.1109/DDECS.2019.8724647]. 1-gen-2019 Floridia, AndreaPiumatti, DavideSanchez, Ernesto + -
In-field functional test programs development flow for embedded FPUs / Cantoro, Riccardo; Piumatti, Davide; Bernardi, Paolo; De Luca, S.; Sansonetti, A.. - STAMPA. - (2016), pp. 107-110. ((Intervento presentato al convegno 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Storrs (USA) nel 19-20 Sept. 2016 [10.1109/DFT.2016.7684079]. 1-gen-2016 CANTORO, RICCARDOPIUMATTI, DAVIDEBERNARDI, PAOLO + PUBLISHED_07684079.pdf
Increasing the Robustness of Software Test Libraries in Multi-core System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mose. - ART 2019:(2019). ((Intervento presentato al convegno ART 2019 tenutosi a Washington d.c. nel 14-15 November 2019. 1-gen-2019 Andrea FloridiaDavide PiumattiAnnachiara RuospoErnesto Sanchez + -
Multilevel Simulation Methodology for FMECA Study Applied to a Complex Cyber-Physical System / Piumatti, Davide; Sini, Jacopo; Borlo, Stefano; Sonza Reorda, Matteo; Bojoi, Radu; Violante, Massimo. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 9:10(2020), p. 1736. [10.3390/electronics9101736] 1-gen-2020 Piumatti, DavideSini, JacopoBorlo, StefanoSonza Reorda, MatteoBojoi, RaduViolante, Massimo electronics-09-01736.pdf
New categories of Safe Faults in a processor-based Embedded System / Gursoy, C.; Jenihhin, M.; Oyeniran, A. S.; Piumatti, D.; Raik, J.; Reorda, M. Sonza; Ubar, R.. - DDECS19:(2019), pp. 1-4. ((Intervento presentato al convegno Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Cluj-Napoca nel April 24-26, 2019 [10.1109/DDECS.2019.8724642]. 1-gen-2019 Piumatti, D.Reorda, M. Sonza + -
A New Technique to Check the Correct Mounting of the Power Module Heatsinks / Quitadamo, Matteo Vincenzo; Piumatti, Davide; Raviola, Erica; Fiori, Franco; Sonza Reorda, Matteo. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 128:(2022). [10.1016/j.microrel.2021.114416] 1-gen-2022 Quitadamo, Matteo VincenzoPiumatti, DavideRaviola, EricaFiori, FrancoSonza Reorda, Matteo Termico_FINALpoof.pdf1-s2.0-S0026271421003826-main.pdf
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions / Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - IEEE DATE 2019:(2019), pp. 920-923. ((Intervento presentato al convegno Design, Automation and Test in Europe; DATE 2019 [10.23919/DATE.2019.8714780]. 1-gen-2019 Bernardi, P.Cantoro, R.Floridia, A.Piumatti, D.Ruospo, A.Sanchez, E. + -
On the In-field Testing of Spare Modules in Automotive Microprocessors / Piumatti, Davide; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; Regis, Simone; Luca, Segio De; Sansonetti, Alessandro. - (2017). ((Intervento presentato al convegno 25th IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC). 1-gen-2017 PIUMATTI, DAVIDEBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTO + -
Parallel software-based self-test suite for multi-core system-on-chip: Migration from single-core to multi-core automotive microcontrollers / Floridia, A.; Piumatti, D.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - STAMPA. - (2018), pp. 1-6. ((Intervento presentato al convegno 2018 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) tenutosi a Taormina, Italy nel 9-12 April 2018 [10.1109/DTIS.2018.8368558]. 1-gen-2018 Floridia, A.Piumatti, D.Sanchez, E. + -