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SABENA, DAVIDE

SABENA, DAVIDE  

Dipartimento di Automatica e Informatica  

028076  

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Risultati 1 - 13 di 13 (tempo di esecuzione: 0.014 secondi).
Citazione Data di pubblicazione Autori File
Hardening Dynamically Reconfigurable Processing Modules Architectures: A Neutron Test Experience / Desogus, Marco; Sterpone, Luca; Sabena, Davide; Ullah, Anees; Mario, Porrmann; Jens, Hagemeyer; Jorgan, Ilstad. - (In corso di stampa). ( Radiation Effects on Components and Systems 2013). In corso di stampa DESOGUS, MARCOSTERPONE, LucaSABENA, DAVIDEULLAH, ANEES + -
Fault Injection in GPGPU Cores to Validate and Debug Robust Parallel Applications / DE CARVALHO, Mauricio; Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - (2014), pp. 210-211. ( IEEE 20th International On-Line Testing Symposium (IOLTS) Platja d'Aro July 7 - 9, 2014). 1-gen-2014 DE CARVALHO, MAURICIOSABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
Reconfigurable High Performance Architectures: How much are they ready for safety-critical applications / Sabena, Davide; Sterpone, Luca; Schölzel, M.; Koal, T.; Vierhaus, H. T.; Wong, S.; Glein, R.; Rittner, F.; Stender, C.; Porrmann, M.; Hagemeyer, J.. - ELETTRONICO. - (2014), pp. 175-182. ( 19th IEEE European Test Symposium (ETS) Paderborn 26 May - 30 May 2014). 1-gen-2014 SABENA, DAVIDESTERPONE, Luca + -
Soft Error Effects Analysis and Mitigation in VLIW Safety-Critical Applications / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2014), pp. 135-140. ( IFIP/IEEE 22nd International Conference on Very Large Scale Integration (VLSI-SoC) Playa del Carmen, Mexico. October 6-8, 2014). 1-gen-2014 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
Dynamic Neutron Testing of Dynamically Reconfigurable Processing Modules Architecture / Sterpone, Luca; Sabena, Davide; Ullah, Anees; Porrmann, M.; Hagemeyer, J.; Ilstad, J.. - ELETTRONICO. - (2013), pp. 184-188. ( IEEE AHS Torino June 2013). 1-gen-2013 STERPONE, LucaSABENA, DAVIDEULLAH, ANEES + -
On the Automatic Generation of Software-Based Self-Test Programs for Functional Test and Diagnosis of VLIW Processors / Sabena, Davide; Sterpone, Luca; SONZA REORDA, Matteo. - ELETTRONICO. - (2013), pp. 162-180. ( 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration Santa Cruz, CA, USA October 7-10, 2012) [10.1007/978-3-642-45073-0_9]. 1-gen-2013 SABENA, DAVIDESTERPONE, LucaSONZA REORDA, Matteo -
On the development of diagnostic test programs for VLIW processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2013), pp. 87-92. ( 21st IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) Istanbul October 2013). 1-gen-2013 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
On the evaluation of soft-errors detection techniques for GPGPUs / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca; Rech, P.; Carro, L.. - ELETTRONICO. - (2013). ( 2013 8th IEEE International Design and Test Symposium (IDT) Marrakesh December 16-18, 2013). 1-gen-2013 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, LucaRech P. + -
A New Fault Injection Approach for Testing Network-on-Chips / Sterpone, Luca; Sabena, Davide; SONZA REORDA, Matteo. - STAMPA. - (2012), pp. 530-535. ( PDP 2012 Munich ) [10.1109/PDP.2012.82]. 1-gen-2012 STERPONE, LucaSABENA, DAVIDESONZA REORDA, Matteo -
A New SBST Algorithm for Testing the Register File of VLIW Processors / Sterpone, Luca; Sabena, Davide; SONZA REORDA, Matteo. - ELETTRONICO. - (2012), pp. 412-417. ( IEEE Design, Automation and Test in Europe, 2012 Dresden, Germany 12-16 March 2012). 1-gen-2012 STERPONE, LucaSABENA, DAVIDESONZA REORDA, Matteo -
On the development of Software-Based Self-Test methods for VLIW processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2012), pp. 25-30. ( Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on Austin, TX, USA October, 2012.) [10.1109/DFT.2012.6378194]. 1-gen-2012 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
On the optimized generation of Software-Based Self-Test programs for VLIW processors / Sabena, Davide; SONZA REORDA, Matteo; Sterpone, Luca. - ELETTRONICO. - (2012), pp. 129-134. ( VLSI and System-on-Chip (VLSI-SoC), 2012 IEEE/IFIP 20th International Conference on Santa Cruz, CA, USA 7-10 October 2012) [10.1109/VLSI-SoC.2012.6379018]. 1-gen-2012 SABENA, DAVIDESONZA REORDA, MatteoSTERPONE, Luca -
Fault Injection Analysis of Transient Faults in Clustered VLIW Processors / Sterpone, Luca; Sabena, Davide; Campagna, Salvatore; SONZA REORDA, Matteo. - (2011), pp. 207-212. ( 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems Cottbus, Germany 13-15 Aprile, 2011). 1-gen-2011 STERPONE, LucaSABENA, DAVIDECAMPAGNA, SALVATORESONZA REORDA, Matteo -