Archivio Istituzionale della RicercaThis paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented using three different standard cell libraries. Each library is based on a different Design for Manufacturability (DfM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested resorting to advanced Design for Testability (DfT) methodologies and radiation experiments results are compared. Electrical simulations of flip-flops are finally performed to propose physical motivations to the observed phenomena.
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core / Appello, D.; Grosso, Michelangelo; Loparco, D.; Melchiori, F.; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - STAMPA. - 57:4(2010), pp. 2098-2105. [10.1109/TNS.2010.2049119]
Evaluating the Impact of DFM Library Optimizations on Alpha-induced SEU Sensitivity in a Microprocessor Core
GROSSO, MICHELANGELO;RECH P.;SONZA REORDA, Matteo
2010
Abstract
This paper presents and discusses the results of Alpha Single Event Upset (SEU) tests on an embedded 8051 microprocessor core implemented using three different standard cell libraries. Each library is based on a different Design for Manufacturability (DfM) optimization strategy; our goal is to understand how these strategies may affect the device sensitivity to alpha-induced Soft Errors. The three implementations are tested resorting to advanced Design for Testability (DfT) methodologies and radiation experiments results are compared. Electrical simulations of flip-flops are finally performed to propose physical motivations to the observed phenomena.
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
https://hdl.handle.net/11583/2318207
Attenzione
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo