Space applications using SRAM-based FPGA devices demand an accurate evaluation of high-energy radiation particle effects on the design functionality even when mitigation techniques are adopted. In this work, we evaluated the failure rate of different layout solutions of redundancy-based radiation tolerant design. Experimental results achieved thanks to fault injection campaigns and proton radiation tests on different radiation tolerant design implementations demonstrate that an isolation-based redundancy layout provides more than one order of magnitude radiation tolerance capabilities than a commercial solution.

Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778]

Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs

Vacca, Eleonora;Azimi, Sarah;Sterpone, Luca
2022

Abstract

Space applications using SRAM-based FPGA devices demand an accurate evaluation of high-energy radiation particle effects on the design functionality even when mitigation techniques are adopted. In this work, we evaluated the failure rate of different layout solutions of redundancy-based radiation tolerant design. Experimental results achieved thanks to fault injection campaigns and proton radiation tests on different radiation tolerant design implementations demonstrate that an isolation-based redundancy layout provides more than one order of magnitude radiation tolerance capabilities than a commercial solution.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2971149