VACCA, ELEONORA

VACCA, ELEONORA  

Dipartimento di Automatica e Informatica  

058723  

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Risultati 1 - 8 di 8 (tempo di esecuzione: 0.013 secondi).
Citazione Data di pubblicazione Autori File
A Comprehensive Analysis of Transient Errors on Systolic Arrays / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2023), pp. 175-180. (Intervento presentato al convegno 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Tallinn (Estonia) nel 3-5 May 2023) [10.1109/DDECS57882.2023.10139763]. 1-gen-2023 Vacca, EleonoraAzimi, SarahSterpone, Luca DDECS23_CAMERA_READY_copyright.pdfA_Comprehensive_Analysis_of_Transient_Errors_on_Systolic_Arrays.pdf
Analyzing the SEU-induced Error Propagation in Systolic Array on SRAM-based FPGA / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - ELETTRONICO. - (2023). (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2023 tenutosi a Toulouse (France) nel 25-29 September 2023). 1-gen-2023 Vacca, EleonoraAzimi, SarahSterpone, Luca D_143_Vacca_2023-04-07_22_12_51.pdf
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] 1-gen-2023 Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + electronics-12-00169.pdf
RunSAFER: A Novel Runtime Fault Detection Approach for Systolic Array Accelerators / Vacca, Eleonora; Ajmone, Giorgio; Sterpone, Luca. - ELETTRONICO. - (2023), pp. 596-604. (Intervento presentato al convegno The 41st IEEE International Conference on Computer Design tenutosi a Washington DC (USA) nel 6-8 November 2023) [10.1109/ICCD58817.2023.00095]. 1-gen-2023 Vacca, EleonoraAjmone, GiorgioSterpone, Luca ICCD23.pdfRunSAFER_A_Novel_Runtime_Fault_Detection_Approach_for_Systolic_Array_Accelerators.pdf
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] 1-gen-2022 Vacca, EleonoraAzimi, SarahSterpone, Luca microelectronics_reliability_camera_ready.pdf3220228.3220229.pdf
Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor / Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah. - ELETTRONICO. - (2022), pp. 215-220. (Intervento presentato al convegno 19th ACM International Conference on Computing Frontiers 2022 tenutosi a Torino nel May 2022) [10.1145/3528416.3530984]. 1-gen-2022 Vacca, EleonoraDe Sio, CorradoAzimi, Sarah CF2022_camera_ready.pdf3528416.3530984.pdf
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (IT) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412414]. 1-gen-2022 De Sio, CorradoAzimi, SarahPortaluri, AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + RADECS2022_Final.pdfProton-induced_MBU_Effects_in_Real-time_Operating_System_on_Embedded_Soft_Processor.pdf
Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (ITA) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412546]. 1-gen-2022 Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + RADECS_prediction_v6 (2).pdfSoft_Error_Reliability_Prediction_of_SRAM-based_FPGA_Designs.pdf