Archivio Istituzionale della RicercaDE CARVALHO, MAURICIO
DE CARVALHO, MAURICIO
Dipartimento di Automatica e Informatica
025516
Innovative Techniques for Testing and Diagnosing SoCs
2015 DE CARVALHO, Mauricio
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications
2014 DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test
2014 DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption
2013 Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard
Increasing fault coverage during functional test in the operational phase2013 IEEE 19th International On-Line Testing Symposium (IOLTS)
2013 DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; O., Ballan
On-Line Software-Based Self-Test of the Address Calculation Unit in RISC Processors
2012 Bernardi, Paolo; Ciganda, LYL MERCEDES; DE CARVALHO, Mauricio; Grosso, Michelangelo; J., Lagos Benites; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; O., Ballan
Peak Power Estimation: A Case Study on CPU Cores
2012 Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; P., Girard; M., Valka
A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing
2011 M., Valka; A., Bosio; L., Dilillo; P., Girard; S., Pravossoudovitch; A., Virazel; SANCHEZ SANCHEZ, EDGAR ERNESTO; DE CARVALHO, Mauricio; SONZA REORDA, Matteo
Optimized embedded memory diagnosis
2011 DE CARVALHO, Mauricio; Bernardi, Paolo; SONZA REORDA, Matteo; N., Campanelli; T., Kerekes; D., Appello; M., Barone; V., Tancorre; M., Terzi
An enhanced strategy for functional stress pattern generation for system-on-chip reliability characterization
2010 DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo
Cumulative embedded memory failure bitmap display & analysis
2010 Campanelli, N.; Kekeres, T.; Bernardi, Paolo; DE CARVALHO, Mauricio; Panariti, Alessandro; SONZA REORDA, Matteo; Appello, D.; Barrone, M.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Innovative Techniques for Testing and Diagnosing SoCs / DE CARVALHO, Mauricio. - (2015). [10.6092/polito/porto/2612755] | 1-gen-2015 | DE CARVALHO, MAURICIO | DECARVALHO_MAURICIO_thesis_final.pdf |
| Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications / DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - (2014), pp. 210-211. ( IEEE 20th International On-Line Testing Symposium (IOLTS) Platja d'Aro July 7 - 9, 2014). | 1-gen-2014 | DE CARVALHO, MAURICIOSABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + | - |
| Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test / DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 30:(2014), pp. 317-328. [10.1007/s10836-014-5457-5] | 1-gen-2014 | DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO + | - |
| Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption / Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - 9:(2013), pp. 253-263. [10.1166/jolpe.2013.1259] | 1-gen-2013 | BERNARDI, PAOLODE CARVALHO, MAURICIOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| Increasing fault coverage during functional test in the operational phase2013 IEEE 19th International On-Line Testing Symposium (IOLTS) / DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; O., Ballan. - (2013), pp. 43-48. ( 2013 IEEE 19th International On-Line Testing Symposium (IOLTS)) [10.1109/IOLTS.2013.6604049]. | 1-gen-2013 | DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| On-Line Software-Based Self-Test of the Address Calculation Unit in RISC Processors / Bernardi, Paolo; Ciganda, LYL MERCEDES; DE CARVALHO, Mauricio; Grosso, Michelangelo; J., Lagos Benites; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; O., Ballan. - (2012). ( European Test Symposium (ETS), 2012 17th IEEE). | 1-gen-2012 | BERNARDI, PAOLOCIGANDA, LYL MERCEDESDE CARVALHO, MAURICIOGROSSO, MICHELANGELOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |
| Peak Power Estimation: A Case Study on CPU Cores / Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; P., Girard; M., Valka. - (2012), pp. 167-172. ( 2012 IEEE 21st Asian Test Symposium) [10.1109/ATS.2012.58]. | 1-gen-2012 | BERNARDI, PAOLODE CARVALHO, MAURICIOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | 2507957-1.pdf |
| A Functional Power Evaluation Flow for Defining Test Power Limits during At-Speed Delay Testing / M., V., A., B., L., D., P., G., S., P., A., V., SANCHEZ SANCHEZ, E.E., DE CARVALHO, M., SONZA REORDA, M.. - (2011), pp. 153-158. (2011 16th IEEE European Test Symposium (ETS) ) [10.1109/ETS.2011.21]. | 1-gen-2011 | SANCHEZ SANCHEZ, EDGAR ERNESTODE CARVALHO, MAURICIOSONZA REORDA, Matteo + | - |
| Optimized embedded memory diagnosis / DE CARVALHO, M., Bernardi, P., SONZA REORDA, M., N., C., T., K., D., A., M., B., V., T., M., T.. - (2011), pp. 347-352. (2011 IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ) [10.1109/DDECS.2011.5783109]. | 1-gen-2011 | DE CARVALHO, MAURICIOBERNARDI, PAOLOSONZA REORDA, Matteo + | - |
| An enhanced strategy for functional stress pattern generation for system-on-chip reliability characterization / DE CARVALHO, M., Bernardi, P., SANCHEZ SANCHEZ, E.E., SONZA REORDA, M.. - ELETTRONICO. - (2010). (2010 11th International Workshop on Microprocessor Test and Verification 2010 Austin (USA) 13-15 December 2010). | 1-gen-2010 | DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo | - |
| Cumulative embedded memory failure bitmap display & analysis / Campanelli, N.; Kekeres, T.; Bernardi, Paolo; DE CARVALHO, Mauricio; Panariti, Alessandro; SONZA REORDA, Matteo; Appello, D.; Barrone, M.. - ELETTRONICO. - (2010), pp. 255-260. ( 2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Vienna (Autria) 14-16 April 2010) [10.1109/DDECS.2010.5654683]. | 1-gen-2010 | BERNARDI, PAOLODE CARVALHO, MAURICIOPANARITI, ALESSANDROSONZA REORDA, Matteo + | - |