RECH, PAOLO

RECH, PAOLO  

Dipartimento di Automatica e Informatica  

033071  

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Citazione Data di pubblicazione Autori File
A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility / Violante, Massimo; Sterpone, Luca; Manuzzato, A; Gerardin, S; Rech, P; Bagatin, M; Paccagnella, A; Andreani, C; Gorini, G; Pietropaolo, A; Cardarilli, G; Pontarelli, S; Frost, C.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2007), pp. 1184-1189. [10.1109/TNS.2007.902349] 1-gen-2007 VIOLANTE, MASSIMOSTERPONE, LucaRECH P + -
A new hardware/software platform for the soft-error sensitivity evaluation of FPGA devices / Violante, Massimo; SONZA REORDA, Matteo; Sterpone, Luca; Manuzzato, A.; Gerardin, S.; Rech, P.; Bagatin, M.; Paccagnella, A.; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Salsano, A.; Pontarelli, S.; Frost, C.. - STAMPA. - (2007), pp. 1-6. ((Intervento presentato al convegno 8th IEEE Latin American Test Workshop tenutosi a Cuzco, Peru. 1-gen-2007 VIOLANTE, MASSIMOSONZA REORDA, MatteoSTERPONE, LucaRECH P. + -
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts / Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo. - STAMPA. - (2010), pp. 29-34. ((Intervento presentato al convegno IEEE 16th International On-Line Testing Symposium tenutosi a corfu (greece) nel july 2010. 1-gen-2010 P. RechGROSSO, MICHELANGELOSONZA REORDA, Matteo + -
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2022), pp. 1-1. [10.1109/tns.2022.3224538] 1-gen-2022 Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + -
Combining architectural simulation and software fault injection for a fast and accurate CNNs reliability evaluation on GPUs / Rodriguez Condia, Josie E.; Fernandes dos Santos, Fernando.; Sonza Reorda, Matteo; Rech, P.. - ELETTRONICO. - 2021-:(2021), pp. 1-7. ((Intervento presentato al convegno 39th IEEE VLSI Test Symposium, VTS 2021 tenutosi a usa nel 2021 [10.1109/VTS50974.2021.9441044]. 1-gen-2021 Rodriguez Condia, Josie E.Sonza Reorda, MatteoRech, P. + Combining_Architectural_Simulation_and_Software_Fault_Injection_for_a_Fast_and_Accurate_CNNs_Reliability_Evaluation_on_GPUs.pdf
Demystifying GPU Reliability: Comparing and Combining Beam Experiments, Fault Simulation, and Profiling / Fernandes dos Santos, Fernando; Kumas Sastry Hari, Siva; Martins Basso, Pedro; Carro, Luigi; Rech, Paolo. - (In corso di stampa). ((Intervento presentato al convegno 35th IEEE International Parallel & Distributed Processing Symposium (IPDPS). In corso di stampa Carro, LuigiRech, Paolo + IPDPS_GPU_reliability.pdf
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study / Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - (2009), pp. 276-281. ((Intervento presentato al convegno 27th IEEE VLSI Test Symposium (VTS '09) tenutosi a Santa Cruz, USA nel May 2009 [10.1109/VTS.2009.26]. 1-gen-2009 BERNARDI, PAOLOGROSSO, MICHELANGELOP. RECHSONZA REORDA, Matteo + -
Early Reliability Evaluation of a Biomedical System / Hakobyan, H.; Rech, P.; SONZA REORDA, Matteo; Violante, Massimo. - STAMPA. - (2014), pp. 45-50. ((Intervento presentato al convegno 2014 9th International Design & Test Symposium tenutosi a Algiers, Algeria nel December 2014. 1-gen-2014 P. RechSONZA REORDA, MatteoVIOLANTE, MASSIMO + paper_57.pdf
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs / Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - ELETTRONICO. - 22:2(2022), pp. 129-141. [10.1109/TDMR.2022.3166260] 1-gen-2022 Rodriguez Condia, Josie E.Rech, PaoloCarro, LuigiSonza Reorda, Matteo + Transactions_on_device_and_materials_reliability_accepted_version.pdfAn_Effective_Method_to_Identify_Microarchitectural_Vulnerabilities_in_GPUs.pdf
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors / Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.. - (2009). [10.1109/IOLTS.2009.5195985] 1-gen-2009 BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, MatteoP. RECH + -
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits / Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 68:5(2021), pp. 1045-1053. [10.1109/TNS.2021.3070643] 1-gen-2021 Paolo, Rech + FINAL VERSION.pdfEvaluating_Architectural_Redundancy_and_Implementation_Strategies_for_Radiation_Hardening_of_FinFET_Integrated_Circuits.pdf
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core / Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.. - (2009), pp. 481-488. ((Intervento presentato al convegno European Conference on Radiation and Its Effects on Components and Systems (RADECS) tenutosi a Bruges, Belgium nel Sept. 14-18, 2009 [10.1109/RADECS.2009.5994699]. 1-gen-2009 RECH PGROSSO, MICHELANGELOSONZA REORDA, Matteo + -
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core / Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 57:4(2010), pp. 2098-2105. [10.1109/TNS.2010.2049119] 1-gen-2010 GROSSO, MICHELANGELORECH P.SONZA REORDA, Matteo + 2318207.pdf
Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 54:11(2014), pp. 2621-2628. [10.1016/j.microrel.2014.05.001] 1-gen-2014 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs / Fernandes dos Santos, Fernando; Malde, Sujit; Cazzaniga, Carlo; Frost, Cris; Carro, Luigi; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 69:3(2022), pp. 436-443. [10.1109/TNS.2022.3141341] 1-gen-2022 Carro, LuigiRech, Paolo + FINAL_VERSION.pdfExperimental_Findings_on_the_Sources_of_Detected_Unrecoverable_Errors_in_GPUs.pdf
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications / DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - (2014), pp. 210-211. ((Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium (IOLTS) tenutosi a Platja d'Aro nel July 7 - 9, 2014. 1-gen-2014 DE CARVALHO, MAURICIOSABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
GPGPUs: How to combine high computational power with high reliability / Bautista Gomez, L.; Cappello, F.; Carro, L.; Debardeleben, N.; Fang, B.; Gurumurthi, S.; Pattabiraman, K.; Rech, P.; SONZA REORDA, Matteo. - (2014). ((Intervento presentato al convegno Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 tenutosi a Dresden, Germany nel March 2014 [10.7873/DATE2014.354]. 1-gen-2014 P. RechSONZA REORDA, Matteo + 06800555.pdf
High Energy and Thermal Neutrons Sensitivity of Google Tensor Processing Units / Luiz Rech Junior, Rubens; Malde, Sujit; Cazzaniga, Carlo; Kastriotou, Maria; Letiche, Manon; Frost, Christopher; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 69:3(2022), pp. 567-575. [10.1109/TNS.2022.3142092] 1-gen-2022 Rech, Paolo + bare_conf.pdfHigh_Energy_and_Thermal_Neutron_Sensitivity_of_Google_Tensor_Processing_Units.pdf
On the evaluation of soft-errors detection techniques for GPGPUs / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - ELETTRONICO. - (2013). ((Intervento presentato al convegno 2013 8th IEEE International Design and Test Symposium (IDT) tenutosi a Marrakesh nel December 16-18, 2013. 1-gen-2013 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening / Rodriguez Condia, Josie Esteban; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - ELETTRONICO. - (2021), pp. 1-7. ((Intervento presentato al convegno 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino, Italy nel 28-30 June 2021 [10.1109/IOLTS52814.2021.9486703]. 1-gen-2021 Rodriguez Condia, Josie EstebanRech, PaoloCarro, LuigiSonza Reorda, Matteo + IOLTS_2021_camera_Ready.pdfProtecting_GPUs_Microarchitectural_Vulnerabilities_via_Effective_Selective_Hardening.pdf