Archivio Istituzionale della RicercaAZIMI, SARAH
AZIMI, SARAH
Dipartimento di Automatica e Informatica
039557
CNN-Oriented Placement Algorithm for High-Performance Accelerators on Rad-Hard FPGAs
2024 Sterpone, L.; Azimi, S.; De Sio, C
NXRouting: A GPU-Enhanced CAD Tool for European Radiation-Hardened FPGAs
2024 Portaluri, Andrea; Azimi, Sarah; Saracino, Andrea; Sterpone, Luca; Kilic, Alp; Dupuis, Damien
Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches
2023 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca
Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems
2023 Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David
Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help”
2023 Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca
A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS
2022 Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.
An Automated Continuous Integration Multitest Platform for Automotive Systems
2022 Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca
Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs
2022 Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca
FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms
2022 De Sio, C.; Azimi, S.; Sterpone, L.
A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology
2021 Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
Analysis of Single Event Effects on Embedded Processor
2021 Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca
Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis
2021 Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca
A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits
2020 Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.
On the Analysis of Radiation-induced Failures in the AXI Interconnect Module
2020 De Sio, C.; Azimi, S.; Sterpone, L.
A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs
2019 Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; Cattaneo, Luca
Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect
2019 DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang
Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs
2019 De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.
Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA
2019 Du, Boyang; Sterpone, Luca; Azimi, Sarah; Merodio Codinachs, David; Ferlet-Cavrois, Véronique; Boatella Polo, Cesar; García Alía, Rubén; Kastriotou, Maria; Fernández-Martínez, Pablo
On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs
2018 Azimi, S.; Sterpone, L.; Du, B.; Boragno, L.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| CNN-Oriented Placement Algorithm for High-Performance Accelerators on Rad-Hard FPGAs / Sterpone, L.; Azimi, S.; De Sio, C. - In: IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS. - ISSN 0278-0070. - 43:4(2024), pp. 1079-1092. [10.1109/TCAD.2023.3331976] | 1-gen-2024 | Sterpone, L.Azimi, S.De Sio, C | TCAD_2023.pdf; CNN-Oriented_Placement_Algorithm_for_High-Performance_Accelerators_on_Rad-Hard_FPGAs.pdf |
| NXRouting: A GPU-Enhanced CAD Tool for European Radiation-Hardened FPGAs / Portaluri, Andrea; Azimi, Sarah; Saracino, Andrea; Sterpone, Luca; Kilic, Alp; Dupuis, Damien. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 13:14(2024). [10.3390/electronics13142803] | 1-gen-2024 | Portaluri,AndreaAzimi,SarahSterpone,Luca + | electronics-13-02803-1.pdf |
| Evaluating Reliability against SEE of Embedded Systems: A Comparison of RTOS and Bare-metal Approaches / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 150:(2023). [10.1016/j.microrel.2023.115124] | 1-gen-2023 | Corrado De SioSarah AzimiLuca Sterpone | MicRel_V2.2_CD.pdf; 1-s2.0-S002627142300224X-main.pdf |
| Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems / Azimi, Sarah; DE SIO, Corrado; Portaluri, Andrea; Rizzieri, Daniele; Vacca, Eleonora; Sterpone, Luca; Merodio Codinachs, David. - In: ELECTRONICS. - ISSN 2079-9292. - 12:1(2023), p. 169. [10.3390/electronics12010169] | 1-gen-2023 | Sarah AzimiCorrado De SioAndrea PortaluriDaniele RizzieriEleonora VaccaLuca Sterpone + | electronics-12-00169.pdf |
| Fighting for a Future Free from Violence: A Framework for Real-time Detection of “Signal for Help” / Azimi, Sarah; De Sio, Corrado; Carlucci, Francesco; Sterpone, Luca. - In: INTELLIGENT SYSTEMS WITH APPLICATIONS. - ISSN 2667-3053. - 17:(2023), pp. 1-24. [10.1016/j.iswa.2022.200174] | 1-gen-2023 | Azimi, SarahDe Sio, CorradoCarlucci, FrancescoSterpone, Luca | ISwA_2023.pdf |
| A Comparative Radiation Analysis of Reconfigurable Memory Technologies: FinFET versus Bulk CMOS / Azimi, S.; De Sio, C.; Portaluri, A.; Rizzieri, D.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 138:(2022), pp. 1-5. [10.1016/j.microrel.2022.114733] | 1-gen-2022 | S. AzimiC. De SioA. PortaluriD. RizzieriL. Sterpone | MicRel_CMOSvsFinFET_V3_fin.pdf; 1-s2.0-S0026271422002578-main.pdf |
| An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] | 1-gen-2022 | Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + | IEEESystem_2021.pdf; An_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf |
| Failure rate analysis of radiation tolerant design techniques on SRAM-based FPGAs / Vacca, Eleonora; Azimi, Sarah; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 138:(2022). [10.1016/j.microrel.2022.114778] | 1-gen-2022 | Vacca, EleonoraAzimi, SarahSterpone, Luca | microelectronics_reliability_camera_ready.pdf; 3220228.3220229.pdf |
| FireNN: Neural Networks Reliability Evaluation on Hybrid Platforms / De Sio, C.; Azimi, S.; Sterpone, L.. - In: IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING. - ISSN 2168-6750. - ELETTRONICO. - 10:2(2022), pp. 549-563. [10.1109/TETC.2022.3152668] | 1-gen-2022 | De Sio C.Azimi S.Sterpone L. | FireNN_cd_2.2.pdf; FireNN_Neural_Networks_Reliability_Evaluation_on_Hybrid_Platforms.pdf |
| A Radiation-Hardened CMOS Full-Adder Based on Layout Selective Transistor Duplication / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 29:8(2021), pp. 1596-1600. [10.1109/TVLSI.2021.3086897] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | ToVLSI-Final Version.pdf; A_Radiation-Hardened_CMOS_Full-Adder_Based_on_Layout_Selective_Transistor_Duplication.pdf |
| Analysis of Radiation-induced Transient Errors on 7nm FinFET Technology / Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 126:(2021). [10.1016/j.microrel.2021.114319] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca | MicRel 2021.pdf; 1-s2.0-S0026271421002857-main.pdf |
| Analysis of Single Event Effects on Embedded Processor / Azimi, Sarah; De Sio, Corrado; Rizzieri, Daniele; Sterpone, Luca. - In: ELECTRONICS. - ISSN 2079-9292. - ELETTRONICO. - 10:24 (3160)(2021). [10.3390/electronics10243160] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoRizzieri, DanieleSterpone, Luca | electronics-10-03160 (1).pdf |
| Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis / Yang, Wei-Tao; Du, Xue-Cheng; Li, Yong-Hong; He, Chao-Hui; Guo, Gang; Shi, Shu-Ting; Cai, Li; Azimi, Sarah; De Sio, Corrado; Sterpone, Luca. - In: NUCLEAR SCIENCE AND TECHNIQUES. - ISSN 1001-8042. - 32:(2021). [10.1007/s41365-021-00943-6] | 1-gen-2021 | Azimi, SarahDe Sio, CorradoSterpone, Luca + | Yang2021_Article_Single-event-effectPropagation (1).pdf |
| A 3D Simulation-based Approach to Analyze Heavy Ions-induced SET on Digital Circuits / Sterpone, L.; Luoni, F.; Azimi, S.; Du, B.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2020). [10.1109/TNS.2020.3006997] | 1-gen-2020 | L. SterponeS. AzimiB. Du + | FINAL_VERSION.pdf; 09133159.pdf |
| On the Analysis of Radiation-induced Failures in the AXI Interconnect Module / De Sio, C.; Azimi, S.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 114 (113733):(2020). [10.1016/j.microrel.2020.113733] | 1-gen-2020 | De Sio C.Azimi S.Sterpone L. | MicRel2020_CameraReady.pdf; 1-s2.0-S0026271420305400-main.pdf |
| A new CAD tool for Single Event Transient Analysis and Mitigation on Flash-based FPGAs / Azimi, Sarah; Du, Boyang; Sterpone, Luca; Merodio Codinachs, David; Grimoldi, Raoul; Cattaneo, Luca. - In: INTEGRATION. - ISSN 0167-9260. - 67:(2019), pp. 73-81. [10.1016/j.vlsi.2019.02.001] | 1-gen-2019 | Sarah AzimiBoyang DuLuca Sterpone + | 1-s2.0-S0167926018305753-main.pdf |
| Analyzing Radiation-induced Transient Errors on SRAM-based FPGAs by Propagation of Broadening Effect / DE SIO, Corrado; Azimi, Sarah; Sterpone, Luca; Du, Boyang. - In: IEEE ACCESS. - ISSN 2169-3536. - 7:(2019), pp. 140182-140189. [10.1109/ACCESS.2019.2915136] | 1-gen-2019 | Corrado De SioSarah AzimiLuca SterponeBoyang Du | 08708270.pdf |
| Radiation-induced Single Event Transient effects during the reconfiguration process of SRAM-based FPGAs / De Sio, C.; Azimi, S.; Bozzoli, L.; Du, B.; Sterpone, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - (2019). [10.1016/j.microrel.2019.06.034] | 1-gen-2019 | De Sio, C.Azimi, S.Bozzoli, L.Du, B.Sterpone, L. | - |
| Ultra High Energy Heavy Ion Test Beam on Xilinx Kintex-7 SRAM-based FPGA / Du, Boyang; Sterpone, Luca; Azimi, Sarah; Merodio Codinachs, David; Ferlet-Cavrois, Véronique; Boatella Polo, Cesar; García Alía, Rubén; Kastriotou, Maria; Fernández-Martínez, Pablo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 66:7(2019), pp. 1813-1819. [10.1109/TNS.2019.2915207] | 1-gen-2019 | Boyang DuLuca SterponeSarah Azimi + | 08708253.pdf |
| On the analysis of radiation-induced Single Event Transients on SRAM-based FPGAs / Azimi, S.; Sterpone, L.; Du, B.; Boragno, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - 88-90:(2018), pp. 936-940. [10.1016/j.microrel.2018.07.135] | 1-gen-2018 | Azimi, S.Sterpone, L.Du, B. + | - |