Performance benchmarks have been used over the years to compare different systems. These benchmarks can be useful for researchers trying to determine how changes to the technology, architecture, or compiler affect the system’s performance. No such standard exists for systems deployed into high radiation environments, making it difficult to assess whether changes in the fabrication process, circuitry, architecture, or software affect reliability or radiation sensitivity. In this paper, we propose a benchmark suite for high-reliability systems that is designed for field-programmable gate arrays and microprocessors. We describe the development process and report neutron test data for the hardware and software benchmarks.

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs / Quinn, Heather; Robinson, William H.; Rech, Paolo; Aguirre, Miguel; Barnard, Arno; Desogus, Marco; Entrena, Luis; Garcia Valderas, Mario; Guertin, Steven M.; Kaeli, David; Kastensmidt, Fernanda Lima; Kiddie, Bradley T.; Sanchez Clemente, Antonio; SONZA REORDA, Matteo; Sterpone, Luca; Wirthlin, Michael. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - ELETTRONICO. - 62:6(2015), pp. 2547-2554. [10.1109/TNS.2015.2498313]

Using Benchmarks for Radiation Testing of Microprocessors and FPGAs

RECH, PAOLO;DESOGUS, MARCO;SONZA REORDA, Matteo;STERPONE, LUCA;
2015

Abstract

Performance benchmarks have been used over the years to compare different systems. These benchmarks can be useful for researchers trying to determine how changes to the technology, architecture, or compiler affect the system’s performance. No such standard exists for systems deployed into high radiation environments, making it difficult to assess whether changes in the fabrication process, circuitry, architecture, or software affect reliability or radiation sensitivity. In this paper, we propose a benchmark suite for high-reliability systems that is designed for field-programmable gate arrays and microprocessors. We describe the development process and report neutron test data for the hardware and software benchmarks.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11583/2626671
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