RECH, PAOLO

RECH, PAOLO  

Dipartimento di Automatica e Informatica  

033071  

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Risultati 1 - 20 di 36 (tempo di esecuzione: 0.034 secondi).
Citazione Data di pubblicazione Autori File
Demystifying GPU Reliability: Comparing and Combining Beam Experiments, Fault Simulation, and Profiling / Fernandes dos Santos, Fernando; Kumas Sastry Hari, Siva; Martins Basso, Pedro; Carro, Luigi; Rech, Paolo. - (In corso di stampa). (Intervento presentato al convegno 35th IEEE International Parallel & Distributed Processing Symposium (IPDPS)). In corso di stampa Carro, LuigiRech, Paolo + IPDPS_GPU_reliability.pdf
Reduced Precision DWC: an Efficient Hardening Strategy for Mixed-Precision Architectures / Fernandes dos Santos, Fernando; Brandalero, Marcelo; Sullivan, Michael; Martins Basso, Pedro; Hubner, Michael; Carro, Luigi; Rech, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - ELETTRONICO. - (In corso di stampa). In corso di stampa Carro, LuigiRech, Paolo + main_final.pdf
A Systematic Methodology to Compute the Quantum Vulnerability Factors for Quantum Circuits / Oliveira, Daniel; Giusto, Edoardo; Baheri, Betis; Guan, Qiang; Montrucchio, Bartolomeo; Rech, Paolo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - (2024), pp. 1-15. [10.1109/TDSC.2023.3313934] 1-gen-2024 Daniel OliveiraEdoardo GiustoBartolomeo MontrucchioPaolo Rech + A_Systematic_Methodology_to_Compute_the_Quantum_Vulnerability_Factors_for_Quantum_Circuits.pdf
Understanding Logical-Shift Error Propagation in Quanvolutional Neural Networks / Vallero, Marzio; Dri, Emanuele; Giusto, Edoardo; Montrucchio, Bartolomeo; Rech, Paolo. - In: IEEE TRANSACTIONS ON QUANTUM ENGINEERING. - ISSN 2689-1808. - 5:(2024), pp. 1-15. [10.1109/TQE.2024.3372880] 1-gen-2024 Marzio ValleroEmanuele DriEdoardo GiustoBartolomeo MontrucchioPaolo Rech Understanding_Logical-Shift_Error_Propagation_in_Quanvolutional_Neural_Networks.pdfUnderstanding_Logical-Shift_Error_Propagation_in_Quanvolutional_Neural_Networks.pdf
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 70:4(2023), pp. 370-380. [10.1109/tns.2022.3224538] 1-gen-2023 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + Characterizing_a_Neutron-Induced_Fault_Model_for_Deep_Neural_Networks.pdf
Quantum Computing Reliability: Problems, Tools, and Potential Solutions / Giusto, Edoardo; Dri, Emanuele; Montrucchio, Bartolomeo; Baheri, Betis; Guan, Qiang; Tiwari, Devesh; Rech, Paolo. - ELETTRONICO. - (2023), pp. 2-3. (Intervento presentato al convegno IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S) tenutosi a Portugal (PTR) nel 27-30 june 2023) [10.1109/DSN-S58398.2023.00015]. 1-gen-2023 Giusto, EdoardoDri, EmanueleMontrucchio, BartolomeoRech, Paolo + Quantum_Computing_Reliability_Problems_Tools_and_Potential_Solutions.pdf
Understanding the Effect of Transpilation in the Reliability of Quantum Circuits / Dilillo, Nicola; Giusto, Edoardo; Dri, Emanuele; Baheri, Betis; Guan, Qiang; Montrucchio, Bartolomeo; Rech, Paolo. - ELETTRONICO. - (2023), pp. 232-235. (Intervento presentato al convegno IEEE International Conference on Quantum Computing and Engineering (QCE) tenutosi a Bellevue, WA (USA) nel 17-22 September 2023) [10.1109/QCE57702.2023.10220]. 1-gen-2023 Dilillo, NicolaGiusto, EdoardoDri, EmanueleMontrucchio, BartolomeoRech, Paolo + Understanding_the_Effect_of_Transpilation_in_the_Reliability_of_Quantum_Circuits.pdfqvf_transpilation-1.pdf
Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; dos Santos, Fernando F.; Sonza, Matteo; Rech, Paolo. - ELETTRONICO. - (2023), pp. 1-14. (Intervento presentato al convegno SC23: International Conference for High Performance Computing, Networking, Storage and Analysis tenutosi a Denver CO (USA) nel November 12 - 17, 2023) [10.1145/3581784.3607086]. 1-gen-2023 Juan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo SonzaPaolo Rech + sc_2023_nvbitpermfi.pdf3581784.3607086.pdf
A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Dos Santos, Fernando F.; Reorda, Matteo Sonza; Rech, Paolo. - (2022), pp. 278-287. (Intervento presentato al convegno 2022 IEEE International Test Conference (ITC) tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00036]. 1-gen-2022 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidReorda, Matteo SonzaRech, Paolo + ITC_2022.pdfA_Multi-level_Approach_to_Evaluate_the_Impact_of_GPU_Permanent_Faults_on_CNNs_Reliability.pdf
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs / Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - ELETTRONICO. - 22:2(2022), pp. 129-141. [10.1109/TDMR.2022.3166260] 1-gen-2022 Rodriguez Condia, Josie E.Rech, PaoloCarro, LuigiSonza Reorda, Matteo + Transactions_on_device_and_materials_reliability_accepted_version.pdfAn_Effective_Method_to_Identify_Microarchitectural_Vulnerabilities_in_GPUs.pdf
Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs / Fernandes dos Santos, Fernando; Malde, Sujit; Cazzaniga, Carlo; Frost, Cris; Carro, Luigi; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 69:3(2022), pp. 436-443. [10.1109/TNS.2022.3141341] 1-gen-2022 Carro, LuigiRech, Paolo + FINAL_VERSION.pdfExperimental_Findings_on_the_Sources_of_Detected_Unrecoverable_Errors_in_GPUs.pdf
High Energy and Thermal Neutrons Sensitivity of Google Tensor Processing Units / Luiz Rech Junior, Rubens; Malde, Sujit; Cazzaniga, Carlo; Kastriotou, Maria; Letiche, Manon; Frost, Christopher; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 69:3(2022), pp. 567-575. [10.1109/TNS.2022.3142092] 1-gen-2022 Rech, Paolo + bare_conf.pdfHigh_Energy_and_Thermal_Neutron_Sensitivity_of_Google_Tensor_Processing_Units.pdf
Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements / Bodmann, Pablo; Papadimitriou, George; Rech Junior, Rubens L.; Gizopoulous, Dimitris; Rech, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 71:10(2022), pp. 2358-2369. [10.1109/TC.2021.3128501] 1-gen-2022 Rech, Paolo + TC_2021___ARM-2.pdfSoft_Error_Effects_on_Arm_Microprocessors_Early_Estimations_versus_Chip_Measurements.pdf
Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults / Casciola, Nadir; Giusto, Edoardo; Dri, Emanuele; Oliveira, Daniel; Rech, Paolo; Montrucchio, Bartolomeo. - ELETTRONICO. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design tenutosi a Torino (ITA) nel 12-14 settembre 2022) [10.1109/IOLTS56730.2022.9897308]. 1-gen-2022 Edoardo GiustoEmanuele DriPaolo RechBartolomeo Montrucchio + Understanding_the_Impact_of_Cutting_in_Quantum_Circuits_Reliability_to_Transient_Faults.pdf
Combining architectural simulation and software fault injection for a fast and accurate CNNs reliability evaluation on GPUs / Rodriguez Condia, Josie E.; Fernandes dos Santos, Fernando.; Sonza Reorda, Matteo; Rech, P.. - ELETTRONICO. - 2021-:(2021), pp. 1-7. (Intervento presentato al convegno 39th IEEE VLSI Test Symposium, VTS 2021 tenutosi a usa nel 2021) [10.1109/VTS50974.2021.9441044]. 1-gen-2021 Rodriguez Condia, Josie E.Sonza Reorda, MatteoRech, P. + Combining_Architectural_Simulation_and_Software_Fault_Injection_for_a_Fast_and_Accurate_CNNs_Reliability_Evaluation_on_GPUs.pdf
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits / Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 68:5(2021), pp. 1045-1053. [10.1109/TNS.2021.3070643] 1-gen-2021 Paolo, Rech + FINAL VERSION.pdfEvaluating_Architectural_Redundancy_and_Implementation_Strategies_for_Radiation_Hardening_of_FinFET_Integrated_Circuits.pdf
Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening / Rodriguez Condia, Josie Esteban; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - ELETTRONICO. - (2021), pp. 1-7. (Intervento presentato al convegno 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino, Italy nel 28-30 June 2021) [10.1109/IOLTS52814.2021.9486703]. 1-gen-2021 Rodriguez Condia, Josie EstebanRech, PaoloCarro, LuigiSonza Reorda, Matteo + IOLTS_2021_camera_Ready.pdfProtecting_GPUs_Microarchitectural_Vulnerabilities_via_Effective_Selective_Hardening.pdf
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection / Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo. - ELETTRONICO. - (2021), pp. 292-304. (Intervento presentato al convegno 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021 tenutosi a twn nel 2021) [10.1109/DSN48987.2021.00042]. 1-gen-2021 Rodriguez Condia, Josie Esteban.Carro, LuigiSonza Reorda, MatteoRech, Paolo + dsn_2021_end.pdfRevealing_GPUs_Vulnerabilities_by_Combining_Register-Transfer_and_Software-Level_Fault_Injection.pdf
Special session: How approximate computing impacts verification, test and reliability / Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.. - ELETTRONICO. - 2018:(2018), pp. 1-1. (Intervento presentato al convegno 36th IEEE VLSI Test Symposium, VTS 2018 tenutosi a San Francisco, USA nel 22-25 April, 2018) [10.1109/VTS.2018.8368628]. 1-gen-2018 Rech, P.Di Carlo, S. + camera_ready.pdf
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Robinson, W. H.; Rech, P.; Aguirre, M.; Barnard, A.; Desogus, M.; Entrena, L.; Garcia Valderas, M.; Guertin, S. M.; Kaeli, D.; Kastensmidt, F. L.; Kiddie, B. T.; Sanchez Clemente, A.; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, M.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313] 1-gen-2015 Rech, P.SONZA REORDA, MatteoSTERPONE, LUCA + -