RIZZIERI, DANIELE

RIZZIERI, DANIELE  

Dipartimento di Automatica e Informatica  

090668  

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Risultati 1 - 12 di 12 (tempo di esecuzione: 0.023 secondi).
Citazione Data di pubblicazione Autori File
A New Reliability Analysis of RISC-V Soft Processor for Safety-Critical Systems / Cora, Giorgio; De Sio, Corrado; Rizzieri, Daniele; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (In corso di stampa). (Intervento presentato al convegno 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Kielce (Poland) nel April 2024). In corso di stampa Cora,GiorgioDe Sio,CorradoRizzieri,DanieleAzimi,SarahSterpone,Luca DDECS2024.pdf
EUFRATE: A High-Perfomance Reconfigurable Architecture for Radiation-hardened Telecom Payloads / Bozzoli, Ludovica; Catanese, Antonino; Scarpa, Eugenio; Fazzoletto, Emilio; Goehringer, Diana; Pertuz, Sergio; Lester, Kalms; Wulf, Cornelia; Charaf, Nejdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele. - (2024). (Intervento presentato al convegno European Data Handling and Data Processing Conference for Space, EDHPC 2023 tenutosi a Juan Les Pins (FRA) nel 02-06 October 2023) [10.23919/EDHPC59100.2023.10396517]. 1-gen-2024 Bozzoli, LudovicaCatanese, AntoninoFazzoletto, EmilioSterpone, LucaAzimi, SarahRizzieri, Daniele + EUFRATE_a_High-Perfomance_Reconfigurable_Architecture_for_Radiation-hardened_Telecom_Payloads.pdf
EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications / Bozzoli, Ludovica; Catanese, Antonio; Fazzoletto, Emilio; Scarpa, Eugenio; Goehringer, Diana; Pertuz, Sergio; Kalms, Lester; Wulf, Cornelia; Charaf, Najdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele; La Greca, Salvatore Gabriele; Merodio Cordinachs, David; King, Stephen. - ELETTRONICO. - (2023), pp. 1-6. (Intervento presentato al convegno Design, Automation & Test in Europe Conference & Exhibition (DATE) - DATE 2023 tenutosi a Antwerp (Belgium) nel 17-19 Aprile 2023) [10.23919/DATE56975.2023.10137035]. 1-gen-2023 Bozzoli, LudovicaFazzoletto EmilioSterpone, LucaAzimi, SarahRizzieri, DanieleLa Greca, Salvatore Gabriele + DATE_EuFRATE_2023.pdfEuFRATE_European_FPGA_Radiation-hardened_Architecture_for_Telecommunications.pdf
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] 1-gen-2023 Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + electronics-12-00169.pdf
Programmable SEL Test Monitoring System for Radiation Hardness Assurance / Rizzieri, Daniele; Azimi, Sarah; Sterpone, Luca; DE SIO, Corrado; Borel, Thomas; Gupta, Viyas; Cardi, Marghertia. - (2023), pp. 217-223. (Intervento presentato al convegno IEEE/IFIP International Conference on Dependable Systems and Networks tenutosi a Porto (PRT) nel 27 - 30 June 2023) [10.1109/DSN-S58398.2023.00061]. 1-gen-2023 Daniele RizzieriSarah AzimiLuca SterponeCorrado De Sio + DSN2023_Camera Ready.pdfProgrammable_SEL_Test_Monitoring_System_for_Radiation_Hardness_Assurance.pdf
Radiation Effects in Real-Time Soft Processors: Relating Software Errors to Hardware Faults / DE SIO, Corrado; Rizzieri, Daniele; La Greca, Salvatore G.; Azimi, Sarah; Sterpone, Luca. - (2023). (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2023 (RADECS)). 1-gen-2023 Corrado De SioDaniele RizzieriSalvatore G. La GrecaSarah AzimiLuca Sterpone -
Radiation-Induced Errors in the Software Level of Real-Time Soft Processing System / DE SIO, Corrado; Rizzieri, Daniele; Portaluri, Andrea; LA GRECA, SALVATORE GABRIELE; Azimi, Sarah. - (2023), pp. 1-3. (Intervento presentato al convegno IEEE Symposium on On-Line Testing and Robust System Design -IOLTS tenutosi a Chania, Crete (GRC) nel 03-05 July 2023) [10.1109/IOLTS59296.2023.10224884]. 1-gen-2023 Corrado De SioDaniele RizzieriAndrea PortaluriSalvatore Gabriele La GrecaSarah Azimi IOLTS_Camera Ready.pdfRadiation-Induced_Errors_in_the_Software_Level_of_Real-Time_Soft_Processing_System.pdf
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] 1-gen-2022 S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone MicRel_CMOSvsFinFET_V3_fin.pdf1-s2.0-S0026271422002578-main.pdf
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications / Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 181-193. (Intervento presentato al convegno 35th GI/ITG International Conference on Architecture of Computing Systems tenutosi a Heilbronn (Germany) nel September, 2022) [10.1007/978-3-031-21867-5_12]. 1-gen-2022 Andrea PortaluriSarah AzimiCorrado De SioDaniele RizzieriLuca Sterpone paper_26.pdf978-3-031-21867-5_12.pdf
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (IT) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412414]. 1-gen-2022 De Sio, CorradoAzimi, SarahPortaluri, AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + RADECS2022_Final.pdfProton-induced_MBU_Effects_in_Real-time_Operating_System_on_Embedded_Soft_Processor.pdf
Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (ITA) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412546]. 1-gen-2022 Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + RADECS_prediction_v6 (2).pdfSoft_Error_Reliability_Prediction_of_SRAM-based_FPGA_Designs.pdf
Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] 1-gen-2021 Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca electronics-10-03160 (1).pdf