Archivio Istituzionale della RicercaVACCA, ELEONORA
VACCA, ELEONORA
Dipartimento di Automatica e Informatica
058723
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
2022 Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor
2022 Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor
2022 De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Soft Error Reliability Prediction of SRAM-based FPGA Designs
2022 Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] | 1-gen-2022 | Vacca, EleonoraAzimi, SarahSterpone, Luca | microelectronics_reliability_camera_ready.pdf; 3220228.3220229.pdf |
| Layout-oriented Radiation Effects Mitigation in RISC-V Soft Processor / Vacca, Eleonora; De Sio, Corrado; Azimi, Sarah. - ELETTRONICO. - (2022), pp. 1-6. ((Intervento presentato al convegno 19th ACM International Conference on Computing Frontiers 2022 tenutosi a Torino nel May 2022 [10.1145/3528416.3530984]. | 1-gen-2022 | Vacca, EleonoraDe Sio, CorradoAzimi, Sarah | CF2022_camera_ready.pdf; 3528416.3530984.pdf |
| Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022. | 1-gen-2022 | De Sio, CorradoAzimi SarahPortaluri AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + | RADECS2022_Final.pdf |
| Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (Italy) nel October, 2022. | 1-gen-2022 | Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + | RADECS_prediction_v6 (2).pdf |