Archivio Istituzionale della RicercaWe developed a tool for the reliability analysis of SEU effects on the configuration memory of Xilinx Zynq SRAM-based FPGAs. A proton radiation test campaign on different TMR layouts demonstrated the effectiveness of our approach.
Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. (Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (ITA) nel 03-07 October 2022) [10.1109/RADECS55911.2022.10412546].
Soft Error Reliability Prediction of SRAM-based FPGA Designs
Eleonora Vacca;Sarah Azimi;Corrado De Sio;Andrea Portaluri;Daniele Rizzieri;Luca Sterpone;
2022
Abstract
We developed a tool for the reliability analysis of SEU effects on the configuration memory of Xilinx Zynq SRAM-based FPGAs. A proton radiation test campaign on different TMR layouts demonstrated the effectiveness of our approach.
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https://hdl.handle.net/11583/2971147