Archivio Istituzionale della RicercaVACCA, ELEONORA
VACCA, ELEONORA
Dipartimento di Automatica e Informatica
058723
Mostra
records
Risultati 1 - 2 di 2 (tempo di esecuzione: 0.003 secondi).
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
2022 Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] | 1-gen-2022 | Vacca, EleonoraAzimi, SarahSterpone, Luca | microelectronics_reliability_camera_ready.pdf; 3220228.3220229.pdf |