Archivio Istituzionale della RicercaRIZZIERI, DANIELE
RIZZIERI, DANIELE
Dipartimento di Automatica e Informatica
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Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
Analysis of Single Event Effects on Embedded Processor
2021 Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone | MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf |
| Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24 (3160)(2021). [10.3390/electronics10243160] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca | electronics-10-03160 (1).pdf |