DE SIO, CORRADO

DE SIO, CORRADO  

Dipartimento di Automatica e Informatica  

049588  

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Risultati 1 - 20 di 37 (tempo di esecuzione: 0.035 secondi).
Citazione Data di pubblicazione Autori File
A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor / Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno Design, Automation and Test in Europe Conference (DATE2021) nel February 2021. 1-gen-2021 Sarah AzimiCorrado De SioLuca Sterpone DATE 2021- Camera Ready.pdfA_3-D_LUT_Design_for_Transient_Error_Detection_Via_Inter-Tier_In-Silicon_Radiation_Sensor.pdf
Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs / Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F.. - ELETTRONICO. - (2022), pp. 1-8. ((Intervento presentato al convegno 21st IEEE International Symposium on Parallel and Distributed Computing tenutosi a Basel (Switzerland) nel July, 2022. 1-gen-2022 L. SterponeS. AzimiC. De Sio + ISPDC_2022.pdf
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-6. ((Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Austin (USA) nel October, 2022. 1-gen-2022 Corrado De SioSarah AzimiLuca Sterpone + DFT22_v2.2_cready.pdf
Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - (2019). ((Intervento presentato al convegno 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019). 1-gen-2019 Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi -
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 126:(2021). [10.1016/j.microrel.2021.114319] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca MicRel 2021.pdf1-s2.0-S0026271421002857-main.pdf
Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] 1-gen-2021 Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca electronics-10-03160 (1).pdf
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] 1-gen-2019 Corrado De SioSarah AzimiLuca SterponeBoyang Du 08708270.pdf
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - (2022), pp. 1-6. [10.1016/j.microrel.2022.114733] 1-gen-2022 S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone MicRel_CMOSvsFinFET_V3_fin.pdf
Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs / Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L. - In: VLSI-SoC[s.l] : Springer, 2022. 1-gen-2022 S. AzimiC. De SioA. PortaluriL. Sterpone springer_book_extended_vlsi_soc_2021_final.pdf
An Emulation Platform for Evaluating the Reliability of Deep Neural Networks / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-4. ((Intervento presentato al convegno The 33th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology (DFT 2020) nel 19-21 Oct. 2020 [10.1109/DFT50435.2020.9250872]. 1-gen-2020 Corrado De SioSarah AzimiLuca Sterpone DFT_CameaReady_FinalVersion.pdf09250872.pdf
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms / De Sio, C.; Azimi, S.; Sterpone, L.. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - (2022), pp. 1-1. [10.1109/TETC.2022.3152668] 1-gen-2022 De Sio C.Azimi S.Sterpone L. FireNN_cd_2.2.pdf
In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-6. ((Intervento presentato al convegno 26th IEEE International Symposium on On-Line Testing and robust System Design (IOLT 2020) nel 13-15 July 2020 [10.1109/IOLTS50870.2020.9159738]. 1-gen-2020 Azimi, SarahDe Sio, CorradoSterpone, Luca IOLTS2020_CameraReady.pdfIn-Circuit_Mitigation_Approach_of_Single_Event_Transients_for_45nm_Flip-Flops.pdf
Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor / Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah. - ELETTRONICO. - (2022), pp. 1-6. ((Intervento presentato al convegno 19th ACM International Conference on Computing Frontiers 2022 tenutosi a Torino nel May 2022 [10.1145/3528416.3530984]. 1-gen-2022 Vacca, EleonoraDe Sio, CorradoAzimi, Sarah CF2022_camera_ready.pdf3528416.3530984.pdf
A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs / Bozzoli, L.; De Sio, C.; Du, B.; Sterpone, L.. - ELETTRONICO. - (2021), pp. 1-5. ((Intervento presentato al convegno IEEE International Instrumentation and Measurement Technology Conference (I2MTC) tenutosi a Glasgow, United Kingdom nel 17-20 May 2021 [10.1109/I2MTC50364.2021.9459804]. 1-gen-2021 L. BozzoliC. De SioB. DuL. Sterpone 09459804.pdf
A New Domains-based Isolation Design Flow for Reconfigurable SoCs / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-7. ((Intervento presentato al convegno IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021) [10.1109/IOLTS52814.2021.9486687]. 1-gen-2021 Portaluri,AndreaDe Sio, CorradoAzimi, SarahSterpone,Luca PaperID-30-IOLTS2021.pdfA_New_Domains-based_Isolation_Design_Flow_for_Reconfigurable_SoCs.pdf
A new FPGA-based Detection Method for Spurious Variations in PCBA Power Distribution Network / Odintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur. - (2019), pp. 1-6. ((Intervento presentato al convegno IEEE DDECS 2019 [10.1109/DDECS.2019.8724662]. 1-gen-2019 Bozzoli, LudovicaDe Sio, CorradoSterpone, Luca + -
A new Method for the Analysis of Radiation-induced Effects in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - ELETTRONICO. - (2019). ((Intervento presentato al convegno IEEE International Conference on Synthesis, modeling, analysis and Simulation methods and applications to circuit design (SMACD). 1-gen-2019 Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi SMACD2019.pdf
A New Single Event Transient Hardened Floating Gate Configurable Logic Circuit / Azimi, Sarah; De Sio, Corrado; Yang, Weitao; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 311-314. ((Intervento presentato al convegno 18th IEEE International NEWCAS tenutosi a Montreal, Canada nel June 16-19, 2020 [10.1109/NEWCAS49341.2020.9159844]. 1-gen-2020 Sarah AzimiCorrado De SioWeitao YangLuca Sterpone NEWCAS_2020.pdf09159844.pdf
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module / De Sio, C.; Azimi, S.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114:(2020), p. 113733. [10.1016/j.microrel.2020.113733] 1-gen-2020 De Sio C.Azimi S.Sterpone L. MicRel2020_CameraReady.pdf1-s2.0-S0026271420305400-main.pdf
On the Evaluation of SEEs on Open-Source Embedded Static RAMs / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno IEEE International Conference on Very Large Scale Integration (VLSI-SoC) nel 4-7 October 2021 [10.1109/VLSI-SoC53125.2021.9606985]. 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca VLSI-SoC Camera Ready.pdfOn_the_Evaluation_of_SEEs_on_Open-Source_Embedded_Static_RAMs.pdf