An Integrated Flow for Predicting Radiation Effects in CubeSat Onboard Electronics

We introduce a simulation-driven methodology to assess the Single Event Effect (SEE) sensitivity of CubeSat electronics under mission-specific radiation environments. By combining component-level Single Event Upset (SEU) cross-section data with detailed 3D structural shielding models, our approach enables fine-grained estimation of SEE rates. Applied to the RAMSES CubeSat mission, it demonstrates that accounting for 3D analysis reduce predicted SEU rates by over 50× compared to simplified standalone models. This improved precision enhances component selection, informs shielding strategies, and streamlines fault mitigation planning, ultimately supporting cost-effective and reliable mission design.