Archivio Istituzionale della RicercaRIZZIERI, DANIELE
RIZZIERI, DANIELE
Dipartimento di Automatica e Informatica
090668
A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems
2024 Cora, Giorgio; De Sio, Corrado; Rizzieri, Daniele; Azimi, Sarah; Sterpone, Luca
EUFRATE: A High-Perfomance Reconfigurable Architecture for Radiation-hardened Telecom Payloads
2023 Bozzoli, Ludovica; Catanese, Antonino; Scarpa, Eugenio; Fazzoletto, Emilio; Goehringer, Diana; Pertuz, Sergio; Lester, Kalms; Wulf, Cornelia; Charaf, Nejdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele
EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications
2023 Bozzoli, Ludovica; Catanese, Antonio; Fazzoletto, Emilio; Scarpa, Eugenio; Goehringer, Diana; Pertuz, Sergio; Kalms, Lester; Wulf, Cornelia; Charaf, Najdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele; La Greca, Salvatore Gabriele; Merodio Cordinachs, David; King, Stephen
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Programmable SEL Test Monitoring System for Radiation Hardness Assurance
2023 Rizzieri, Daniele; Azimi, Sarah; Sterpone, Luca; DE SIO, Corrado; Borel, Thomas; Gupta, Viyas; Cardi, Marghertia
Radiation Effects in Real-Time Soft Processors: Relating Software Errors to Hardware Faults
2023 DE SIO, Corrado; Rizzieri, Daniele; La Greca, Salvatore G.; Azimi, Sarah; Sterpone, Luca
Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System
2023 DE SIO, Corrado; Rizzieri, Daniele; Portaluri, Andrea; LA GRECA, SALVATORE GABRIELE; Azimi, Sarah
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications
2022 Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor
2022 De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Soft Error Reliability Prediction of SRAM-based FPGA Designs
2022 Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian
Analysis of Single Event Effects on Embedded Processor
2021 Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems / Cora, G., De Sio, C., Rizzieri, D., Azimi, S., Sterpone, L.. - ELETTRONICO. - (2024), pp. 31-36. (27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems Kielce (POL) 03-05 April 2024) [10.1109/DDECS60919.2024.10508921]. | 1-gen-2024 | Cora, GiorgioDe Sio, CorradoRizzieri, DanieleAzimi, SarahSterpone, Luca | DDECS2024.pdf; A_New_Reliability_Analysis_of_RISC-V_Soft_Processor_for_Safety-Critical_Systems.pdf |
| EUFRATE: A High-Perfomance Reconfigurable Architecture for Radiation-hardened Telecom Payloads / Bozzoli, L., Catanese, A., Scarpa, E., Fazzoletto, E., Goehringer, D., Pertuz, S., Lester, K., Wulf, C., Charaf, N., Sterpone, L., Azimi, S., Rizzieri, D.. - (2023). (European Data Handling and Data Processing Conference for Space, EDHPC 2023 Juan Les Pins (FRA) 02-06 October 2023) [10.23919/EDHPC59100.2023.10396517]. | 1-gen-2023 | Bozzoli, LudovicaCatanese, AntoninoFazzoletto, EmilioSterpone, LucaAzimi, SarahRizzieri, Daniele + | EUFRATE_a_High-Perfomance_Reconfigurable_Architecture_for_Radiation-hardened_Telecom_Payloads.pdf |
| EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications / Bozzoli, L., Catanese, A., Fazzoletto, E., Scarpa, E., Goehringer, D., Pertuz, S., Kalms, L., Wulf, C., Charaf, N., Sterpone, L., Azimi, S., Rizzieri, D., La Greca, S.G., Merodio Cordinachs, D., King, S.. - ELETTRONICO. - (2023), pp. 1-6. (Design, Automation & Test in Europe Conference & Exhibition (DATE) - DATE 2023 Antwerp (Belgium) 17-19 Aprile 2023) [10.23919/DATE56975.2023.10137035]. | 1-gen-2023 | Bozzoli, LudovicaFazzoletto EmilioSterpone, LucaAzimi, SarahRizzieri, DanieleLa Greca, Salvatore Gabriele + | DATE_EuFRATE_2023.pdf; EuFRATE_European_FPGA_Radiation-hardened_Architecture_for_Telecommunications.pdf |
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, S., DE SIO, C., Portaluri, A., Rizzieri, D., Vacca, E., Sterpone, L., Merodio Codinachs, D.. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| Programmable SEL Test Monitoring System for Radiation Hardness Assurance / Rizzieri, D., Azimi, S., Sterpone, L., DE SIO, C., Borel, T., Gupta, V., Cardi, M.. - (2023), pp. 217-223. (IEEE/IFIP International Conference on Dependable Systems and Networks Porto (PRT) 27 - 30 June 2023) [10.1109/DSN-S58398.2023.00061]. | 1-gen-2023 | Daniele RizzieriSarah AzimiLuca SterponeCorrado De Sio + | DSN2023_Camera Ready.pdf; Programmable_SEL_Test_Monitoring_System_for_Radiation_Hardness_Assurance.pdf |
| Radiation Effects in Real-Time Soft Processors: Relating Software Errors to Hardware Faults / DE SIO, C., Rizzieri, D., La Greca, S.G., Azimi, S., Sterpone, L.. - (2023), pp. 1-4. (IEEE Radiation and its Effects on Components and Systems 2023 (RADECS) Toulouse (FRA) 25-29 September 2023) [10.1109/RADECS59069.2023.10766965]. | 1-gen-2023 | Corrado De SioDaniele RizzieriSalvatore G. La GrecaSarah AzimiLuca Sterpone | Radiation_Effects_in_Real-Time_Soft_Processors_Relating_Software_Errors_to_Hardware_Faults.pdf |
| Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System / DE SIO, C., Rizzieri, D., Portaluri, A., LA GRECA, S.G., Azimi, S.. - (2023), pp. 1-3. (IEEE Symposium on On-Line Testing and Robust System Design -IOLTS Chania, Crete (GRC) 03-05 July 2023) [10.1109/IOLTS59296.2023.10224884]. | 1-gen-2023 | Corrado De SioDaniele RizzieriAndrea PortaluriSalvatore Gabriele La GrecaSarah Azimi | IOLTS_Camera Ready.pdf; Radiation-Induced_Errors_in_the_Software_Level_of_Real-Time_Soft_Processing_System.pdf |
| A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S., De Sio, C., Portaluri, A., Rizzieri, D., Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone | MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf |
| On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications / Portaluri, A., Azimi, S., DE SIO, C., Rizzieri, D., Sterpone, L.. - ELETTRONICO. - (2022), pp. 181-193. (35th GI/ITG International Conference on Architecture of Computing Systems Heilbronn (Germany) September, 2022) [10.1007/978-3-031-21867-5_12]. | 1-gen-2022 | Andrea PortaluriSarah AzimiCorrado De SioDaniele RizzieriLuca Sterpone | paper_26.pdf; 978-3-031-21867-5_12.pdf |
| Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, C., Azimi, S., Portaluri, A., Rizzieri, D., Vacca, E., Sterpone, L., Merodio Codinachs, D.. - ELETTRONICO. - (2022), pp. 1-4. (IEEE Radiation and its Effects on Components and Systems 2022 Venice (IT) 03-07 October 2022) [10.1109/RADECS55911.2022.10412414]. | 1-gen-2022 | De Sio, CorradoAzimi, SarahPortaluri, AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + | RADECS2022_Final.pdf; Proton-induced_MBU_Effects_in_Real-time_Operating_System_on_Embedded_Soft_Processor.pdf |
| Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, E., Azimi, S., DE SIO, C., Portaluri, A., Rizzieri, D., Sterpone, L., Merodio Codinachs, D., Poivey, C.. - ELETTRONICO. - (2022), pp. 1-4. (IEEE Radiation and its Effects on Components and Systems 2022 Venice (ITA) 03-07 October 2022) [10.1109/RADECS55911.2022.10412546]. | 1-gen-2022 | Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + | RADECS_prediction_v6 (2).pdf; Soft_Error_Reliability_Prediction_of_SRAM-based_FPGA_Designs.pdf |
| Analysis of Single Event Effects on Embedded Processor / Azimi, S., De Sio, C., Rizzieri, D., Sterpone, L.. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24 (3160)(2021). [10.3390/electronics10243160] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca | electronics-10-03160 (1).pdf |