DI CARLO, STEFANO

DI CARLO, STEFANO  

Dipartimento di Automatica e Informatica  

003272  

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Risultati 1 - 20 di 283 (tempo di esecuzione: 0.032 secondi).
Citazione Data di pubblicazione Autori File
Automatic linux malware detection using binary inspection and runtime opcode tracing / Alonso, Martí; Gironés, Andreu; Costa, Juan-José; Morancho, Enric; Di Carlo, Stefano; Canal, Ramon. - In: MICROPROCESSORS AND MICROSYSTEMS. - ISSN 0141-9331. - ELETTRONICO. - 120:(2026), pp. 1-8. [10.1016/j.micpro.2025.105237] 1-gen-2026 Di Carlo, Stefano + 2025_DFTS_extension__Malware_Attacks__Martý_Andreu_.pdf1-s2.0-S0141933125001048-main.pdf
AI-based Classification of Intentional vs. Unintentional Corruptions in the Split Computing context / Esposito, Giuseppe; Magliano, Enrico; Scarano, Nicola; Ahmed-Eltaras, Tamer; Guerrero-Balaguera, Juan-David; Mannella, Luca; Rodriguez-Condia, Josie-Esteban; Ruospo, Annachiara; Di Carlo, Stefano; Levorato, Marco; Savino, Alessandro; Sonza Reorda, Matteo. - (2025), pp. 1-7. ( 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) Ischia, Naples, Italy 7-9 July 2025) [10.1109/IOLTS65288.2025.11116959]. 1-gen-2025 Esposito, GiuseppeMagliano, EnricoScarano, NicolaAhmed-Eltaras,TamerGuerrero-Balaguera, Juan-DavidMannella, LucaRodriguez-Condia, Josie-EstebanRuospo, AnnachiaraDi Carlo, StefanoLevorato, MarcoSavino, AlessandroSonza Reorda, Matteo _IOLTS_2025__Split_Reliabiliy_and_Security-6.pdfAI-Based_Classification_of_Adversarial_Attacks_vs._Hardware_Fault_Corruptions_in_the_Split_Computing_Context.pdf
Assessing LLMs models’ knowledge of automotive cyberthreats benchmarking autoISAC framework / Scarano, Nicola; Mannella, Luca; Savino, Alessandro; Di Carlo, Stefano. - ELETTRONICO. - (2025), pp. 1-7. (Intervento presentato al convegno CSCS '25: 2nd Cyber Security in CarS Workshop (CSC) tenutosi a Taipei (TWN) nel October 13-17, 2025) [10.1145/3736130.3762690]. 1-gen-2025 Scarano, NicolaMannella, LucaSavino, AlessandroDi Carlo, Stefano 3736130.3762690.pdf
Braided interferometer mesh for robust photonic matrix-vector multiplications with non-ideal components / Marchesin, Federico; Hejda, Matĕj; Melendez Carmona, Tzamn; Di Carlo, Stefano; Savino, Alessandro; Pavanello, Fabio; Van Vaerenbergh, Thomas; Bienstman, Peter. - In: OPTICS EXPRESS. - ISSN 1094-4087. - 33:2(2025), pp. 2227-2246. [10.1364/oe.547206] 1-gen-2025 Melendez Carmona, TzamnDi Carlo, StefanoSavino, Alessandro + 25-01-Opt Express.pdf
CANDoSA: A Hardware Performance Counter-Based Intrusion Detection System for DoS Attacks on Automotive CAN Bus / Oberti, Franco; Di Carlo, Stefano; Savino, Alessandro. - ELETTRONICO. - (2025), pp. 1-5. ( 31st IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2025 Ischia (ITA) 07-09 July 2025) [10.1109/iolts65288.2025.11116886]. 1-gen-2025 Oberti, FrancoDi Carlo, StefanoSavino, Alessandro Paper___IOLTS_2025___CANDoSA.pdfCANDoSA_A_Hardware_Performance_Counter-Based_Intrusion_Detection_System_for_DoS_Attacks_on_Automotive_CAN_Bus.pdf
Energy-Efficient Digital Design: A Comparative Study of Event-Driven and Clock-Driven Spiking Neurons / Marostica, F.; Carpegna, A.; Savino, A.; Di Carlo, S.. - ELETTRONICO. - (2025), pp. 1-6. ( IEEE Computer Society Annual Symposium on VLSI - ISVLSI Kalamata (GR) 06-09 July 2025) [10.1109/ISVLSI65124.2025.11130320]. 1-gen-2025 Marostica F.Carpegna A.Savino A.Di Carlo S. ISVLSI_conference.pdfEnergy-Efficient_Digital_Design_A_Comparative_Study_of_Event-Driven_and_Clock-Driven_Spiking_Neurons.pdf
European Test Symposium Teams: an Anniversary Snapshot / Jenihhin, M.; Raik, J.; Jutman, A.; Cherezova, N.; Ubar, R.; Miclea, L.; Enyedi, S.; Ştefan, I.; Stan, O.; Corcheş, C.; Peng, Z.; Eles, P.; Drechsler, R.; Eggersglüß, S.; Fey, G.; Glowatz, A.; Tille, D.; Gielen, G.; Coyette, A.; Dobbelaere, W.; Vanhooren, R.; Chuang, P. -Y.; Marinissen, E. J.; Di Natale, G.; Barragan, M.; Maistri, P.; Mir, S.; Vatajelu, E. -I.; Bernardi, P.; Di Carlo, S.; Prinetto, P.; Reorda, M. Sonza; Violante, M.; Stratigopoulos, H. -G.; Michael, M. K.; Neophytou, S.; Hadjitheophanous, S.; Christou, K.; Skitsas, M.; Bosio, A.; Deveautour, B.; Girard, P.; Traiola, M.; Virazel, A.; Dos Santos, F. Fernandes; Kritikakou, A.; Casagranda, G.; Vallero, M.; Vella, F.; Rech, P.; Bolzani Poehls, L. M.; Krstic, M.; Andjelkovic, M.; Vargas, F.; Tshagharyan, G.; Harutyunyan, G.; Vardanian, V.; Shoukourian, S.; Zorian, Y.; Dworak, J.; Nepal, K.; Manikas, T.; Taouil, M.; Fieback, M.; Gebregiorgis, A.; Bishnoi, R.; Hamdioui, S.; Chatterjee, A.; Saha, A.; Komarraju, S.; Ma, K.; Amarnath, C.; Tahoori, M.; Mayahinia, M.; Rajabalipanah, M.; Basharkhah, K.; Nosrati, N.; Jahanpeima, Z.; Navabi, Z.; Wunderlich, H. -J.; Hellebrand, S.. - ELETTRONICO. - (2025), pp. 1-48. ( 2025 IEEE European Test Symposium, ETS 2025 Tallinn, Estonia 26-30 May 2025) [10.1109/ets63895.2025.11049652]. 1-gen-2025 Bernardi, P.Di Carlo, S.Prinetto, P.Violante, M. + European_Test_Symposium_Teams_an_Anniversary_Snapshot.pdfETSteams_2025_Draft1.pdf
Late Contribution: VeriSide: A Modified Verilator for Leakage Assessment at the RTL Level / Farnaghinejad, Behnam; Porsia, Antonio; Ruospo, Annachiara; Savino, Alessandro; Di Carlo, Stefano; Sanchez, Ernesto. - ELETTRONICO. - (2025), pp. 1-2. ( 26th IEEE Latin American Test Samposium 2025 San Andres Islas (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963943]. 1-gen-2025 Farnaghinejad, BehnamPorsia, AntonioRuospo, AnnachiaraSavino, AlessandroDi Carlo, StefanoSanchez, Ernesto LATS2025_IRIS.pdfLate_Contribution_VeriSide_A_Modified_Verilator_for_Leakage_Assessment_at_the_RTL_Level.pdf
Power Side-Channel Vulnerabilities of a RISC-V Cryptography Accelerator Integrated into CVA6 via Core-V eXtension Interface (CV-X-IF) / Farnaghinejad, Behnam; Bellizia, Davide; Dolmeta, Alessandra; Masera, Guido; Porsia, Antonio; Ruospo, Annachiara; Di Carlo, Stefano; Savino, Alessandro; Sanchez, Ernesto. - (2025), pp. 233-242. ( International Test Conference 2025 San Diego, California (USA) September 20-26, 2025) [10.1109/ITC58126.2025.00030]. 1-gen-2025 Behnam FarnaghinejadAlessandra DolmetaGuido MaseraAntonio PorsiaAnnachiara RuospoStefano Di CarloAlessandro SavinoErnesto Sanchez + ITC2025___Power_Side_Channel_Vulnerabilities_of_a_RISC_V_Cryptography_Accelerator_Integrated_into_CVA6_via_CV_X_IF.pdfPower_Side-Channel_Vulnerabilities_of_a_RISC-V_Cryptography_Accelerator_Integrated_into_CVA6_via_Core-V_eXtension_Interface_CV-X-IF.pdf
R-CONV++: uncovering privacy vulnerabilities through analytical gradient inversion attacks / Ahmed Eltaras, Tamer; Malluhi, Qutaibah; Savino, Alessandro; Di Carlo, Stefano; Qayyum, Adnan. - In: COMPUTING. - ISSN 0010-485X. - ELETTRONICO. - 107:7(2025), pp. 1-25. [10.1007/s00607-025-01508-w] 1-gen-2025 Ahmed Eltaras, TamerSavino, AlessandroDi Carlo, Stefano + RCONV++.pdf
R-CONV: An Analytical Approach for Efficient Data Reconstruction via Convolutional Gradients / Eltaras, Tamer Ahmed; Malluhi, Qutaibah; Savino, Alessandro; Di Carlo, Stefano; Qayyum, Adnan. - ELETTRONICO. - 15440:(2025), pp. 271-285. ( 25th International Conference on Web Information Systems Engineering, WISE 2024 Doha (QAT) December 2–5, 2024) [10.1007/978-981-96-0576-7_21]. 1-gen-2025 Eltaras, Tamer AhmedSavino, AlessandroDi Carlo, Stefano + R_CONV__An_Analytical_Approach_for_Efficient_Data_Reconstruction_via_Convolutional_Gradients.pdf978-981-96-0576-7-paper.pdf
Real-time Embedded System Fault Injector Framework for Micro-architectural State Based Reliability Assessment / Magliano, Enrico; Savino, Alessandro; Di Carlo, Stefano. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 41:2(2025), pp. 193-208. [10.1007/s10836-025-06170-w] 1-gen-2025 Magliano, EnricoSavino, AlessandroDi Carlo, Stefano s10836-025-06170-w.pdf
Spike Train Scalograms (STS): a Deep Learning Classification Pipeline for Neuronal Cell Types / Amprimo, Gianluca; Martini, Lorenzo; Bilir, Begum; Bardini, Roberta; Savino, Alessandro; Olmo, Gabriella; Di Carlo, Stefano. - ELETTRONICO. - 2025:(2025), pp. 1-7. ( 2025 47th Annual International Conference of the IEEE Engineering in Medicine and Biology Society (EMBC) Copenhagen (DNK) 14-18 July 2025) [10.1109/embc58623.2025.11252661]. 1-gen-2025 Amprimo, GianlucaMartini, LorenzoBardini, RobertaSavino, AlessandroOlmo, GabriellaDi Carlo, Stefano + Spike_Train_Scalograms_STS_a_Deep_Learning_Classification_Pipeline_for_Neuronal_Cell_Types.pdfSpike_Train_Scalograms_STS.pdf
Spiker+: a framework for the generation of efficient Spiking Neural Networks FPGA accelerators for inference at the edge / Carpegna, Alessio; Savino, Alessandro; Di Carlo, Stefano. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 13:3(2025), pp. 784-798. [10.1109/tetc.2024.3511676] 1-gen-2025 Carpegna, AlessioSavino, AlessandroDi Carlo, Stefano Spiker_A_Framework_for_the_Generation_of_Efficient_Spiking_Neural_Networks_FPGA_Accelerators_for_Inference_at_the_Edge.pdf
Start & Stop: a PhysiCell and PhysiBoSS 2.0 add-on for interactive simulation control / Smeriglio, Riccardo; Bardini, Roberta; Savino, Alessandro; Di Carlo, Stefano. - In: BMC BIOINFORMATICS. - ISSN 1471-2105. - ELETTRONICO. - 26:(2025). [10.1186/s12859-025-06144-x] 1-gen-2025 Smeriglio, RiccardoBardini, RobertaSavino, AlessandroDi Carlo, Stefano public_version.pdf
Zero-Day Hardware-Supported Malware Detection of Stack Buffer Overflow Attacks: An Application Exploiting the CV32e40p RISC-V Core / Chenet, Cristiano Pegoraro; Savino, Alessandro; Di Carlo, Stefano. - ELETTRONICO. - (2025), pp. 1-6. ( 26th IEEE Latin American Test Symposium, LATS 2025 San Andres Islas, Colombia 11-14 March 2025) [10.1109/lats65346.2025.10963939]. 1-gen-2025 Chenet, Cristiano PegoraroSavino, AlessandroDi Carlo, Stefano conference_101719_camera_ready.pdfZero-Day_Hardware-Supported_Malware_Detection_of_Stack_Buffer_Overflow_Attacks_An_Application_Exploiting_the_CV32e40p_RISC-V_Core.pdf
A methodology combining reinforcement learning and simulation to optimize the in silico culture of epithelial sheets / Castrignanò, Alberto; Bardini, Roberta; Savino, Alessandro; Di Carlo, Stefano. - In: JOURNAL OF COMPUTATIONAL SCIENCE. - ISSN 1877-7503. - ELETTRONICO. - 76:(2024), pp. 1-20. [10.1016/j.jocs.2024.102226] 1-gen-2024 Bardini, RobertaSavino, AlessandroDi Carlo, Stefano + 1-s2.0-S187775032400019X-main (1).pdf
A Micro Architectural Events Aware Real-Time Embedded System Fault Injector / Magliano, Enrico; Carpegna, Alessio; Savino, Alessandro; DI CARLO, Stefano. - ELETTRONICO. - (2024), pp. 1-6. ( 2024 IEEE 25th Latin American Test Symposium (LATS) Maceio (BRA) 09-12 April 2024) [10.1109/LATS62223.2024.10534595]. 1-gen-2024 Enrico MaglianoAlessio CarpegnaAlessandro SavinoStefano Di Carlo A_Micro_Architectural_Events_Aware_Real-Time_Embedded_System_Fault_Injector.pdfLats_camera_ready_no_copy.pdf
A Survey on Design Space Exploration Approaches for Approximate Computing Systems / Saeedi, Sepide; Piri, Ali; Deveautour, Bastien; O'Connor, Ian; Bosio, Alberto; Savino, Alessandro; Di Carlo, Stefano. - In: ELECTRONICS. - ISSN 2079-9292. - 13:22(2024). [10.3390/electronics13224442] 1-gen-2024 Saeedi, SepideSavino, AlessandroDi Carlo, Stefano + electronics-13-04442.pdf
A survey on hardware-based malware detection approaches / Pegoraro Chenet, Cristiano; Savino, Alessandro; Di Carlo, Stefano. - In: IEEE ACCESS. - ISSN 2169-3536. - 12:(2024), pp. 54115-54128. [10.1109/ACCESS.2024.3388716] 1-gen-2024 Pegoraro Chenet, CristianoSavino, AlessandroDi Carlo, Stefano A_Survey_on_Hardware-Based_Malware_Detection_Approaches.pdf