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SABENA, DAVIDE

SABENA, DAVIDE  

Dipartimento di Automatica e Informatica  

028076  

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Citazione Data di pubblicazione Autori File
Hardening Dynamically Reconfigurable Processing Modules Architectures: A Neutron Test Experience / Desogus, Marco; Sterpone, Luca; Sabena, Davide; Ullah, Anees; Mario, Porrmann; Jens, Hagemeyer; Jorgan, Ilstad. - (In corso di stampa). (Intervento presentato al convegno Radiation Effects on Components and Systems 2013). In corso di stampa DESOGUS, MARCOSTERPONE, LucaSABENA, DAVIDEULLAH, ANEES + -
An Automated Continuous Integration Multitest Platform for Automotive Systems / Du, Boyang; Azimi, Sarah; Moramarco, Annarita; Sabena, Davide; Parisi, Filippo; Sterpone, Luca. - In: IEEE SYSTEMS JOURNAL. - ISSN 1932-8184. - ELETTRONICO. - 16:2(2022), pp. 2495-2506. [10.1109/JSYST.2021.3069548] 1-gen-2022 Du, BoyangAzimi, SarahMoramarco, AnnaritaSabena, DavideSterpone, Luca + IEEESystem_2021.pdf; An_Automated_Continuous_Integration_Multitest_Platform_for_Automotive_Systems.pdf
New Test and Fault Tolerance Techniques for Reliability Characterization of Parallel and Reconfigurable Processors / Sabena, Davide. - (2015). 1-gen-2015 SABENA, DAVIDE -
Partition-Based Faults Diagnosis of a VLIW Processor / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca - In: VLSI-SoC: At the Crossroads of Emerging Trends / Alex Orailoglu, H. Fatih Ugurdag, Luís Miguel Silveira, Martin Margala, Ricardo Reis. - STAMPA. - Berlino : Springer, 2015. - ISBN 978-3-319-23798-5. - pp. 208-226 [10.1007/978-3-319-23799-2] 1-gen-2015 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LUCA -
Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 54:11(2014), pp. 2621-2628. [10.1016/j.microrel.2014.05.001] 1-gen-2014 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications / DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - (2014), pp. 210-211. (Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium (IOLTS) tenutosi a Platja d'Aro nel July 7 - 9, 2014). 1-gen-2014 DE CARVALHO, MAURICIOSABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - In: IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS. - ISSN 1063-8210. - ELETTRONICO. - 22:4(2014), pp. 813-823. [10.1109/TVLSI.2013.2252636] 1-gen-2014 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
Reconfigurable High Performance Architectures: How much are they ready for safety-critical applications / Sabena, Davide; Sterpone, Luca; Schölzel, M.; Koal, T.; Vierhaus, H. T.; Wong, S.; Glein, R.; Rittner, F.; Stender, C.; Porrmann, M.; Hagemeyer, J.. - ELETTRONICO. - (2014), pp. 175-182. (Intervento presentato al convegno 19th IEEE European Test Symposium (ETS) tenutosi a Paderborn nel 26 May - 30 May 2014). 1-gen-2014 SABENA, DAVIDESTERPONE, Luca + -
Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications / Sabena, Davide; Sterpone, Luca; Carro, L.; Rech, P.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 61:6(2014), pp. 3123-3129. [10.1109/TNS.2014.2363358] 1-gen-2014 SABENA, DAVIDESTERPONE, LucaRech P. + -
Soft Error Effects Analysis and Mitigation in VLIW Safety-Critical Applications / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2014), pp. 135-140. (Intervento presentato al convegno IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC) tenutosi a Playa del Carmen, Mexico. nel October 6-8, 2014). 1-gen-2014 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
Dynamic Neutron Testing of Dynamically Reconfigurable Processing Modules Architecture / Sterpone, Luca; Sabena, Davide; Ullah, Anees; Porrmann, M.; Hagemeyer, J.; Ilstad, J.. - ELETTRONICO. - (2013), pp. 184-188. (Intervento presentato al convegno IEEE AHS tenutosi a Torino nel June 2013). 1-gen-2013 STERPONE, LucaSABENA, DAVIDEULLAH, ANEES + -
On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors / Sabena, Davide; Sterpone, Luca; SONZA REORDA, Matteo. - ELETTRONICO. - (2013), pp. 162-180. (Intervento presentato al convegno 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration tenutosi a Santa Cruz, CA, USA nel October 7-10, 2012) [10.1007/978-3-642-45073-0_9]. 1-gen-2013 SABENA, DAVIDESTERPONE, LucaSONZA REORDA, Matteo -
On the development of diagnostic test programs for VLIW processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2013), pp. 87-92. (Intervento presentato al convegno 21st IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) tenutosi a Istanbul nel October 2013). 1-gen-2013 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
On the evaluation of soft-errors detection techniques for GPGPUs / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - ELETTRONICO. - (2013). (Intervento presentato al convegno 2013 8th IEEE International Design and Test Symposium (IDT) tenutosi a Marrakesh nel December 16-18, 2013). 1-gen-2013 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
A New Fault Injection Approach for Testing Network-on-Chips / Sterpone, Luca; Sabena, Davide; SONZA REORDA, Matteo. - STAMPA. - (2012), pp. 530-535. (Intervento presentato al convegno PDP 2012 tenutosi a Munich) [10.1109/PDP.2012.82]. 1-gen-2012 STERPONE, LucaSABENA, DAVIDESONZA REORDA, Matteo -
A New SBST Algorithm for Testing the Register File of VLIW Processors / Sterpone, Luca; Sabena, Davide; SONZA REORDA, Matteo. - ELETTRONICO. - (2012), pp. 412-417. (Intervento presentato al convegno IEEE Design, Automation and Test in Europe, 2012 tenutosi a Dresden, Germany nel 12-16 March 2012). 1-gen-2012 STERPONE, LucaSABENA, DAVIDESONZA REORDA, Matteo -
On the development of Software-Based Self-Test methods for VLIW processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2012), pp. 25-30. (Intervento presentato al convegno Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on tenutosi a Austin, TX, USA nel October, 2012.) [10.1109/DFT.2012.6378194]. 1-gen-2012 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
On the optimized generation of Software-Based Self-Test programs for VLIW processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2012), pp. 129-134. (Intervento presentato al convegno VLSI and System-on-Chip (VLSI-SoC), 2012 IEEE/IFIP 20th International Conference on tenutosi a Santa Cruz, CA, USA nel 7-10 October 2012) [10.1109/VLSI-SoC.2012.6379018]. 1-gen-2012 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
Fault Injection Analysis of Transient Faults in Clustered VLIW Processors / Sterpone, Luca; Sabena, Davide; Campagna, Salvatore; SONZA REORDA, Matteo. - (2011), pp. 207-212. (Intervento presentato al convegno 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems tenutosi a Cottbus, Germany nel 13-15 Aprile, 2011). 1-gen-2011 STERPONE, LucaSABENA, DAVIDECAMPAGNA, SALVATORESONZA REORDA, Matteo -