PORTO @ Archivio Istituzionale della Ricerca

BELLARMINO, NICOLO'

BELLARMINO, NICOLO'  

Dipartimento di Automatica e Informatica  

Bellarmino, N.; Bellarmino, Nicolò  

053793  

Mostra records
Risultati 1 - 17 di 17 (tempo di esecuzione: 0.036 secondi).
Citazione Data di pubblicazione Autori File
Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said. - 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025:(In corso di stampa). (Intervento presentato al convegno 30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 tenutosi a Tokyo Odaiba Miraikan, Japan nel Jan. 20-23, 2025). In corso di stampa Nicolò BellarminoRiccardo CantoroSaid Hamdioui + Sicong_2024_ASPDAC__Device_Aware_Test_for_Anomalous_Charge_Trapping_in_FeFETs.pdf
Embedded Feature Selection in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (In corso di stampa). (Intervento presentato al convegno IEEE 2nd International conference on Design, Test & Technology of Integrated Systems tenutosi a Aix-en-Provence (FRA) nel October 14th -16th 2024). In corso di stampa Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf
Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno 10th International Conference on machine Learning, Optimization and Data science (LOD 2024) tenutosi a Riva del Sole Resort & SPA, Castiglione della Pescaia (Grosseto), Tuscany, Italy nel September 22 – 25, 2024). In corso di stampa Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni 2024_LOD_GRADIENT_PENALIZATION.pdf
Transfer Learning in MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno IEEE International Test Conference (ITC 2023) tenutosi a Anaheim, CA 92802, Stati Uniti nel 8-13 Ottobre 2023). In corso di stampa Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_XXX_Transfer_Learning_POSTER (5).pdf
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - (2024), pp. 1-13. [10.1109/tc.2024.3500378] 1-gen-2024 Bellarmino, NicolòCantoro, RiccardoFosson, Sophie M.Squillero, Giovanni + 2023_XXX_Compress_Sensing_Journal_Paper (2).pdf
COVID-19 Detection from Exhaled Breath / Bellarmino, Nicolo'; Cantoro, Riccardo; Castelluzzo, Michele; Correale, Raffaele; Squillero, Giovanni; Bozzini, Giorgio; Castelletti, Francesco; Ciricugno, Carla; Dalla Gasperina, Daniela; Dentali, Francesco; Poggialini, Giovanni; Salerno, Piergiorgio; Stefanotaborelli,. - In: SCIENTIFIC REPORTS. - ISSN 2045-2322. - 14:(2024). [10.1038/s41598-024-74104-1] 1-gen-2024 Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + SCIENTIFIC_REPORTS_REVIEW.pdf; Bellarmino_et_al-2024-Scientific_Reports.pdf
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - (2024), pp. 1-1. [10.1109/tcad.2024.3436542] 1-gen-2024 Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + 2024_TCAD_Transfer_Learning_Paper.pdf
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni. - ELETTRONICO. - 14505:(2024), pp. 364-378. (Intervento presentato al convegno The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) tenutosi a Grasmere, Lake District, England (UK) nel September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. 1-gen-2024 Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf
A Multi-Label Active Learning Framework for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 42:10(2023), pp. 3436-3449. [10.1109/TCAD.2023.3245989] 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoMartone, RaffaeleSquillero, Giovanni + post-print.pdf; A_Multilabel_Active_Learning_Framework_for_Microcontroller_Performance_Screening.pdf
Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno IEEE 32nd Asian Test Symposium tenutosi a Beijing (China) nel 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ATS_Transfer_Learning (4) (1).pdf; Enabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf
Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 24th IEEE Latin-American Test Symposium (LATS) tenutosi a Veracruz (MEX) nel 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. 1-gen-2023 Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + 2023_LATS_Feature_Selection.pdf; Feature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf
Machine Learning for Microcontroller Performance Screening / Bellarmino, Nicolo'. - (2023). (Intervento presentato al convegno 2023 IEEE European Test Symposium tenutosi a Venezia, (IT) nel 22-26 Maggio 2023). 1-gen-2023 Nicolo' Bellarmino 2023_ETS_PhD_Forum.pdf
Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2023), pp. 1-6. (Intervento presentato al convegno 2023 IEEE European Test Symposium (ETS) tenutosi a Venezia (IT) nel 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. 1-gen-2023 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + 2023_ETS_Semi_Supersived_Learning (2).pdf; Semi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data / Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni. - (2022). (Intervento presentato al convegno IEEE International Symposium on On-Line Testing and Robust System 2022 tenutosi a Torino nel 12-14 September 2022) [10.1109/IOLTS56730.2022.9897769]. 1-gen-2022 Bellarmino,Nicolo'Cantoro,RiccardoSquillero,Giovanni + Microcontroller_Performance_Screening_Optimizing_the_Characterization_in_the_Presence_of_Anomalous_and_Noisy_Data.pdf; 2022_IOLTS_Outlier_Detection_.pdf
Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; de Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022). (Intervento presentato al convegno IEEE European Test Symposium). 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + 01_ETS_special_session_ABSTRACT.pdf
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - (2022), pp. 1-10. (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (Spain) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. 1-gen-2022 F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf
Exploiting Active Learning for Microcontroller Performance Prediction / Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni. - ELETTRONICO. - (2021), pp. 1-4. (Intervento presentato al convegno 2021 IEEE European Test Symposium nel 24-28 May 2021) [10.1109/ETS50041.2021.9465472]. 1-gen-2021 Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + ETS21___Speed_Monitors__Camera_ready.pdf; Exploiting_Active_Learning_for_Microcontroller_Performance_Prediction.pdf