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RODRIGUEZ CONDIA, JOSIE ESTEBAN

RODRIGUEZ CONDIA, JOSIE ESTEBAN  

Dipartimento di Automatica e Informatica  

JER Condia; Josie E. R. Condia; Josie E. Rodriguez Condia  

046136  

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Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo - In: VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence[s.l] : Springer, In corso di stampa. In corso di stampa Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe, AZ (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Reliability of Stream Sparse Matrix-Vector Multiplication Accelerators: A High-Level Approach / Pinto-Salamanca, María L.; Rodriguez Condia, Josie Esteban; Hidalgo-López, José A.; Perez Holguin, Wilson Javier. - ELETTRONICO. - (2024), pp. 1-4. (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534624]. 1-gen-2024 Rodriguez Condia, Josie Esteban + LATS_2024_camera_ready.pdf; Analyzing_the_Reliability_of_Stream_Sparse_Matrix-Vector_Multiplication_Accelerators_A_High-Level_Approach.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2024), pp. 1-4. (Intervento presentato al convegno 29th IEEE European Test Symposium 2024 tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf
Assessing the Reliability of Different Split Computing Neural Network Applications / Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534618]. 1-gen-2024 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoReorda, Matteo Sonza Assessing_the_Reliability_of_Different_Split_Computing_Neural_Network_Applications.pdf
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-7. (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf
Enhancing the Reliability of Split Computing Deep Neural Networks / Esposito, G.; Guerrero-Balaguera, J. -D.; Condia, J. E. R.; Levorato, M.; Reorda, M. S.. - (2024), pp. 1-7. (Intervento presentato al convegno 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FR) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616071]. 1-gen-2024 Esposito G.Guerrero-Balaguera J. -D.Condia J. E. R.Levorato M.Reorda M. S. _IOLTS2024__Hardening_Split_Computing_DNNs.pdf; Enhancing_the_Reliability_of_Split_Computing_Deep_Neural_Networks.pdf
Evaluating the Reliability of Supervised Compression for Split Computing / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538938]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo Evaluating_the_Reliability_of_Supervised_Compression_for_Split_Computing.pdf
Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:3(2024). [10.3390/electronics13030578] 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-13-00578.pdf
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Sonza Reorda, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 40:(2024), pp. 215-228. [10.1007/s10836-024-06107-9] 1-gen-2024 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertSonza Reorda, Matteo + s10836-024-06107-9.pdf
Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538707]. 1-gen-2024 Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf
A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. 1-gen-2023 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf
Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154504]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Analyzing_the_Architectural_Impact_of_Transient_Fault_Effects_in_SFUs_of_GPUs.pdf
Analyzing the Impact of Different Real Number Formats on the Structural Reliability of TCUs in GPUs / Sierra, Robert Limas; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - (2023), pp. 1-6. (Intervento presentato al convegno IFIP/IEEE Conference on Very Large Scale Integration (VLSI-SoC 2023) tenutosi a Dubai (United Arab Emirates) nel 16-18 October 2023) [10.1109/VLSI-SoC57769.2023.10321881]. 1-gen-2023 Sierra, Robert LimasGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo Analyzing_the_Impact_of_Different_Real_Number_Formats_on_the_Structural_Reliability_of_TCUs_in_GPUs.pdf
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 70:4(2023), pp. 370-380. [10.1109/tns.2022.3224538] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + Characterizing_a_Neutron-Induced_Fault_Model_for_Deep_Neural_Networks.pdf
Evaluating the Impact of Transition Delay Faults in GPUs / Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2023), pp. 353-358. (Intervento presentato al convegno International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID) tenutosi a Hyderabad (India) nel 08-12 January 2023) [10.1109/VLSID57277.2023.00077]. 1-gen-2023 Rodriguez Condia, Josie E.Reorda, Matteo Sonza Camera_Ready_last_mod.pdf; Evaluating_the_Impact_of_Transition_Delay_Faults_in_GPUs.pdf
Evaluating the Prevalence of SFUs in the Reliability of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venice (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174110]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Evaluating_the_Prevalence_of_SFUs_in_the_Reliability_of_GPUs.pdf
Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters / Rodriguez, Esteban; Deligiannis, Nikolaos; Sini, Jacopo; Cantoro, Riccardo; SONZA REORDA, Matteo. - 13999:(2023), pp. 444-457. (Intervento presentato al convegno ISC High Performance 2023 International Workshops tenutosi a Hamburg (DEU) nel May 21–25, 2023) [10.1007/978-3-031-40843-4_33]. 1-gen-2023 Esteban RodriguezNikolaos DeligiannisJacopo SiniRiccardo CantoroMatteo Sonza Reorda _RV_HPC2023__FULL_FORMAT__Functional_Testing_with_SLTs__A_step_towards_reliable_RISC_V_Based_HPC_commodity_clusters.pdf; 978-3-031-40843-4_33.pdf
Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems / Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) tenutosi a Helsinki (FIN) nel 19-21 June 2023) [10.1109/ISIE51358.2023.10227928]. 1-gen-2023 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Reliability_Estimation_of_Split_DNN_Models_for_Distributed_Computing_in_IoT_Systems.pdf
STLs for GPUs: Using High-Level Language Approaches / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 40:4(2023), pp. 51-60. [10.1109/MDAT.2023.3267601] 1-gen-2023 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo STLs_for_GPUs_Using_High-Level_Language_Approaches.pdf; STLs_for_GPUs_Using_High-Level_Language_Approaches.pdf