Archivio Istituzionale della RicercaBELLARMINO, NICOLO'
BELLARMINO, NICOLO'
Dipartimento di Automatica e Informatica
Bellarmino, N.; Bellarmino, Nicolò
053793
In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models
In corso di stampa Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Transfer Learning in MCU Performance Screening
In corso di stampa Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks
2025 Bellarmino, Nicolo'; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto
Device-Aware Test for Anomalous Charge Trapping in FeFETs
2025 Yuan, Sicong; Wang, Changhao; Fieback, Moritz; Xun, Hanzhi; Taouil, Mottaqiallah; Li, Xiuyan; Wang, Lin; Chen, Danyang; Bellarmino, Nicolò; Cantoro, Riccardo; Hamdioui, Said
Device-Aware Test for Threshold Voltage Shifting in FeFET
2025 Wang, Changhao; Kolahimahmoudi, Nima; Bellarmino, Nicolo; Cantoro, Riccardo; Yuan, Sicong; Xun, Hanzhi; Chen, Danyang; Yin, Chujun; Taouil, Mottaqiallah; Fieback, Moritz; Li, Xiuyan; Wang, Lin; Li, Chaobo; Hamdioui, Said
DOC: Detection of On-Line Failures in CNNs
2025 Turco, Vittorio; Bellarmino, Nicolò; Ruospo, Annachiara; Cantoro, Riccardo; Sanchez, Ernesto
Grouped Feature Selection for SMONs Placement in MCU Performance Screening
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni
Investigating on Gradient Regularization for Testing Neural Networks
2025 Bellarmino, Nicolo; Bosio, Alberto; Cantoro, Riccardo; Ruospo, Annachiara; Sanchez, Ernesto; Squillero, Giovanni
Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction
2025 Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias
Embedded Feature Selection in MCU Performance Screening
2024 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration
2024 Bellarmino, Nicolo’; Cantoro, Riccardo; Squillero, Giovanni
Enabling Inter-Product Transfer Learning on MCU Performance Screening
2023 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Feature Selection for Cost Reduction in MCU Performance Screening
2023 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Machine Learning for Microcontroller Performance Screening
2023 Bellarmino, Nicolo'
Semi-Supervised Deep Learning for Microcontroller Performance Screening
2023 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data
2022 Bellarmino, Nicolo'; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Schlichtmann, Ulf; Squillero, Giovanni
Test, Reliability and Functional Safety trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Test, Reliability and Functional Safety Trends for Automotive System-on-Chip
2022 Angione, F.; Appello, D.; Aribido, J.; Athavale, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Guerrero, J.; Huch, M.; Iaria, G.; Kilian, T.; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.
Exploiting Active Learning for Microcontroller Performance Prediction
2021 Bellarmino, Nicolo; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Martone, Raffaele; Schlichtmann, Ulf; Squillero, Giovanni
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| In-Context Learning for Microcontroller Performance Screening Using Tabular Foundation Models / Bellarmino, Nicolò; Cantoro, Riccardo; Huch, Martin; Kilian, Tobias; Squillero, Giovanni. - ELETTRONICO. - (In corso di stampa). ( 28th Euromicro Conference Series on Digital System Design (DSD) 2025 Salerno (IT) 10-12 September, 2025). | In corso di stampa | Nicolò BellarminoRiccardo CantoroGiovanni Squillero + | 2025_DSD_Foundation_Models (2).pdf |
| Transfer Learning in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (In corso di stampa). (IEEE International Test Conference (ITC 2023) Anaheim, CA 92802, Stati Uniti 8-13 Ottobre 2023). | In corso di stampa | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_XXX_Transfer_Learning_POSTER (5).pdf |
| DEAR-CNN: Data-Efficient Assessment of Resiliency in Convolutional Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E.. - ELETTRONICO. - (2025), pp. 13-18. (28th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Lyon (FRA) May 5-7, 2025) [10.1109/DDECS63720.2025.11006797]. | 1-gen-2025 | Nicolo' BellarminoAlberto BosioRiccardo CantoroAnnachiara RuospoErnesto Sanchez | 2025_DDECS_DNN_TEST_COMPACTION_CONFERENCE (1).pdf; DEAR-CNN_Data-Efficient_Assessment_of_Resiliency_in_Convolutional_Neural_Networks.pdf |
| Device-Aware Test for Anomalous Charge Trapping in FeFETs / Yuan, S., Wang, C., Fieback, M., Xun, H., Taouil, M., Li, X., Wang, L., Chen, D., Bellarmino, N., Cantoro, R., Hamdioui, S.. - (2025), pp. 635-641. (30th Asia and South Pacific Design Automation Conference ASP-DAC 2025 Tokyo (JPN) Jan. 20-23, 2025) [10.1145/3658617.3697755]. | 1-gen-2025 | Changhao WangNicolò BellarminoRiccardo CantoroSaid Hamdioui + | 3658617.3697755.pdf |
| Device-Aware Test for Threshold Voltage Shifting in FeFET / Wang, C., Kolahimahmoudi, N., Bellarmino, N., Cantoro, R., Yuan, S., Xun, H., Chen, D., Yin, C., Taouil, M., Fieback, M., Li, X., Wang, L., Li, C., Hamdioui, S.. - (2025), pp. 410-413. (IEEE International Test Conference 2025 San Diego (USA) 20-26 September 2025) [10.1109/ITC58126.2025.00052]. | 1-gen-2025 | Wang, ChanghaoKolahimahmoudi, NimaBellarmino, NicoloCantoro, RiccardoHamdioui, Said + | 2025_ITC__Device_Aware_Test_for_voltage_shifting_in_FeFET__4_pages_.pdf; Device-Aware_Test_for_Threshold_Voltage_Shifting_in_FeFET.pdf |
| DOC: Detection of On-Line Failures in CNNs / Turco, V., Bellarmino, N., Ruospo, A., Cantoro, R., Sanchez, E.. - ELETTRONICO. - (2025). (Latin American Test Workshop, LATW San Andrés (COL) 11-14 March 2025) [10.1109/LATS65346.2025.10963935]. | 1-gen-2025 | Turco VittorioNicolò BellarminoAnnachiara RuospoCantoro RiccardoErnesto Sanchez | LATS2025_On_line_detection (3).pdf; DOC_Detection_of_On-Line_Failures_in_CNNs.pdf |
| Grouped Feature Selection for SMONs Placement in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Squillero, G.. - (2025), pp. 1-6. (2025 IEEE 26th Latin American Test Symposium (LATS) San Andrés (COL) 11-14 March 2025) [10.1109/lats65346.2025.10963942]. | 1-gen-2025 | Bellarmino, NicolòCantoro, RiccardoSquillero, Giovanni + | 2024_LATS_GROUP_LASSO_TPAM_SEL (1).pdf; Grouped_Feature_Selection_for_SMONs_Placement_in_MCU_Performance_Screening.pdf |
| Investigating on Gradient Regularization for Testing Neural Networks / Bellarmino, N., Bosio, A., Cantoro, R., Ruospo, A., Sanchez, E., Squillero, G.. - ELETTRONICO. - 15509:(2025), pp. 67-81. (10th International Conference on machine Learning, Optimization and Data science (LOD 2024) Castiglione della Pescaia (ITA) September 22 – 25, 2024) [10.1007/978-3-031-82484-5_6]. | 1-gen-2025 | Bellarmino, NicoloBosio, AlbertoCantoro, RiccardoRuospo, AnnachiaraSanchez, ErnestoSquillero, Giovanni | 2024_LOD_GRADIENT_PENALIZATION.pdf; 978-3-031-82484-5_6.pdf |
| Minimal Supervision, Maximum Accuracy: TabPFN for Microcontroller Performance Prediction / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T.. - STAMPA. - (2025), pp. 470-473. (International Test Conference (ITC) 2025 San Diego, California (USA) 21-26 September, 2025) [10.1109/ITC58126.2025.00067]. | 1-gen-2025 | Nicolò BellarminoRiccardo Cantoro + | 2025_ITC_FOUNDATION_MODELS_POSTER (3).pdf; Minimal_Supervision_Maximum_Accuracy_TabPFN_for_Microcontroller_Performance_Prediction.pdf |
| Embedded Feature Selection in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2024), pp. 1-6. (IEEE 2nd International conference on Design, Test & Technology of Integrated Systems Aix-en-Provence (FRA) October 14th -16th 2024) [10.1109/DTTIS62212.2024.10780418]. | 1-gen-2024 | Nicolo' BellarminoRiccardo CantoroGiovanni Squillero + | 2024_DTTIS_EMBEDDED_Feature_Selection (1).pdf; Embedded_Feature_Selection_in_MCU_Performance_Screening.pdf |
| U-FLEX: Unsupervised Feature Learning with Evolutionary eXploration / Bellarmino, N., Cantoro, R., Squillero, G.. - ELETTRONICO. - 14505:(2024), pp. 364-378. (The 9th International Conference on Machine Learning, Optimization, and Data Science (LOD 2023) Grasmere, Lake District, England (UK) September 22 – 26, 2023) [10.1007/978-3-031-53969-5_27]. | 1-gen-2024 | Nicolo’ BellarminoRiccardo CantoroGiovanni Squillero | 2023_LOD_Genetic_Feature_Selection (2).pdf; 978-3-031-53969-5_27.pdf |
| Enabling Inter-Product Transfer Learning on MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (2023), pp. 1-6. (IEEE 32nd Asian Test Symposium Beijing (China) 14-17 October 2023) [10.1109/ATS59501.2023.10317992]. | 1-gen-2023 | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_ATS_Transfer_Learning (4) (1).pdf; Enabling_Inter-Product_Transfer_Learning_on_MCU_Performance_Screening.pdf |
| Feature Selection for Cost Reduction in MCU Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2023), pp. 1-6. (24th IEEE Latin-American Test Symposium (LATS) Veracruz (MEX) 21-24 Marzo 2023) [10.1109/LATS58125.2023.10154495]. | 1-gen-2023 | Bellarmino, Nicolo'Cantoro, RiccardoSquillero, Giovanni + | 2023_LATS_Feature_Selection.pdf; Feature_Selection_for_Cost_Reduction_In_MCU_Performance_Screening.pdf |
| Machine Learning for Microcontroller Performance Screening / Bellarmino, N.. - (2023). (2023 IEEE European Test Symposium Venezia, (IT) 22-26 Maggio 2023). | 1-gen-2023 | Nicolo' Bellarmino | 2023_ETS_PhD_Forum.pdf |
| Semi-Supervised Deep Learning for Microcontroller Performance Screening / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2023), pp. 1-6. (2023 IEEE European Test Symposium (ETS) Venezia (IT) 22-26 May 2023) [10.1109/ETS56758.2023.10174083]. | 1-gen-2023 | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | 2023_ETS_Semi_Supersived_Learning (2).pdf; Semi-Supervised_Deep_Learning_for_Microcontroller_Performance_Screening.pdf |
| Microcontroller Performance Screening: Optimizing the Characterization in the Presence of Anomalous and Noisy Data / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Schlichtmann, U., Squillero, G.. - (2022). (IEEE International Symposium on On-Line Testing and Robust System 2022 Torino 12-14 September 2022) [10.1109/IOLTS56730.2022.9897769]. | 1-gen-2022 | Bellarmino,Nicolo'Cantoro,RiccardoSquillero,Giovanni + | Microcontroller_Performance_Screening_Optimizing_the_Characterization_in_the_Presence_of_Anomalous_and_Noisy_Data.pdf; 2022_IOLTS_Outlier_Detection_.pdf |
| Test, Reliability and Functional Safety trends for Automotive System-on-Chip / Angione, F.; Appello, D.; Aribido, J.; Bellarmino, N.; Bernardi, P.; Cantoro, R.; De Sio, C.; Foscale, T.; Gavarini, G.; Huch, M.; Kilian, T; Mariani, R.; Martone, R.; Ruospo, A.; Sanchez, E.; Schlichtmann, U.; Squillero, G.; Sonza Reorda, M.; Sterpone, L.; Tancorre, V.; Ugioli, R.. - ELETTRONICO. - (2022). (Intervento presentato al convegno 2022 IEEE European Test Symposium (ETS) tenutosi a Barcelona (ESP) nel 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. de SioT. FoscaleG. GavariniA. RuospoE. SanchezG. SquilleroM. Sonza ReordaL. Sterpone + | 01_ETS_special_session_ABSTRACT.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |
| Test, Reliability and Functional Safety Trends for Automotive System-on-Chip / Angione, F., Appello, D., Aribido, J., Athavale, J., Bellarmino, N., Bernardi, P., Cantoro, R., De Sio, C., Foscale, T., Gavarini, G., Guerrero, J., Huch, M., Iaria, G., Kilian, T., Mariani, R., Martone, R., Ruospo, A., Sanchez, E., Schlichtmann, U., Squillero, G., et al.. - (2022), pp. 1-10. (2022 IEEE European Test Symposium (ETS) Barcelona (Spain) 23-27 May 2022) [10.1109/ETS54262.2022.9810388]. | 1-gen-2022 | F. AngioneN. BellarminoP. BernardiR. CantoroC. De SioT. FoscaleG. GavariniJ. GuerreroG. IariaR. MarianiA. RuospoG. SquilleroM. Sonza ReordaL. Sterpone + | 2022_ETS_SpecialSession.pdf; Test_Reliability_and_Functional_Safety_Trends_for_Automotive_System-on-Chip.pdf |
| Exploiting Active Learning for Microcontroller Performance Prediction / Bellarmino, N., Cantoro, R., Huch, M., Kilian, T., Martone, R., Schlichtmann, U., Squillero, G.. - ELETTRONICO. - (2021), pp. 1-4. (2021 IEEE European Test Symposium 24-28 May 2021) [10.1109/ETS50041.2021.9465472]. | 1-gen-2021 | Bellarmino, NicoloCantoro, RiccardoSquillero, Giovanni + | ETS21___Speed_Monitors__Camera_ready.pdf; Exploiting_Active_Learning_for_Microcontroller_Performance_Prediction.pdf |