FARNAGHINEJAD, BEHNAM

FARNAGHINEJAD, BEHNAM  

Dipartimento di Automatica e Informatica  

097287  

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Case Study: Integrating RISC-V Zicfiss Shadow Stack Support for Control-Flow Integrity on the CVA6 Processor / Farnaghinejad, Behnam; Sanchez, Ernesto. - ELETTRONICO. - (2026), pp. 1-2. ( 27th IEEE Latin American Test Symposium (LATS 2026) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480312]. 1-gen-2026 Farnaghinejad, BehnamSanchez, Ernesto Case_Study_Integrating_RISC-V_Zicfiss_Shadow_Stack_Support_for_Control-Flow_Integrity_on_the_CVA6_Processor.pdfCase_Study__LATS2026__Integrating_RISC_V_Zicfiss_Shadow_Stack_Support_for_Control_Flow_Integrity_on_the_CVA6_Processor.pdf
Deep Learning-Based Power Side-Channel Evaluation from RTL Switching-Activity Proxies / Farnaghinejad, Behnam; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto. - ELETTRONICO. - (2026), pp. 1-6. ( 27th IEEE Latin American Test Symposium (LATS 2026) Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480302]. 1-gen-2026 Farnaghinejad, BehnamRuospo, AnnachiaraSavino, AlessandroDi Carlo, StefanoSanchez, Ernesto Paper__LATS2026__Deep_Learning_Based_Power_Side_Channel_Evaluation_from_RTL_Switching_Activity_Proxies.pdfDeep_Learning-Based_Power_Side-Channel_Evaluation_from_RTL_Switching-Activity_Proxies.pdf
Late Contribution: VeriSide: A Modified Verilator for Leakage Assessment at the RTL Level / Farnaghinejad, Behnam; Porsia, Antonio; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 1-2. ( 26th IEEE Latin American Test Samposium 2025 San Andres Islas (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963943]. 1-gen-2025 Farnaghinejad, BehnamPorsia, AntonioRuospo, AnnachiaraSavino, AlessandroDi Carlo, StefanoSanchez, Ernesto LATS2025_IRIS.pdfLate_Contribution_VeriSide_A_Modified_Verilator_for_Leakage_Assessment_at_the_RTL_Level.pdf
Power Side-Channel Vulnerabilities of a RISC-V Cryptography Accelerator Integrated into CVA6 via Core-V eXtension Interface (CV-X-IF) / Farnaghinejad, Behnam; Bellizia, Davide; Dolmeta, Alessandra; Masera, Guido; Porsia, Antonio; Ruospo, Annachiara; Di Carlo, Stefano; Savino, Alessandro; Sanchez, Ernesto. - (2025), pp. 233-242. ( International Test Conference 2025 San Diego, California (USA) September 20-26, 2025) [10.1109/ITC58126.2025.00030]. 1-gen-2025 Behnam FarnaghinejadAlessandra DolmetaGuido MaseraAntonio PorsiaAnnachiara RuospoStefano Di CarloAlessandro SavinoErnesto Sanchez + ITC2025___Power_Side_Channel_Vulnerabilities_of_a_RISC_V_Cryptography_Accelerator_Integrated_into_CVA6_via_CV_X_IF.pdfPower_Side-Channel_Vulnerabilities_of_a_RISC-V_Cryptography_Accelerator_Integrated_into_CVA6_via_Core-V_eXtension_Interface_CV-X-IF.pdf