AZIMI, SARAH

AZIMI, SARAH  

Dipartimento di Automatica e Informatica  

039557  

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Risultati 1 - 20 di 61 (tempo di esecuzione: 0.04 secondi).
Citazione Data di pubblicazione Autori File
A 3-D LUT Design for Transient Error Detection Via Inter-Tier In-Silicon Radiation Sensor / Azimi, Sarah; DE SIO, Corrado; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno Design, Automation and Test in Europe Conference (DATE2021) nel February 2021. 1-gen-2021 Sarah AzimiCorrado De SioLuca Sterpone DATE 2021- Camera Ready.pdfA_3-D_LUT_Design_for_Transient_Error_Detection_Via_Inter-Tier_In-Silicon_Radiation_Sensor.pdf
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits / Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2020). [10.1109/TNS.2020.3006997] 1-gen-2020 L. SterponeS. AzimiB. Du + FINAL_VERSION.pdf09133159.pdf
Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications / Azimi, Sarah; Du, Boyang; Sterpone, Luca. - ELETTRONICO. - (2016). ((Intervento presentato al convegno Radiation Effects on Components & Systems Conference [10.1109/RADECS.2016.8093203]. 1-gen-2016 AZIMI, SARAHDU, BOYANGSTERPONE, LUCA RADECS_Sterpone_PJ6.pdfAccurate_analysis_of_SET_effects_on_Flash-based_FPGA_System-on-a-Chip_for_satellite_applications.pdf
Accurate Analysis of SET effects on Flash-based FPGA System-on-a-Chip for Satellite Applications / Azimi, Sarah; Du, Boyang; Sterpone, Luca; Grimoldi, Raoul; Fossati, Luca; Codinachs, David Merodio. - ELETTRONICO. - (2016). ((Intervento presentato al convegno 2016 IEEE 19th International Symposium on Design and Diagnostic of Electronic Circuits & Systems (DDECS) tenutosi a Kosice nel April 20-22. 1-gen-2016 AZIMI, SARAHDU, BOYANGSTERPONE, LUCA + DDECS_transient_modeling_v16f_ls.pdf
Analysis and Mitigation of Soft-Errors on High Performance Embedded GPUs / Sterpone, L.; Azimi, S.; De Sio, C.; Parisi, F.. - ELETTRONICO. - (2022), pp. 91-98. ((Intervento presentato al convegno 21st IEEE International Symposium on Parallel and Distributed Computing tenutosi a Basel (Switzerland) nel 11-13 July 2022 [10.1109/ISPDC55340.2022.00022]. 1-gen-2022 L. SterponeS. AzimiC. De Sio + ISPDC_2022.pdfAnalysis_and_Mitigation_of_Soft-Errors_on_High_Performance_Embedded_GPUs.pdf
Analysis of Proton-induced Single Event Effect in the On-Chip Memory of Embedded Processor / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-6. ((Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Austin (USA) nel October, 2022 [10.1109/DFT56152.2022.9962341]. 1-gen-2022 Corrado De SioSarah AzimiLuca Sterpone + DFT22_v2.2_cready.pdfAnalysis_of_Proton-induced_Single_Event_Effect_in_the_On-Chip_Memory_of_Embedded_Process.pdf
Analysis of Radiation-induced SETs in 3D VLSI Face-to-Back LUTs / Sterpone, Luca; Bozzoli, Ludovica; DE SIO, Corrado; Du, Boyang; Azimi, Sarah. - (2019). ((Intervento presentato al convegno 30th IEEE Radiation and its Effects on Components and Systems (RADECS 2019). 1-gen-2019 Luca SterponeLudovica BozzoliCorrado De SioBoyang DuSarah Azimi -
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 126:(2021). [10.1016/j.microrel.2021.114319] 1-gen-2021 Azimi, SarahDe Sio, CorradoSterpone, Luca MicRel 2021.pdf1-s2.0-S0026271421002857-main.pdf
Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] 1-gen-2021 Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca electronics-10-03160 (1).pdf
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] 1-gen-2019 Corrado De SioSarah AzimiLuca SterponeBoyang Du 08708270.pdf
An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] 1-gen-2022 Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + IEEESystem_2021.pdfAn_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] 1-gen-2022 S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone MicRel_CMOSvsFinFET_V3_fin.pdf1-s2.0-S0026271422002578-main.pdf
Concurrent Detection and Classification of Faults in Matrix Converter Using Trans-Conductance / Azimi, Sarah; Vejdaniamiri, Mehdi. - In: INTERNATIONAL JOURNAL OF POWER ELECTRONICS AND DRIVE SYSTEMS. - ISSN 2088-8694. - 5(2014), pp. 93-100. [10.11591/ijpeds.v4i5.6065] 1-gen-2014 Sarah Azimi + -
Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs / Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L. - In: VLSI-SoC[s.l] : Springer, 2022. 1-gen-2022 S. AzimiC. De SioA. PortaluriL. Sterpone springer_book_extended_vlsi_soc_2021_final.pdf
The development of Eddy Current Nondestructive Testing Method for Coating Thickness Measurement on the Steel Sheets / Shamgholi, Maryam; Abbasi, Majid; Mahmood Riazi, Seyed; Azimi, Sarah. - ELETTRONICO. - (2015). ((Intervento presentato al convegno 4th International Engineering Material and Metallurgy. 1-gen-2015 Sarah Azimi + -
Digital Design Techniques for Dependable High Performance Computing / Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-10. ((Intervento presentato al convegno IEEE International Test Conference (ITC 2020) nel 2020 [10.1109/ITC44778.2020.9325281]. 1-gen-2020 Azimi, SarahSterpone, Luca ITC 2020- Camera Ready.pdf09325281.pdf
Digital design techniques for dependable High-Performance Computing / Azimi, Sarah. - (2019 May 16), pp. 1-196. 16-mag-2019 AZIMI, SARAH PhD_Thesis_SarahAzimi_V2.pdfThesis_Abstract_SarahAzimi.pdf
Effective Characterization of Radiation-induced SET on Flash-based FPGAs / Sterpone, Luca; Azimi, Sarah. - ELETTRONICO. - (2017). ((Intervento presentato al convegno Radiation Effects on Components & Systems Conference tenutosi a Geneva, Switzerland nel 2-6 October 2017. 1-gen-2017 STERPONE, LUCAAZIMI, SARAH RADECS_2017.pdf
Effective Mitigation of Radiation-induced Single Event Transient on Flash-based FPGAs / Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul. - ELETTRONICO. - (2017), pp. 203-208. ((Intervento presentato al convegno GLSVLSI '17 tenutosi a Banff, Alberta, Canada nel May 10 - 12, 2017 [10.1145/3060403.3060454]. 1-gen-2017 AZIMI, SARAHDU, BOYANGSTERPONE, LUCA + glsv142-sterpone_final.pdf
An Emulation Platform for Evaluating the Reliability of Deep Neural Networks / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2020), pp. 1-4. ((Intervento presentato al convegno The 33th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology (DFT 2020) nel 19-21 Oct. 2020 [10.1109/DFT50435.2020.9250872]. 1-gen-2020 Corrado De SioSarah AzimiLuca Sterpone DFT_CameaReady_FinalVersion.pdf09250872.pdf