RUOSPO, ANNACHIARA

RUOSPO, ANNACHIARA  

Dipartimento di Automatica e Informatica  

041203  

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Risultati 1 - 20 di 25 (tempo di esecuzione: 0.02 secondi).
Citazione Data di pubblicazione Autori File
Analysis of Fault Simulations Result during development of a Software Test Library / Floridia, A.; Piumatti, D.; Ruospo, A.; Sanchez, E.. - ELETTRONICO. - ART 2018:(2018). ((Intervento presentato al convegno ART 2018 tenutosi a Phoenix, Arizona, USA nel November 01-02, 2018.. 1-gen-2018 A. FloridiaD. PiumattiRUOSPO, ANNACHIARAE. Sanchez -
A Benchmark Suite of RT-level Hardware Trojansfor Pipelined Microprocessor Cores / Damljanovic, Aleksa; Ruospo, Annachiara; Sanchez Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (2021). ((Intervento presentato al convegno 24th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Vienna, Austria nel April 7-9. 1-gen-2021 Damljanovic, AleksaRuospo, AnnachiaraSanchez Sanchez, ErnestoSquillero, Giovanni Trojan2021_DDECS_.pdf
A Decentralized Scheduler for On-line Self-test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Sergio De Luca, ; Rosario, Martorana. - ELETTRONICO. - (2019), pp. 1-10. ((Intervento presentato al convegno 2019 IEEE International Test Conference (ITC) tenutosi a Washington (USA) nel 9 - 15 November, 2019 [10.1109/ITC44170.2019.9000129]. 1-gen-2019 Andrea FloridiaDavide PiumattiRUOSPO, ANNACHIARAErnesto Sanchez + pre_print_IEEE.pdfpost_print_IEEE.pdf
Design, Verification, Test, and In-Field Implications of Approximate Digital Integrated Circuits / Bosio, Alberto; Di Carlo, Stefano; Girard, Patrick; Ruospo, Annachiara; Sanchez, Ernesto; Savino, Alessandro; Sekanina, Lukas; Traiola, Marcello; Vasicek, Zdenek; Virazel, Arnaud. - STAMPA. - (2022), pp. 349-385. [10.1007/978-3-030-94705-7_12] 1-gen-2022 Bosio, AlbertoDi Carlo, StefanoRuospo, AnnachiaraSanchez, ErnestoSavino, Alessandro + chapter12.pdfprinted-chapter.pdf
Deterministic Cache-based Execution of On-line Self-Test Routines in Multi-core Automotive System-on-Chips / Floridia, Andrea; Carmona, Tzamn Melendez; Piumatti, Davide; Ruospo, Annachiara; Sanchez, Ernesto; Luca, Sergio De; Martorana, Rosario; Pernice, Mose Alessandro. - ELETTRONICO. - (2020), pp. 1235-1240. ((Intervento presentato al convegno 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) tenutosi a Grenoble, France nel 9-13 March, 2020 [10.23919/DATE48585.2020.9116239]. 1-gen-2020 Floridia, AndreaPiumatti, DavideRuospo, AnnachiaraSanchez, Ernesto + DATE_CACHES.pdfpost_print_IEEE.pdf
Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks / Matana Luza, Lucas; Ruospo, Annachiara; Soderstrom, Daniel; Cazzaniga, Carlo; Kastriotou, Maria; Sanchez, Ernesto; Bosio, Alberto; Dilillo, Luigi. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - (2021). [10.1109/TETC.2021.3116999] 1-gen-2021 Ruospo, AnnachiaraSanchez, Ernesto + 2021_TETC___Emulating_the_Effects_of_Radiation_Induced_Soft_Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdfPUBLISHED_Emulating_the_Effects_of_Radiation-Induced_Soft-Errors_for_the_Reliability_Assessment_of_Neural_Networks.pdf
Evaluating Convolutional Neural Networks Reliability depending on their Data Representation / Ruospo, Annachiara; Bosio, Alberto; Ianne, Alessandro; Ernesto, Sanchez. - ELETTRONICO. - (2020), pp. 672-679. ((Intervento presentato al convegno Euromicro Conference on Digital System Design (DSD) 2020 tenutosi a Kranj, Slovenia (virtual event) nel August 26 – 28, 2020 [10.1109/DSD51259.2020.00109]. 1-gen-2020 Annachiara RuospoAlberto BosioAlessandro IanneErnesto Sanchez 09217880_POSTPRINT.pdfDSD_ACK_CR.pdf
Increasing the Robustness of Software Test Libraries in Multi-core System-on-Chips / Floridia, Andrea; Piumatti, Davide; Ruospo, Annachiara; Ernesto, Sanchez; Martorana, Rosario; Alessandro Pernice, Mose. - ART 2019:(2019). ((Intervento presentato al convegno ART 2019 tenutosi a Washington d.c. nel 14-15 November 2019. 1-gen-2019 Andrea FloridiaDavide PiumattiAnnachiara RuospoErnesto Sanchez + -
Investigating data representation for efficient and reliable Convolutional Neural Networks / Ruospo, Annachiara; Sanchez, Ernesto; Traiola, Marcello; O’Connor, Ian; Bosio, Alberto. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - ELETTRONICO. - 86:(2021), p. 104318. [10.1016/j.micpro.2021.104318] 1-gen-2021 Ruospo, AnnachiaraSanchez, Ernesto + FINAL_POSTPRODUCTION_PUBLISHED.pdf
Machine Learning for Hardware Security: Classifier-based Identification of Trojans in Pipelined Microprocessors / Damljanovic, Aleksa; Ruospo, Annachiara; Ernesto, Sanchez; Squillero, Giovanni. - In: APPLIED SOFT COMPUTING. - ISSN 1568-4946. - ELETTRONICO. - 116:(2022), pp. 1-16. [https://doi.org/10.1016/j.asoc.2021.108068] 1-gen-2022 Aleksa DamljanovicAnnachiara RuospoErnesto SanchezGiovanni Squillero HT_ML_Elsevier.pdf1-s2.0-S1568494621009753-main.pdf
A Model-Based Framework to Assess the Reliability of Safety-Critical Applications / Matana Luza, Lucas; Ruospo, Annachiara; Bosio, Alberto; Ernesto, Sanchez; Dilillo, Luigi. - ELETTRONICO. - (2021), pp. 41-44. ((Intervento presentato al convegno 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Vienna, Austria nel 7-9 April 2021 [10.1109/DDECS52668.2021.9417059]. 1-gen-2021 Annachiara RuospoErnesto Sanchez + 2021_DDECS___preprint.pdf09417059_postprint.pdf
Non-Intrusive Self-Test Library for Automotive Critical Applications: Constraints and Solutions / Bernardi, P.; Cantoro, R.; Floridia, A.; Piumatti, D.; Pogonea, C.; Ruospo, A.; Sanchez, E.; De Luca, S.; Sansonetti, A.. - IEEE DATE 2019:(2019), pp. 920-923. ((Intervento presentato al convegno Design, Automation and Test in Europe; DATE 2019 [10.23919/DATE.2019.8714780]. 1-gen-2019 Bernardi, P.Cantoro, R.Floridia, A.Piumatti, D.Ruospo, A.Sanchez, E. + -
On the detection of always-on hardware trojans supported by a pre-silicon verification methodology / Ruospo, A.; Sanchez, E.. - ELETTRONICO. - (2019), pp. 25-30. ((Intervento presentato al convegno 20th International Workshop on Microprocessor/SoC Test, Security and Verification, MTV 2019 tenutosi a usa nel 2019 [10.1109/MTV48867.2019.00013]. 1-gen-2019 Ruospo A.Sanchez E. 09027216_EDITORIALE.pdfMTV2019.pdf
On the Reliability Assessment of Artificial Neural Networks Running on AI-Oriented MPSoCs / Ruospo, Annachiara; Ernesto, Sanchez. - In: APPLIED SCIENCES. - ISSN 2076-3417. - ELETTRONICO. - 11:14(2021). [10.3390/app11146455] 1-gen-2021 Annachiara RuospoErnesto Sanchez applsci-11-06455.pdfOn_the_Reliability_Assessment_of_Artificial_Neural_Networks_Running_on_AI_Oriented_MPSoCs_final.pdf
On-line Testing for Autonomous Systems driven by RISC-V Processor Design Verification / Ruospo, Annachiara; Cantoro, Riccardo; Ernesto, Sanchez; Pasquale Davide Schiavone, ; Angelo, Garofalo; Benini, Luca. - ELETTRONICO. - IEEE The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems:(2019). ((Intervento presentato al convegno The 32nd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems tenutosi a Noordwijk, Netherlands, Netherlands nel October 2 – October 4, 2019 [10.1109/DFT.2019.8875345]. 1-gen-2019 Annachiara RuospoRiccardo CantoroErnesto SanchezBENINI, LUCA + 08875345.pdfDFT2019_postprint.pdf
An Open-Source Verification Framework for Open-Source Cores: A RISC-V Case Study / Schiavone, P. D.; Sanchez, E.; Ruospo, A.; Minervini, F.; Zaruba, F.; Haugou, G.; Benini, L.. - 2018-:(2019), pp. 43-48. ((Intervento presentato al convegno 26th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2018 tenutosi a Verona (Italia) nel 2018 [10.1109/VLSI-SoC.2018.8644818]. 1-gen-2019 Sanchez E.Ruospo A.Benini L. + -
A Pipelined Multi-Level Fault Injector for Deep Neural Networks / Ruospo, Annachiara; Balaara, Angelo; Bosio, Alberto; Ernesto, Sanchez. - ELETTRONICO. - (2020). ((Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a ESA-ESRIN, Frascati (Rome) Italy nel October 19 – October 21, 2020 [10.1109/DFT50435.2020.9250866]. 1-gen-2020 Annachiara RuospoAngelo BalaaraAlberto BosioErnesto Sanchez DFT_2020_CR_FINAL.pdf
Pros and Cons of Fault Injection Approaches for the Reliability Assessment of Deep Neural Networks / Ruospo, Annachiara; Matana Luza, Lucas; Bosio, Alberto; Traiola, Marcello; Dilillo, Luigi; Ernesto, Sanchez. - ELETTRONICO. - (2021), pp. 1-5. ((Intervento presentato al convegno LATS 2021 : IEEE Latin-American Test Symposium tenutosi a Punta del Este, Uruguay nel Oct 27, 2021 - Oct 29, 2021 [10.1109/LATS53581.2021.9651807]. 1-gen-2021 Annachiara RuospoErnesto Sanchez + 2021_LATS_CR.pdfPros_and_Cons_of_Fault_Injection_Approaches_for_the_Reliability_Assessment_of_Deep_Neural_Networks.pdf
A reliability analysis of a deep neural network / Bosio, A.; Bernardi, P.; Ruospo, A.; Sanchez, E.. - (2019), pp. 1-6. ((Intervento presentato al convegno 20th IEEE Latin American Test Symposium, LATS 2019 tenutosi a Santiago del Chile nel 2019 [10.1109/LATW.2019.8704548]. 1-gen-2019 Bernardi P.Ruospo A.Sanchez E. + -
Reliability and Security Assessment of Modern Embedded Devices / Ruospo, Annachiara. - (2022 Jul 05), pp. 1-193. 5-lug-2022 RUOSPO, ANNACHIARA conv_phd_thesis.pdfconv_phd_thesis_summary.pdf