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Reduced Precision DWC: an Efficient Hardening Strategy for Mixed-Precision Architectures
In corso di stampa Fernandes dos Santos, Fernando; Brandalero, Marcelo; Sullivan, Michael; Martins Basso, Pedro; Hubner, Michael; Carro, Luigi; Rech, Paolo
A Systematic Methodology to Compute the Quantum Vulnerability Factors for Quantum Circuits
2024 Oliveira, Daniel; Giusto, Edoardo; Baheri, Betis; Guan, Qiang; Montrucchio, Bartolomeo; Rech, Paolo
Understanding Logical-Shift Error Propagation in Quanvolutional Neural Networks
2024 Vallero, Marzio; Dri, Emanuele; Giusto, Edoardo; Montrucchio, Bartolomeo; Rech, Paolo
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks
2023 Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo
An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs
2022 Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo
Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs
2022 Fernandes dos Santos, Fernando; Malde, Sujit; Cazzaniga, Carlo; Frost, Cris; Carro, Luigi; Rech, Paolo
High Energy and Thermal Neutrons Sensitivity of Google Tensor Processing Units
2022 Luiz Rech Junior, Rubens; Malde, Sujit; Cazzaniga, Carlo; Kastriotou, Maria; Letiche, Manon; Frost, Christopher; Rech, Paolo
Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements
2022 Bodmann, Pablo; Papadimitriou, George; Rech Junior, Rubens L.; Gizopoulous, Dimitris; Rech, Paolo
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits
2021 Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs
2015 Robinson, W. H.; Rech, P.; Aguirre, M.; Barnard, A.; Desogus, M.; Entrena, L.; Garcia Valderas, M.; Guertin, S. M.; Kaeli, D.; Kastensmidt, F. L.; Kiddie, B. T.; Sanchez Clemente, A.; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, M.
Using Benchmarks for Radiation Testing of Microprocessors and FPGAs
2015 Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael
Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results
2014 Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.
Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications
2014 Sabena, Davide; Sterpone, Luca; Carro, L.; Rech, P.
Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs
2014 Pilla, L. L.; Rech, P.; Silvestri, F.; Frost, C.; Navaux, P. O. A.; SONZA REORDA, Matteo; Carro, L.
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core
2010 Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo
A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility
2007 Violante, Massimo; Sterpone, Luca; Manuzzato, A; Gerardin, S; Rech, P; Bagatin, M; Paccagnella, A; Andreani, C; Gorini, G; Pietropaolo, A; Cardarilli, G; Pontarelli, S; Frost, C.
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Reduced Precision DWC: an Efficient Hardening Strategy for Mixed-Precision Architectures / Fernandes dos Santos, Fernando; Brandalero, Marcelo; Sullivan, Michael; Martins Basso, Pedro; Hubner, Michael; Carro, Luigi; Rech, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - ELETTRONICO. - (In corso di stampa). | In corso di stampa | Carro, LuigiRech, Paolo + | main_final.pdf |
| A Systematic Methodology to Compute the Quantum Vulnerability Factors for Quantum Circuits / Oliveira, Daniel; Giusto, Edoardo; Baheri, Betis; Guan, Qiang; Montrucchio, Bartolomeo; Rech, Paolo. - In: IEEE TRANSACTIONS ON DEPENDABLE AND SECURE COMPUTING. - ISSN 1545-5971. - (2024), pp. 1-15. [10.1109/TDSC.2023.3313934] | 1-gen-2024 | Daniel OliveiraEdoardo GiustoBartolomeo MontrucchioPaolo Rech + | A_Systematic_Methodology_to_Compute_the_Quantum_Vulnerability_Factors_for_Quantum_Circuits.pdf |
| Understanding Logical-Shift Error Propagation in Quanvolutional Neural Networks / Vallero, Marzio; Dri, Emanuele; Giusto, Edoardo; Montrucchio, Bartolomeo; Rech, Paolo. - In: IEEE TRANSACTIONS ON QUANTUM ENGINEERING. - ISSN 2689-1808. - (2024), pp. 1-15. [10.1109/TQE.2024.3372880] | 1-gen-2024 | Marzio ValleroEmanuele DriEdoardo GiustoBartolomeo MontrucchioPaolo Rech | Understanding_Logical-Shift_Error_Propagation_in_Quanvolutional_Neural_Networks.pdf |
| Characterizing a Neutron-Induced Fault Model for Deep Neural Networks / Fernandes Dos Santos, Fernando; Kritikakou, Angeliki; Rodriguez Condia, Josie E.; Juan-David, Guerrero-Balaguera; SONZA REORDA, Matteo; Sentieys, Olivier; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 70:4(2023), pp. 370-380. [10.1109/tns.2022.3224538] | 1-gen-2023 | Josie E. Rodriguez CondiaJuan-David Guerrero-BalagueraMatteo Sonza ReordaOlivier SentieysPaolo Rech + | Characterizing_a_Neutron-Induced_Fault_Model_for_Deep_Neural_Networks.pdf |
| An Effective Method to Identify Microarchitectural Vulnerabilities in GPUs / Rodriguez Condia, Josie E.; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - In: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY. - ISSN 1530-4388. - ELETTRONICO. - 22:2(2022), pp. 129-141. [10.1109/TDMR.2022.3166260] | 1-gen-2022 | Rodriguez Condia, Josie E.Rech, PaoloCarro, LuigiSonza Reorda, Matteo + | Transactions_on_device_and_materials_reliability_accepted_version.pdf; An_Effective_Method_to_Identify_Microarchitectural_Vulnerabilities_in_GPUs.pdf |
| Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs / Fernandes dos Santos, Fernando; Malde, Sujit; Cazzaniga, Carlo; Frost, Cris; Carro, Luigi; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 69:3(2022), pp. 436-443. [10.1109/TNS.2022.3141341] | 1-gen-2022 | Carro, LuigiRech, Paolo + | FINAL_VERSION.pdf; Experimental_Findings_on_the_Sources_of_Detected_Unrecoverable_Errors_in_GPUs.pdf |
| High Energy and Thermal Neutrons Sensitivity of Google Tensor Processing Units / Luiz Rech Junior, Rubens; Malde, Sujit; Cazzaniga, Carlo; Kastriotou, Maria; Letiche, Manon; Frost, Christopher; Rech, Paolo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 69:3(2022), pp. 567-575. [10.1109/TNS.2022.3142092] | 1-gen-2022 | Rech, Paolo + | bare_conf.pdf; High_Energy_and_Thermal_Neutron_Sensitivity_of_Google_Tensor_Processing_Units.pdf |
| Soft Error Effects on Arm Microprocessors: Early Estimations versus Chip Measurements / Bodmann, Pablo; Papadimitriou, George; Rech Junior, Rubens L.; Gizopoulous, Dimitris; Rech, Paolo. - In: IEEE TRANSACTIONS ON COMPUTERS. - ISSN 0018-9340. - 71:10(2022), pp. 2358-2369. [10.1109/TC.2021.3128501] | 1-gen-2022 | Rech, Paolo + | TC_2021___ARM-2.pdf; Soft_Error_Effects_on_Arm_Microprocessors_Early_Estimations_versus_Chip_Measurements.pdf |
| Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits / Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 68:5(2021), pp. 1045-1053. [10.1109/TNS.2021.3070643] | 1-gen-2021 | Paolo, Rech + | FINAL VERSION.pdf; Evaluating_Architectural_Redundancy_and_Implementation_Strategies_for_Radiation_Hardening_of_FinFET_Integrated_Circuits.pdf |
| Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Robinson, W. H.; Rech, P.; Aguirre, M.; Barnard, A.; Desogus, M.; Entrena, L.; Garcia Valderas, M.; Guertin, S. M.; Kaeli, D.; Kastensmidt, F. L.; Kiddie, B. T.; Sanchez Clemente, A.; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, M.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313] | 1-gen-2015 | Rech, P.SONZA REORDA, MatteoSTERPONE, LUCA + | - |
| Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313] | 1-gen-2015 | RECH, PAOLODESOGUS, MARCOSONZA REORDA, MatteoSTERPONE, LUCA + | 07348783.pdf |
| Evaluating the radiation sensitivity of GPGPU caches: New algorithms and experimental results / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - In: MICROELECTRONICS RELIABILITY. - ISSN 0026-2714. - ELETTRONICO. - 54:11(2014), pp. 2621-2628. [10.1016/j.microrel.2014.05.001] | 1-gen-2014 | SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + | - |
| Reliability Evaluation of Embedded GPGPUs for Safety Critical Applications / Sabena, Davide; Sterpone, Luca; Carro, L.; Rech, P.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 61:6(2014), pp. 3123-3129. [10.1109/TNS.2014.2363358] | 1-gen-2014 | SABENA, DAVIDESTERPONE, LucaRech P. + | - |
| Software-Based Hardening Strategies for Neutron Sensitive FFT Algorithms on GPUs / Pilla, L. L.; Rech, P.; Silvestri, F.; Frost, C.; Navaux, P. O. A.; SONZA REORDA, Matteo; Carro, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 61:4/1(2014), pp. 1874-1880. [10.1109/TNS.2014.2301768] | 1-gen-2014 | Rech P.SONZA REORDA, Matteo + | - |
| Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core / Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 57:4(2010), pp. 2098-2105. [10.1109/TNS.2010.2049119] | 1-gen-2010 | GROSSO, MICHELANGELORECH P.SONZA REORDA, Matteo + | - |
| A new hardware/software platform and a new 1/E neutron source for soft error studies: testing FPGAs at the ISIS facility / Violante, Massimo; Sterpone, Luca; Manuzzato, A; Gerardin, S; Rech, P; Bagatin, M; Paccagnella, A; Andreani, C; Gorini, G; Pietropaolo, A; Cardarilli, G; Pontarelli, S; Frost, C.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - (2007), pp. 1184-1189. [10.1109/TNS.2007.902349] | 1-gen-2007 | VIOLANTE, MASSIMOSTERPONE, LucaRECH P + | - |