Archivio Istituzionale della RicercaRODRIGUEZ CONDIA, JOSIE ESTEBAN
RODRIGUEZ CONDIA, JOSIE ESTEBAN
Dipartimento di Automatica e Informatica
JER Condia; Josie E. R. Condia; Josie E. Rodriguez Condia
046136
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats
In corso di stampa LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo
Modular Functional Testing: Targeting the Small Embedded Memories in GPUs
2021 Rodriguez Condia, Josie E.; Sonza Reorda, M.
Design techniques to improve the resilience of computing systems: software layer
2020 Bosio, Alberto; Di Carlo, Stefano; Di Natale, Giorgio; Sonza Reorda, Matteo; Rodriguez Condia, Josie E.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo - In: VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence[s.l] : Springer, In corso di stampa. | In corso di stampa | Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda | VLSI_Soc2023_Book_Chapter.pdf |
| Modular Functional Testing: Targeting the Small Embedded Memories in GPUs / Rodriguez Condia, Josie E.; Sonza Reorda, M. (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC: Design Trends. VLSI-SoC 2020 / Calimera, A., Gaillardon, PE., Korgaonkar, K., Kvatinsky, S., Reis, R. (eds). - ELETTRONICO. - [s.l] : Springer, 2021. - ISBN 978-3-030-81640-7. - pp. 205-233 [10.1007/978-3-030-81641-4_10] | 1-gen-2021 | Josie E. Rodriguez CondiaSonza Reorda M. | Modular Functional Testing Targeting the Small Embedded Memories in GPUs 2021.pdf |
| Design techniques to improve the resilience of computing systems: software layer / Bosio, Alberto; Di Carlo, Stefano; Di Natale, Giorgio; Sonza Reorda, Matteo; Rodriguez Condia, Josie E. - In: Cross-Layer Reliability of Computing Systems / Di Natale G., Gizopoulos D., Di Carlo S., Bosio A. and Canal R.. - ELETTRONICO. - [s.l] : IET - the institution of engineering and technology, 2020. - ISBN 9781785617980. - pp. 95-112 [10.1049/PBCS057E_ch4] | 1-gen-2020 | Di Carlo, StefanoSonza Reorda, MatteoRodriguez Condia, Josie E. + | PBCS0570_DiNatale_Chapter04_Proof.pdf; I.4 - Software Layer.pdf |