As the adoption of SRAM-based FPGAs and Reconfigurable SoCs for High-Performance Computing increased in the last years, the use of Direct Memory Access for data transfer becomes a key feature of many reconfigurable applications even in the space industry. For such kinds of applications, radiation-induced effects are a serious issue that mines the correctness and success of mission-critical tasks. In this paper, we evaluate the effects of proton-induced errors on a DMA-based application implemented on a Xilinx Zynq-7020 FPGA in order to quantify the robustness of this module in a typical hardware-accelerated configuration. The obtained results confirm the high criticality of the DMA module on programmable logic. Moreover, the Multiple Bits Upsets effect has been evaluated. The most recurring patterns have been reported in order to provide further tools to better characterize the behavior of these systems under future fault injection campaigns, as demonstrated in the experimental results.

Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices / Portaluri, Andrea; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-7. ((Intervento presentato al convegno IEEE The 28th International Symposium on On-Line Testing and Robust System Design (IOLTS 2022) tenutosi a Turin nel 12-14 September 2022 [10.1109/IOLTS56730.2022.9897262].

Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices

Portaluri, Andrea;Azimi, Sarah;De Sio, Corrado;Sterpone, Luca;
2022

Abstract

As the adoption of SRAM-based FPGAs and Reconfigurable SoCs for High-Performance Computing increased in the last years, the use of Direct Memory Access for data transfer becomes a key feature of many reconfigurable applications even in the space industry. For such kinds of applications, radiation-induced effects are a serious issue that mines the correctness and success of mission-critical tasks. In this paper, we evaluate the effects of proton-induced errors on a DMA-based application implemented on a Xilinx Zynq-7020 FPGA in order to quantify the robustness of this module in a typical hardware-accelerated configuration. The obtained results confirm the high criticality of the DMA module on programmable logic. Moreover, the Multiple Bits Upsets effect has been evaluated. The most recurring patterns have been reported in order to provide further tools to better characterize the behavior of these systems under future fault injection campaigns, as demonstrated in the experimental results.
File in questo prodotto:
File Dimensione Formato  
IOLTS_22_paper.pdf

non disponibili

Descrizione: iolts_2022
Tipologia: 2. Post-print / Author's Accepted Manuscript
Licenza: Non Pubblico - Accesso privato/ristretto
Dimensione 1.36 MB
Formato Adobe PDF
1.36 MB Adobe PDF   Visualizza/Apri   Richiedi una copia
Pubblicazioni consigliate

Caricamento pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2970901