PORTALURI, ANDREA

PORTALURI, ANDREA  

Dipartimento di Automatica e Informatica  

063257  

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Citazione Data di pubblicazione Autori File
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] 1-gen-2022 S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone MicRel_CMOSvsFinFET_V3_fin.pdf1-s2.0-S0026271422002578-main.pdf
A New Domains-based Isolation Design Flow for Reconfigurable SoCs / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-7. ((Intervento presentato al convegno IEEE International Symposium on On-Line Testing and robust System Design (IOLTS 2021) [10.1109/IOLTS52814.2021.9486687]. 1-gen-2021 Portaluri,AndreaDe Sio, CorradoAzimi, SarahSterpone,Luca PaperID-30-IOLTS2021.pdfA_New_Domains-based_Isolation_Design_Flow_for_Reconfigurable_SoCs.pdf
Design and Mitigation techniques of Radiation induced SEEs on Open-Source Embedded Static RAMs / Azimi, S.; De Sio, C.; Portaluri, A.; Sterpone, L. - In: VLSI-SoC: Technology Advancement on SoC Design / Grimblatt V., Chang C.H., Reis R., Chattopadhyay A., Calimera A.. - [s.l] : Springer, 2022. - ISBN 978-3-031-16818-5. - pp. 135-153 [10.1007/978-3-031-16818-5_7] 1-gen-2022 S. AzimiC. De SioA. PortaluriL. Sterpone springer_book_extended_vlsi_soc_2021_final.pdf
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] 1-gen-2023 Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + electronics-12-00169.pdf
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications / Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 181-193. ((Intervento presentato al convegno 35th GI/ITG International Conference on Architecture of Computing Systems tenutosi a Heilbronn (Germany) nel September, 2022 [10.1007/978-3-031-21867-5_12]. 1-gen-2022 Andrea PortaluriSarah AzimiCorrado De SioDaniele RizzieriLuca Sterpone paper_26.pdf978-3-031-21867-5_12.pdf
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022. 1-gen-2022 De Sio, CorradoAzimi SarahPortaluri AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + RADECS2022_Final.pdf
Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices / Portaluri, Andrea; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-7. ((Intervento presentato al convegno IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) tenutosi a Turin nel 12-14 September 2022 [10.1109/IOLTS56730.2022.9897262]. 1-gen-2022 Portaluri, AndreaAzimi, SarahDe Sio, CorradoSterpone, Luca + IOLTS_22_paper.pdfRadiation-induced_Effects_on_DMA_Data_Transfer_in_Reconfigurable_Devices.pdf
SEU Evaluation of Hardened-by-Replication Software in RISC-V Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Sterpone, Luca. - ELETTRONICO. - (2021), pp. 1-6. ((Intervento presentato al convegno IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) tenutosi a Athens (GR) nel 6-8 October 2019 [10.1109/DFT52944.2021.9568342]. 1-gen-2021 De Sio, CorradoAzimi, SarahPortaluri, AndreaSterpone, Luca DFT_CAMERA READY.pdfSEU_Evaluation_of_Hardened-by-Replication_Software_in_RISC-_V_Soft_Processor.pdf
SEU Mitigation on SRAM-based FPGAs through Domains-based Isolation Design Flow / Portaluri, Andrea; De Sio, Corrado; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2022). ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2021 tenutosi a Vienna (Austria) nel 13-17 September 2021 [10.1109/RADECS53308.2021.9954492]. 1-gen-2022 Portaluri,AndreaDe Sio,CorradoAzimi,SarahSterpone,Luca RADECS-Camera Ready.pdfSEU_Mitigation_on_SRAM-based_FPGAs_through_Domains-based_Isolation_Design_Flow.pdf
Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (Italy) nel October, 2022. 1-gen-2022 Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + RADECS_prediction_v6 (2).pdf