Archivio Istituzionale della RicercaDE CARVALHO, MAURICIO
DE CARVALHO, MAURICIO
Dipartimento di Automatica e Informatica
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Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test
2014 DE CARVALHO, Mauricio; Bernardi, Paolo; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; Ballan, O.
Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption
2013 Bernardi, Paolo; DE CARVALHO, Mauricio; SANCHEZ SANCHEZ, EDGAR ERNESTO; SONZA REORDA, Matteo; A., Bosio; L., Dilillo; M., Valka; P., Girard
| Citazione | Data di pubblicazione | Autori | File |
|---|---|---|---|
| Increasing the Fault Coverage of Processor Devices during the Operational Phase Functional Test / DE CARVALHO, M., Bernardi, P., SANCHEZ SANCHEZ, E.E., SONZA REORDA, M., Ballan, O.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - ELETTRONICO. - 30:(2014), pp. 317-328. [10.1007/s10836-014-5457-5] | 1-gen-2014 | DE CARVALHO, MAURICIOBERNARDI, PAOLOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, MATTEO + | - |
| Fast Power Evaluation for Effective Generation of Test Programs Maximizing Peak Power Consumption / Bernardi, P., DE CARVALHO, M., SANCHEZ SANCHEZ, E.E., SONZA REORDA, M., A., B., L., D., M., V., P., G.. - In: JOURNAL OF LOW POWER ELECTRONICS. - ISSN 1546-1998. - 9:(2013), pp. 253-263. [10.1166/jolpe.2013.1259] | 1-gen-2013 | BERNARDI, PAOLODE CARVALHO, MAURICIOSANCHEZ SANCHEZ, EDGAR ERNESTOSONZA REORDA, Matteo + | - |