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GUERRERO BALAGUERA, JUAN DAVID

GUERRERO BALAGUERA, JUAN DAVID  

Dipartimento di Automatica e Informatica  

J. Guerrero  

068072  

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A Reliability Evaluation Flow for Assessing the Impact of Permanent Hardware Faults on Integer Arithmetic Circuits / Deligiannis, Nikolaos; Guerrero-Balaguera, Juan-David; Cantoro, Riccardo; Habib, S. E. D.; Reorda, Matteo Sonza. - In: IEEE ACCESS. - ISSN 2169-3536. - 13:(2025), pp. 32177-32196. [10.1109/access.2025.3534274] 1-gen-2025 Deligiannis, NikolaosGuerrero-Balaguera, Juan-DavidCantoro, RiccardoReorda, Matteo Sonza + A_Reliability_Evaluation_Flow_for_Assessing_the_Impact_of_Permanent_Hardware_Faults_on_Integer_Arithmetic_Circuits.pdf
A Structured Method to Generate Self-Test Libraries for Tensor Cores / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 14:11(2025). [10.3390/electronics14112148] 1-gen-2025 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-14-02148.pdf
About the Functional In-Field Self-Testing of AI Accelerators / Guerrero-Balaguera, Juan-David; Rodriguez condia, Josie Esteban; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963960]. 1-gen-2025 Guerrero-Balaguera, Juan-DavidRodriguez condia, Josie EstebanSierra, Robert LimasReorda, Matteo Sonza About_the_Functional_In-Field_Self-Testing_of_AI_Accelerators.pdf
Effective Fault Effects Evaluation for Permanent Faults in GPUs executing DNNs / Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - In: ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS. - ISSN 1084-4309. - 30:2(2025), pp. 1-33. [10.1145/3715327] 1-gen-2025 Guerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo 3715327.pdf
Improving CNN Runtime Robustness Against Soft Errors by Dropout Layer Optimization / Sierra, Robert Limas; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2025), pp. 1-6. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Islas (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963963]. 1-gen-2025 Sierra, Robert LimasEsposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza -
IoT and Edge Computing: Applications and Reliability Implications / Caro-Anzola, Edward-W.; Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Jiménez-López, Andrés-F.; Jiménez-López, Fabián-R.; Limas-Sierra, Robert; Ramirez-Espinosa, Gustavo; Giusto, Edoardo; Montrucchio, Bartolomeo; Vera-Cely, Oscar-F.; Rodriguez Condia, Josie Esteban. - ELETTRONICO. - (2025), pp. 1-10. (Intervento presentato al convegno 2025 IEEE 26th Latin American Test Symposium (LATS) tenutosi a San Andres Island (COL) nel 11-14 March 2025) [10.1109/lats65346.2025.10963944]. 1-gen-2025 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidLimas-Sierra, RobertRamirez-Espinosa, GustavoGiusto, EdoardoMontrucchio, BartolomeoRodriguez Condia, Josie Esteban + _LATS_25__Special_Session__IoT_and_Edge_Computing__Applications_and_Reliability_Implications.pdf; IoT_and_Edge_Computing_Applications_and_Reliability_Implications.pdf
An Integrated Environment for the Reliability Assessment of CNNs Accelerators Implemented in FPGAs / Mesa, Luis Ariel; Guerrero-Balaguera, Juan-David; Castañeda, Erika D.; Sanchez, Ernesto; Pérez-Holguín, Wilson-Javier. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534609]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidSanchez, Ernesto + An_Integrated_Environment_for_the_Reliability_Assessment_of_CNNs_Accelerators_Implemented_in_FPGAs.pdf
Analyzing the Impact of Scheduling Policies on the Reliability of GPUs Running CNN Operations / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Pessia, Francesco; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe, AZ (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538940]. 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza + Analyzing_the_Impact_of_Scheduling_Policies_on_the_Reliability_of_GPUs_Running_CNN_Operations.pdf
Analyzing the Reliability of TCUs Through Micro-architecture and Structural Evaluations for Two Real Number Formats / LIMAS SIERRA, ROBERT ALEXANDER; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo (IFIP ADVANCES IN INFORMATION AND COMMUNICATION TECHNOLOGY). - In: VLSI-SoC 2023: Silicon Innovations for Trustworthy Artificial Intelligence[s.l] : Springer, 2024. - ISBN 978-3-031-70946-3. - pp. 149-176 [10.1007/978-3-031-70947-0_8] 1-gen-2024 Robert Limas SierraJuan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda VLSI_Soc2023_Book_Chapter.pdf; 978-3-031-70947-0_8.pdf
Analyzing the Structural and Operational Impact of Faults in Floating-Point and Posit Arithmetic Cores for CNN Operations / Rodriguez Condia, Josie E; Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2024), pp. 1-4. (Intervento presentato al convegno 29th IEEE European Test Symposium 2024 tenutosi a The Hague (NL) nel 20-24 May 2024) [10.1109/ets61313.2024.10567884]. 1-gen-2024 Rodriguez Condia, Josie EGuerrero-Balaguera, Juan-DavidSierra, Robert LimasReorda, Matteo Sonza Analyzing_the_Structural_and_Operational_Impact_of_Faults_in_Floating-Point_and_Posit_Arithmetic_Cores_for_CNN_Operations.pdf
Assessing the Reliability of Different Split Computing Neural Network Applications / Esposito, Giuseppe; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Reorda, Matteo Sonza. - (2024). (Intervento presentato al convegno 2024 IEEE 25th Latin American Test Symposium (LATS) tenutosi a Maceio (BRA) nel 09-12 April 2024) [10.1109/lats62223.2024.10534618]. 1-gen-2024 Esposito, GiuseppeGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoReorda, Matteo Sonza Assessing_the_Reliability_of_Different_Split_Computing_Neural_Network_Applications.pdf
Effective Application-level Error Modeling of Permanent Faults on AI Accelerators / Pessia, Francesco; Guerrero-Balaguera, Juan-David; Limas Sierra, Robert; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-7. (Intervento presentato al convegno International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FRA) nel 03-05 July 2024) [10.1109/iolts60994.2024.10616087]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Effective_Application-level_Error_Modeling_of_Permanent_Faults_on_AI_Accelerators.pdf
Enhancing the Reliability of Split Computing Deep Neural Networks / Esposito, G.; Guerrero-Balaguera, J. -D.; Condia, J. E. R.; Levorato, M.; Reorda, M. S.. - (2024), pp. 1-7. (Intervento presentato al convegno 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Rennes (FR) nel 03-05 July 2024) [10.1109/IOLTS60994.2024.10616071]. 1-gen-2024 Esposito G.Guerrero-Balaguera J. -D.Condia J. E. R.Levorato M.Reorda M. S. _IOLTS2024__Hardening_Split_Computing_DNNs.pdf; Enhancing_the_Reliability_of_Split_Computing_Deep_Neural_Networks.pdf
Evaluating Different Fault Injection Abstractions on the Assessment of DNN SW Hardening Strategies / Esposito, Giuseppe; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 33rd IEEE Asian Test Symposium (ATS 2024) tenutosi a Ahmedabad, Gujarat (IND) nel 17th -20th December 2024) [10.1109/ATS64447.2024.10915284]. 1-gen-2024 Esposito, GiuseppeGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo _ATS2024_Eval_Hard_App_NvbitPERfi-2.pdf; Evaluating_Different_Fault_Injection_Abstractions_on_the_Assessment_of_DNN_SW_Hardening_Strategies.pdf
Evaluating the Reliability of Supervised Compression for Split Computing / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - ELETTRONICO. - (2024), pp. 1-6. (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538938]. 1-gen-2024 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo Evaluating_the_Reliability_of_Supervised_Compression_for_Split_Computing.pdf
Exploring Hardware Fault Impacts on Different Real Number Representations of the Structural Resilience of TCUs in GPUs / Limas Sierra, Robert; Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: ELECTRONICS. - ISSN 2079-9292. - 13:3(2024). [10.3390/electronics13030578] 1-gen-2024 Limas Sierra, RobertGuerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo electronics-13-00578.pdf
Investigating and Reducing the Architectural Impact of Transient Faults in Special Function Units for GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Sonza Reorda, Matteo. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 40:(2024), pp. 215-228. [10.1007/s10836-024-06107-9] 1-gen-2024 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertSonza Reorda, Matteo + s10836-024-06107-9.pdf
Reliability Assessment of Large DNN Models:Trading Off Performance and Accuracy / Chen, Junchao; Esposito, Giuseppe; Fernandes dos Santos, Fernando; Guerrero-Balaguera, Juan-David; Kritikakou, Angeliki; Krstic, Milos; Limas-Sierra, Robert-Alexander; Rodriguez-Condia, Josie-Esteban; Sonza-Reorda, Matteo; Traiola, Marcello; Veronesi, Alessandro. - ELETTRONICO. - (2024), pp. 1-10. (Intervento presentato al convegno 2024 IFIP/IEEE 32nd International Conference on Very Large Scale Integration (VLSI-SoC) tenutosi a Tanger (MAR) nel 06-09 October 2024) [10.1109/VLSI-SoC62099.2024.10767814]. 1-gen-2024 Esposito,GiuseppeGuerrero-Balaguera,Juan-DavidLimas-Sierra,Robert-AlexanderRodriguez-Condia,Josie-EstebanSonza-Reorda,Matteo + Reliability_Assessment_of_Large_DNN_Models_Trading_Off_Performance_and_Accuracy.pdf
Reliability Enhancement in GPU Architectures / GUERRERO BALAGUERA, JUAN DAVID. - (2024 Jul 08), pp. 1-159. 8-lug-2024 GUERRERO BALAGUERA, JUAN DAVID Thesis_JDGB_reliability_enhancement_in_gpu_fv.pdf; Abstract_JDGB_reliability_enhancement_in_gpu_fv.pdf
Special Session: Reliability Assessment Recipes for DNN Accelerators / Ahmadilivani, Mohammad Hasan; Bosio, Alberto; Deveautour, Bastien; Santos, Fernando Fernandes Dos; Guerrero-Balaguera, Juan-David; Jenihhin, Maksim; Kritikakou, Angeliki; Limas Sierra, Robert; Pappalardo, Salvatore; Raik, Jaan; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo; Taheri, Mahdi; Traiola, Marcello. - ELETTRONICO. - (2024). (Intervento presentato al convegno 2024 IEEE 42nd VLSI Test Symposium (VTS) tenutosi a Tempe (USA) nel 22-24 April 2024) [10.1109/vts60656.2024.10538707]. 1-gen-2024 Bosio, AlbertoGuerrero-Balaguera, Juan-DavidLimas Sierra, RobertRodriguez Condia, Josie E.Sonza Reorda, Matteo + Special_Session_Reliability_Assessment_Recipes_for_DNN_Accelerators.pdf