Archivio Istituzionale della RicercaBELLARMINO, NICOLO'
BELLARMINO, NICOLO'
Dipartimento di Automatica e Informatica
Bellarmino, N.; Bellarmino, Nicolò
053793
Data-Efficient Cross-Generation Adaptation for Microcontroller Performance Screening
In corso di stampa Bellarmino, Nicolo; Vancini, Alessandro; Kilian, Tobias; Cantoro, Riccardo
Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo
From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics
In corso di stampa Wang, Changhao; Yao, Xinhao; Chen, Danyang; Li, Chaobo; Li, Xiuyan; Yuan, Sicong; Xun, Hanzhi; Hamdioui, Said; Bellarmino, Nicolo'; Cantoro, Riccardo
Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective
In corso di stampa Bellarmino, Nicolo'; Bosio, Alberto; Ruospo, Annachiara; Ernesto, Sanchez; Cantoro, Riccardo
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation
In corso di stampa Wang, Changhao; Chen, Yijing; Bellarmino, Nicolo'; Rodriguez Condia, Josie Esteban; Li, Chaobo; Squillero, Giovanni; Cantoro, Riccardo
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design
2026 Wang, Changhao; Yuan, Sicong; Bellarmino, Nicolò; Chen, Danyang; Kolahimahmoudi, Nima; Wang, Honghao; Xun, Hanzhi; Li, Xiuyan; Wang, Lin; Yin, Chujun; Li, Chaobo; Taouil, Mottaqiallah; Fieback, Moritz; Hamdioui, Said; Squillero, Giovanni; Cantoro, Riccardo
M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis
2026 Bellarmino, Nicolò; Bosio, Alberto; Al-Kaf, Ahmed; Benabdenbi, Mounir; Leveugle, Régis; Cantoro, Riccardo
OpRA: Optimizing Resiliency Assessment for Deep Neural Networks
2026 Bellarmino, Nicolò; Barone, Salvatore; Pappalardo, Salvatore; Bosio, Alberto; Cantoro, Riccardo
COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Fosson, Sophie M.; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias
SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators
2025 Pappalardo, Salvatore; Bellarmino, Nicolo'; Deveautour, Bastien; Bosio, Alberto; Taheri, Mahdi; Daneshtalab, Masoud; Raik, Jaan; Jenihhin, Maksim
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Data-Efficient Cross-Generation Adaptation for Microcontroller Performance Screening / Bellarmino, N., Vancini, A., Kilian, T., Cantoro, R.. - (In corso di stampa). (39th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems Rome (ITA) September 30th - October 2nd, 2026). | In corso di stampa | Nicolo BellarminoRiccardo Cantoro + | 2026_DFTS_Transfer_Learning_Alessandro (6).pdf |
| Dynamic Workload Selection for Ranked Fault Injection via Sequential Bernoulli Discovery Modeling / Bellarmino, N., Bosio, A., Cantoro, R.. - (In corso di stampa). (IEEE 35th Asian Test Symposium (ATS 2026) Kaohsiung, Taiwan 1st - 3rd December, 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioRiccardo, Cantoro | 2026_ATS_ON_LINE_FI_CONFERNCE.pdf |
| From Synthesis to Kinetics: A Data-Driven Deep Learning Framework for Process-Aware Ferroelectric Dynamics / Wang, C., Yao, X., Chen, D., Li, C., Li, X., Yuan, S., Xun, H., Hamdioui, S., Bellarmino, N., Cantoro, R.. - (In corso di stampa). (The Fourteenth International Conference on Learning Representations (ICLR 2026) Rio de Janeiro, Brazil April 23rd - 27th, 2026). | In corso di stampa | Changhao, WangSaid, HamdiouiNicolò, BellarminoRiccardo, Cantoro + | 7_From_Synthesis_to_Kinetics_A.pdf |
| Implicit Activation Sparsity for Fault-Tolerant CNNs: A Training-Dynamics Perspective / Bellarmino, N., Bosio, A., Ruospo, A., Ernesto, S., Cantoro, R.. - IEEE International Conference on Omni-Layer Intelligent Systems (COINS):(In corso di stampa). (IEEE International Conference on Omni-Layer Intelligent Systems (COINS) Bologna, Italy 7-9 September 2026). | In corso di stampa | Nicolo, BellarminoAlberto, BosioAnnachiara, RuospoErnesto, SanchezRiccardo, Cantoro | 2026_COINS_LOL_TRAINING_DYNAMICS_CNN (7).pdf |
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Si-ATLAS: Autonomous Testing via LLM-Agent Synergy for RISC-V SBST Generation / Wang, C., Chen, Y., Bellarmino, N., Rodriguez Condia, J.E., Li, C., Squillero, G., Cantoro, R.. - (In corso di stampa). (International Test Conference 2026 (ITC 2026) San Antonio, Texas, USA October 11–16, 2026). | In corso di stampa | Changhao, WangNicolo, BellarminoJosie Esteban, Rodriguez CondiaGiovanni, SquilleroRiccardo, Cantoro + | 2026_ITC_SBST_agent (1).pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| A Data-Driven ANN-Based Model for FeCAP & FeFET: Orienting to SPICE and Circuit Design / Wang, C., Yuan, S., Bellarmino, N., Chen, D., Kolahimahmoudi, N., Wang, H., Xun, H., Li, X., Wang, L., Yin, C., Li, C., Taouil, M., Fieback, M., Hamdioui, S., Squillero, G., Cantoro, R.. - In: IEEE ELECTRON DEVICE LETTERS. - ISSN 0741-3106. - 47:6(2026), pp. 1233-1236. [10.1109/led.2026.3680006] | 1-gen-2026 | Wang, ChanghaoBellarmino, NicolòKolahimahmoudi, NimaHamdioui, SaidSquillero, GiovanniCantoro, Riccardo + | A_Data-Driven_ANN-Based_Model_for_FeCAP_amp_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf; A_Data-Driven_ANN-Based_Model_for_FeCAP_and_FeFET_Orienting_to_SPICE_and_Circuit_Design.pdf |
| M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis / Bellarmino, N., Bosio, A., Al-Kaf, A., Benabdenbi, M., Leveugle, R., Cantoro, R.. - (2026), pp. 1-6. (27th Latin American Test Symposium, LATS 2026 Florianópolis (BRA) 17-20 March 2026) [10.1109/lats70329.2026.11480331]. | 1-gen-2026 | Bellarmino, NicolòBosio, AlbertoCantoro, Riccardo + | M-EL2N_Data-Efficient_Fault_Injection_Through_Sample_Difficulty_Analysis.pdf; 2025_LATS_MIRRORED_EL2N (3).pdf |
| OpRA: Optimizing Resiliency Assessment for Deep Neural Networks / Bellarmino, N., Barone, S., Pappalardo, S., Bosio, A., Cantoro, R.. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 45:4(2026), pp. 1921-1934. [10.1109/TCAD.2025.3610062] | 1-gen-2026 | Nicolò BellarminoAlberto BosioRiccardo Cantoro + | Data_Efficient_Resiliency_Assessment_of_Convolutional_Neural_Networks__IEEE_TCAD_ (3).pdf; OpRA_Optimizing_Resiliency_Assessment_for_Deep_Neural_Networks.pdf |
| COSMO: COmpressed Sensing for Models and logging Optimization in MCU Performance Screening / Bellarmino, N., Cantoro, R., Fosson, S.M., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 74:2(2025), pp. 652-664. [10.1109/tc.2024.3500378] | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoFosson, Sophie M.Squillero, Giovanni + | 2023_XXX_Compress_Sensing_Journal_Paper (2).pdf; COSMO_COmpressed_Sensing_for_Models_and_Logging_Optimization_in_MCU_Performance_Screening.pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025), pp. 13-18. (28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Deep Learning Strategies for Labeling and Accuracy Optimization in Microcontroller Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - ELETTRONICO. - 44:2(2025), pp. 641-654. [10.1109/tcad.2024.3436542] | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_TCAD_Transfer_Learning_Paper.pdf; Deep_Learning_Strategies_for_Labeling_and_Accuracy_Optimization_in_Microcontroller_Performance_Screening.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, V., Bellarmino, N., Ruospo, A., Cantoro, R., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T.. - STAMPA. - (2025), pp. 470-473. (International Test Conference (ITC) 2025 San Diego, California (USA) 21-26 September, 2025) [10.1109/ITC58126.2025.00067]. | 1-gen-2025 | Nicolò BellarminoRiccardo Cantoro + | 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf; Minimal_Supervision_Maximum_Accuracy_TabPFN_for_Microcontroller_Performance_Prediction.pdf |
| SAFFIRA A Framework for Assessing the Reliability of Systolic-Array DNN Accelerators / Pappalardo, S., Bellarmino, N., Deveautour, B., Bosio, A., Taheri, M., Daneshtalab, M., Raik, J., Jenihhin, M.. - In: JOURNAL OF CIRCUITS, SYSTEMS, AND COMPUTERS. - ISSN 0218-1266. - 34:18(2025). [10.1142/s0218126625430017] | 1-gen-2025 | Bellarmino, Nicolo' + | Saffira_Extended.pdf |