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RODRIGUEZ CONDIA, JOSIE ESTEBAN

RODRIGUEZ CONDIA, JOSIE ESTEBAN  

Dipartimento di Automatica e Informatica  

JER Condia; Josie E. R. Condia; Josie E. Rodriguez Condia  

046136  

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Citazione Data di pubblicazione Autori File
A Flexible Framework for Vector Accelerators In-field Testing / Vilar De Farias, Gustavo; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (In corso di stampa). ( 44th IEEE VLSI Test Symposium). In corso di stampa Gustavo, Vilar de FariasJosie Esteban, Rodriguez CondiaMatteo, Sonza Reorda -
Analyzing hardware accelerators’ reliability: from design exploration to fast evaluation with hyperscalers / Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Vilar De Farias, Gustavo; Abed, Sergiu-Mohamed; Bagbaba, Ahmet Cagri; Rodriguez Condia, Josie E.. - ELETTRONICO. - (2026). ( 2026 17th IEEE Latin American Symposium on Circuits and Systems Arequipa (PE) 24-27 February 2026) [10.1109/LASCAS67804.2026.11457105]. 1-gen-2026 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertVilar de Farias, GustavoAbed, Sergiu-MohamedRodriguez Condia, Josie E. + lascas_final.pdf; Analyzing_Hardware_Accelerators_Reliability_From_Design_Exploration_to_Fast_Evaluation_with_Hyperscalers.pdf
About the Functional In-Field Self-Testing of AI Accelerators / Guerrero-Balaguera, Juan-David; Rodriguez condia, Josie Esteban; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963960]. 1-gen-2025 Guerrero-Balaguera, Juan-DavidRodriguez condia, Josie EstebanSierra, Robert LimasReorda, Matteo Sonza About_the_Functional_In-Field_Self-Testing_of_AI_Accelerators.pdf
AI-based Classification of Intentional vs. Unintentional Corruptions in the Split Computing context / Esposito, Giuseppe; Magliano, Enrico; Scarano, Nicola; Ahmed-Eltaras, Tamer; Guerrero-Balaguera, Juan-David; Mannella, Luca; Rodriguez-Condia, Josie-Esteban; Ruospo, Annachiara; Di Carlo, Stefano; Levorato, Marco; Savino, Alessandro; Sonza Reorda, Matteo. - (2025), pp. 1-7. ( 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS) Ischia, Naples, Italy 7-9 July 2025) [10.1109/IOLTS65288.2025.11116959]. 1-gen-2025 Esposito, GiuseppeMagliano, EnricoScarano, NicolaAhmed-Eltaras,TamerGuerrero-Balaguera, Juan-DavidMannella, LucaRodriguez-Condia, Josie-EstebanRuospo, AnnachiaraDi Carlo, StefanoLevorato, MarcoSavino, AlessandroSonza Reorda, Matteo _IOLTS_2025__Split_Reliabiliy_and_Security-6.pdf; AI-Based_Classification_of_Adversarial_Attacks_vs._Hardware_Fault_Corruptions_in_the_Split_Computing_Context.pdf
Early Reliability Estimation in Hardware Accelerators using Improved Colored Petri Nets / Villegas Castillo, Ernesto Cristopher; Da Silva, Felipe Augusto; Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Glaß, Michael. - ELETTRONICO. - (2025), pp. 498-501. ( 2025 IEEE International Test Conference, ITC 2025 San Diego, CA (USA) 20-26 September 2025) [10.1109/itc58126.2025.00074]. 1-gen-2025 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-David + Early_Reliability_Estimation_in_Hardware_Accelerators_using_Improved_Colored_Petri_Nets.pdf
Estimating the Impact of Soft Errors on AI-Based Perception in Automotive / Hegde, Shailesh Sudhakara; Selvaraj, Dinesh Cyril; Rodriguez Condia, Josie Esteban; Amati, Nicola; Chiasserini, Carla Fabiana; Deflorio, Francesco Paolo; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963959]. 1-gen-2025 Hegde, Shailesh SudhakaraSelvaraj, Dinesh CyrilRodriguez Condia, Josie EstebanAmati, NicolaChiasserini, Carla FabianaDeflorio, Francesco PaoloReorda, Matteo Sonza Estimating_the_Impact_of_Soft_Errors_on_AI-Based_Perception_in_Automotive.pdf; SCANeR_Software_Reliability_submitted .pdf
Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization / Sierra, Robert Limas; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2025), pp. 1-6. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Islas (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963963]. 1-gen-2025 Sierra, Robert LimasEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza Improving_CNN_Runtime_Robustness_Against_Soft_Errors_by_Dropout_Layer_Optimization.pdf
IoT and Edge Computing: Applications and Reliability Implications / Caro-Anzola, Edward-W.; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Jiménez-López, Andrés-F.; Jiménez-López, Fabián-R.; Limas-Sierra, Robert; Ramirez-Espinosa, Gustavo; Giusto, Edoardo; Montrucchio, Bartolomeo; Vera-Cely, Oscar-F.; Rodriguez Condia, Josie Esteban. - ELETTRONICO. - (2025), pp. 1-10. ( 2025 IEEE 26th Latin American Test Symposium (LATS) San Andres Island (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963944]. 1-gen-2025 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidLimas-Sierra, RobertRamirez-Espinosa, GustavoGiusto, EdoardoMontrucchio, BartolomeoRodriguez Condia, Josie Esteban + _LATS_25__Special_Session__IoT_and_Edge_Computing__Applications_and_Reliability_Implications.pdf; IoT_and_Edge_Computing_Applications_and_Reliability_Implications.pdf
Non-Functional Properties in HPC Systems: Design Exploration of Energy, Power, and Reliability / Agosta, Giovanni; Bini, Enrico; Baroffio, D.; Brandolese, C.; Castrovilli, M.; Cattaneo, D.; Cesarini, D.; Fornaciari, W.; Galimberti, A.; Garfagnini, A.; Gavrikov, Arsenii; Iannone, F.; Lapegna, Marco; Lopez, T. A.; Magnani, G.; Mencagli, G.; Metra, C.; Omana, M. E.; Palombi, F.; Reghenzani, F.; Rodriguez Condia, Josie E.; Serafini, Andrea; Sonza Reorda, M.; Zoni, D; Zummo, G.. - ELETTRONICO. - (2025), pp. 242-251. ( 28th Euromicro Conference on Digital System Design (DSD) Salerno, Italy 10-12 September 2025) [10.1109/dsd67783.2025.00043]. 1-gen-2025 Cattaneo, D.Fornaciari, W.Magnani, G.Metra, C.Rodriguez Condia, Josie E.Serafini, AndreaSonza Reorda, M. + Non-Functional_Properties_in_HPC_Systems_Design_Exploration_of_Energy_Power_and_Reliability.pdf
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). ( 2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe, AZ (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Reliability of Stream Sparse Matrix-Vector Multiplication Accelerators: A High-Level Approach / Pinto-Salamanca, María L.; Rodriguez Condia, Josie Esteban; Hidalgo-López, José A.; Perez Holguin, Wilson Javier. - ELETTRONICO. - (2024), pp. 1-4. ( 2024 IEEE 25th Latin American Test Symposium (LATS) Maceio (BRA) 09-12 April 2024) [10.1109/lats62223.2024.10534624]. 1-gen-2024 Rodriguez Condia, Josie Esteban + LATS_2024_camera_ready.pdf; Analyzing_the_Reliability_of_Stream_Sparse_Matrix-Vector_Multiplication_Accelerators_A_High-Level_Approach.pdf
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / Limas Sierra, Robert Alexander; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - 680:(2024), pp. 149-176. ( 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023 Sharjah, United Arab Emirates October 16–18, 2023) [10.1007/978-3-031-70947-0_8]. 1-gen-2024 Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf; 978-3-031-70947-0_8.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2024), pp. 1-4. ( 29th IEEE European Test Symposium 2024 The Hague (NL) 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf
Assessing the Reliability of Different Split Computing Neural Network Applications / Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza. - (2024). ( 2024 IEEE 25th Latin American Test Symposium (LATS) Maceio (BRA) 09-12 April 2024) [10.1109/lats62223.2024.10534618]. 1-gen-2024 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoReorda, Matteo Sonza Assessing_the_Reliability_of_Different_Split_Computing_Neural_Network_Applications.pdf
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-7. ( International Symposium on On-Line Testing and Robust System Design (IOLTS) Rennes (FRA) 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf
Enhancing the Reliability of Split Computing Deep Neural Networks / Esposito, G.; Guerrero-Balaguera, J. -D.; Condia, J. E. R.; Levorato, M.; Reorda, M. S.. - (2024), pp. 1-7. ( 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) Rennes (FR) 03-05 July 2024) [10.1109/IOLTS60994.2024.10616071]. 1-gen-2024 Esposito G.Guerrero-Balaguera J. -D.Condia J. E. R.Levorato M.Reorda M. S. _IOLTS2024__Hardening_Split_Computing_DNNs.pdf; Enhancing_the_Reliability_of_Split_Computing_Deep_Neural_Networks.pdf
Evaluating Different Fault Injection Abstractions on the Assessment of DNN SW Hardening Strategies / Esposito, Giuseppe; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. ( 33rd IEEE Asian Test Symposium (ATS 2024) Ahmedabad, Gujarat (IND) 17th -20th December 2024) [10.1109/ATS64447.2024.10915284]. 1-gen-2024 Esposito, GiuseppeGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo _ATS2024_Eval_Hard_App_NvbitPERfi-2.pdf; Evaluating_Different_Fault_Injection_Abstractions_on_the_Assessment_of_DNN_SW_Hardening_Strategies.pdf
Evaluating the Reliability of Supervised Compression for Split Computing / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. ( 2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538938]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo Evaluating_the_Reliability_of_Supervised_Compression_for_Split_Computing.pdf
Reliability Assessment of Large DNN Models:Trading Off Performance and Accuracy / Chen, Junchao; Esposito, Giuseppe; Fernandes dos Santos, Fernando; Guerrero-Balaguera, Juan-David; Kritikakou, Angeliki; Krstic, Milos; Limas-Sierra, Robert-Alexander; Rodriguez-Condia, Josie-Esteban; Sonza-Reorda, Matteo; Traiola, Marcello; Veronesi, Alessandro. - ELETTRONICO. - (2024), pp. 1-10. ( 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC) Tanger (MAR) 06-09 October 2024) [10.1109/VLSI-SoC62099.2024.10767814]. 1-gen-2024 Esposito,GiuseppeGuerrero-Balaguera,Juan-DavidLimas-Sierra,Robert-AlexanderRodriguez-Condia,Josie-EstebanSonza-Reorda,Matteo + Reliability_Assessment_of_Large_DNN_Models_Trading_Off_Performance_and_Accuracy.pdf
Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello. - ELETTRONICO. - (2024). ( 2024 IEEE 42nd VLSI Test Symposium (VTS) Tempe (USA) 22-24 April 2024) [10.1109/vts60656.2024.10538707]. 1-gen-2024 Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf