Archivio Istituzionale della RicercaRIZZIERI, DANIELE
RIZZIERI, DANIELE
Dipartimento di Automatica e Informatica
090668
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
Analysis of Single Event Effects on Embedded Processor
2021 Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications
2023 Bozzoli, Ludovica; Catanese, Antonio; Fazzoletto, Emilio; Scarpa, Eugenio; Goehringer, Diana; Pertuz, Sergio; Kalms, Lester; Wulf, Cornelia; Charaf, Najdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele; La Greca, Salvatore Gabriele; Merodio Cordinachs, David; King, Stephen
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications
2022 Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca
Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor
2022 De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Soft Error Reliability Prediction of SRAM-based FPGA Designs
2022 Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone | MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf |
| Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24(2021), p. 3160. [10.3390/electronics10243160] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca | electronics-10-03160 (1).pdf |
| EuFRATE: European FPGA Radiation-hardened Architecture for Telecommunications / Bozzoli, Ludovica; Catanese, Antonio; Fazzoletto, Emilio; Scarpa, Eugenio; Goehringer, Diana; Pertuz, Sergio; Kalms, Lester; Wulf, Cornelia; Charaf, Najdet; Sterpone, Luca; Azimi, Sarah; Rizzieri, Daniele; La Greca, Salvatore Gabriele; Merodio Cordinachs, David; King, Stephen. - ELETTRONICO. - (2023), pp. 1-6. ((Intervento presentato al convegno Design, Automation & Test in Europe Conference & Exhibition (DATE) - DATE 2023 tenutosi a Antwerp, Belgium nel 17-19 Aprile 2023. | 1-gen-2023 | Bozzoli, LudovicaFazzoletto EmilioSterpone, LucaAzimi, SarahRizzieri, DanieleLa Greca, Salvatore Gabriele + | DATE_EuFRATE_2023.pdf |
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| On the Reliability of Real-time Operating System on Embedded Soft Processor for Space Applications / Portaluri, Andrea; Azimi, Sarah; DE SIO, Corrado; Rizzieri, Daniele; Sterpone, Luca. - ELETTRONICO. - (2022), pp. 181-193. ((Intervento presentato al convegno 35th GI/ITG International Conference on Architecture of Computing Systems tenutosi a Heilbronn (Germany) nel September, 2022 [10.1007/978-3-031-21867-5_12]. | 1-gen-2022 | Andrea PortaluriSarah AzimiCorrado De SioDaniele RizzieriLuca Sterpone | paper_26.pdf; 978-3-031-21867-5_12.pdf |
| Proton-induced MBU Effects in Real-time Operating System on Embedded Soft Processor / De Sio, Corrado; Azimi, Sarah; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022. | 1-gen-2022 | De Sio, CorradoAzimi SarahPortaluri AndreaRizzieri, DanieleVacca, EleonoraSterpone, Luca + | RADECS2022_Final.pdf |
| Soft Error Reliability Prediction of SRAM-based FPGA Designs / Vacca, Eleonora; Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Sterpone, Luca; Merodio Codinachs, David; Poivey, Christian. - ELETTRONICO. - (2022), pp. 1-4. ((Intervento presentato al convegno IEEE Radiation and its Effects on Components and Systems 2022 tenutosi a Venice (Italy) nel October, 2022. | 1-gen-2022 | Eleonora VaccaSarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriLuca Sterpone + | RADECS_prediction_v6 (2).pdf |