RECH, PAOLO

RECH, PAOLO  

Dipartimento di Automatica e Informatica  

033071  

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Citazione Data di pubblicazione Autori File
Demystifying GPU Reliability: Comparing and Combining Beam Experiments, Fault Simulation, and Profiling / Fernandes dos Santos, Fernando; Kumas Sastry Hari, Siva; Martins Basso, Pedro; Carro, Luigi; Rech, Paolo. - (In corso di stampa). (Intervento presentato al convegno 35th IEEE International Parallel & Distributed Processing Symposium (IPDPS)). In corso di stampa Carro, LuigiRech, Paolo + IPDPS_GPU_reliability.pdf
Quantum Computing Reliability: Problems, Tools, and Potential Solutions / Giusto, Edoardo; Dri, Emanuele; Montrucchio, Bartolomeo; Baheri, Betis; Guan, Qiang; Tiwari, Devesh; Rech, Paolo. - ELETTRONICO. - (2023), pp. 2-3. (Intervento presentato al convegno IEEE/IFIP International Conference on Dependable Systems and Networks – Supplemental Volume (DSN-S) tenutosi a Portugal (PTR) nel 27-30 june 2023) [10.1109/DSN-S58398.2023.00015]. 1-gen-2023 Giusto, EdoardoDri, EmanueleMontrucchio, BartolomeoRech, Paolo + Quantum_Computing_Reliability_Problems_Tools_and_Potential_Solutions.pdf
Understanding the Effect of Transpilation in the Reliability of Quantum Circuits / Dilillo, Nicola; Giusto, Edoardo; Dri, Emanuele; Baheri, Betis; Guan, Qiang; Montrucchio, Bartolomeo; Rech, Paolo. - ELETTRONICO. - (2023), pp. 232-235. (Intervento presentato al convegno IEEE International Conference on Quantum Computing and Engineering (QCE) tenutosi a Bellevue, WA (USA) nel 17-22 September 2023) [10.1109/QCE57702.2023.10220]. 1-gen-2023 Dilillo, NicolaGiusto, EdoardoDri, EmanueleMontrucchio, BartolomeoRech, Paolo + Understanding_the_Effect_of_Transpilation_in_the_Reliability_of_Quantum_Circuits.pdfqvf_transpilation-1.pdf
Understanding the Effects of Permanent Faults in GPU's Parallelism Management and Control Units / Guerrero-Balaguera, Juan-David; Rodriguez Condia, Josie E.; dos Santos, Fernando F.; Sonza, Matteo; Rech, Paolo. - ELETTRONICO. - (2023), pp. 1-14. (Intervento presentato al convegno SC23: International Conference for High Performance Computing, Networking, Storage and Analysis tenutosi a Denver CO (USA) nel November 12 - 17, 2023) [10.1145/3581784.3607086]. 1-gen-2023 Juan-David Guerrero-BalagueraJosie E. Rodriguez CondiaMatteo SonzaPaolo Rech + sc_2023_nvbitpermfi.pdf3581784.3607086.pdf
A Multi-level Approach to Evaluate the Impact of GPU Permanent Faults on CNN's Reliability / Rodriguez Condia, Josie E.; Guerrero-Balaguera, Juan-David; Dos Santos, Fernando F.; Reorda, Matteo Sonza; Rech, Paolo. - (2022), pp. 278-287. (Intervento presentato al convegno 2022 IEEE International Test Conference (ITC) tenutosi a Anaheim, CA (USA) nel 23-30 September 2022) [10.1109/ITC50671.2022.00036]. 1-gen-2022 Rodriguez Condia, Josie E.Guerrero-Balaguera, Juan-DavidReorda, Matteo SonzaRech, Paolo + ITC_2022.pdfA_Multi-level_Approach_to_Evaluate_the_Impact_of_GPU_Permanent_Faults_on_CNNs_Reliability.pdf
Understanding the Impact of Cutting in Quantum Circuits Reliability to Transient Faults / Casciola, Nadir; Giusto, Edoardo; Dri, Emanuele; Oliveira, Daniel; Rech, Paolo; Montrucchio, Bartolomeo. - ELETTRONICO. - (2022). (Intervento presentato al convegno The 28th IEEE International Symposium on On-Line Testing and Robust System Design tenutosi a Torino (ITA) nel 12-14 settembre 2022) [10.1109/IOLTS56730.2022.9897308]. 1-gen-2022 Edoardo GiustoEmanuele DriPaolo RechBartolomeo Montrucchio + Understanding_the_Impact_of_Cutting_in_Quantum_Circuits_Reliability_to_Transient_Faults.pdf
Combining architectural simulation and software fault injection for a fast and accurate CNNs reliability evaluation on GPUs / Rodriguez Condia, Josie E.; Fernandes dos Santos, Fernando.; Sonza Reorda, Matteo; Rech, P.. - ELETTRONICO. - 2021-:(2021), pp. 1-7. (Intervento presentato al convegno 39th IEEE VLSI Test Symposium, VTS 2021 tenutosi a usa nel 2021) [10.1109/VTS50974.2021.9441044]. 1-gen-2021 Rodriguez Condia, Josie E.Sonza Reorda, MatteoRech, P. + Combining_Architectural_Simulation_and_Software_Fault_Injection_for_a_Fast_and_Accurate_CNNs_Reliability_Evaluation_on_GPUs.pdf
Protecting GPU's Microarchitectural Vulnerabilities via Effective Selective Hardening / Rodriguez Condia, Josie Esteban; Rech, Paolo; Fernandes dos Santos, Fernando; Carro, Luigi; Sonza Reorda, Matteo. - ELETTRONICO. - (2021), pp. 1-7. (Intervento presentato al convegno 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS) tenutosi a Torino, Italy nel 28-30 June 2021) [10.1109/IOLTS52814.2021.9486703]. 1-gen-2021 Rodriguez Condia, Josie EstebanRech, PaoloCarro, LuigiSonza Reorda, Matteo + IOLTS_2021_camera_Ready.pdfProtecting_GPUs_Microarchitectural_Vulnerabilities_via_Effective_Selective_Hardening.pdf
Revealing GPUs Vulnerabilities by Combining Register-Transfer and Software-Level Fault Injection / Fernandes dos Santos, Fernando; Rodriguez Condia, Josie Esteban.; Carro, Luigi; Sonza Reorda, Matteo; Rech, Paolo. - ELETTRONICO. - (2021), pp. 292-304. (Intervento presentato al convegno 51st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2021 tenutosi a twn nel 2021) [10.1109/DSN48987.2021.00042]. 1-gen-2021 Rodriguez Condia, Josie Esteban.Carro, LuigiSonza Reorda, MatteoRech, Paolo + dsn_2021_end.pdfRevealing_GPUs_Vulnerabilities_by_Combining_Register-Transfer_and_Software-Level_Fault_Injection.pdf
Special session: How approximate computing impacts verification, test and reliability / Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.. - ELETTRONICO. - 2018:(2018), pp. 1-1. (Intervento presentato al convegno 36th IEEE VLSI Test Symposium, VTS 2018 tenutosi a San Francisco, USA nel 22-25 April, 2018) [10.1109/VTS.2018.8368628]. 1-gen-2018 Rech, P.Di Carlo, S. + camera_ready.pdf
Early Reliability Evaluation of a Biomedical System / Hakobyan, H.; Rech, P.; SONZA REORDA, Matteo; Violante, Massimo. - STAMPA. - (2014), pp. 45-50. (Intervento presentato al convegno 2014 9th International Design & Test Symposium tenutosi a Algiers, Algeria nel December 2014). 1-gen-2014 P. RechSONZA REORDA, MatteoVIOLANTE, MASSIMO + -
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications / DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - (2014), pp. 210-211. (Intervento presentato al convegno IEEE 20th International On-Line Testing Symposium (IOLTS) tenutosi a Platja d'Aro nel July 7 - 9, 2014). 1-gen-2014 DE CARVALHO, MAURICIOSABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
GPGPUs: How to combine high computational power with high reliability / Bautista Gomez, L.; Cappello, F.; Carro, L.; Debardeleben, N.; Fang, B.; Gurumurthi, S.; Pattabiraman, K.; Rech, P.; SONZA REORDA, Matteo. - (2014). (Intervento presentato al convegno Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014 tenutosi a Dresden, Germany nel March 2014) [10.7873/DATE2014.354]. 1-gen-2014 P. RechSONZA REORDA, Matteo + -
On the evaluation of soft-errors detection techniques for GPGPUs / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - ELETTRONICO. - (2013). (Intervento presentato al convegno 2013 8th IEEE International Design and Test Symposium (IDT) tenutosi a Marrakesh nel December 16-18, 2013). 1-gen-2013 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
Analysis of Root Causes of Alpha Sensitivity Variations on Microprocessors Manufactured using Different Cell Layouts / Rech, P.; Grosso, Michelangelo; Melchiori, F.; Loparco, D.; Appello, D.; Dilillo, L.; Paccagnella, A.; SONZA REORDA, Matteo. - STAMPA. - (2010), pp. 29-34. (Intervento presentato al convegno IEEE 16th International On-Line Testing Symposium tenutosi a corfu (greece) nel july 2010). 1-gen-2010 P. RechGROSSO, MICHELANGELOSONZA REORDA, Matteo + -
DfT Reuse for Low-Cost Radiation Testing of SoCs: A Case Study / Appello, D.; Bernardi, Paolo; Gerardin, S.; Grosso, Michelangelo; Paccagnella, A.; Rech, P.; SONZA REORDA, Matteo. - (2009), pp. 276-281. (Intervento presentato al convegno 27th IEEE VLSI Test Symposium (VTS '09) tenutosi a Santa Cruz, USA nel May 2009) [10.1109/VTS.2009.26]. 1-gen-2009 BERNARDI, PAOLOGROSSO, MICHELANGELOP. RECHSONZA REORDA, Matteo + -
Evaluating Alpha-induced Soft Errors in Embedded Microprocessors / Bernardi, Paolo; Grosso, Michelangelo; SONZA REORDA, Matteo; Appello, D.; Rech, P.; Gerardin, S.; Paccagnella, A.. - (2009). [10.1109/IOLTS.2009.5195985] 1-gen-2009 BERNARDI, PAOLOGROSSO, MICHELANGELOSONZA REORDA, MatteoP. RECH + -
Evaluating the impact of DFM library optimizations on alpha-induced SEU sensitivity in a microprocessor core / Rech, P; Paccagnella, A; Grosso, Michelangelo; SONZA REORDA, Matteo; Melchiori, F; Appello, D.. - (2009), pp. 481-488. (Intervento presentato al convegno European Conference on Radiation and Its Effects on Components and Systems (RADECS) tenutosi a Bruges, Belgium nel Sept. 14-18, 2009) [10.1109/RADECS.2009.5994699]. 1-gen-2009 RECH PGROSSO, MICHELANGELOSONZA REORDA, Matteo + -
A new hardware/software platform for the soft-error sensitivity evaluation of FPGA devices / Violante, Massimo; SONZA REORDA, Matteo; Sterpone, Luca; Manuzzato, A.; Gerardin, S.; Rech, P.; Bagatin, M.; Paccagnella, A.; Andreani, C.; Gorini, G.; Pietropaolo, A.; Cardarilli, G.; Salsano, A.; Pontarelli, S.; Frost, C.. - STAMPA. - (2007), pp. 1-6. (Intervento presentato al convegno 8th IEEE Latin American Test Workshop tenutosi a Cuzco, Peru). 1-gen-2007 VIOLANTE, MASSIMOSONZA REORDA, MatteoSTERPONE, LucaRECH P. + -
Sensitivity evaluation of TMR-hardened circuits to multiple SEUs induced by alpha particles in commercial SRAM-based FPGAs / Manuzzato, A; Rech, P; Gerardin, S; Paccagnella, A; Sterpone, Luca; Violante, Massimo. - (2007), pp. 79-86. (Intervento presentato al convegno International Symposium on Defect and Fault Tolerance in VLSI Systems). 1-gen-2007 RECH PSTERPONE, LucaVIOLANTE, MASSIMO + -