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GUERRERO BALAGUERA, JUAN DAVID

GUERRERO BALAGUERA, JUAN DAVID  

Dipartimento di Automatica e Informatica  

J. Guerrero  

068072  

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A Compaction Method for STLs for GPU in-field test / Guerrero-Balaguera, Juan-David; Rodriguez Condia, J. E.; Sonza Reorda, M.. - ELETTRONICO. - (2022), pp. 454-459. (Intervento presentato al convegno 2022 Design, Automation and Test in Europe Conference and Exhibition, DATE 2022 tenutosi a Antwerp (BE) nel 14-23 March 2022) [10.23919/DATE54114.2022.9774597]. 1-gen-2022 Guerrero-Balaguera Juan-DavidRodriguez Condia J. E.Sonza Reorda M. A_Compaction_Method_for_STLs_for_GPU_in-field_test.pdf
A New Method to Generate Software Test Libraries for In-Field GPU Testing Resorting to High-Level Languages / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - ELETTRONICO. - (2022), pp. 1-7. (Intervento presentato al convegno 40th IEEE VLSI Test Symposium, VTS 2022 tenutosi a San Diego (USA) nel 25-27 April 2022) [10.1109/VTS52500.2021.9794225]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_New_Method_to_Generate_Software_Test_Libraries_for_In-Field_GPU_Testing_Resorting_to_High-Level_Languages.pdf
A Novel Compaction Approach for SBST Test Programs / GUERRERO BALAGUERA, JUAN DAVID; RODRIGUEZ CONDIA, JOSIE ESTEBAN; SONZA REORDA, Matteo. - (2021), pp. 67-72. (Intervento presentato al convegno Asian Test Symposium tenutosi a Japan nel 22-25 Nov. 2021) [10.1109/ATS52891.2021.00024]. 1-gen-2021 Juan David Guerrero BalagueraJosie Esteban Rodriguez CondiaMatteo Sonza Reorda Compaction_paper_for_submission2.pdf; A_Novel_Compaction_Approach_for_SBST_Test_Programs.pdf
A Reliability-aware Environment for Design Exploration for GPU Devices / Limas Sierra, Robert; Guerrero Balaguera, Juan David; Rodriguez Condia, Josie Esteban; Sonza Reorda, Matteo. - (2023), pp. 169-174. (Intervento presentato al convegno 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) tenutosi a Tallinn (Estonia) nel 03-05 May 2023) [10.1109/DDECS57882.2023.10139643]. 1-gen-2023 Limas Sierra, RobertGuerrero Balaguera, Juan DavidRodriguez Condia, Josie EstebanSonza Reorda, Matteo A_Reliability-aware_Environment_for_Design_Exploration_for_GPU_Devices.pdf
Analyzing the Architectural Impact of Transient Fault Effects in SFUs of GPUs / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Patiño Núñez, Edwar J.; Limas, Robert; Reorda, Matteo Sonza. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE 24th Latin American Test Symposium (LATS) tenutosi a Veracruz (Mexico) nel 21-24 March 2023) [10.1109/LATS58125.2023.10154504]. 1-gen-2023 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidLimas, RobertReorda, Matteo Sonza + Analyzing_the_Architectural_Impact_of_Transient_Fault_Effects_in_SFUs_of_GPUs.pdf
Assessing Convolutional Neural Networks Reliability through Statistical Fault Injections / Ruospo, Annachiara; Gavarini, Gabriele; De Sio, Corrado; Guerrero Balaguera, Juan David; Sterpone, Luca; Sonza Reorda, Matteo; Sanchez, Ernesto; Mariani, Riccardo; Aribido, Joseph; Athavale, Jyotika. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe Conference (DATE) tenutosi a Antwerp (Belgium) nel 17 - 19 April 2023) [10.23919/DATE56975.2023.10136998]. 1-gen-2023 Ruospo, AnnachiaraGavarini, GabrieleDe Sio, CorradoGuerrero Balaguera, Juan DavidSterpone, LucaSonza Reorda, MatteoSanchez, Ernesto + date_2023_acceptedVersion.pdf; Assessing_Convolutional_Neural_Networks_Reliability_through_Statistical_Fault_Injections.pdf
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 70:4(2023), pp. 370-380. [10.1109/tns.2022.3224538] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + Characterizing_a_Neutron-Induced_Fault_Model_for_Deep_Neural_Networks.pdf
Design and Verification of an open-source SFU model for GPGPUs / Rodriguez Condia Josie, Esteban.; Guerrero-Balaguera, Juan-David; Moreno-Manrique, C. -F.; Reorda, M. S.. - ELETTRONICO. - (2020), pp. 1-6. (Intervento presentato al convegno 17th Biennial Baltic Electronics Conference, BEC 2020 tenutosi a Tallin (Est) nel 2020) [10.1109/BEC49624.2020.9276748]. 1-gen-2020 Rodriguez Condia Josie Esteban.Guerrero-Balaguera Juan-DavidReorda M. S. + 09276748.pdf
Effective fault simulation of GPU’s permanent faults for reliability estimation of CNNs / Guerrero-Balaguera, Juan-David; Sierra, Robert Limas; Reorda, Matteo Sonza. - (2022), pp. 1-6. (Intervento presentato al convegno 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino) [10.1109/IOLTS56730.2022.9897823]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + Effective_fault_simulation_of_GPUs_permanent_faults_for_reliability_estimation_of_CNNs.pdf
Evaluating the impact of Permanent Faults in a GPU running a Deep Neural Network / Juan-David, Guerrero-Balaguera; Galasso, Luigi; LIMAS SIERRA, ROBERT ALEXANDER; Ernesto, Sanchez; SONZA REORDA, Matteo. - (2022), pp. 96-101. (Intervento presentato al convegno 2022 {IEEE} International Test Conference in Asia ({ITC}-Asia) tenutosi a Taipei (Taiwan) nel 24-26 August 2022) [10.1109/itcasia55616.2022.00027]. 1-gen-2022 Juan-David Guerrero-BalagueraRobert Limas SierraErnesto SanchezMatteo Sonza Reorda + 2022_ITC_ASIA_CNNs_Reliability_Registers_cameraready.pdf; Evaluating_the_impact_of_Permanent_Faults_in_a_GPU_running_a_Deep_Neural_Network.pdf
FPGA-based translation system from Colombian sign language to text / Guerrero-Balaguera, Juan-David.; Perez-Holguin, W. J.. - In: DYNA. - ISSN 0012-7353. - STAMPA. - 82:189(2015), pp. 172-181. [10.15446/dyna.v82n189.43075] 1-gen-2015 Guerrero-Balaguera Juan-David. + v82n189a22.pdf
Neural Network's Reliability to Permanent Faults: Analyzing the Impact of Performance Optimizations in GPUs / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - (2022), pp. 1-4. (Intervento presentato al convegno 2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS) tenutosi a Glasgow (UK) nel 24-26 October 2022) [10.1109/ICECS202256217.2022.9971036]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza Neural_Networks_Reliability_to_Permanent_Faults_Analyzing_the_Impact_of_Performance_Optimizations_in_GPUs.pdf
On the Functional Test of Special Function Units in GPUs / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Reorda, Matteo Sonza. - ELETTRONICO. - (2021), pp. 81-86. (Intervento presentato al convegno 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) tenutosi a Vienna nel April 7-9, 2021) [10.1109/DDECS52668.2021.9417025]. 1-gen-2021 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Reorda, Matteo Sonza Paper_SBST_SFU_camera_ready_polito.pdf; 09417025.pdf
Programmers manual FlexGripPlus SASS SM 1.0 / Rodriguez Condia, Josie Esteban; Du, Boyang; Roascio, Gianluca; Scie, Edouard; Guerrero Balaguera, Juan David. - ELETTRONICO. - (2020), pp. 1-67. [10.5281/ZENODO.3819312] 1-gen-2020 Rodriguez Condia, Josie EstebanDu, BoyangRoascio, GianlucaGuerrero Balaguera, Juan David + Programmers manual FlexGripPlus SASS.pdf
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections / Guerrero-Balaguera, Juan-David; Galasso, Luigi; Sierra, Robert Limas; Reorda, Matteo Sonza. - ELETTRONICO. - (2022), pp. 959-962. (Intervento presentato al convegno 2022 IEEE 31st International Symposium on Industrial Electronics (ISIE)) [10.1109/ISIE51582.2022.9831549]. 1-gen-2022 Guerrero-Balaguera, Juan-DavidReorda, Matteo Sonza + Reliability_Assessment_of_Neural_Networks_in_GPUs_A_Framework_For_Permanent_Faults_Injections.pdf
Reliability Estimation of Split DNN Models for Distributed Computing in IoT Systems / Guerrero-Balaguera, Juan-David; Harshbarger, Ian A.; Rodriguez Condia, Josie E.; Levorato, Marco; Sonza Reorda, Matteo. - (2023), pp. 1-4. (Intervento presentato al convegno 2023 IEEE 32nd International Symposium on Industrial Electronics (ISIE) tenutosi a Helsinki (FIN) nel 19-21 June 2023) [10.1109/ISIE51358.2023.10227928]. 1-gen-2023 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Levorato, MarcoSonza Reorda, Matteo + Reliability_Estimation_of_Split_DNN_Models_for_Distributed_Computing_in_IoT_Systems.pdf
STLs for GPUs: Using High-Level Language Approaches / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; Sonza Reorda, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 40:4(2023), pp. 51-60. [10.1109/MDAT.2023.3267601] 1-gen-2023 Guerrero-Balaguera, Juan-DavidRodriguez Condia, Josie E.Sonza Reorda, Matteo STLs_for_GPUs_Using_High-Level_Language_Approaches.pdf; STLs_for_GPUs_Using_High-Level_Language_Approaches.pdf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
Using Hardware Performance Counters to support in-field GPU Testing / Juan-David, Guerrero-Balaguera; Rodriguez Condia, Josie E.; SONZA REORDA, Matteo. - (2021), pp. 1-4. (Intervento presentato al convegno 28th IEEE International Conference on Electronics Circuits and Systems tenutosi a Dubai nel 28 november-1 december 2021) [10.1109/ICECS53924.2021.9665511]. 1-gen-2021 Juan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo Sonza Reorda GPU_Hardware_Performance_Counters.pdf; Using_Hardware_Performance_Counters_to_support_infield_GPU_Testing.pdf
Using STLs for Effective In-field Test of GPUs / Rodriguez Condia, Josie E.; Augusto Da Silva, Felipe; Cagri Bagbaba, Ahmet; Juan-David, Guerrero-Balaguera; Hamdioui, Said; Sauer, Christian; SONZA REORDA, Matteo. - In: IEEE DESIGN & TEST. - ISSN 2168-2356. - ELETTRONICO. - 40:2(2023), pp. 109-117. [10.1109/MDAT.2022.3188573] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraSaid HamdiouiMatteo Sonza Reorda + DT_DT-2021-10-0106.R2_RODRIGUEZ CONDIA.pdf; Using_STLs_for_Effective_In-Field_Test_of_GPUs.pdf